KR940008109A - 반도체집적회로장치 - Google Patents
반도체집적회로장치 Download PDFInfo
- Publication number
- KR940008109A KR940008109A KR1019930016669A KR930016669A KR940008109A KR 940008109 A KR940008109 A KR 940008109A KR 1019930016669 A KR1019930016669 A KR 1019930016669A KR 930016669 A KR930016669 A KR 930016669A KR 940008109 A KR940008109 A KR 940008109A
- Authority
- KR
- South Korea
- Prior art keywords
- reference potential
- layer
- circuit device
- potential layer
- integrated circuit
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 25
- 230000002457 bidirectional effect Effects 0.000 claims abstract 3
- 239000008188 pellet Substances 0.000 claims 9
- 239000000758 substrate Substances 0.000 claims 5
- 238000005538 encapsulation Methods 0.000 claims 2
- 239000011347 resin Substances 0.000 claims 2
- 229920005989 resin Polymers 0.000 claims 2
- 238000007789 sealing Methods 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
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- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
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- H01L23/50—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
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Abstract
반도체집적회로장치에 관한 것으로써, 여러개의 신호선의 동시전환에 대해서 접지선 Vss의 전위의 요동을 저감하고, 동작속의 고속화를 도모하기 위해, 여려개의 신호선(109), 전원공급선(110) 및 접지선(107)을 갖고,여러개의 신호선(109)는 쌍방향 전류로로 되는 회로 구성으로 되어 있는 반도체집적회로장치에 있어서, 각 신호선(109)가 전원공급선(110)과 접지선(107)사이에 마련되고, 각각을 적층구조로 구성한다.
이러한 장치를 이용하는 것에 의해 여러개의 신호선의 동시전환에 대해서 접지의 전위의 요동의 저감화, 동작속도의 고속화 및 접지의 리이드의 갯수를 저감할 수 있다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제4도는 본발명의 기본구성을 설명하기 위한 단면도.
제5도는 제4도의 동가회로도.
제6도는 본발명의 실시에 1인 QFP구조를 채용하는 수지봉지형 반도체장치의 구성을 도시한 일부 절단 평면도.
제7도는 제6도의 측면도.
제8도는 제6도에 도시한 X-X절단선으로 자른 단면도.
제9도는 제8도에 도시한 반도체칩과 패케이지내 전송로의 접속부의 구성을 설명하기 위한 확대사시도.
제16도는 본 발명의 실시에 4인 주요부 구성을 설명하기 위한 단면도.
Claims (12)
- 그 주표면에 여러개의 제1, 제2및 제3의 본딩패드를 갖는 반도체펠릿, 상기 반도체펠릿의 주표면과 평행한 제1의 면에는 상기 반도체 펠릿에 기준전위를 공급하는 역할을 하고 있는 제1의 기준전위층이 형성되고, 상기제1의 면과 대항하고 상기 반도체펠릿의 주표면과 평행한 제2의 면에는 제2의 기준전위층이 형성되어 있는 절연성의 다층기관, 상기 다층기관의 내부층으로써 상기 제1의 기준전위층과 상기 제2의 기준전위층사이에 마련되며,또한 상기 제1 및 제2의 기준전위층과 일정한 간격을 갖도록 배치되어 있고, 쌍방향 전류로로 되는 회로 구성으로되어 있는 여러개의 신호배선층, 상기 제1의 본딩패드와 상기 제1의 기준전위층사이, 상가 제2의 본딩패드와 상기 신호배선층사이 및 상기 제3의 본딩패드와 상기 제2의 기준전위층사이를 각각 전기적으로 접속하는 와이어,상기 제1의 기준전위층, 상기 제2의 기준전위층 및 상기 신호 배선층의 각각에 전기적으로 접속된 여러개의 외부인출용 리이드 및 상기 반도체펠릿, 상기 다층기판 및 상기 와이어를 그안에 봉하고 있는 수지봉지체를 포함하는 반도체집적회로장치.
- 제1항에 있어서, 상기 제1 및 제2의 기준전위층의 선폭은 상기 신호배선층의 선폭과 같던가 그이상인 반도체집적회로장치.
- 제1항에 있어서, 상기 제1의 기준전위층은 전원전위배선층인 반도체집적회로장치.
- 제1항에 있어서, 상기 제2의 기준전위층은 접지전위배선층인 반도체집적회로장치.
- 제1항에 있어서, 상기 제1의 기준전위층은 1개의 평면으로 이루어지는 반도체집격회로장치.
- 제1항에 있어서, 상기 제2의 기준전위층은 1개의 평면으로 이루어지는 반도체칩적회로장치.
- 그 주표면에 여러개의 제1, 제2 및 제3의 본딩패드를 갖는 반도체펠릿, 상기 반도체펠릿을 지지하기 위한 베이스기판, 상기 반도체펠릿의 주표면과 평행한 제1의 면에는 상기 반도체 펠릿에 기준전위를 공급하는 역할을 하고 있는 제1의 기준전위층이 형성되고, 상기 제1의 면과 대항하는 제2의 면 및 상기 제1의 면과 상기 제2의면사이로 연장하는 측면에는 제2의 기준전위층이 형성되어 있고, 상기 베이스기판에 부착되어 있는 절연성의 다층 기판, 상기 다층기판의 내부층으로써 상기 제1의 기준전위와 상기 제2의 기준전위층 사이에 마련되며, 또한 상기 제1 및 제2의 기준전위층과 일정한 간격을 갖도록 배치되어 있고, 쌍방향전류로로 되는 회로구성으로 되어있는 여러개의 신호배선층, 상기 제1의 본딩패드와 상기 제1의 기준전위층사이, 상기 제2의 본딩패드와 상기 신호배선층사이 및 상기 제3의 본딩패드와 상기 제2의 기준전위층사이를 각각 전기적으로 접속하는 와이어, 상기제1의 기준전위층, 상기 제2의 기준전위층 및 상기 신호 배선층이 각각에 전기적으로 접속된 여러개의 외부인출용 리이드 및 상기 반도체펠릿, 상기 다층기판 및 상기 와이어를 그 안에 봉하고 있는 수지봉지체를 포함하는 반도체집적회로장치.
- 제7항에 있어서, 상기 제1 및 제2의 기준전위층의 선폭은 상기 신호배선층의 선폭과 같던가 그 이상인 반도체집적회로장치.
- 제7항에 있어서, 상기 제1의 기준전위층은 전원전위배선층인 반도체집적회로장치.
- 제7항에 있어서, 상기 제2의 기준전위층은 접지전위배선층인 반도체집적회로장치.
- 제7항에 있어서, 상기 제1의 기준전위층은 1개의 평면으로 이루어지는 반도체칩적회로장치.
- 제7항에 있어서, 상기 제2의 기준전위층은 2개의 평면으로 이루어지는 반도체집적회로 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4237942A JPH0685154A (ja) | 1992-09-07 | 1992-09-07 | 半導体集積回路装置 |
JP92-237942 | 1992-09-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR940008109A true KR940008109A (ko) | 1994-04-28 |
Family
ID=17022750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019930016669A KR940008109A (ko) | 1992-09-07 | 1993-08-26 | 반도체집적회로장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5402318A (ko) |
JP (1) | JPH0685154A (ko) |
KR (1) | KR940008109A (ko) |
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US10847015B2 (en) | 2013-06-19 | 2020-11-24 | Georgia Tech Research Corporation | System and methods for wireless hand hygiene monitoring |
US11170632B2 (en) | 2010-04-07 | 2021-11-09 | Clean Hands Safe Hands Llc | Systems and methods for pattern recognition and individual detection |
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US5701032A (en) * | 1994-10-17 | 1997-12-23 | W. L. Gore & Associates, Inc. | Integrated circuit package |
US5581122A (en) * | 1994-10-25 | 1996-12-03 | Industrial Technology Research Institute | Packaging assembly with consolidated common voltage connections for integrated circuits |
US5962815A (en) | 1995-01-18 | 1999-10-05 | Prolinx Labs Corporation | Antifuse interconnect between two conducting layers of a printed circuit board |
US5672909A (en) * | 1995-02-07 | 1997-09-30 | Amkor Electronics, Inc. | Interdigitated wirebond programmable fixed voltage planes |
US5760466A (en) * | 1995-04-20 | 1998-06-02 | Kyocera Corporation | Semiconductor device having improved heat resistance |
JP3245329B2 (ja) * | 1995-06-19 | 2002-01-15 | 京セラ株式会社 | 半導体素子収納用パッケージ |
US5861660A (en) * | 1995-08-21 | 1999-01-19 | Stmicroelectronics, Inc. | Integrated-circuit die suitable for wafer-level testing and method for forming the same |
FR2739496B1 (fr) * | 1995-10-03 | 1998-01-30 | Dassault Electronique | Circuit hyperfrequence multicouches a elements actifs integres |
US5767575A (en) | 1995-10-17 | 1998-06-16 | Prolinx Labs Corporation | Ball grid array structure and method for packaging an integrated circuit chip |
JP2755239B2 (ja) * | 1995-11-25 | 1998-05-20 | 日本電気株式会社 | 半導体装置用パッケージ |
EP0795907A1 (fr) * | 1996-03-14 | 1997-09-17 | Dassault Electronique | Circuit hyperfréquence multicouches à éléments actifs intégrés |
US5714800A (en) * | 1996-03-21 | 1998-02-03 | Motorola, Inc. | Integrated circuit assembly having a stepped interposer and method |
US6087728A (en) * | 1996-06-27 | 2000-07-11 | Intel Corporation | Interconnect design with controlled inductance |
JP3512977B2 (ja) * | 1996-08-27 | 2004-03-31 | 同和鉱業株式会社 | 高信頼性半導体用基板 |
US7321485B2 (en) | 1997-04-08 | 2008-01-22 | X2Y Attenuators, Llc | Arrangement for energy conditioning |
US9054094B2 (en) | 1997-04-08 | 2015-06-09 | X2Y Attenuators, Llc | Energy conditioning circuit arrangement for integrated circuit |
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US6034427A (en) | 1998-01-28 | 2000-03-07 | Prolinx Labs Corporation | Ball grid array structure and method for packaging an integrated circuit chip |
TW473882B (en) * | 1998-07-06 | 2002-01-21 | Hitachi Ltd | Semiconductor device |
US7525813B2 (en) * | 1998-07-06 | 2009-04-28 | Renesas Technology Corp. | Semiconductor device |
US7020958B1 (en) * | 1998-09-15 | 2006-04-04 | Intel Corporation | Methods forming an integrated circuit package with a split cavity wall |
EP1196014B1 (en) * | 1999-07-09 | 2006-01-04 | Fujitsu Limited | Printed wiring board unit, hierarchical mounting auxiliary substrate and electronic apparatus |
JP3425898B2 (ja) * | 1999-07-09 | 2003-07-14 | Necエレクトロニクス株式会社 | エリアアレイ型半導体装置 |
JP3615126B2 (ja) * | 2000-07-11 | 2005-01-26 | 寛治 大塚 | 半導体回路装置 |
JP3586435B2 (ja) * | 2001-03-30 | 2004-11-10 | ユーディナデバイス株式会社 | 高周波半導体装置 |
JP3958156B2 (ja) * | 2002-08-30 | 2007-08-15 | 三菱電機株式会社 | 電力用半導体装置 |
GB2439861A (en) | 2005-03-01 | 2008-01-09 | X2Y Attenuators Llc | Internally overlapped conditioners |
JP4777295B2 (ja) * | 2007-04-27 | 2011-09-21 | 株式会社豊田中央研究所 | 半導体チップ実装基板 |
TW200921612A (en) * | 2007-11-08 | 2009-05-16 | Etron Technology Inc | An overdrive device for enhancing the response time of LCD display |
JP5504712B2 (ja) * | 2009-06-30 | 2014-05-28 | 日立金属株式会社 | 高速伝送用回路基板の接続構造 |
KR20120048875A (ko) * | 2010-11-08 | 2012-05-16 | 삼성전자주식회사 | 노출 패들을 갖는 쿼드 플랫 패키지 |
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JP2653504B2 (ja) * | 1988-12-19 | 1997-09-17 | 株式会社日立製作所 | 半導体装置 |
JPH02208947A (ja) * | 1989-02-08 | 1990-08-20 | Nec Corp | 積層型パッケージ |
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JP2978533B2 (ja) * | 1990-06-15 | 1999-11-15 | 株式会社日立製作所 | 半導体集積回路装置 |
JPH04180401A (ja) * | 1990-11-15 | 1992-06-26 | Hitachi Ltd | 高周波伝送線路 |
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-
1992
- 1992-09-07 JP JP4237942A patent/JPH0685154A/ja not_active Withdrawn
-
1993
- 1993-08-26 KR KR1019930016669A patent/KR940008109A/ko not_active Application Discontinuation
- 1993-09-03 US US08/115,611 patent/US5402318A/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11170632B2 (en) | 2010-04-07 | 2021-11-09 | Clean Hands Safe Hands Llc | Systems and methods for pattern recognition and individual detection |
US10847015B2 (en) | 2013-06-19 | 2020-11-24 | Georgia Tech Research Corporation | System and methods for wireless hand hygiene monitoring |
US11348441B2 (en) | 2013-06-19 | 2022-05-31 | Georgia Tech Research Corporation | System and methods for wireless hand hygiene monitoring |
US11893872B2 (en) | 2013-06-19 | 2024-02-06 | Georgia Tech Research Corporation | System and methods for wireless hand hygiene monitoring |
Also Published As
Publication number | Publication date |
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JPH0685154A (ja) | 1994-03-25 |
US5402318A (en) | 1995-03-28 |
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