KR950012617A - 반도체 웨이퍼연삭용 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 - Google Patents

반도체 웨이퍼연삭용 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 Download PDF

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Publication number
KR950012617A
KR950012617A KR1019940026844A KR19940026844A KR950012617A KR 950012617 A KR950012617 A KR 950012617A KR 1019940026844 A KR1019940026844 A KR 1019940026844A KR 19940026844 A KR19940026844 A KR 19940026844A KR 950012617 A KR950012617 A KR 950012617A
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South Korea
Prior art keywords
workpiece holder
piezoelectric element
semiconductor wafer
holder
piece holder
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KR1019940026844A
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English (en)
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KR0159916B1 (ko
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안톤후버
바이스 로버트
Original Assignee
균터 시르베 ; 아르.스타우디글
와커-헤미트로닉 게셀샤프트 휘르 엘렉트로닉-그룬드스토페 엠베하
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Publication of KR950012617A publication Critical patent/KR950012617A/ko
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Publication of KR0159916B1 publication Critical patent/KR0159916B1/ko

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25Movable or adjustable work or tool supports
    • B23Q1/26Movable or adjustable work or tool supports characterised by constructional features relating to the co-operation of relatively movable members; Means for preventing relative movement of such members
    • B23Q1/34Relative movement obtained by use of deformable elements, e.g. piezoelectric, magnetostrictive, elastic or thermally-dilatable elements
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/10Single-purpose machines or devices
    • B24B7/16Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning In General (AREA)
  • Automatic Control Of Machine Tools (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

이 발명은 회전식 연삭공구쪽으로 향하여 있고 가공할 반도체 웨이퍼를 설정한 회전시킬 수 있는 가공면을 가진 반도체 웨이퍼를 연삭하는 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 축방향으로 지지시킨 압전소자(piezoeletric elements)에 관한 것이다.
그 압전소자는 서로 각각 작동시킬 수 있고, 작동할 때 그 직선운동을 변화시킬 수 있으며, 작동한 압전소자는 그 가공편홀더를 지지하는 지지점에서 가공편홀더를 축방향으로 상승 또는 하강시킨다.
이 발명은 또 그 가공편을 위치시키는 방법에 관한 것이다.

Description

반도체 웨이퍼연삭용 회전식 연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
첨부도면은 이 발명 실시예에 의한 반도체 웨이퍼연삭용 회전연삭기계의 개략 횡단면도를 나타낸다.

Claims (10)

  1. 회전식 연삭공구쪽으로 향하여 있고 가공할 반도체 웨이퍼를 설정한 회전할 수 있는 가공면을 가지며, 가공편홀더를 축방향으로 지지시킨 수단을 가진 반도체 웨이퍼를 연삭하는 회전식 연삭기계의 가공편홀더(workpiece holder)에 있어서, 그 수단은 서로 각각 작동할 수 있고 직선운동을 변화시키는 압전소자(piezoeletric elements)이며, 작동한 압전소자는 그 가공편홀더를 지지하는 지지점에서 가공편홀더를 축방향으로 상승 또는 하강시키도록 구성함을 특징으로 하는 위 가공편홀더.
  2. 제1항에 있어서, 3개의 압전소자는 그 가공편홀더의 축방향지지체로 구성함을 특징으로 하는 위 가공편홀더.
  3. 제1항에 있어서, 그 가공할 반도체 웨이퍼를 가공편홀더의 가공면에 대하여 흡입(suction)에 의해 드로잉(drawing)하도록 하는 수단을 구성함을 특징으로 하는 위 가공편홀더.
  4. 제1항에 있어서, 그 압전소자는 가공편홀더를 그 위주에서 지지하도록 구성함을 특징으로 하는 위 가공편홀더.
  5. 제1항에 있어서, 각각의 압전소자는 직선운동을 기록하는 측정프로브(probe)로 장치함을 특징으로 하는 위 가공편홀더.
  6. 제1항에 있어서, 그 압전소자를 작동시키는 중앙제어유닛(central control unit)을 구성함을 특징으로 하는 위 가공편홀더.
  7. 가공편홀더를 위치시키는 방법에 있어서, 가공편홀더의 회전축과 연삭공구의 회전축을 평행하게 배치시키거나 서로 소정의 위치로 위치하도록 그 압전소자를 작동시킴을 특징으로 하는 위 방법.
  8. 제7항에 있어서, 그 압전소자는 그 가공편홀더가 이동운동을 하도록 작동함을 특징으로 하는 위 방법.
  9. 제7항 도는 제8항에 있어서, 반도체 웨이퍼를 연삭할 때 회전식 연삭기계의 절삭력은 압전소자에 의해 측정하며 그 가공편홀더를 그 절삭력의 비예칙적 변화를 시킨후에 재위치시킴을 특징으로 하는 위 방법.
  10. 반도체 웨이퍼로서 실리콘 웨이퍼 또는 SOI 웨이퍼(SOI:Silicon on lusul ator)를 연삭하는 제1항 내지 제6항의 가공편홀더의 사용.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940026844A 1993-10-21 1994-10-20 반도체웨이퍼연삭용 회전식연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법 KR0159916B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE93-P4335980.9 1993-10-21
DE4335980A DE4335980C2 (de) 1993-10-21 1993-10-21 Verfahren zum Positionieren einer Werkstückhalterung

Publications (2)

Publication Number Publication Date
KR950012617A true KR950012617A (ko) 1995-05-16
KR0159916B1 KR0159916B1 (ko) 1999-02-01

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KR1019940026844A KR0159916B1 (ko) 1993-10-21 1994-10-20 반도체웨이퍼연삭용 회전식연삭기계의 가공편홀더 및 그 가공편홀더를 위치시키는 방법

Country Status (8)

Country Link
US (1) US5567199A (ko)
JP (1) JP2896746B2 (ko)
KR (1) KR0159916B1 (ko)
CN (1) CN1070403C (ko)
DE (1) DE4335980C2 (ko)
IT (1) IT1280040B1 (ko)
MY (1) MY110610A (ko)
TW (1) TW245818B (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020090195A (ko) * 2002-10-30 2002-11-30 도대홍 튜브형 마늘다데기 제조

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5951368A (en) * 1996-05-29 1999-09-14 Ebara Corporation Polishing apparatus
DE19627142C2 (de) * 1996-07-05 2003-04-24 Andreas Hilker Vorrichtung zur Oberflächenbearbeitung von Metall, Glas oder dergleichen
KR100218309B1 (ko) * 1996-07-09 1999-09-01 구본준 씨엠피장치의 반도체웨이퍼 레벨링 감지장치 및 방법
US5816895A (en) * 1997-01-17 1998-10-06 Tokyo Seimitsu Co., Ltd. Surface grinding method and apparatus
US6425812B1 (en) 1997-04-08 2002-07-30 Lam Research Corporation Polishing head for chemical mechanical polishing using linear planarization technology
US6244946B1 (en) 1997-04-08 2001-06-12 Lam Research Corporation Polishing head with removable subcarrier
JPH1110498A (ja) * 1997-06-18 1999-01-19 Sumitomo Heavy Ind Ltd 固体アクチュエータを用いた面振れ修正機構を持つ加工装置
US5888120A (en) * 1997-09-29 1999-03-30 Lsi Logic Corporation Method and apparatus for chemical mechanical polishing
US5920769A (en) * 1997-12-12 1999-07-06 Micron Technology, Inc. Method and apparatus for processing a planar structure
US6045431A (en) * 1997-12-23 2000-04-04 Speedfam Corporation Manufacture of thin-film magnetic heads
JP2000015557A (ja) * 1998-04-27 2000-01-18 Ebara Corp 研磨装置
JP2968784B1 (ja) * 1998-06-19 1999-11-02 日本電気株式会社 研磨方法およびそれに用いる装置
JP2000015570A (ja) * 1998-07-02 2000-01-18 Disco Abrasive Syst Ltd 研削装置
JP3515917B2 (ja) * 1998-12-01 2004-04-05 シャープ株式会社 半導体装置の製造方法
DE19859360C2 (de) * 1998-12-22 2003-07-17 Schwaebische Werkzeugmaschinen Werkzeugmaschine mit piezoelektrischer Positionskorrektureinrichtung
US6432823B1 (en) 1999-11-04 2002-08-13 International Business Machines Corporation Off-concentric polishing system design
US6383056B1 (en) 1999-12-02 2002-05-07 Yin Ming Wang Plane constructed shaft system used in precision polishing and polishing apparatuses
US6666756B1 (en) 2000-03-31 2003-12-23 Lam Research Corporation Wafer carrier head assembly
JP2002025961A (ja) * 2000-07-04 2002-01-25 Disco Abrasive Syst Ltd 半導体ウエーハの研削方法
US6991524B1 (en) * 2000-07-07 2006-01-31 Disc Go Technologies Inc. Method and apparatus for reconditioning digital discs
TW200301211A (en) * 2001-12-11 2003-07-01 Mitsuboshi Diamond Ind Co Ltd Method of suckingly holding substrate, and suckingly and holdingly carrying machine using the method
DE10325977B4 (de) * 2003-06-07 2005-06-09 Daimlerchrysler Ag Flachschleifvorrichtung mit einer Spannvorrichtung sowie Verfahren zum Schleifbearbeiten eines Werkstücks in einer Flachschleifvorrichtung
CN100343018C (zh) * 2004-01-08 2007-10-17 财团法人工业技术研究院 晶片磨床构造
US6966817B2 (en) * 2004-02-11 2005-11-22 Industrial Technology Research Institute Wafer grinder
NL1036034A1 (nl) * 2007-10-11 2009-04-15 Asml Netherlands Bv Imprint lithography.
JP4783405B2 (ja) * 2008-07-02 2011-09-28 光洋機械工業株式会社 傾斜角調整装置及びワーク装着装置
JP4783404B2 (ja) * 2008-07-02 2011-09-28 光洋機械工業株式会社 ワーク装着装置
JP5295204B2 (ja) * 2010-11-09 2013-09-18 中国電力株式会社 研磨装置
CN103029031A (zh) * 2011-09-30 2013-04-10 上海双明光学科技有限公司 一种晶圆基片加工方法
CN103193199B (zh) * 2013-03-27 2015-09-23 山东理工大学 一种用于低温超声阳极键合装置中的硅片夹持器
CN104227523A (zh) * 2013-06-19 2014-12-24 晶科能源有限公司 硅片打磨工艺及其设备
JP6147587B2 (ja) * 2013-06-27 2017-06-14 株式会社ディスコ 研削装置及び研削方法
JP6121284B2 (ja) * 2013-08-13 2017-04-26 株式会社ディスコ 研磨装置
JP6336772B2 (ja) * 2014-02-14 2018-06-06 株式会社ディスコ 研削研磨装置
JP6660743B2 (ja) * 2016-01-22 2020-03-11 株式会社東京精密 研削装置
JP6906312B2 (ja) * 2017-01-16 2021-07-21 株式会社ディスコ 研磨装置
CN109499984B (zh) * 2018-10-13 2022-03-18 广东嗨学云教育科技有限公司 一种集成电路通用制造装置
JP7417362B2 (ja) * 2019-04-05 2024-01-18 株式会社ディスコ 研削装置
JP2020196100A (ja) * 2019-06-04 2020-12-10 株式会社ディスコ 圧電アクチュエータで構成したチャックテーブル傾き調整機構
JP7391470B2 (ja) * 2019-12-20 2023-12-05 株式会社ディスコ ワークの研削方法
CN113023357B (zh) * 2021-04-14 2022-06-07 湖南三安半导体有限责任公司 黏贴装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3872626A (en) * 1973-05-02 1975-03-25 Cone Blanchard Machine Co Grinding machine with tilting table
JPS58184727A (ja) * 1982-04-23 1983-10-28 Disco Abrasive Sys Ltd シリコンウェ−ハの面を研削する方法
JPS60103651U (ja) * 1983-12-19 1985-07-15 シチズン時計株式会社 真空吸着台
US4603867A (en) * 1984-04-02 1986-08-05 Motorola, Inc. Spinner chuck
DD226819A1 (de) * 1984-08-27 1985-09-04 Werkzeugmasch Okt Veb Messanordnung zur erfassung der ist-lage und der topographie eines rotierenden schleifkoerpers
JPS62124842A (ja) * 1985-11-27 1987-06-06 Hitachi Seiko Ltd テ−ブルの傾斜補正型工作機械
JPS62181862A (ja) * 1986-02-07 1987-08-10 Hitachi Seiko Ltd 平面研削装置
AU637087B2 (en) * 1989-03-24 1993-05-20 Sumitomo Electric Industries, Ltd. Apparatus for grinding semiconductor wafer
JP2977203B2 (ja) * 1989-04-19 1999-11-15 株式会社東芝 研磨装置
US5117589A (en) * 1990-03-19 1992-06-02 Read-Rite Corporation Adjustable transfer tool for lapping magnetic head sliders
JP3077994B2 (ja) * 1990-05-21 2000-08-21 理化学研究所 電解ドレッシング研削装置
US5069002A (en) * 1991-04-17 1991-12-03 Micron Technology, Inc. Apparatus for endpoint detection during mechanical planarization of semiconductor wafers
FR2677276B1 (fr) * 1991-06-06 1995-12-01 Commissariat Energie Atomique Machine de polissage a table porte-echantillon perfectionnee.
DE4136882A1 (de) * 1991-11-09 1993-05-13 Glyco Metall Werke Positioniervorrichtung fuer eine bearbeitungsmaschine fuer werkstuecke
US5320007A (en) * 1992-11-18 1994-06-14 Texas Instruments Incorporated Method for positioning and processing LPE films

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020090195A (ko) * 2002-10-30 2002-11-30 도대홍 튜브형 마늘다데기 제조

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Publication number Publication date
JP2896746B2 (ja) 1999-05-31
TW245818B (ko) 1995-04-21
ITRM940674A0 (it) 1994-10-18
US5567199A (en) 1996-10-22
IT1280040B1 (it) 1997-12-29
DE4335980C2 (de) 1998-09-10
JPH07122524A (ja) 1995-05-12
CN1070403C (zh) 2001-09-05
DE4335980A1 (de) 1995-04-27
KR0159916B1 (ko) 1999-02-01
CN1108591A (zh) 1995-09-20
MY110610A (en) 1998-08-29
ITRM940674A1 (it) 1996-04-18

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