SG97935A1 - Resin-encapsulated semiconductor device - Google Patents
Resin-encapsulated semiconductor deviceInfo
- Publication number
- SG97935A1 SG97935A1 SG200005207A SG200005207A SG97935A1 SG 97935 A1 SG97935 A1 SG 97935A1 SG 200005207 A SG200005207 A SG 200005207A SG 200005207 A SG200005207 A SG 200005207A SG 97935 A1 SG97935 A1 SG 97935A1
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor device
- interconnect pattern
- resin
- metallic
- encapsulated semiconductor
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 5
- 238000000034 method Methods 0.000 abstract 2
- 238000005530 etching Methods 0.000 abstract 1
Classifications
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01075—Rhenium [Re]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15151—Shape the die mounting substrate comprising an aperture, e.g. for underfilling, outgassing, window type wire connections
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15182—Fan-in arrangement of the internal vias
- H01L2924/15183—Fan-in arrangement of the internal vias in a single layer of the multilayer substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15182—Fan-in arrangement of the internal vias
- H01L2924/15184—Fan-in arrangement of the internal vias in different layers of the multilayer substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
- H01L2924/1816—Exposing the passive side of the semiconductor or solid-state body
- H01L2924/18161—Exposing the passive side of the semiconductor or solid-state body of a flip chip
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26195999 | 1999-09-16 | ||
JP2000184151A JP2001156212A (ja) | 1999-09-16 | 2000-06-20 | 樹脂封止型半導体装置及びその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG97935A1 true SG97935A1 (en) | 2003-08-20 |
Family
ID=26545318
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200005207A SG97935A1 (en) | 1999-09-16 | 2000-09-15 | Resin-encapsulated semiconductor device |
Country Status (7)
Country | Link |
---|---|
US (1) | US6611063B1 (ko) |
JP (1) | JP2001156212A (ko) |
KR (1) | KR100383112B1 (ko) |
CN (1) | CN1289147A (ko) |
GB (2) | GB2360629B (ko) |
SG (1) | SG97935A1 (ko) |
TW (1) | TW463272B (ko) |
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CN103681557B (zh) * | 2012-09-11 | 2017-12-22 | 恩智浦美国有限公司 | 半导体器件及其组装方法 |
US20160317068A1 (en) * | 2015-04-30 | 2016-11-03 | Verily Life Sciences Llc | Electronic devices with encapsulating silicone based adhesive |
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JPH08115989A (ja) * | 1994-08-24 | 1996-05-07 | Fujitsu Ltd | 半導体装置及びその製造方法 |
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JPH08236586A (ja) * | 1994-12-29 | 1996-09-13 | Nitto Denko Corp | 半導体装置及びその製造方法 |
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JP3176542B2 (ja) * | 1995-10-25 | 2001-06-18 | シャープ株式会社 | 半導体装置及びその製造方法 |
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-
2000
- 2000-06-20 JP JP2000184151A patent/JP2001156212A/ja active Pending
- 2000-09-15 KR KR10-2000-0054182A patent/KR100383112B1/ko not_active IP Right Cessation
- 2000-09-15 GB GB0022745A patent/GB2360629B/en not_active Expired - Fee Related
- 2000-09-15 GB GB0202655A patent/GB2369245B/en not_active Expired - Fee Related
- 2000-09-15 TW TW89118927A patent/TW463272B/zh not_active IP Right Cessation
- 2000-09-15 SG SG200005207A patent/SG97935A1/en unknown
- 2000-09-15 CN CN00124859A patent/CN1289147A/zh active Pending
- 2000-09-18 US US09/664,061 patent/US6611063B1/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5592025A (en) * | 1992-08-06 | 1997-01-07 | Motorola, Inc. | Pad array semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
GB2369245A (en) | 2002-05-22 |
GB2369245B (en) | 2002-11-20 |
GB0202655D0 (en) | 2002-03-20 |
GB0022745D0 (en) | 2000-11-01 |
TW463272B (en) | 2001-11-11 |
JP2001156212A (ja) | 2001-06-08 |
CN1289147A (zh) | 2001-03-28 |
GB2360629A (en) | 2001-09-26 |
KR100383112B1 (ko) | 2003-05-12 |
GB2360629B (en) | 2002-04-24 |
KR20010030395A (ko) | 2001-04-16 |
US6611063B1 (en) | 2003-08-26 |
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