KR20090018925A - 전자부품 제조용 개편화장치 - Google Patents
전자부품 제조용 개편화장치 Download PDFInfo
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- KR20090018925A KR20090018925A KR1020087028995A KR20087028995A KR20090018925A KR 20090018925 A KR20090018925 A KR 20090018925A KR 1020087028995 A KR1020087028995 A KR 1020087028995A KR 20087028995 A KR20087028995 A KR 20087028995A KR 20090018925 A KR20090018925 A KR 20090018925A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/53087—Means to assemble or disassemble with signal, scale, illuminator, or optical viewer
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T83/00—Cutting
- Y10T83/364—By fluid blast and/or suction
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Dicing (AREA)
Abstract
Description
Claims (5)
- 기판에 마련된 복수의 영역에 각각 장착된 반도체 칩 등을 수지밀봉함으로써 밀봉이 끝난 기판을 형성하고, 상기 밀봉이 끝난 기판을 영역마다 개편화(個片化)함으로써 복수의 전자부품을 제조할 때에 사용되는 전자부품 제조용 개편화장치로서,상기 밀봉이 끝난 기판을 수취하는 수취부와,상기 밀봉이 끝난 기판을 개편화하는 개편화부와,개편화된 상기 복수의 전자부품을 배출하는 배출부를 구성요소로서 구비함과 함께,상기 수취부와 상기 개편화부와 상기 배출부는 다른 상기 구성요소에 대하여 각각 착탈 가능하며 또한 교환 가능한 것을 특징으로 하는 전자부품 제조용 개편화장치.
- 청구항 1에 있어서,개편화된 상기 복수의 전자부품으로 이루어지는 집합체를 세정하는 세정부를 구성요소로서 구비함과 함께,상기 세정부는 다른 상기 구성요소에 대하여 착탈 가능하며 또한 교환 가능한 것을 특징으로 하는 전자부품 제조용 개편화장치.
- 청구항 1 또는 청구항 2에 있어서,개편화된 상기 복수의 전자부품을 각각 검사하는 검사부를 구성요소로서 구비함과 함께,상기 검사부는 다른 상기 구성요소에 대하여 착탈 가능하며 또한 교환 가능한 것을 특징으로 하는 전자부품 제조용 개편화장치.
- 청구항 1 내지 청구항 3 중 어느 한 항에 있어서,상기 각 구성요소 중 적어도 일부에 대하여 공통으로 적용되는 위치에 설치되어 상기 밀봉이 끝난 기판 또는 상기 집합체를 반송(搬送)하는 주(主) 반송기구를 구비하는 것을 특징으로 하는 전자부품 제조용 개편화장치.
- 청구항 1 내지 청구항 4 중 어느 한 항에 있어서,상기 개편화부는, 회전 날, 레이저광, 워터제트, 와이어소(wire saw), 또는 밴드소 중 어느 하나를 사용하는 절단기구를 가짐과 함께,상기 개편화부는 하나 또는 복수 설치되어 있는 것을 특징으로 하는 전자부품 제조용 개편화장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2006-342180 | 2006-12-20 | ||
JP2006342180A JP5215556B2 (ja) | 2006-12-20 | 2006-12-20 | 電子部品製造用の個片化装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090018925A true KR20090018925A (ko) | 2009-02-24 |
KR101034487B1 KR101034487B1 (ko) | 2011-05-17 |
Family
ID=39536085
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020087028995A KR101034487B1 (ko) | 2006-12-20 | 2007-11-07 | 전자부품 제조용 개편화장치 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20090242524A1 (ko) |
EP (1) | EP2077578A4 (ko) |
JP (1) | JP5215556B2 (ko) |
KR (1) | KR101034487B1 (ko) |
CN (1) | CN101479838B (ko) |
TW (1) | TWI415200B (ko) |
WO (1) | WO2008075446A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150000408A (ko) * | 2013-06-24 | 2015-01-02 | 토와 가부시기가이샤 | 전자 부품용의 수용 지그, 그 제조 방법 및 개편화 장치 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5399690B2 (ja) * | 2008-11-28 | 2014-01-29 | アピックヤマダ株式会社 | 切断装置 |
JP6235391B2 (ja) * | 2014-03-27 | 2017-11-22 | Towa株式会社 | 検査用治具、切断装置及び切断方法 |
CN105225988A (zh) * | 2015-09-25 | 2016-01-06 | 江苏中科晶元信息材料有限公司 | 晶片清洗检查一体机 |
KR102541489B1 (ko) | 2016-02-26 | 2023-06-08 | 삼성전자주식회사 | 기판 세정 장치 및 이를 이용한 기판 세정 설비 |
CN106057711B (zh) * | 2016-08-04 | 2018-10-02 | 中山德华芯片技术有限公司 | 一种应用于晶圆片涂胶清洗设备的除水雾装置 |
JP6845038B2 (ja) * | 2017-02-27 | 2021-03-17 | 株式会社ディスコ | パッケージ基板の分割方法 |
JP2020001504A (ja) | 2018-06-27 | 2020-01-09 | トヨタ自動車株式会社 | 駐車支援装置 |
JP7377092B2 (ja) * | 2019-12-16 | 2023-11-09 | Towa株式会社 | 統計データ生成方法、切断装置及びシステム |
US11700789B2 (en) * | 2020-05-28 | 2023-07-18 | Automated Harvesting Solutions, LLC | De-leafing apparatus for removing leaves of harvestable crops |
US11768187B2 (en) | 2020-05-28 | 2023-09-26 | Automated Harvesting Solutions, LLC | Harvester for selectively and robotically harvesting crops |
KR102163813B1 (ko) * | 2020-07-16 | 2020-10-08 | 지용남 | 피씨비 자동검사방법 및 장치 |
KR102617780B1 (ko) * | 2020-11-19 | 2023-12-26 | 세메스 주식회사 | 반도체 스트립 절단 및 분류 설비에서 공기 분사 장치 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
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US3562058A (en) * | 1967-05-16 | 1971-02-09 | Texas Instruments Inc | Method for breaking and separating substrate material |
US5776796A (en) * | 1994-05-19 | 1998-07-07 | Tessera, Inc. | Method of encapsulating a semiconductor package |
JP3085278B2 (ja) * | 1998-05-01 | 2000-09-04 | 日本電気株式会社 | 半導体装置の製造方法および半導体製造装置 |
US6426303B1 (en) * | 1999-07-16 | 2002-07-30 | Tokyo Electron Limited | Processing system |
JP4326788B2 (ja) * | 2002-11-27 | 2009-09-09 | Towa株式会社 | 半導体製造装置 |
JP2004349483A (ja) * | 2003-05-22 | 2004-12-09 | Towa Corp | 成形体の分割装置及び分割方法 |
JP4426799B2 (ja) * | 2003-09-04 | 2010-03-03 | Towa株式会社 | 基板の切断方法及び装置 |
JP4315788B2 (ja) * | 2003-11-26 | 2009-08-19 | アピックヤマダ株式会社 | 半導体装置の製造方法及び製造装置 |
JP2005190077A (ja) * | 2003-12-25 | 2005-07-14 | Towa Corp | 処理装置及び処理装置用プログラム供給方法 |
JP2006245098A (ja) * | 2005-03-01 | 2006-09-14 | Seiko Epson Corp | 電子部品及びその製造方法、並びに電子機器 |
-
2006
- 2006-12-20 JP JP2006342180A patent/JP5215556B2/ja active Active
-
2007
- 2007-11-07 WO PCT/JP2007/001222 patent/WO2008075446A1/ja active Application Filing
- 2007-11-07 EP EP07828000A patent/EP2077578A4/en not_active Withdrawn
- 2007-11-07 KR KR1020087028995A patent/KR101034487B1/ko active IP Right Grant
- 2007-11-07 US US12/438,196 patent/US20090242524A1/en not_active Abandoned
- 2007-11-07 CN CN2007800239538A patent/CN101479838B/zh not_active Expired - Fee Related
- 2007-11-22 TW TW96144249A patent/TWI415200B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150000408A (ko) * | 2013-06-24 | 2015-01-02 | 토와 가부시기가이샤 | 전자 부품용의 수용 지그, 그 제조 방법 및 개편화 장치 |
Also Published As
Publication number | Publication date |
---|---|
US20090242524A1 (en) | 2009-10-01 |
KR101034487B1 (ko) | 2011-05-17 |
TWI415200B (zh) | 2013-11-11 |
CN101479838B (zh) | 2010-12-08 |
JP2008153565A (ja) | 2008-07-03 |
CN101479838A (zh) | 2009-07-08 |
TW200845239A (en) | 2008-11-16 |
WO2008075446A1 (ja) | 2008-06-26 |
EP2077578A1 (en) | 2009-07-08 |
EP2077578A4 (en) | 2009-09-30 |
JP5215556B2 (ja) | 2013-06-19 |
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