KR20140094619A - 저항 온도 계수 보상을 갖춘 저항기 - Google Patents

저항 온도 계수 보상을 갖춘 저항기 Download PDF

Info

Publication number
KR20140094619A
KR20140094619A KR1020147016551A KR20147016551A KR20140094619A KR 20140094619 A KR20140094619 A KR 20140094619A KR 1020147016551 A KR1020147016551 A KR 1020147016551A KR 20147016551 A KR20147016551 A KR 20147016551A KR 20140094619 A KR20140094619 A KR 20140094619A
Authority
KR
South Korea
Prior art keywords
tcr
terminals
resistor
slots
slot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020147016551A
Other languages
English (en)
Korean (ko)
Inventor
클락 엘 스미스
토마스 엘 버트쉬
토드 엘 와이어트
토마스 엘 베익
Original Assignee
비쉐이 데일 일렉트로닉스, 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 비쉐이 데일 일렉트로닉스, 인코포레이티드 filed Critical 비쉐이 데일 일렉트로닉스, 인코포레이티드
Publication of KR20140094619A publication Critical patent/KR20140094619A/ko
Ceased legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32Compensating for temperature change
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C1/00Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C1/00Details
    • H01C1/14Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
    • H01C1/148Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors the terminals embracing or surrounding the resistive element
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C17/00Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H01C17/232Adjusting the temperature coefficient; Adjusting value of resistance by adjusting temperature coefficient of resistance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C17/00Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/28Apparatus or processes specially adapted for manufacturing resistors adapted for applying terminals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C7/00Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
    • H01C7/02Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having positive temperature coefficient
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C7/00Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
    • H01C7/06Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material including means to minimise changes in resistance with changes in temperature
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49082Resistor making
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49082Resistor making
    • Y10T29/49101Applying terminal

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Non-Adjustable Resistors (AREA)
  • Details Of Resistors (AREA)
  • Thermistors And Varistors (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Control Of Electrical Variables (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR1020147016551A 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기 Ceased KR20140094619A (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US23996209P 2009-09-04 2009-09-04
US61/239,962 2009-09-04
US35900010P 2010-06-28 2010-06-28
US61/359,000 2010-06-28
PCT/US2010/047628 WO2011028870A1 (en) 2009-09-04 2010-09-02 Resistor with temperature coefficient of resistance (tcr) compensation

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020137028154A Division KR101603005B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020177013849A Division KR20170061185A (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기

Publications (1)

Publication Number Publication Date
KR20140094619A true KR20140094619A (ko) 2014-07-30

Family

ID=43647284

Family Applications (7)

Application Number Title Priority Date Filing Date
KR1020147016551A Ceased KR20140094619A (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020177025439A Active KR101895742B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020187035465A Active KR102115114B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020177013849A Ceased KR20170061185A (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020167005915A Ceased KR20160032255A (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020127008673A Active KR101398145B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020137028154A Active KR101603005B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기

Family Applications After (6)

Application Number Title Priority Date Filing Date
KR1020177025439A Active KR101895742B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020187035465A Active KR102115114B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020177013849A Ceased KR20170061185A (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020167005915A Ceased KR20160032255A (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020127008673A Active KR101398145B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기
KR1020137028154A Active KR101603005B1 (ko) 2009-09-04 2010-09-02 저항 온도 계수 보상을 갖춘 저항기

Country Status (11)

Country Link
US (10) US8198977B2 (enExample)
EP (2) EP2474008B1 (enExample)
JP (5) JP5545784B2 (enExample)
KR (7) KR20140094619A (enExample)
CN (2) CN102696079B (enExample)
ES (1) ES2967360T3 (enExample)
HU (1) HUE065457T2 (enExample)
IL (2) IL218453A (enExample)
IN (1) IN2012DN01923A (enExample)
TW (3) TWI544502B (enExample)
WO (1) WO2011028870A1 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8198977B2 (en) * 2009-09-04 2012-06-12 Vishay Dale Electronics, Inc. Resistor with temperature coefficient of resistance (TCR) compensation
US8779887B2 (en) 2010-05-13 2014-07-15 Cyntec Co., Ltd. Current sensing resistor
US9305687B2 (en) 2010-05-13 2016-04-05 Cyntec Co., Ltd. Current sensing resistor
DE102010035485A1 (de) 2010-08-26 2012-03-01 Isabellenhütte Heusler Gmbh & Co. Kg Strommesswiderstand
CN104376938B (zh) * 2013-08-13 2018-03-13 乾坤科技股份有限公司 电阻装置
US20150276881A1 (en) * 2014-03-25 2015-10-01 The Boeing Company Model-independent battery life and performance forecaster
JP6509022B2 (ja) * 2015-04-28 2019-05-08 サンコール株式会社 シャント抵抗器の製造方法
JP6795879B2 (ja) * 2015-06-15 2020-12-02 Koa株式会社 抵抗器及びその製造方法
JP6842823B2 (ja) * 2015-06-22 2021-03-17 Koa株式会社 電流検出用抵抗器
US9595518B1 (en) 2015-12-15 2017-03-14 Globalfoundries Inc. Fin-type metal-semiconductor resistors and fabrication methods thereof
DE102016014130B3 (de) * 2016-11-25 2017-11-23 Isabellenhütte Heusler Gmbh & Co. Kg Strommessvorrichtung
JP2018132386A (ja) 2017-02-14 2018-08-23 Koa株式会社 電流測定装置および電流検出用抵抗器
WO2018229817A1 (ja) * 2017-06-12 2018-12-20 新電元工業株式会社 パワーモジュール
EP3853620B1 (de) * 2018-09-21 2023-11-08 Continental Automotive Technologies GmbH Batteriesensor zur temperaturunabhängigen strommessung mit einem shunt
US11415601B2 (en) * 2018-12-21 2022-08-16 Cyntec Co., Ltd. Resistor having low temperature coefficient of resistance
JP7210335B2 (ja) * 2019-03-08 2023-01-23 サンコール株式会社 シャント抵抗器及びその製造方法
TWM581283U (zh) * 2019-04-02 2019-07-21 光頡科技股份有限公司 四端子電阻器
BR112021003117A2 (pt) 2019-05-07 2021-11-16 Invue Security Products Inc Sistemas e métodos de segurança para exibição de mercadorias
WO2021161237A1 (en) * 2020-02-12 2021-08-19 Sendyne Corporation Method of predicting thermal resistive behavior of shunts
JP7491723B2 (ja) * 2020-04-20 2024-05-28 Koa株式会社 シャント抵抗器
CN115461826B (zh) * 2020-04-27 2025-02-25 Koa株式会社 分流电阻器、分流电阻器的制造方法、以及电流检测装置
DE102020111634B3 (de) * 2020-04-29 2021-04-01 Isabellenhütte Heusler Gmbh & Co. Kg Strommesswiderstand
JP7567261B2 (ja) * 2020-07-31 2024-10-16 株式会社デンソー 電流検出装置
US11555831B2 (en) 2020-08-20 2023-01-17 Vishay Dale Electronics, Llc Resistors, current sense resistors, battery shunts, shunt resistors, and methods of making
JP7606842B2 (ja) * 2020-09-30 2024-12-26 Koa株式会社 シャント抵抗装置、および電流検出用シャント抵抗装置の特性調整方法
DE102020007556A1 (de) * 2020-12-10 2022-06-15 Wieland-Werke Aktiengesellschaft Widerstandsanordnung und Verfahren zu deren Herstellung
DE102021103241A1 (de) 2021-02-11 2022-08-11 Isabellenhütte Heusler Gmbh & Co. Kg Strommesswiderstand
JP7435505B2 (ja) * 2021-03-04 2024-02-21 トヨタ自動車株式会社 抵抗スポット溶接方法、および、抵抗スポット溶接装置
USD1069711S1 (en) 2021-05-11 2025-04-08 Vishay Dale Electronics, Llc Resistor
JP7627172B2 (ja) 2021-05-18 2025-02-05 Koa株式会社 電流検出装置
JP2023087730A (ja) 2021-12-14 2023-06-26 Koa株式会社 シャント抵抗器および電流検出装置
CN116741482A (zh) 2022-03-01 2023-09-12 国巨电子(中国)有限公司 电流感测电阻及其制造方法
DE102024109636B3 (de) * 2024-04-05 2025-07-10 Isabellenhütte Heusler Gmbh & Co. Kg Strommessanordnung sowie Herstellungsverfahren und Abgleichanlage für eine solche Strommessanordnung

Family Cites Families (71)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4079349A (en) * 1976-09-29 1978-03-14 Corning Glass Works Low TCR resistor
US4200970A (en) * 1977-04-14 1980-05-06 Milton Schonberger Method of adjusting resistance of a thermistor
JPS57117204A (en) * 1981-01-14 1982-07-21 Hitachi Ltd Method of forming thick film resistor
DE3113745A1 (de) * 1981-04-04 1982-10-21 Robert Bosch Gmbh, 7000 Stuttgart Duennschicht-dehnungsmessstreifen und verfahren zu seiner herstellung
FR2529374B1 (fr) * 1982-06-25 1985-06-21 Renix Electronique Sa Element de circuit resistif et son procede de fabrication
US4529958A (en) * 1983-05-02 1985-07-16 Dale Electronics, Inc. Electrical resistor
US4907341A (en) * 1987-02-27 1990-03-13 John Fluke Mfg. Co., Inc. Compound resistor manufacturing method
JP2639012B2 (ja) 1988-10-31 1997-08-06 キヤノン株式会社 画像処理装置
JPH0325994A (ja) * 1989-06-23 1991-02-04 Nec Corp 混成集積回路
US5015989A (en) * 1989-07-28 1991-05-14 Pacific Hybrid Microelectronics, Inc. Film resistor with enhanced trimming characteristics
JPH02110903A (ja) 1989-08-31 1990-04-24 Murata Mfg Co Ltd 抵抗体の製造方法
JP3049843B2 (ja) * 1991-04-26 2000-06-05 株式会社デンソー 抵抗体電極構造の形成方法
US5214407A (en) 1991-11-06 1993-05-25 Hewlett-Packard Company High performance current shunt
US5287083A (en) * 1992-03-30 1994-02-15 Dale Electronics, Inc. Bulk metal chip resistor
DE4243349A1 (de) 1992-12-21 1994-06-30 Heusler Isabellenhuette Herstellung von Widerständen aus Verbundmaterial
JP3284375B2 (ja) * 1993-03-10 2002-05-20 コーア株式会社 電流検出用抵抗器及びその製造方法
BE1007868A3 (nl) * 1993-12-10 1995-11-07 Koninkl Philips Electronics Nv Elektrische weerstand.
US5604477A (en) * 1994-12-07 1997-02-18 Dale Electronics, Inc. Surface mount resistor and method for making same
US5621240A (en) * 1995-09-05 1997-04-15 Delco Electronics Corp. Segmented thick film resistors
JP3637124B2 (ja) 1996-01-10 2005-04-13 ローム株式会社 チップ型抵抗器の構造及びその製造方法
DE69715091T2 (de) 1996-05-29 2003-01-02 Matsushita Electric Industrial Co., Ltd. Widerstand für Oberflächenmontage
WO1998019316A1 (en) 1996-10-30 1998-05-07 Philips Electronics N.V. Method of securing an electric contact to a ceramic layer as well as a resistance element thus manufactured
JPH10289803A (ja) * 1997-04-16 1998-10-27 Matsushita Electric Ind Co Ltd 抵抗器およびその製造方法
US5953811A (en) * 1998-01-20 1999-09-21 Emc Technology Llc Trimming temperature variable resistor
US5999085A (en) * 1998-02-13 1999-12-07 Vishay Dale Electronics, Inc. Surface mounted four terminal resistor
JPH11283802A (ja) * 1998-03-30 1999-10-15 Kyocera Corp チップ抵抗器
GB9813982D0 (en) * 1998-06-30 1998-08-26 Mem Limited Residual current detection device
DE19906276A1 (de) 1999-02-15 2000-09-21 Heusler Isabellenhuette Verfahren und Strommeßmodul zur Stromüberwachung in einem Stromversorgungssystem
JP2000269012A (ja) 1999-03-17 2000-09-29 Kooa T & T Kk 抵抗素子付きチップ型電子部品及びその製造方法
JP3366916B2 (ja) 1999-06-03 2003-01-14 スミダコーポレーション株式会社 インダクタンス素子
JP2001155902A (ja) * 1999-11-30 2001-06-08 Taiyosha Denki Kk チップ抵抗器及びチップ抵抗器の製造方法
US6401329B1 (en) * 1999-12-21 2002-06-11 Vishay Dale Electronics, Inc. Method for making overlay surface mount resistor
US6181234B1 (en) 1999-12-29 2001-01-30 Vishay Dale Electronics, Inc. Monolithic heat sinking resistor
JP4722318B2 (ja) 2000-06-05 2011-07-13 ローム株式会社 チップ抵抗器
JP2002025802A (ja) 2000-07-10 2002-01-25 Rohm Co Ltd チップ抵抗器
JP2002050501A (ja) * 2000-08-01 2002-02-15 K-Tech Devices Corp 実装体及びその使用法
JP3967553B2 (ja) 2001-03-09 2007-08-29 ローム株式会社 チップ型抵抗器の製造方法、およびチップ型抵抗器
JP3958532B2 (ja) 2001-04-16 2007-08-15 ローム株式会社 チップ抵抗器の製造方法
CN2490589Y (zh) * 2001-07-20 2002-05-08 成都希望电子研究所 一种电流采样电阻
DE20117650U1 (de) * 2001-10-29 2003-03-13 Isabellenhütte Heusler GmbH KG, 35683 Dillenburg Oberflächenmontierbarer elektrischer Widerstand
JP2003197403A (ja) * 2001-12-26 2003-07-11 Koa Corp 低抵抗器
CN100498986C (zh) 2002-06-13 2009-06-10 罗姆股份有限公司 具有低电阻值的芯片电阻器及其制造方法
JP2004047603A (ja) * 2002-07-10 2004-02-12 Matsushita Electric Ind Co Ltd 電流検出用抵抗器およびその製造方法
US20040216303A1 (en) * 2003-05-01 2004-11-04 Berlin Carl W. Thick film current sensing resistor and method
DE10328870A1 (de) 2003-06-26 2005-01-20 Isabellenhütte Heusler GmbH KG Widerstandsanordnung, Herstellungsverfahren und Messschaltung
JP2005181056A (ja) * 2003-12-18 2005-07-07 Microjenics Inc 電流検出用抵抗器
JP5008288B2 (ja) 2004-09-29 2012-08-22 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP4391918B2 (ja) * 2004-10-13 2009-12-24 コーア株式会社 電流検出用抵抗器
JP2007221006A (ja) * 2006-02-17 2007-08-30 Sanken Electric Co Ltd 抵抗体を有する抵抗器及び抵抗器による抵抗値検査方法
WO2007107013A1 (en) * 2006-03-23 2007-09-27 Microbridge Technologies Inc. Self-heating effects during operation of thermally-trimmable resistors
JP4971693B2 (ja) * 2006-06-09 2012-07-11 コーア株式会社 金属板抵抗器
US8018310B2 (en) 2006-09-27 2011-09-13 Vishay Dale Electronics, Inc. Inductor with thermally stable resistance
US7843309B2 (en) 2007-09-27 2010-11-30 Vishay Dale Electronics, Inc. Power resistor
JP5179155B2 (ja) 2007-12-07 2013-04-10 太陽社電気株式会社 チップ抵抗器
US8031043B2 (en) 2008-01-08 2011-10-04 Infineon Technologies Ag Arrangement comprising a shunt resistor and method for producing an arrangement comprising a shunt resistor
US7911319B2 (en) * 2008-02-06 2011-03-22 Vishay Dale Electronics, Inc. Resistor, and method for making same
JP5263733B2 (ja) 2008-04-24 2013-08-14 コーア株式会社 金属板抵抗器
US8242878B2 (en) 2008-09-05 2012-08-14 Vishay Dale Electronics, Inc. Resistor and method for making same
US8581687B2 (en) 2008-11-06 2013-11-12 Vishay Dale Electronics, Inc. Four-terminal resistor with four resistors and adjustable temperature coefficient of resistance
US8248202B2 (en) 2009-03-19 2012-08-21 Vishay Dale Electronics, Inc. Metal strip resistor for mitigating effects of thermal EMF
DE102009031408A1 (de) * 2009-07-01 2011-01-05 Isabellenhütte Heusler Gmbh & Co. Kg Elektronisches Bauelement und entsprechendes Herstellungsverfahren
US8198977B2 (en) 2009-09-04 2012-06-12 Vishay Dale Electronics, Inc. Resistor with temperature coefficient of resistance (TCR) compensation
TWI381170B (zh) 2009-09-17 2013-01-01 Cyntec Co Ltd 電流感測用電阻裝置與製造方法
DE102010035485A1 (de) * 2010-08-26 2012-03-01 Isabellenhütte Heusler Gmbh & Co. Kg Strommesswiderstand
ITTO20120293A1 (it) * 2012-04-03 2013-10-04 Metallux Sa Procedimento per tarare un elemento di calibrazione, e relativo dispositivo
US9396849B1 (en) 2014-03-10 2016-07-19 Vishay Dale Electronics Llc Resistor and method of manufacture
JP6795879B2 (ja) * 2015-06-15 2020-12-02 Koa株式会社 抵抗器及びその製造方法
US10438730B2 (en) 2017-10-31 2019-10-08 Cyntec Co., Ltd. Current sensing resistor and fabrication method thereof
US11415601B2 (en) 2018-12-21 2022-08-16 Cyntec Co., Ltd. Resistor having low temperature coefficient of resistance
US11555831B2 (en) 2020-08-20 2023-01-17 Vishay Dale Electronics, Llc Resistors, current sense resistors, battery shunts, shunt resistors, and methods of making
DE202021103627U1 (de) 2021-07-06 2021-07-15 Vishay Dale Electronics, Llc Elektrischer Widerstand

Also Published As

Publication number Publication date
CN102696079B (zh) 2016-03-16
TW201120923A (en) 2011-06-16
US20110057764A1 (en) 2011-03-10
US9400294B2 (en) 2016-07-26
KR101603005B1 (ko) 2016-03-18
EP2474008B1 (en) 2023-10-04
US9779860B2 (en) 2017-10-03
WO2011028870A1 (en) 2011-03-10
KR20130139350A (ko) 2013-12-20
US10796826B2 (en) 2020-10-06
KR101398145B1 (ko) 2014-05-27
CN105679474B (zh) 2020-10-02
US20140002232A1 (en) 2014-01-02
KR20120046328A (ko) 2012-05-09
TW201635316A (zh) 2016-10-01
US20250118463A1 (en) 2025-04-10
KR20160032255A (ko) 2016-03-23
US12009127B2 (en) 2024-06-11
US11562838B2 (en) 2023-01-24
EP2474008A4 (en) 2018-03-28
JP2013504213A (ja) 2013-02-04
US20120293299A1 (en) 2012-11-22
KR101895742B1 (ko) 2018-09-05
KR20170061185A (ko) 2017-06-02
TWI590265B (zh) 2017-07-01
EP4280232A3 (en) 2024-06-05
US10217550B2 (en) 2019-02-26
IL218453A0 (en) 2012-04-30
US20210020339A1 (en) 2021-01-21
IL231753A0 (en) 2014-05-28
TW201503172A (zh) 2015-01-16
US20230343495A1 (en) 2023-10-26
EP4280232A2 (en) 2023-11-22
JP2014090205A (ja) 2014-05-15
JP2014170960A (ja) 2014-09-18
IN2012DN01923A (enExample) 2015-07-24
IL231753B (en) 2019-09-26
ES2967360T3 (es) 2024-04-29
HK1175296A1 (zh) 2013-06-28
CN102696079A (zh) 2012-09-26
CN105679474A (zh) 2016-06-15
JP6586315B2 (ja) 2019-10-02
US20190326038A1 (en) 2019-10-24
US20180122538A1 (en) 2018-05-03
IL218453A (en) 2015-03-31
TWI544502B (zh) 2016-08-01
KR20170105648A (ko) 2017-09-19
JP5545784B2 (ja) 2014-07-09
JP2018160675A (ja) 2018-10-11
JP5778794B2 (ja) 2015-09-16
JP2016006899A (ja) 2016-01-14
TWI590264B (zh) 2017-07-01
US20150054531A1 (en) 2015-02-26
US8878643B2 (en) 2014-11-04
KR20180132997A (ko) 2018-12-12
US8198977B2 (en) 2012-06-12
KR102115114B1 (ko) 2020-05-25
HUE065457T2 (hu) 2024-05-28
US8525637B2 (en) 2013-09-03
HK1225852A1 (zh) 2017-09-15
US20170025206A1 (en) 2017-01-26
JP6044964B2 (ja) 2016-12-14
EP2474008A1 (en) 2012-07-11

Similar Documents

Publication Publication Date Title
KR101603005B1 (ko) 저항 온도 계수 보상을 갖춘 저항기

Legal Events

Date Code Title Description
A107 Divisional application of patent
PA0104 Divisional application for international application

Comment text: Divisional Application for International Patent

Patent event code: PA01041R01D

Patent event date: 20140617

Application number text: 1020137028154

Filing date: 20131024

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20150819

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20160222

Patent event code: PE09021S01D

AMND Amendment
E601 Decision to refuse application
PE0601 Decision on rejection of patent

Patent event date: 20161024

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 20160222

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I

PX0901 Re-examination

Patent event code: PX09011S01I

Patent event date: 20161024

Comment text: Decision to Refuse Application

Patent event code: PX09012R01I

Patent event date: 20160622

Comment text: Amendment to Specification, etc.

E601 Decision to refuse application
E801 Decision on dismissal of amendment
PE0601 Decision on rejection of patent

Patent event date: 20170220

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 20160222

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I

PE0801 Dismissal of amendment

Patent event code: PE08012E01D

Comment text: Decision on Dismissal of Amendment

Patent event date: 20170220

Patent event code: PE08011R01I

Comment text: Amendment to Specification, etc.

Patent event date: 20170123

Patent event code: PE08011R01I

Comment text: Amendment to Specification, etc.

Patent event date: 20160622

A107 Divisional application of patent
PA0104 Divisional application for international application

Comment text: Divisional Application for International Patent

Patent event code: PA01041R01D

Patent event date: 20170522

Application number text: 1020137028154

Filing date: 20131024

PC1202 Submission of document of withdrawal before decision of registration

Comment text: [Withdrawal of Procedure relating to Patent, etc.] Withdrawal (Abandonment)

Patent event code: PC12021R01D

Patent event date: 20170522

WITB Written withdrawal of application