NL193622C - Halfgeleidergeheugeninrichting met redundant blok. - Google Patents

Halfgeleidergeheugeninrichting met redundant blok. Download PDF

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Publication number
NL193622C
NL193622C NL9000227A NL9000227A NL193622C NL 193622 C NL193622 C NL 193622C NL 9000227 A NL9000227 A NL 9000227A NL 9000227 A NL9000227 A NL 9000227A NL 193622 C NL193622 C NL 193622C
Authority
NL
Netherlands
Prior art keywords
redundant
normal
signals
block
column
Prior art date
Application number
NL9000227A
Other languages
English (en)
Dutch (nl)
Other versions
NL193622B (nl
NL9000227A (nl
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of NL9000227A publication Critical patent/NL9000227A/nl
Publication of NL193622B publication Critical patent/NL193622B/xx
Application granted granted Critical
Publication of NL193622C publication Critical patent/NL193622C/nl

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/787—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using a fuse hierarchy
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/781—Masking faults in memories by using spares or by reconfiguring using programmable devices combined in a redundant decoder

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
NL9000227A 1989-05-24 1990-01-30 Halfgeleidergeheugeninrichting met redundant blok. NL193622C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019890006959A KR910005601B1 (ko) 1989-05-24 1989-05-24 리던던트 블럭을 가지는 반도체 메모리장치
KR890006959 1989-05-24

Publications (3)

Publication Number Publication Date
NL9000227A NL9000227A (nl) 1990-12-17
NL193622B NL193622B (nl) 1999-12-01
NL193622C true NL193622C (nl) 2000-04-04

Family

ID=19286437

Family Applications (1)

Application Number Title Priority Date Filing Date
NL9000227A NL193622C (nl) 1989-05-24 1990-01-30 Halfgeleidergeheugeninrichting met redundant blok.

Country Status (7)

Country Link
US (1) US5297085A (fr)
JP (1) JPH0614438B2 (fr)
KR (1) KR910005601B1 (fr)
DE (1) DE4001223A1 (fr)
FR (1) FR2647583B1 (fr)
GB (1) GB2231984B (fr)
NL (1) NL193622C (fr)

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US5257229A (en) * 1992-01-31 1993-10-26 Sgs-Thomson Microelectronics, Inc. Column redundancy architecture for a read/write memory
US5471426A (en) * 1992-01-31 1995-11-28 Sgs-Thomson Microelectronics, Inc. Redundancy decoder
JP3040625B2 (ja) * 1992-02-07 2000-05-15 松下電器産業株式会社 半導体記憶装置
KR950000275B1 (ko) * 1992-05-06 1995-01-12 삼성전자 주식회사 반도체 메모리 장치의 컬럼 리던던시
EP0596198B1 (fr) * 1992-07-10 2000-03-29 Sony Corporation Flash EPROM avec vérification d'effacement et architecture de brouillage d'addresses
KR960002777B1 (ko) * 1992-07-13 1996-02-26 삼성전자주식회사 반도체 메모리 장치의 로우 리던던시 장치
US5452251A (en) 1992-12-03 1995-09-19 Fujitsu Limited Semiconductor memory device for selecting and deselecting blocks of word lines
US5557618A (en) * 1993-01-19 1996-09-17 Tektronix, Inc. Signal sampling circuit with redundancy
JPH07182893A (ja) * 1993-12-24 1995-07-21 Mitsubishi Electric Corp 半導体記憶装置
KR0119888B1 (ko) * 1994-04-11 1997-10-30 윤종용 반도체 메모리장치의 결함구제방법 및 그 회로
KR0130030B1 (ko) * 1994-08-25 1998-10-01 김광호 반도체 메모리 장치의 컬럼 리던던시 회로 및 그 방법
DE19540915A1 (de) * 1994-11-10 1996-05-15 Raymond Engineering Redundante Anordnung von Festkörper-Speicherbausteinen
KR0145223B1 (ko) * 1995-04-24 1998-08-17 김광호 리던던시 기능을 가지는 반도체 메모리 장치
ATE220228T1 (de) * 1995-08-09 2002-07-15 Infineon Technologies Ag Integrierte halbleiter-speichervorrichtung mit redundanzschaltungsanordnung
US5841709A (en) * 1995-12-29 1998-11-24 Stmicroelectronics, Inc. Memory having and method for testing redundant memory cells
US6037799A (en) * 1995-12-29 2000-03-14 Stmicroelectronics, Inc. Circuit and method for selecting a signal
US5612918A (en) * 1995-12-29 1997-03-18 Sgs-Thomson Microelectronics, Inc. Redundancy architecture
US5790462A (en) * 1995-12-29 1998-08-04 Sgs-Thomson Microelectronics, Inc. Redundancy control
US5771195A (en) * 1995-12-29 1998-06-23 Sgs-Thomson Microelectronics, Inc. Circuit and method for replacing a defective memory cell with a redundant memory cell
US5699307A (en) * 1996-06-28 1997-12-16 Intel Corporation Method and apparatus for providing redundant memory in an integrated circuit utilizing a subarray shuffle replacement scheme
US5729551A (en) * 1996-12-17 1998-03-17 Integrated Silicon Solution, Inc. Space efficient column decoder for flash memory redundant columns
KR100247920B1 (ko) * 1996-12-31 2000-03-15 윤종용 반도체메모리장치의로우리던던시구조및불량셀구제방법
KR100228533B1 (ko) * 1997-06-23 1999-11-01 윤종용 반도체 집적회로의 용단가능한 퓨즈 및 그 제조방법
KR100256819B1 (ko) * 1997-06-30 2000-05-15 김영환 리던던트 동작을 안정시킨 싱크로노스 디램
JP3868130B2 (ja) 1998-11-13 2007-01-17 松下電器産業株式会社 半導体記憶装置
US6795367B1 (en) * 2000-05-16 2004-09-21 Micron Technology, Inc. Layout technique for address signal lines in decoders including stitched blocks
FR2811464B1 (fr) * 2000-07-05 2005-03-25 St Microelectronics Sa Circuit memoire comportant des cellules de secours
JP2002093907A (ja) * 2000-09-11 2002-03-29 Mitsubishi Electric Corp 集積回路および集積回路の設計方法
TW546664B (en) * 2001-01-17 2003-08-11 Toshiba Corp Semiconductor storage device formed to optimize test technique and redundancy technology
JP3597501B2 (ja) * 2001-11-20 2004-12-08 松下電器産業株式会社 半導体集積回路
US6473349B1 (en) * 2001-11-29 2002-10-29 Motorola, Inc. Cascode sense AMP and column select circuit and method of operation
US6728123B2 (en) 2002-04-15 2004-04-27 International Business Machines Corporation Redundant array architecture for word replacement in CAM
JP2004071093A (ja) * 2002-08-08 2004-03-04 Fujitsu Ltd 出荷試験が簡単で消費電力を削減した冗長メモリセルアレイ付きメモリ回路
US8068380B2 (en) * 2008-05-15 2011-11-29 Micron Technology, Inc. Block repair scheme
KR101100958B1 (ko) * 2010-09-06 2011-12-29 주식회사 하이닉스반도체 불휘발성 메모리 장치
US9202569B2 (en) 2011-08-12 2015-12-01 Micron Technology, Inc. Methods for providing redundancy and apparatuses
US10134486B2 (en) * 2016-09-13 2018-11-20 Samsung Electronics Co., Ltd. Memory device including a redundancy column and a redundancy peripheral logic circuit
US11090926B2 (en) * 2017-07-06 2021-08-17 Hewlett-Packard Development Company, L.P. Decoders for memories of fluid ejection devices

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US4281398A (en) * 1980-02-12 1981-07-28 Mostek Corporation Block redundancy for memory array
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US4462091A (en) * 1982-02-26 1984-07-24 International Business Machines Corporation Word group redundancy scheme
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JP2639650B2 (ja) * 1987-01-14 1997-08-13 日本テキサス・インスツルメンツ株式会社 半導体装置
JP2629697B2 (ja) * 1987-03-27 1997-07-09 日本電気株式会社 半導体記憶装置
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Also Published As

Publication number Publication date
JPH0614438B2 (ja) 1994-02-23
KR910005601B1 (ko) 1991-07-31
US5297085A (en) 1994-03-22
DE4001223A1 (de) 1990-11-29
NL193622B (nl) 1999-12-01
DE4001223C2 (fr) 1992-03-26
FR2647583A1 (fr) 1990-11-30
KR900019028A (ko) 1990-12-22
JPH02310890A (ja) 1990-12-26
FR2647583B1 (fr) 1997-03-28
GB9002191D0 (en) 1990-03-28
GB2231984B (en) 1993-08-18
GB2231984A (en) 1990-11-28
NL9000227A (nl) 1990-12-17

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A1A A request for search or an international-type search has been filed
BB A search report has been drawn up
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V4 Discontinued because of reaching the maximum lifetime of a patent

Effective date: 20100130