KR950012617A - 반도체 웨이퍼연삭용 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 - Google Patents
반도체 웨이퍼연삭용 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 Download PDFInfo
- Publication number
- KR950012617A KR950012617A KR1019940026844A KR19940026844A KR950012617A KR 950012617 A KR950012617 A KR 950012617A KR 1019940026844 A KR1019940026844 A KR 1019940026844A KR 19940026844 A KR19940026844 A KR 19940026844A KR 950012617 A KR950012617 A KR 950012617A
- Authority
- KR
- South Korea
- Prior art keywords
- workpiece holder
- piezoelectric element
- semiconductor wafer
- holder
- piece holder
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 8
- 238000000034 method Methods 0.000 title claims abstract 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
- 238000003754 machining Methods 0.000 claims 1
- 239000000523 sample Substances 0.000 claims 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
- B23Q1/25—Movable or adjustable work or tool supports
- B23Q1/26—Movable or adjustable work or tool supports characterised by constructional features relating to the co-operation of relatively movable members; Means for preventing relative movement of such members
- B23Q1/34—Relative movement obtained by use of deformable elements, e.g. piezoelectric, magnetostrictive, elastic or thermally-dilatable elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/10—Single-purpose machines or devices
- B24B7/16—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning In General (AREA)
- Automatic Control Of Machine Tools (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
이 발명은 회전식 연삭공구쪽으로 향하여 있고 가공할 반도체 웨이퍼를 설정한 회전시킬 수 있는 가공면을 가진 반도체 웨이퍼를 연삭하는 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 축방향으로 지지시킨 압전소자(piezoeletric elements)에 관한 것이다.
그 압전소자는 서로 각각 작동시킬 수 있고, 작동할 때 그 직선운동을 변화시킬 수 있으며, 작동한 압전소자는 그 가공편홀더를 지지하는 지지점에서 가공편홀더를 축방향으로 상승 또는 하강시킨다.
이 발명은 또 그 가공편을 위치시키는 방법에 관한 것이다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
첨부도면은 이 발명 실시예에 의한 반도체 웨이퍼연삭용 회전연삭기계의 개략 횡단면도를 나타낸다.
Claims (10)
- 회전식 연삭공구쪽으로 향하여 있고 가공할 반도체 웨이퍼를 설정한 회전할 수 있는 가공면을 가지며, 가공편홀더를 축방향으로 지지시킨 수단을 가진 반도체 웨이퍼를 연삭하는 회전식 연삭기계의 가공편홀더(workpiece holder)에 있어서, 그 수단은 서로 각각 작동할 수 있고 직선운동을 변화시키는 압전소자(piezoeletric elements)이며, 작동한 압전소자는 그 가공편홀더를 지지하는 지지점에서 가공편홀더를 축방향으로 상승 또는 하강시키도록 구성함을 특징으로 하는 위 가공편홀더.
- 제1항에 있어서, 3개의 압전소자는 그 가공편홀더의 축방향지지체로 구성함을 특징으로 하는 위 가공편홀더.
- 제1항에 있어서, 그 가공할 반도체 웨이퍼를 가공편홀더의 가공면에 대하여 흡입(suction)에 의해 드로잉(drawing)하도록 하는 수단을 구성함을 특징으로 하는 위 가공편홀더.
- 제1항에 있어서, 그 압전소자는 가공편홀더를 그 위주에서 지지하도록 구성함을 특징으로 하는 위 가공편홀더.
- 제1항에 있어서, 각각의 압전소자는 직선운동을 기록하는 측정프로브(probe)로 장치함을 특징으로 하는 위 가공편홀더.
- 제1항에 있어서, 그 압전소자를 작동시키는 중앙제어유닛(central control unit)을 구성함을 특징으로 하는 위 가공편홀더.
- 가공편홀더를 위치시키는 방법에 있어서, 가공편홀더의 회전축과 연삭공구의 회전축을 평행하게 배치시키거나 서로 소정의 위치로 위치하도록 그 압전소자를 작동시킴을 특징으로 하는 위 방법.
- 제7항에 있어서, 그 압전소자는 그 가공편홀더가 이동운동을 하도록 작동함을 특징으로 하는 위 방법.
- 제7항 도는 제8항에 있어서, 반도체 웨이퍼를 연삭할 때 회전식 연삭기계의 절삭력은 압전소자에 의해 측정하며 그 가공편홀더를 그 절삭력의 비예칙적 변화를 시킨후에 재위치시킴을 특징으로 하는 위 방법.
- 반도체 웨이퍼로서 실리콘 웨이퍼 또는 SOI 웨이퍼(SOI:Silicon on lusul ator)를 연삭하는 제1항 내지 제6항의 가공편홀더의 사용.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE93-P4335980.9 | 1993-10-21 | ||
DE4335980A DE4335980C2 (de) | 1993-10-21 | 1993-10-21 | Verfahren zum Positionieren einer Werkstückhalterung |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950012617A true KR950012617A (ko) | 1995-05-16 |
KR0159916B1 KR0159916B1 (ko) | 1999-02-01 |
Family
ID=6500715
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940026844A KR0159916B1 (ko) | 1993-10-21 | 1994-10-20 | 반도체웨이퍼연삭용 회전식연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 |
Country Status (8)
Country | Link |
---|---|
US (1) | US5567199A (ko) |
JP (1) | JP2896746B2 (ko) |
KR (1) | KR0159916B1 (ko) |
CN (1) | CN1070403C (ko) |
DE (1) | DE4335980C2 (ko) |
IT (1) | IT1280040B1 (ko) |
MY (1) | MY110610A (ko) |
TW (1) | TW245818B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020090195A (ko) * | 2002-10-30 | 2002-11-30 | 도대홍 | 튜브형 마늘다데기 제조 |
Families Citing this family (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5951368A (en) * | 1996-05-29 | 1999-09-14 | Ebara Corporation | Polishing apparatus |
DE19627142C2 (de) * | 1996-07-05 | 2003-04-24 | Andreas Hilker | Vorrichtung zur Oberflächenbearbeitung von Metall, Glas oder dergleichen |
KR100218309B1 (ko) * | 1996-07-09 | 1999-09-01 | 구본준 | 씨엠피장치의 반도체웨이퍼 레벨링 감지장치 및 방법 |
US5816895A (en) * | 1997-01-17 | 1998-10-06 | Tokyo Seimitsu Co., Ltd. | Surface grinding method and apparatus |
US6425812B1 (en) | 1997-04-08 | 2002-07-30 | Lam Research Corporation | Polishing head for chemical mechanical polishing using linear planarization technology |
US6244946B1 (en) | 1997-04-08 | 2001-06-12 | Lam Research Corporation | Polishing head with removable subcarrier |
JPH1110498A (ja) * | 1997-06-18 | 1999-01-19 | Sumitomo Heavy Ind Ltd | 固体アクチュエータを用いた面振れ修正機構を持つ加工装置 |
US5888120A (en) * | 1997-09-29 | 1999-03-30 | Lsi Logic Corporation | Method and apparatus for chemical mechanical polishing |
US5920769A (en) * | 1997-12-12 | 1999-07-06 | Micron Technology, Inc. | Method and apparatus for processing a planar structure |
US6045431A (en) * | 1997-12-23 | 2000-04-04 | Speedfam Corporation | Manufacture of thin-film magnetic heads |
JP2000015557A (ja) * | 1998-04-27 | 2000-01-18 | Ebara Corp | 研磨装置 |
JP2968784B1 (ja) * | 1998-06-19 | 1999-11-02 | 日本電気株式会社 | 研磨方法およびそれに用いる装置 |
JP2000015570A (ja) * | 1998-07-02 | 2000-01-18 | Disco Abrasive Syst Ltd | 研削装置 |
JP3515917B2 (ja) * | 1998-12-01 | 2004-04-05 | シャープ株式会社 | 半導体装置の製造方法 |
DE19859360C2 (de) * | 1998-12-22 | 2003-07-17 | Schwaebische Werkzeugmaschinen | Werkzeugmaschine mit piezoelektrischer Positionskorrektureinrichtung |
US6432823B1 (en) | 1999-11-04 | 2002-08-13 | International Business Machines Corporation | Off-concentric polishing system design |
US6383056B1 (en) | 1999-12-02 | 2002-05-07 | Yin Ming Wang | Plane constructed shaft system used in precision polishing and polishing apparatuses |
US6666756B1 (en) | 2000-03-31 | 2003-12-23 | Lam Research Corporation | Wafer carrier head assembly |
JP2002025961A (ja) * | 2000-07-04 | 2002-01-25 | Disco Abrasive Syst Ltd | 半導体ウエーハの研削方法 |
US6991524B1 (en) * | 2000-07-07 | 2006-01-31 | Disc Go Technologies Inc. | Method and apparatus for reconditioning digital discs |
TW200301211A (en) * | 2001-12-11 | 2003-07-01 | Mitsuboshi Diamond Ind Co Ltd | Method of suckingly holding substrate, and suckingly and holdingly carrying machine using the method |
DE10325977B4 (de) * | 2003-06-07 | 2005-06-09 | Daimlerchrysler Ag | Flachschleifvorrichtung mit einer Spannvorrichtung sowie Verfahren zum Schleifbearbeiten eines Werkstücks in einer Flachschleifvorrichtung |
CN100343018C (zh) * | 2004-01-08 | 2007-10-17 | 财团法人工业技术研究院 | 晶片磨床构造 |
US6966817B2 (en) * | 2004-02-11 | 2005-11-22 | Industrial Technology Research Institute | Wafer grinder |
NL1036034A1 (nl) * | 2007-10-11 | 2009-04-15 | Asml Netherlands Bv | Imprint lithography. |
JP4783405B2 (ja) * | 2008-07-02 | 2011-09-28 | 光洋機械工業株式会社 | 傾斜角調整装置及びワーク装着装置 |
JP4783404B2 (ja) * | 2008-07-02 | 2011-09-28 | 光洋機械工業株式会社 | ワーク装着装置 |
JP5295204B2 (ja) * | 2010-11-09 | 2013-09-18 | 中国電力株式会社 | 研磨装置 |
CN103029031A (zh) * | 2011-09-30 | 2013-04-10 | 上海双明光学科技有限公司 | 一种晶圆基片加工方法 |
CN103193199B (zh) * | 2013-03-27 | 2015-09-23 | 山东理工大学 | 一种用于低温超声阳极键合装置中的硅片夹持器 |
CN104227523A (zh) * | 2013-06-19 | 2014-12-24 | 晶科能源有限公司 | 硅片打磨工艺及其设备 |
JP6147587B2 (ja) * | 2013-06-27 | 2017-06-14 | 株式会社ディスコ | 研削装置及び研削方法 |
JP6121284B2 (ja) * | 2013-08-13 | 2017-04-26 | 株式会社ディスコ | 研磨装置 |
JP6336772B2 (ja) * | 2014-02-14 | 2018-06-06 | 株式会社ディスコ | 研削研磨装置 |
JP6660743B2 (ja) * | 2016-01-22 | 2020-03-11 | 株式会社東京精密 | 研削装置 |
JP6906312B2 (ja) * | 2017-01-16 | 2021-07-21 | 株式会社ディスコ | 研磨装置 |
CN109499984B (zh) * | 2018-10-13 | 2022-03-18 | 广东嗨学云教育科技有限公司 | 一种集成电路通用制造装置 |
JP7417362B2 (ja) * | 2019-04-05 | 2024-01-18 | 株式会社ディスコ | 研削装置 |
JP2020196100A (ja) * | 2019-06-04 | 2020-12-10 | 株式会社ディスコ | 圧電アクチュエータで構成したチャックテーブル傾き調整機構 |
JP7391470B2 (ja) * | 2019-12-20 | 2023-12-05 | 株式会社ディスコ | ワークの研削方法 |
CN113023357B (zh) * | 2021-04-14 | 2022-06-07 | 湖南三安半导体有限责任公司 | 黏贴装置 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3872626A (en) * | 1973-05-02 | 1975-03-25 | Cone Blanchard Machine Co | Grinding machine with tilting table |
JPS58184727A (ja) * | 1982-04-23 | 1983-10-28 | Disco Abrasive Sys Ltd | シリコンウェ−ハの面を研削する方法 |
JPS60103651U (ja) * | 1983-12-19 | 1985-07-15 | シチズン時計株式会社 | 真空吸着台 |
US4603867A (en) * | 1984-04-02 | 1986-08-05 | Motorola, Inc. | Spinner chuck |
DD226819A1 (de) * | 1984-08-27 | 1985-09-04 | Werkzeugmasch Okt Veb | Messanordnung zur erfassung der ist-lage und der topographie eines rotierenden schleifkoerpers |
JPS62124842A (ja) * | 1985-11-27 | 1987-06-06 | Hitachi Seiko Ltd | テ−ブルの傾斜補正型工作機械 |
JPS62181862A (ja) * | 1986-02-07 | 1987-08-10 | Hitachi Seiko Ltd | 平面研削装置 |
AU637087B2 (en) * | 1989-03-24 | 1993-05-20 | Sumitomo Electric Industries, Ltd. | Apparatus for grinding semiconductor wafer |
JP2977203B2 (ja) * | 1989-04-19 | 1999-11-15 | 株式会社東芝 | 研磨装置 |
US5117589A (en) * | 1990-03-19 | 1992-06-02 | Read-Rite Corporation | Adjustable transfer tool for lapping magnetic head sliders |
JP3077994B2 (ja) * | 1990-05-21 | 2000-08-21 | 理化学研究所 | 電解ドレッシング研削装置 |
US5069002A (en) * | 1991-04-17 | 1991-12-03 | Micron Technology, Inc. | Apparatus for endpoint detection during mechanical planarization of semiconductor wafers |
FR2677276B1 (fr) * | 1991-06-06 | 1995-12-01 | Commissariat Energie Atomique | Machine de polissage a table porte-echantillon perfectionnee. |
DE4136882A1 (de) * | 1991-11-09 | 1993-05-13 | Glyco Metall Werke | Positioniervorrichtung fuer eine bearbeitungsmaschine fuer werkstuecke |
US5320007A (en) * | 1992-11-18 | 1994-06-14 | Texas Instruments Incorporated | Method for positioning and processing LPE films |
-
1993
- 1993-10-21 DE DE4335980A patent/DE4335980C2/de not_active Expired - Fee Related
-
1994
- 1994-06-30 MY MYPI94001699A patent/MY110610A/en unknown
- 1994-07-12 TW TW083106328A patent/TW245818B/zh active
- 1994-08-12 JP JP21073394A patent/JP2896746B2/ja not_active Expired - Lifetime
- 1994-09-21 US US08/310,048 patent/US5567199A/en not_active Expired - Fee Related
- 1994-10-18 IT IT94RM000674A patent/IT1280040B1/it active IP Right Grant
- 1994-10-20 KR KR1019940026844A patent/KR0159916B1/ko not_active IP Right Cessation
- 1994-10-21 CN CN94117575A patent/CN1070403C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020090195A (ko) * | 2002-10-30 | 2002-11-30 | 도대홍 | 튜브형 마늘다데기 제조 |
Also Published As
Publication number | Publication date |
---|---|
JP2896746B2 (ja) | 1999-05-31 |
TW245818B (ko) | 1995-04-21 |
ITRM940674A0 (it) | 1994-10-18 |
US5567199A (en) | 1996-10-22 |
IT1280040B1 (it) | 1997-12-29 |
DE4335980C2 (de) | 1998-09-10 |
JPH07122524A (ja) | 1995-05-12 |
CN1070403C (zh) | 2001-09-05 |
DE4335980A1 (de) | 1995-04-27 |
KR0159916B1 (ko) | 1999-02-01 |
CN1108591A (zh) | 1995-09-20 |
MY110610A (en) | 1998-08-29 |
ITRM940674A1 (it) | 1996-04-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR950012617A (ko) | 반도체 웨이퍼연삭용 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 | |
KR970003147B1 (ko) | 기계 가공 장치 | |
KR20050015967A (ko) | 가공기 | |
KR970077291A (ko) | 연동기능을 구비한 폴리싱 장치 | |
US4960352A (en) | Chamfering machine | |
KR860009474A (ko) | 온도 변화에 따른 오류를 감소시키는 정밀장치 | |
KR940008813A (ko) | 회전전후 이송장치 | |
KR870008651A (ko) | 밸브 시이트 기계가공용 장치 | |
KR950005455A (ko) | 스크롤상 공작물의 가공방법 및 장치 | |
JP7082517B2 (ja) | 加工装置 | |
ATE279721T1 (de) | Präzisions-probendrehvorrichtung | |
KR920006077A (ko) | 공작기계의 지석(砥石)수정장치 | |
DE3864706D1 (de) | Honverfahren. | |
JPH10138200A (ja) | スライシング方法およびスライシング装置 | |
RU2124419C1 (ru) | Устройство управления точностью обработки деталей | |
KR200203318Y1 (ko) | 회전 공작물의 치수 측정장치 | |
SU1798102A1 (ru) | Пobopothый ctoл плockoшлифobaльhoгo ctahka | |
US3176406A (en) | Gage drive | |
KR920000068Y1 (ko) | 면삭기 | |
SE8405580L (sv) | Anordning for slipbearbetning av plana ytor hos arbetsstycken | |
JPS59187432A (ja) | 回転テ−ブル | |
JP2003117744A (ja) | 工作機械 | |
SU1595635A1 (ru) | Устройство дл заточки электродов машин дл контактной точечной сварки | |
KR100462820B1 (ko) | 작업공구유닛의 배열을 이용한 가공기계장치 | |
SU579107A1 (ru) | Прижимное устройство |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
N231 | Notification of change of applicant | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20010802 Year of fee payment: 4 |
|
LAPS | Lapse due to unpaid annual fee |