KR970077719A - 둘 이상의 본딩 옵션 패드를 갖는 반도체 장치 - Google Patents

둘 이상의 본딩 옵션 패드를 갖는 반도체 장치 Download PDF

Info

Publication number
KR970077719A
KR970077719A KR1019970018931A KR19970018931A KR970077719A KR 970077719 A KR970077719 A KR 970077719A KR 1019970018931 A KR1019970018931 A KR 1019970018931A KR 19970018931 A KR19970018931 A KR 19970018931A KR 970077719 A KR970077719 A KR 970077719A
Authority
KR
South Korea
Prior art keywords
semiconductor device
bonding option
pad
signal
bonding
Prior art date
Application number
KR1019970018931A
Other languages
English (en)
Other versions
KR100291130B1 (ko
Inventor
카츠토시 이와타
Original Assignee
가네꼬 히사시
닛폰 덴키 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가네꼬 히사시, 닛폰 덴키 가부시키가이샤 filed Critical 가네꼬 히사시
Publication of KR970077719A publication Critical patent/KR970077719A/ko
Application granted granted Critical
Publication of KR100291130B1 publication Critical patent/KR100291130B1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/50Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/58Structural electrical arrangements for semiconductor devices not otherwise provided for
    • H01L2223/64Impedance arrangements
    • H01L2223/66High-frequency adaptations
    • H01L2223/6605High-frequency electrical connections
    • H01L2223/6611Wire connections
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04042Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05553Shape in top view being rectangular
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/05599Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061Disposition
    • H01L2224/0612Layout
    • H01L2224/0613Square or rectangular array
    • H01L2224/06134Square or rectangular array covering only portions of the surface to be connected
    • H01L2224/06136Covering only the central area of the surface to be connected, i.e. central arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/4826Connecting between the body and an opposite side of the item with respect to the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4911Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
    • H01L2224/49113Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting different bonding areas on the semiconductor or solid-state body to a common bonding area outside the body, e.g. converging wires
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01084Polonium [Po]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

둘 이상의 본딩 옵션 패드가 반도체 칩상에 소정의 방향으로 정렬된다. 높고 낮은 전위 측면상의 도선들은 그 도선들이 소정의 방향을 가로지르는 방향으로 확장하도록 본딩 옵션 패드의 양측면상에 제공된다. 최소한의 한 본딩 옵션 패드는 본딩 와이어에 의해 상기 도선들 중 최소한의 하나에 접속된다.

Description

둘 이상의 본딩 옵션 패드를 갖는 반도체 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제3도는 본 발명의 제1실시예에 따른 반도체 장치를 설명하는데 이용할 평면도.

Claims (10)

  1. 반도체 칩상에 소정의 방향으로 배열된 둘 이상의 본딩 옵션 패드와 상기 반도체 칩상에 배열된 고전위 및 저전위 측면상의, 상기 본딩 옵션 패드의 양측상에 위치 도선을 포함하는 반도체 장치에 있어서, 상기 고전위 및 저전위 측면상의 상기 도선은 각각 상기 소정의 방향을 가로질러 서로 떨어져있는 소정의 방향으로 확장하는 일부분을 갖는것을 특징으로 하는 반도체 장치.
  2. 제1항에 있어서, 상기 도선중 최소한의 하나는 상기 본딩 옵션 패드중 하나에 접속되는 것을 특징으로 하는 반도체 장치.
  3. 제1항에 있어서, 상기 도선중 최소한의 하나는 상기 본딩 옵션 패드에 인접하는 위치에서 분기되거나 또는 갈라지는 것을 특징으로 하는 반도체 장치.
  4. 제1항에 있어서, 상기 각각의 도선은 상기 소정의 방향으로 확장하는 상기 일부분을 갖는 것을 특징으로 하는 반도체 장치.
  5. 제1항에 있어서, 상기 본딩 옵션 패드는 단일 패드를 포함하며, 상기 신호 도선은 상기 반도체 칩상에 제공되며, 상기 신호 도선은 상기 도선에 인접하는 것과 함께 상기 신호 패드에 접속되며, 상기 신호 도선은 상기 도선을 가로지르지 않고 상기 신호 도선 및 상기 신호 패드 사이의 접속을 허용하도록 배열되는 것을 특징으로 하는 반도체 장치.
  6. 제1항에 있어서, 상기 반도체 칩은 칩상 도선(lead-on-chip) 구조 또는 선상 칩(chip-on-lead) 구조를 갖는 것을 특징으로 하는 반도체 장치.
  7. 제1항에 있어서, 상기 본딩 옵션 패드는 상기 반도체 칩의 중앙 부분에 배열되는 것을 특징으로 하는 반도체 장치.
  8. 제1항에 있어서, 상기 본딩 옵션 패드로부터 공급된 신호를 디코딩하기 위한 디코더를 더 포함하며, 상기 디코더는 상기 본딩 옵션 패드 및 상기 도선에 접속되며, 상기 반도체 장치의 동작 모드는 상기 디코더에 의해 선택되는 것을 특징으로 하는 반도체 장치.
  9. 제1항 내지 제3항 중 어느 한 항에 있어서, 상기 도선들은 둘 이상의 본딩 포인트에서 상기 본딩 옵션 패드에 접속되는 것을 특징으로 하는 반도체 장치.
  10. 제1항에 있어서, 상기 도선들 중 최소한의 하나는 둘 이상의 위치에서 상기 본딩 옵션 패드와의 접속을 허용하는 구조를 갖는 것을 특징으로 하는 반도체 장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
KR1019970018931A 1996-05-16 1997-05-16 둘이상의본딩옵션패드를갖는반도체장치 KR100291130B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8121240A JP2795315B2 (ja) 1996-05-16 1996-05-16 半導体装置
JP96-121240 1996-05-16

Publications (2)

Publication Number Publication Date
KR970077719A true KR970077719A (ko) 1997-12-12
KR100291130B1 KR100291130B1 (ko) 2001-09-17

Family

ID=14806380

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970018931A KR100291130B1 (ko) 1996-05-16 1997-05-16 둘이상의본딩옵션패드를갖는반도체장치

Country Status (3)

Country Link
US (1) US5982043A (ko)
JP (1) JP2795315B2 (ko)
KR (1) KR100291130B1 (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1092857A (ja) * 1996-09-10 1998-04-10 Mitsubishi Electric Corp 半導体パッケージ
JP2000100814A (ja) * 1998-09-18 2000-04-07 Hitachi Ltd 半導体装置
JP2001053243A (ja) * 1999-08-06 2001-02-23 Hitachi Ltd 半導体記憶装置とメモリモジュール
JP4022040B2 (ja) * 2000-10-05 2007-12-12 松下電器産業株式会社 半導体デバイス
JP2002299568A (ja) * 2001-04-02 2002-10-11 Fujitsu Ltd Icチップ
US6525560B1 (en) 2001-12-12 2003-02-25 Xilinx, Inc. Method and structure for shipping a die as multiple products
US7131033B1 (en) 2002-06-21 2006-10-31 Cypress Semiconductor Corp. Substrate configurable JTAG ID scheme
JP2004055080A (ja) * 2002-07-23 2004-02-19 Renesas Technology Corp 半導体メモリモジュールおよびそれに用いる半導体チップの製造方法
US7818640B1 (en) 2004-10-22 2010-10-19 Cypress Semiconductor Corporation Test system having a master/slave JTAG controller
US7923829B2 (en) * 2008-05-06 2011-04-12 Mediatek Inc. Bonding pad sharing method applied to multi-chip module and apparatus thereof
WO2016176692A2 (en) * 2016-06-17 2016-11-03 Ohmx Corporation Biosensor chip

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0454447A3 (en) * 1990-04-26 1993-12-08 Hitachi Ltd Semiconductor device assembly
JP2890269B2 (ja) * 1991-02-22 1999-05-10 株式会社日立製作所 半導体装置
US5280605A (en) * 1991-05-03 1994-01-18 Intel Corporation Clock speed limiter for microprocessor
JPH0562465A (ja) * 1991-08-30 1993-03-12 Hitachi Ltd ボンデイングオプシヨン回路、及び半導体集積回路
US5563443A (en) * 1993-03-13 1996-10-08 Texas Instruments Incorporated Packaged semiconductor device utilizing leadframe attached on a semiconductor chip
JPH0737931A (ja) * 1993-07-16 1995-02-07 Hitachi Ltd テープキャリア型半導体装置
JPH07130788A (ja) * 1993-09-09 1995-05-19 Mitsubishi Electric Corp 半導体集積回路装置

Also Published As

Publication number Publication date
JPH09306940A (ja) 1997-11-28
US5982043A (en) 1999-11-09
KR100291130B1 (ko) 2001-09-17
JP2795315B2 (ja) 1998-09-10

Similar Documents

Publication Publication Date Title
KR940008109A (ko) 반도체집적회로장치
KR100328906B1 (ko) 리드프레임의리드온칩내부리드를결합하는방법및장치
KR950001971A (ko) 노운 굳 다이 어레이용 테스트 소켓
KR940016637A (ko) 반도체장치
JPS61500245A (ja) リ−ドフレ−ム・チップ支持部を含む半導体集積回路
KR970077719A (ko) 둘 이상의 본딩 옵션 패드를 갖는 반도체 장치
KR870010628A (ko) 반도체 장치
KR850002173A (ko) 집적회로 소자내의 칩 지지패드를 접지시키기 위한방법
KR870700172A (ko) 반도체 회로장치
US5286999A (en) Folded bus bar leadframe
KR910001956A (ko) 반도체장치
KR890013750A (ko) 반도체 장치
KR970018460A (ko) 점프 오버 와이어링없는 리드 온 칩 리드프레임의 설계
EP0041844B1 (en) Semiconductor integrated circuit devices
KR930018702A (ko) 반도체 장치
EP0393620A3 (en) Semiconductor device
KR850002679A (ko) 대규모 집적회로 실장의 다중신호 경로 분배 시스템
TW344894B (en) Semiconductor device
KR890003022A (ko) 반도체 장치
KR980006216A (ko) 패키지 일측에만 리드 단자를 구비한 반도체 장치
KR930002033Y1 (ko) 리드 프레임
KR950003908B1 (ko) 반도체 리드 프레임
KR930017152A (ko) 반도체 패키지
KR940022822A (ko) 반도체 패키지
KR970705180A (ko) 반도체장치(semiconductor device)

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20130227

Year of fee payment: 13

FPAY Annual fee payment

Payment date: 20140220

Year of fee payment: 14

FPAY Annual fee payment

Payment date: 20150224

Year of fee payment: 15

LAPS Lapse due to unpaid annual fee