KR900006164B1 - 불휘발성 반도체 기억장치 - Google Patents

불휘발성 반도체 기억장치 Download PDF

Info

Publication number
KR900006164B1
KR900006164B1 KR1019870002957A KR870002957A KR900006164B1 KR 900006164 B1 KR900006164 B1 KR 900006164B1 KR 1019870002957 A KR1019870002957 A KR 1019870002957A KR 870002957 A KR870002957 A KR 870002957A KR 900006164 B1 KR900006164 B1 KR 900006164B1
Authority
KR
South Korea
Prior art keywords
data
semiconductor memory
signal
test mode
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
KR1019870002957A
Other languages
English (en)
Korean (ko)
Other versions
KR870009397A (ko
Inventor
시게루 아츠미
스미오 다나카
신지 사이토
노부아키 오츠카
Original Assignee
가부시키가이샤 도시바
와타리 스기이치로
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 도시바, 와타리 스기이치로 filed Critical 가부시키가이샤 도시바
Publication of KR870009397A publication Critical patent/KR870009397A/ko
Application granted granted Critical
Publication of KR900006164B1 publication Critical patent/KR900006164B1/ko
Expired legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • G11C16/225—Preventing erasure, programming or reading when power supply voltages are outside the required ranges
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/46—Test trigger logic

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
KR1019870002957A 1986-03-31 1987-03-30 불휘발성 반도체 기억장치 Expired KR900006164B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP61071139A JPS62229600A (ja) 1986-03-31 1986-03-31 不揮発性半導体記憶装置
JP71139 1986-03-31

Publications (2)

Publication Number Publication Date
KR870009397A KR870009397A (ko) 1987-10-26
KR900006164B1 true KR900006164B1 (ko) 1990-08-24

Family

ID=13451953

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870002957A Expired KR900006164B1 (ko) 1986-03-31 1987-03-30 불휘발성 반도체 기억장치

Country Status (5)

Country Link
US (1) US4879689A (https=)
EP (1) EP0239968B1 (https=)
JP (1) JPS62229600A (https=)
KR (1) KR900006164B1 (https=)
DE (1) DE3786819T2 (https=)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2525775B2 (ja) * 1986-07-04 1996-08-21 株式会社東芝 不揮発性半導体メモリ
FR2635600A1 (fr) * 1988-08-19 1990-02-23 Philips Nv Unite de memoire adressable a circuit de selection d'unite ameliore
JP2601903B2 (ja) * 1989-04-25 1997-04-23 株式会社東芝 半導体記憶装置
US5237534A (en) * 1989-04-27 1993-08-17 Kabushiki Kaisha Toshiba Data sense circuit for a semiconductor nonvolatile memory device
JPH07105160B2 (ja) * 1989-05-20 1995-11-13 東芝マイクロエレクトロニクス株式会社 半導体記憶装置
US5258954A (en) * 1989-06-30 1993-11-02 Kabushiki Kaisha Toshiba Semiconductor memory including circuitry for driving plural word lines in a test mode
JPH0338067A (ja) * 1989-07-05 1991-02-19 Toshiba Corp 不揮発性半導体メモリ装置
JPH0346188A (ja) * 1989-07-13 1991-02-27 Mitsubishi Electric Corp 半導体記憶回路
EP0432481A3 (en) * 1989-12-14 1992-04-29 Texas Instruments Incorporated Methods and apparatus for verifying the state of a plurality of electrically programmable memory cells
US5134586A (en) * 1990-08-17 1992-07-28 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with chip enable control from output enable during test mode
US5134587A (en) * 1990-08-17 1992-07-28 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with automatic test mode exit on chip enable
US6781895B1 (en) * 1991-12-19 2004-08-24 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device and memory system using the same
US5361227A (en) * 1991-12-19 1994-11-01 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device and memory system using the same
JPH10213002A (ja) * 1996-11-27 1998-08-11 Denso Corp データ処理装置
JP2004071119A (ja) * 2002-08-09 2004-03-04 Renesas Technology Corp 半導体記憶装置
DE602004014412D1 (de) * 2004-01-23 2008-07-24 Agere Systems Inc Verfahren und vorrichtung zum programmieren eines
US20060139995A1 (en) * 2004-12-28 2006-06-29 Ali Keshavarzi One time programmable memory
CN102110464B (zh) * 2009-12-26 2015-06-10 上海芯豪微电子有限公司 宽带读写存储器装置
US10923204B2 (en) * 2010-08-20 2021-02-16 Attopsemi Technology Co., Ltd Fully testible OTP memory
US10916317B2 (en) 2010-08-20 2021-02-09 Attopsemi Technology Co., Ltd Programmable resistance memory on thin film transistor technology
US10586832B2 (en) 2011-02-14 2020-03-10 Attopsemi Technology Co., Ltd One-time programmable devices using gate-all-around structures
WO2013179594A1 (ja) * 2012-05-29 2013-12-05 パナソニック株式会社 半導体記憶装置
US11062786B2 (en) 2017-04-14 2021-07-13 Attopsemi Technology Co., Ltd One-time programmable memories with low power read operation and novel sensing scheme
US11615859B2 (en) 2017-04-14 2023-03-28 Attopsemi Technology Co., Ltd One-time programmable memories with ultra-low power read operation and novel sensing scheme
US10770160B2 (en) 2017-11-30 2020-09-08 Attopsemi Technology Co., Ltd Programmable resistive memory formed by bit slices from a standard cell library
KR102788153B1 (ko) * 2020-03-30 2025-03-31 에스케이하이닉스 주식회사 반도체 메모리 장치 및 이의 동작 방법
US11985134B2 (en) * 2021-02-01 2024-05-14 Bank Of America Corporation Enhanced authentication framework using EPROM grid pattern recognition
US12483429B2 (en) 2021-06-01 2025-11-25 Attopsemi Technology Co., Ltd Physically unclonable function produced using OTP memory

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5654693A (en) * 1979-10-05 1981-05-14 Hitachi Ltd Programable rom
GB2094086B (en) * 1981-03-03 1985-08-14 Tokyo Shibaura Electric Co Non-volatile semiconductor memory system
US4451903A (en) * 1981-09-14 1984-05-29 Seeq Technology, Inc. Method and device for encoding product and programming information in semiconductors
JPS59162699A (ja) * 1983-03-07 1984-09-13 Hitachi Micro Comput Eng Ltd リ−ド・オンリ・メモリ
JPS6059599A (ja) * 1983-09-13 1985-04-05 Nec Corp 不揮発性半導体メモリ
JPS6159693A (ja) * 1984-08-30 1986-03-27 Seiko Epson Corp 半導体記憶装置
JPS61207000A (ja) * 1985-03-08 1986-09-13 Toshiba Corp ワンタイム型読出し専用メモリ
JPS6258500A (ja) * 1985-09-09 1987-03-14 Fujitsu Ltd 半導体記憶装置の試験方法
JPS62143476A (ja) * 1985-12-18 1987-06-26 Fujitsu Ltd 半導体記憶装置

Also Published As

Publication number Publication date
EP0239968A2 (en) 1987-10-07
DE3786819D1 (de) 1993-09-09
KR870009397A (ko) 1987-10-26
EP0239968A3 (en) 1991-03-27
DE3786819T2 (de) 1993-12-09
JPS62229600A (ja) 1987-10-08
EP0239968B1 (en) 1993-08-04
US4879689A (en) 1989-11-07
JPH0530000B2 (https=) 1993-05-06

Similar Documents

Publication Publication Date Title
KR900006164B1 (ko) 불휘발성 반도체 기억장치
KR0172408B1 (ko) 다수상태 불휘발성 반도체 메모리 및 그의 구동방법
KR100596083B1 (ko) Ｎａｎｄ형 불휘발성 메모리
JP3373632B2 (ja) 不揮発性半導体記憶装置
US6097638A (en) Semiconductor memory device
JP3098189B2 (ja) 不揮発性半導体メモリのデータ読出回路
US6088281A (en) Semiconductor memory device
US6181605B1 (en) Global erase/program verification apparatus and method
US4841482A (en) Leakage verification for flash EPROM
KR100967007B1 (ko) 불휘발성 메모리 소자의 프로그램 검증 방법
US6504761B2 (en) Non-volatile semiconductor memory device improved sense amplification configuration
KR900006144B1 (ko) 불휘발성 반도체기억장치
US6947325B2 (en) Non-volatile semiconductor memory device and controlling method of the same
US5198997A (en) Ultraviolet erasable nonvolatile memory with current mirror circuit type sense amplifier
JPH06176585A (ja) 半導体記憶装置
US4967394A (en) Semiconductor memory device having a test cell array
US5040147A (en) Nonvolatile semiconductor memory
JP3615009B2 (ja) 半導体記憶装置
US7164602B2 (en) Nonvolatile semiconductor memory device including high efficiency and low cost redundant structure
JPWO1993019471A1 (ja) 不揮発性半導体装置
KR0159452B1 (ko) 불휘발성 메모리회로
KR102920566B1 (ko) 전압 레귤레이터를 이용하여 트립 전압을 조절하는 플래시 메모리 장치 및 그것의 센싱 방법
JPH10326495A (ja) 不揮発性半導体記憶装置
JP2000048582A (ja) 半導体記憶装置
JP3123983B2 (ja) 不揮発性半導体記憶装置

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

G160 Decision to publish patent application
PG1605 Publication of application before grant of patent

St.27 status event code: A-2-2-Q10-Q13-nap-PG1605

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

FPAY Annual fee payment

Payment date: 20030801

Year of fee payment: 14

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20040825

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20040825

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000