KR970705831A - 결정성 반도체막 형성방법, 박막 트랜지스터 제조방법, 태양 전지 제조 방법 및 액티브 매트릭스형 액정 장치 (A method for forming crystalline semiconductor layers, a method for fabricating thin film transistors, and a method for fabricating solar cells and active matrix liquid crystal devices) - Google Patents
결정성 반도체막 형성방법, 박막 트랜지스터 제조방법, 태양 전지 제조 방법 및 액티브 매트릭스형 액정 장치 (A method for forming crystalline semiconductor layers, a method for fabricating thin film transistors, and a method for fabricating solar cells and active matrix liquid crystal devices)Info
- Publication number
- KR970705831A KR970705831A KR1019970701411A KR19970701411A KR970705831A KR 970705831 A KR970705831 A KR 970705831A KR 1019970701411 A KR1019970701411 A KR 1019970701411A KR 19970701411 A KR19970701411 A KR 19970701411A KR 970705831 A KR970705831 A KR 970705831A
- Authority
- KR
- South Korea
- Prior art keywords
- fabricating
- liquid crystal
- thin film
- solar cells
- active matrix
- Prior art date
Links
- 239000004973 liquid crystal related substance Substances 0.000 title 1
- 239000011159 matrix material Substances 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
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- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
- H01L31/1864—Annealing
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Ceramic Engineering (AREA)
- Recrystallisation Techniques (AREA)
- Photovoltaic Devices (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15914795 | 1995-06-26 | ||
JP95-159147 | 1995-06-26 | ||
JP16128096 | 1996-06-21 | ||
JP96-161280 | 1996-06-21 | ||
PCT/JP1996/001775 WO1997001863A1 (fr) | 1995-06-26 | 1996-06-26 | Procede de formation de film semi-conducteur cristallin, procede de production de transistor a couche mince, procede de production de cellules solaires et dispositif cristal liquide a matrice active |
Publications (2)
Publication Number | Publication Date |
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KR970705831A true KR970705831A (ko) | 1997-10-09 |
KR100274293B1 KR100274293B1 (ko) | 2001-01-15 |
Family
ID=26486031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970701411A KR100274293B1 (ko) | 1995-06-26 | 1996-06-26 | 결정성 반도체막 형성방법, 박막 트랜지스터 제조방법, 태양 전지 제조 방법 및 액티브 매트릭스형 액정 장치 |
Country Status (5)
Country | Link |
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US (3) | US6066516A (ko) |
JP (1) | JP4026182B2 (ko) |
KR (1) | KR100274293B1 (ko) |
CN (2) | CN1089486C (ko) |
WO (1) | WO1997001863A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100457412B1 (ko) * | 2000-09-18 | 2004-11-16 | 가부시끼가이샤 도시바 | 다결정반도체막의 형성방법 |
Families Citing this family (107)
Publication number | Priority date | Publication date | Assignee | Title |
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US6723590B1 (en) * | 1994-03-09 | 2004-04-20 | Semiconductor Energy Laboratory Co., Ltd. | Method for laser-processing semiconductor device |
JP4026182B2 (ja) * | 1995-06-26 | 2007-12-26 | セイコーエプソン株式会社 | 半導体装置の製造方法、および電子機器の製造方法 |
JP3917698B2 (ja) * | 1996-12-12 | 2007-05-23 | 株式会社半導体エネルギー研究所 | レーザーアニール方法およびレーザーアニール装置 |
TW466772B (en) * | 1997-12-26 | 2001-12-01 | Seiko Epson Corp | Method for producing silicon oxide film, method for making semiconductor device, semiconductor device, display, and infrared irradiating device |
KR19990058636A (ko) * | 1997-12-30 | 1999-07-15 | 구자홍 | 레이저 조사 방법 |
JPH11212934A (ja) | 1998-01-23 | 1999-08-06 | Sony Corp | 情報処理装置および方法、並びに提供媒体 |
JP2000058839A (ja) * | 1998-08-05 | 2000-02-25 | Semiconductor Energy Lab Co Ltd | 半導体素子からなる半導体回路を備えた半導体装置およびその作製方法 |
US6579749B2 (en) * | 1998-11-17 | 2003-06-17 | Nec Corporation | Fabrication method and fabrication apparatus for thin film transistor |
US6410368B1 (en) * | 1999-10-26 | 2002-06-25 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device with TFT |
JP4514861B2 (ja) * | 1999-11-29 | 2010-07-28 | 株式会社半導体エネルギー研究所 | レーザ照射装置およびレーザ照射方法および半導体装置の作製方法 |
KR100660814B1 (ko) * | 1999-12-31 | 2006-12-26 | 엘지.필립스 엘시디 주식회사 | 박막트랜지스터의 반도체층 형성방법 |
US7071041B2 (en) * | 2000-01-20 | 2006-07-04 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
US6872607B2 (en) * | 2000-03-21 | 2005-03-29 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
JP2001284252A (ja) * | 2000-03-30 | 2001-10-12 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
US7078321B2 (en) | 2000-06-19 | 2006-07-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
JP3910004B2 (ja) * | 2000-07-10 | 2007-04-25 | 忠弘 大見 | 半導体シリコン単結晶ウエーハ |
GB2367176A (en) * | 2000-09-14 | 2002-03-27 | Sharp Kk | Active matrix display and display driver |
AUPR174800A0 (en) * | 2000-11-29 | 2000-12-21 | Australian National University, The | Semiconductor processing |
US6594446B2 (en) | 2000-12-04 | 2003-07-15 | Vortek Industries Ltd. | Heat-treating methods and systems |
GB2406710B (en) * | 2000-12-04 | 2005-06-22 | Vortek Ind Ltd | Heat-treating methods and systems |
US7151017B2 (en) * | 2001-01-26 | 2006-12-19 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
US6770518B2 (en) * | 2001-01-29 | 2004-08-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device |
SG114529A1 (en) | 2001-02-23 | 2005-09-28 | Semiconductor Energy Lab | Method of manufacturing a semiconductor device |
US6881447B2 (en) * | 2002-04-04 | 2005-04-19 | Dielectric Systems, Inc. | Chemically and electrically stabilized polymer films |
SG143975A1 (en) * | 2001-02-28 | 2008-07-29 | Semiconductor Energy Lab | Method of manufacturing a semiconductor device |
US6830994B2 (en) * | 2001-03-09 | 2004-12-14 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device having a crystallized semiconductor film |
US6855584B2 (en) * | 2001-03-29 | 2005-02-15 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
US7253032B2 (en) | 2001-04-20 | 2007-08-07 | Semiconductor Energy Laboratory Co., Ltd. | Method of flattening a crystallized semiconductor film surface by using a plate |
JP4854866B2 (ja) * | 2001-04-27 | 2012-01-18 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TW544938B (en) * | 2001-06-01 | 2003-08-01 | Semiconductor Energy Lab | Method of manufacturing a semiconductor device |
US20030003242A1 (en) * | 2001-06-28 | 2003-01-02 | Apostolos Voutsas | Pulse width method for controlling lateral growth in crystallized silicon films |
JP4275336B2 (ja) * | 2001-11-16 | 2009-06-10 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TWI291729B (en) | 2001-11-22 | 2007-12-21 | Semiconductor Energy Lab | A semiconductor fabricating apparatus |
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KR100457412B1 (ko) * | 2000-09-18 | 2004-11-16 | 가부시끼가이샤 도시바 | 다결정반도체막의 형성방법 |
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CN1089486C (zh) | 2002-08-21 |
CN1157056A (zh) | 1997-08-13 |
US6066516A (en) | 2000-05-23 |
JP4026182B2 (ja) | 2007-12-26 |
US6746903B2 (en) | 2004-06-08 |
US6455360B1 (en) | 2002-09-24 |
CN1180457C (zh) | 2004-12-15 |
WO1997001863A1 (fr) | 1997-01-16 |
KR100274293B1 (ko) | 2001-01-15 |
US20020146868A1 (en) | 2002-10-10 |
CN1395289A (zh) | 2003-02-05 |
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