KR920003468B1 - 반도체 집적회로장치 - Google Patents
반도체 집적회로장치 Download PDFInfo
- Publication number
- KR920003468B1 KR920003468B1 KR1019890001160A KR890001160A KR920003468B1 KR 920003468 B1 KR920003468 B1 KR 920003468B1 KR 1019890001160 A KR1019890001160 A KR 1019890001160A KR 890001160 A KR890001160 A KR 890001160A KR 920003468 B1 KR920003468 B1 KR 920003468B1
- Authority
- KR
- South Korea
- Prior art keywords
- potential
- input signal
- transistor
- signal line
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
- H03K17/223—Modifications for ensuring a predetermined initial state when the supply voltage has been applied in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
Landscapes
- Dram (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63-110814 | 1988-05-07 | ||
| JP63110814A JPH01280923A (ja) | 1988-05-07 | 1988-05-07 | 半導体集積回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR890017789A KR890017789A (ko) | 1989-12-18 |
| KR920003468B1 true KR920003468B1 (ko) | 1992-05-01 |
Family
ID=14545334
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019890001160A Expired KR920003468B1 (ko) | 1988-05-07 | 1989-02-01 | 반도체 집적회로장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4985641A (https=) |
| JP (1) | JPH01280923A (https=) |
| KR (1) | KR920003468B1 (https=) |
| DE (1) | DE3911450A1 (https=) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5051622A (en) * | 1989-11-08 | 1991-09-24 | Chips And Technologies, Inc. | Power-on strap inputs |
| JPH03228351A (ja) * | 1990-02-02 | 1991-10-09 | Mitsubishi Electric Corp | 半導体装置 |
| JP3079515B2 (ja) * | 1991-01-29 | 2000-08-21 | 株式会社東芝 | ゲ−トアレイ装置及び入力回路及び出力回路及び降圧回路 |
| JPH04278558A (ja) * | 1991-03-07 | 1992-10-05 | Nec Corp | 半導体装置 |
| JP2827062B2 (ja) * | 1991-09-04 | 1998-11-18 | シャープ株式会社 | 集積回路 |
| JPH0669425A (ja) * | 1992-06-10 | 1994-03-11 | Nec Corp | 半導体装置 |
| DE69326284T2 (de) * | 1992-06-10 | 2000-03-23 | Nec Corp., Tokio/Tokyo | Halbleiteranordnung mit anschlusswählender Schaltung |
| JP2994168B2 (ja) * | 1993-03-10 | 1999-12-27 | 日本電気株式会社 | 初期状態設定回路 |
| US5574633A (en) * | 1994-02-23 | 1996-11-12 | At&T Global Information Solubions Company | Multi-phase charge sharing method and apparatus |
| EP0685847B1 (en) * | 1994-05-31 | 2002-05-02 | STMicroelectronics S.r.l. | Low dissipation initialization circuit, particularly for memory registers |
| US5581201A (en) * | 1994-06-30 | 1996-12-03 | Tandem Computers Incorporated | Apparatus for unit control and presence detection |
| US6804760B2 (en) | 1994-12-23 | 2004-10-12 | Micron Technology, Inc. | Method for determining a type of memory present in a system |
| US6525971B2 (en) | 1995-06-30 | 2003-02-25 | Micron Technology, Inc. | Distributed write data drivers for burst access memories |
| US5526320A (en) | 1994-12-23 | 1996-06-11 | Micron Technology Inc. | Burst EDO memory device |
| US5698903A (en) * | 1995-05-09 | 1997-12-16 | United Memories, Inc. | Bond pad option for integrated circuits |
| JP3415347B2 (ja) * | 1995-10-25 | 2003-06-09 | Necエレクトロニクス株式会社 | マイクロコンピュータの動作モード設定用入力回路 |
| US7681005B1 (en) * | 1996-01-11 | 2010-03-16 | Micron Technology, Inc. | Asynchronously-accessible memory device with mode selection circuitry for burst or pipelined operation |
| KR100203140B1 (ko) * | 1996-06-29 | 1999-06-15 | 김영환 | 입력 누설 전류가 없는 자동 모드 선택 장치 |
| US6401186B1 (en) | 1996-07-03 | 2002-06-04 | Micron Technology, Inc. | Continuous burst memory which anticipates a next requested start address |
| US6981126B1 (en) * | 1996-07-03 | 2005-12-27 | Micron Technology, Inc. | Continuous interleave burst access |
| KR100206931B1 (ko) * | 1996-08-23 | 1999-07-01 | 구본준 | 전원 인가 회로 |
| JP3319960B2 (ja) * | 1996-10-17 | 2002-09-03 | 富士通株式会社 | 半導体装置 |
| US7103742B1 (en) | 1997-12-03 | 2006-09-05 | Micron Technology, Inc. | Burst/pipelined edo memory device |
| US6335646B1 (en) * | 1999-04-28 | 2002-01-01 | Oki Electric Industry Co., Ltd. | Power-on reset circuit for generating a reset pulse signal upon detection of a power supply voltage |
| DE10114767B4 (de) * | 2001-03-26 | 2017-04-27 | Tdk-Micronas Gmbh | Verfahren zur Realisierung von Verdrahtungsoptionen bei einem integrierten Schaltkreis und integrierter Schaltkreis |
| US7131033B1 (en) | 2002-06-21 | 2006-10-31 | Cypress Semiconductor Corp. | Substrate configurable JTAG ID scheme |
| US7818640B1 (en) | 2004-10-22 | 2010-10-19 | Cypress Semiconductor Corporation | Test system having a master/slave JTAG controller |
| US8680901B2 (en) * | 2012-08-06 | 2014-03-25 | Texas Instruments Incorporated | Power on reset generation circuits in integrated circuits |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3569729A (en) * | 1966-07-05 | 1971-03-09 | Hayakawa Denki Kogyo Kk | Integrated fet structure with substrate biasing means to effect bidirectional transistor operation |
| US4307306A (en) * | 1979-05-17 | 1981-12-22 | Rca Corporation | IC Clamping circuit |
| JPS58140649A (ja) * | 1982-02-16 | 1983-08-20 | Fujitsu Ltd | 電圧検出回路 |
| DE3218992A1 (de) * | 1982-05-19 | 1983-11-24 | Siemens AG, 1000 Berlin und 8000 München | Monolithisch integrierter schaltkreis |
| US4591745A (en) * | 1984-01-16 | 1986-05-27 | Itt Corporation | Power-on reset pulse generator |
| US4631420A (en) * | 1984-02-09 | 1986-12-23 | Sanders Associates, Inc. | Dynamic flip-flop with static reset |
| US4581552A (en) * | 1984-02-17 | 1986-04-08 | Texas Instruments Incorporated | Power-up clear circuitry having two thresholds |
| JPS6110319A (ja) * | 1984-05-30 | 1986-01-17 | Fujitsu Ltd | 出力制御回路 |
| US4716323A (en) * | 1985-04-27 | 1987-12-29 | Kabushiki Kaisha Toshiba | Power voltage drop detecting circuit |
| US4677321A (en) * | 1985-09-10 | 1987-06-30 | Harris Corporation | TTL compatible input buffer |
| JPH0685497B2 (ja) * | 1985-12-20 | 1994-10-26 | 株式会社東芝 | 半導体集積回路 |
| US4716322A (en) * | 1986-03-25 | 1987-12-29 | Texas Instruments Incorporated | Power-up control circuit including a comparator, Schmitt trigger, and latch |
| JP2605687B2 (ja) * | 1986-04-17 | 1997-04-30 | 三菱電機株式会社 | 半導体装置 |
| JP2741022B2 (ja) * | 1987-04-01 | 1998-04-15 | 三菱電機株式会社 | パワーオンリセツトパルス発生回路 |
| FR2619939B1 (fr) * | 1987-09-01 | 1989-12-08 | Thomson Semiconducteurs | Circuit de detection de transitions d'adresses |
| US4812679A (en) * | 1987-11-09 | 1989-03-14 | Motorola, Inc. | Power-on reset circuit |
| US4877980A (en) * | 1988-03-10 | 1989-10-31 | Advanced Micro Devices, Inc. | Time variant drive circuit for high speed bus driver to limit oscillations or ringing on a bus |
| US4885476A (en) * | 1989-03-06 | 1989-12-05 | Motorola, Inc. | Power-on reset circuit |
-
1988
- 1988-05-07 JP JP63110814A patent/JPH01280923A/ja active Pending
-
1989
- 1989-02-01 KR KR1019890001160A patent/KR920003468B1/ko not_active Expired
- 1989-02-24 US US07/315,084 patent/US4985641A/en not_active Expired - Lifetime
- 1989-04-07 DE DE3911450A patent/DE3911450A1/de active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| US4985641A (en) | 1991-01-15 |
| DE3911450A1 (de) | 1989-11-16 |
| KR890017789A (ko) | 1989-12-18 |
| DE3911450C2 (https=) | 1993-07-01 |
| JPH01280923A (ja) | 1989-11-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR920003468B1 (ko) | 반도체 집적회로장치 | |
| KR950009087B1 (ko) | 반도체 집적회로의 출력회로 | |
| US6040729A (en) | Digital output buffer for multiple voltage system | |
| KR950000353B1 (ko) | 집적회로용 출력 버퍼 회로 | |
| US5682105A (en) | Bonding option circuit having no pass-through current | |
| US4388538A (en) | Delay signal generating circuit | |
| EP0052504A1 (en) | Semiconductor buffer circuit | |
| US5073731A (en) | Bootstrapping level control circuit for word line signal producing circuit in a dram | |
| US4317051A (en) | Clock generator (buffer) circuit | |
| US4239991A (en) | Clock voltage generator for semiconductor memory | |
| KR910009083B1 (ko) | 반도체장치의 출력회로 | |
| US5327022A (en) | Multiplexer circuit less liable to malfunction | |
| US4239990A (en) | Clock voltage generator for semiconductor memory with reduced power dissipation | |
| US4896056A (en) | Semiconductor IC including circuit for preventing erroneous operation caused by power source noise | |
| US6535021B1 (en) | Logic gate circuit with low sub-threshold leakage current | |
| US5378950A (en) | Semiconductor integrated circuit for producing activation signals at different cycle times | |
| US5874843A (en) | Power-on reset circuit without an RC Network | |
| KR960006376B1 (ko) | 어드레스 천이 검출회로 | |
| US5585759A (en) | Input buffer of semiconductor integrated circuit | |
| GB2334391A (en) | CMOS standby current reduction | |
| US4950926A (en) | Control signal output circuit | |
| US6525597B2 (en) | Circuit configuration with internal supply voltage | |
| US5570058A (en) | Signal line testing circuit causing no delay in transmission of a normal data signal | |
| US5319262A (en) | Low power TTL/CMOS receiver circuit | |
| KR940002858B1 (ko) | 고속형 워드선 구동장치 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
St.27 status event code: A-2-2-Q10-Q13-nap-PG1605 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 12 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 13 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 14 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 15 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 16 |
|
| FPAY | Annual fee payment |
Payment date: 20080425 Year of fee payment: 17 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 17 |
|
| EXPY | Expiration of term | ||
| PC1801 | Expiration of term |
St.27 status event code: N-4-6-H10-H14-oth-PC1801 Not in force date: 20090202 Ip right cessation event data comment text: Termination Category : EXPIRATION_OF_DURATION |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |