NO303808B1 - Integrert kretsbrikke med sikret databehandlings- og/eller lagringsomrÕde - Google Patents
Integrert kretsbrikke med sikret databehandlings- og/eller lagringsomrÕde Download PDFInfo
- Publication number
- NO303808B1 NO303808B1 NO900114A NO900114A NO303808B1 NO 303808 B1 NO303808 B1 NO 303808B1 NO 900114 A NO900114 A NO 900114A NO 900114 A NO900114 A NO 900114A NO 303808 B1 NO303808 B1 NO 303808B1
- Authority
- NO
- Norway
- Prior art keywords
- storage
- circuits
- data
- state
- protection element
- Prior art date
Links
- 238000003860 storage Methods 0.000 title claims description 98
- 238000012545 processing Methods 0.000 title claims description 26
- 230000001681 protective effect Effects 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 15
- 230000004044 response Effects 0.000 claims description 14
- 238000012360 testing method Methods 0.000 claims description 13
- 238000012546 transfer Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 9
- 230000008859 change Effects 0.000 claims description 7
- 238000009792 diffusion process Methods 0.000 claims description 6
- 230000002427 irreversible effect Effects 0.000 claims description 6
- 238000009826 distribution Methods 0.000 claims description 4
- 238000012217 deletion Methods 0.000 claims description 3
- 230000037430 deletion Effects 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims 1
- 230000006870 function Effects 0.000 description 15
- 239000000523 sample Substances 0.000 description 12
- 230000015654 memory Effects 0.000 description 11
- 230000005540 biological transmission Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 229920005591 polysilicon Polymers 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000004075 alteration Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 238000009877 rendering Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 239000000872 buffer Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000008447 perception Effects 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 230000002829 reductive effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
- H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/86—Secure or tamper-resistant housings
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
- Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
- Y04S40/00—Systems for electrical power generation, transmission, distribution or end-user application management characterised by the use of communication or information technologies, or communication or information technology specific aspects supporting them
- Y04S40/20—Information technology specific aspects, e.g. CAD, simulation, modelling, system security
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
- Y10S257/922—Active solid-state devices, e.g. transistors, solid-state diodes with means to prevent inspection of or tampering with an integrated circuit, e.g. "smart card", anti-tamper
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/297,472 US4933898A (en) | 1989-01-12 | 1989-01-12 | Secure integrated circuit chip with conductive shield |
Publications (3)
Publication Number | Publication Date |
---|---|
NO900114D0 NO900114D0 (no) | 1990-01-10 |
NO900114L NO900114L (no) | 1990-07-13 |
NO303808B1 true NO303808B1 (no) | 1998-08-31 |
Family
ID=23146461
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO900114A NO303808B1 (no) | 1989-01-12 | 1990-01-10 | Integrert kretsbrikke med sikret databehandlings- og/eller lagringsomrÕde |
NO975981A NO975981L (no) | 1989-01-12 | 1997-12-19 | Integrert kretsbrikke med sikret område for databehandling/lagring |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO975981A NO975981L (no) | 1989-01-12 | 1997-12-19 | Integrert kretsbrikke med sikret område for databehandling/lagring |
Country Status (11)
Country | Link |
---|---|
US (1) | US4933898A (da) |
EP (2) | EP0378306B1 (da) |
JP (1) | JPH0787237B2 (da) |
KR (1) | KR0180521B1 (da) |
AU (1) | AU617026B2 (da) |
CA (1) | CA2007469C (da) |
DE (2) | DE69033241T2 (da) |
DK (2) | DK0920057T3 (da) |
ES (2) | ES2214760T3 (da) |
IE (1) | IE62793B1 (da) |
NO (2) | NO303808B1 (da) |
Families Citing this family (106)
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US5027397A (en) * | 1989-09-12 | 1991-06-25 | International Business Machines Corporation | Data protection by detection of intrusion into electronic assemblies |
US5029207A (en) * | 1990-02-01 | 1991-07-02 | Scientific-Atlanta, Inc. | External security module for a television signal decoder |
US5237610A (en) * | 1990-02-01 | 1993-08-17 | Scientific-Atlanta, Inc. | Independent external security module for a digitally upgradeable television signal decoder |
US5199008A (en) * | 1990-03-14 | 1993-03-30 | Southwest Research Institute | Device for digitally measuring intervals of time |
US5780323A (en) * | 1990-04-12 | 1998-07-14 | Actel Corporation | Fabrication method for metal-to-metal antifuses incorporating a tungsten via plug |
US5614756A (en) * | 1990-04-12 | 1997-03-25 | Actel Corporation | Metal-to-metal antifuse with conductive |
US5181096A (en) * | 1990-04-12 | 1993-01-19 | Actel Corporation | Electrically programmable antifuse incorporating dielectric and amorphous silicon interlayer |
US5381035A (en) * | 1992-09-23 | 1995-01-10 | Chen; Wenn-Jei | Metal-to-metal antifuse including etch stop layer |
US5270983A (en) * | 1990-09-13 | 1993-12-14 | Ncr Corporation | Single element security fusible link |
US5086410A (en) * | 1990-09-14 | 1992-02-04 | National Semiconductor Corporation | Non-erasable eprom cell for redundancy circuit |
US5053992A (en) * | 1990-10-04 | 1991-10-01 | General Instrument Corporation | Prevention of inspection of secret data stored in encapsulated integrated circuit chip |
JP2960560B2 (ja) | 1991-02-28 | 1999-10-06 | 株式会社日立製作所 | 超小型電子機器 |
FR2674060B1 (fr) * | 1991-03-14 | 1993-05-28 | Gemplus Card Int | Procede de programmation pour memoire integree, notamment pour carte a memoire. |
US5557136A (en) * | 1991-04-26 | 1996-09-17 | Quicklogic Corporation | Programmable interconnect structures and programmable integrated circuits |
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US5196724A (en) * | 1991-04-26 | 1993-03-23 | Quicklogic Corporation | Programmable interconnect structures and programmable integrated circuits |
JP3209745B2 (ja) * | 1991-05-10 | 2001-09-17 | クイックロジック・コーポレイション | アモルファスシリコンアンチヒューズ及びその製造方法 |
US5243226A (en) * | 1991-07-31 | 1993-09-07 | Quicklogic Corporation | Programming of antifuses |
US5302546A (en) * | 1991-07-31 | 1994-04-12 | Quicklogic Corporation | Programming of antifuses |
US5327024A (en) * | 1992-07-02 | 1994-07-05 | Quicklogic Corporation | Field programmable antifuse device and programming method therefor |
US5544070A (en) * | 1991-07-31 | 1996-08-06 | Quicklogic Corporation | Programmed programmable device and method for programming antifuses of a programmable device |
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US5293133A (en) * | 1992-08-27 | 1994-03-08 | Quicklogic Corporation | Method of determining an electrical characteristic of an antifuse and apparatus therefor |
KR100310220B1 (ko) * | 1992-09-14 | 2001-12-17 | 엘란 티본 | 집적회로장치를제조하기위한장치및그제조방법 |
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US5444780A (en) * | 1993-07-22 | 1995-08-22 | International Business Machines Corporation | Client/server based secure timekeeping system |
US5394106A (en) * | 1993-08-31 | 1995-02-28 | Gadzoox Microsystems | Apparatus and method for synthesis of signals with programmable periods |
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US5861652A (en) * | 1996-03-28 | 1999-01-19 | Symbios, Inc. | Method and apparatus for protecting functions imbedded within an integrated circuit from reverse engineering |
US5602053A (en) * | 1996-04-08 | 1997-02-11 | Chartered Semidconductor Manufacturing Pte, Ltd. | Method of making a dual damascene antifuse structure |
DE19634135C2 (de) * | 1996-08-23 | 1998-07-02 | Siemens Ag | Halbleiterschaltung, insbesondere zur Verwendung in einem integrierten Baustein |
DE19639033C1 (de) | 1996-09-23 | 1997-08-07 | Siemens Ag | Analysierschutz für einen Halbleiterchip |
US5898776A (en) * | 1996-11-21 | 1999-04-27 | Quicklogic Corporation | Security antifuse that prevents readout of some but not other information from a programmed field programmable gate array |
US5959466A (en) | 1997-01-31 | 1999-09-28 | Actel Corporation | Field programmable gate array with mask programmed input and output buffers |
US5861662A (en) * | 1997-02-24 | 1999-01-19 | General Instrument Corporation | Anti-tamper bond wire shield for an integrated circuit |
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US6137318A (en) * | 1997-12-09 | 2000-10-24 | Oki Electric Industry Co., Ltd. | Logic circuit having dummy MOS transistor |
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ATE356436T1 (de) | 1998-08-19 | 2007-03-15 | Infineon Technologies Ag | Halbleiterchip mit oberflächenabdeckung gegen optische untersuchung der schaltungsstruktur |
JP2000311943A (ja) | 1999-04-27 | 2000-11-07 | Mitsubishi Electric Corp | 半導体装置 |
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JP3454471B2 (ja) * | 1999-07-09 | 2003-10-06 | 沖電気工業株式会社 | 半導体装置 |
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US6815816B1 (en) | 2000-10-25 | 2004-11-09 | Hrl Laboratories, Llc | Implanted hidden interconnections in a semiconductor device for preventing reverse engineering |
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US7049667B2 (en) | 2002-09-27 | 2006-05-23 | Hrl Laboratories, Llc | Conductive channel pseudo block process and circuit to inhibit reverse engineering |
US6979606B2 (en) | 2002-11-22 | 2005-12-27 | Hrl Laboratories, Llc | Use of silicon block process step to camouflage a false transistor |
JP4846239B2 (ja) | 2002-12-13 | 2011-12-28 | エイチアールエル ラボラトリーズ,エルエルシー | ウェル注入を用いた集積回路の改変 |
AU2003226606A1 (en) * | 2003-04-15 | 2004-11-04 | Nds Limited | Secure clock |
JP4758621B2 (ja) * | 2003-08-28 | 2011-08-31 | パナソニック株式会社 | 基本セル、端部セル、配線形状、配線方法、シールド線の配線構造 |
FR2864667B1 (fr) * | 2003-12-29 | 2006-02-24 | Commissariat Energie Atomique | Protection d'une puce de circuit integre contenant des donnees confidentielles |
FR2868577A1 (fr) * | 2004-03-31 | 2005-10-07 | St Microelectronics Sa | Dispositif de detection d'attaque d'une puce de circuit integre |
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US7015823B1 (en) * | 2004-10-15 | 2006-03-21 | Systran Federal Corporation | Tamper resistant circuit boards |
FR2879296A1 (fr) * | 2004-12-14 | 2006-06-16 | St Microelectronics Sa | Invalidation d'un circuit integre |
DE102005005622B4 (de) * | 2005-02-08 | 2008-08-21 | Infineon Technologies Ag | Sicherheits-Chipstapel und ein Verfahren zum Herstellen eines Sicherheits-Chipstapels |
US7281667B2 (en) * | 2005-04-14 | 2007-10-16 | International Business Machines Corporation | Method and structure for implementing secure multichip modules for encryption applications |
FR2888975B1 (fr) * | 2005-07-21 | 2007-09-07 | Atmel Corp | Procede de securisation pour la protection de donnees |
FR2893436B1 (fr) * | 2005-11-15 | 2008-02-15 | Oberthur Card Syst Sa | Securisation entre des composants electroniques d'une entite electronique securisee portable |
US20070150754A1 (en) * | 2005-12-22 | 2007-06-28 | Pauly Steven J | Secure software system and method for a printer |
US7623378B1 (en) * | 2006-05-02 | 2009-11-24 | Lattice Semiconductor Corporation | Selective programming of non-volatile memory facilitated by security fuses |
US8168487B2 (en) | 2006-09-28 | 2012-05-01 | Hrl Laboratories, Llc | Programmable connection and isolation of active regions in an integrated circuit using ambiguous features to confuse a reverse engineer |
US8255702B1 (en) * | 2009-12-03 | 2012-08-28 | Altera Corporation | Programmable logic device with improved security |
US20120210438A1 (en) * | 2011-02-15 | 2012-08-16 | Guobiao Zhang | Secure Three-Dimensional Mask-Programmed Read-Only Memory |
US9287879B2 (en) | 2011-06-07 | 2016-03-15 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
US9218511B2 (en) * | 2011-06-07 | 2015-12-22 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
US9437555B2 (en) | 2011-06-07 | 2016-09-06 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
US8975748B1 (en) | 2011-06-07 | 2015-03-10 | Secure Silicon Layer, Inc. | Semiconductor device having features to prevent reverse engineering |
JP5692179B2 (ja) * | 2012-07-24 | 2015-04-01 | カシオ計算機株式会社 | システムlsi及びプログラム消去方法 |
EP2943979A4 (en) * | 2013-01-11 | 2017-05-17 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
DE102013214214A1 (de) * | 2013-07-19 | 2015-01-22 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zum Löschen von Informationen und Vorrichtung zur Durchführung desselben |
DE102020202721A1 (de) | 2020-03-03 | 2021-09-09 | Infineon Technologies Ag | Datenspeicher und verfahren zum bereitstellen desselben |
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EP0221351B1 (de) * | 1985-10-22 | 1991-09-25 | Siemens Aktiengesellschaft | Integrierte Halbleiterschaltung mit einem elektrisch leitenden Flächenelement |
-
1989
- 1989-01-12 US US07/297,472 patent/US4933898A/en not_active Expired - Lifetime
-
1990
- 1990-01-02 IE IE390A patent/IE62793B1/en not_active IP Right Cessation
- 1990-01-04 DK DK99102130T patent/DK0920057T3/da active
- 1990-01-04 DE DE69033241T patent/DE69033241T2/de not_active Expired - Fee Related
- 1990-01-04 ES ES99102130T patent/ES2214760T3/es not_active Expired - Lifetime
- 1990-01-04 EP EP90300090A patent/EP0378306B1/en not_active Expired - Lifetime
- 1990-01-04 AU AU47669/90A patent/AU617026B2/en not_active Ceased
- 1990-01-04 DK DK90300090T patent/DK0378306T3/da active
- 1990-01-04 EP EP99102130A patent/EP0920057B1/en not_active Expired - Lifetime
- 1990-01-04 DE DE1990634125 patent/DE69034125T2/de not_active Expired - Fee Related
- 1990-01-04 ES ES90300090T patent/ES2134188T3/es not_active Expired - Lifetime
- 1990-01-10 NO NO900114A patent/NO303808B1/no unknown
- 1990-01-10 CA CA002007469A patent/CA2007469C/en not_active Expired - Fee Related
- 1990-01-10 KR KR1019900000211A patent/KR0180521B1/ko not_active IP Right Cessation
- 1990-01-11 JP JP2004397A patent/JPH0787237B2/ja not_active Expired - Fee Related
-
1997
- 1997-12-19 NO NO975981A patent/NO975981L/no unknown
Also Published As
Publication number | Publication date |
---|---|
ES2134188T3 (es) | 1999-10-01 |
AU4766990A (en) | 1990-07-19 |
EP0920057A3 (en) | 2000-01-12 |
CA2007469A1 (en) | 1990-07-12 |
NO975981D0 (no) | 1997-12-19 |
AU617026B2 (en) | 1991-11-14 |
IE62793B1 (en) | 1995-03-08 |
NO900114D0 (no) | 1990-01-10 |
IE900003L (en) | 1990-07-12 |
NO900114L (no) | 1990-07-13 |
JPH0787237B2 (ja) | 1995-09-20 |
EP0378306A2 (en) | 1990-07-18 |
NO975981L (no) | 1997-12-19 |
KR0180521B1 (ko) | 1999-04-15 |
EP0378306A3 (en) | 1991-12-04 |
EP0920057B1 (en) | 2004-01-02 |
US4933898A (en) | 1990-06-12 |
CA2007469C (en) | 1994-08-16 |
DK0378306T3 (da) | 2000-03-13 |
ES2214760T3 (es) | 2004-09-16 |
DE69034125T2 (de) | 2004-11-18 |
JPH02232960A (ja) | 1990-09-14 |
DK0920057T3 (da) | 2004-05-10 |
DE69033241D1 (de) | 1999-09-16 |
EP0920057A2 (en) | 1999-06-02 |
DE69033241T2 (de) | 2000-02-03 |
EP0378306B1 (en) | 1999-08-11 |
DE69034125D1 (de) | 2004-02-05 |
KR900012345A (ko) | 1990-08-03 |
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