KR20060043770A - GaN 단결정 기판의 제조 방법 및 GaN 단결정 기판 - Google Patents
GaN 단결정 기판의 제조 방법 및 GaN 단결정 기판 Download PDFInfo
- Publication number
- KR20060043770A KR20060043770A KR1020050022331A KR20050022331A KR20060043770A KR 20060043770 A KR20060043770 A KR 20060043770A KR 1020050022331 A KR1020050022331 A KR 1020050022331A KR 20050022331 A KR20050022331 A KR 20050022331A KR 20060043770 A KR20060043770 A KR 20060043770A
- Authority
- KR
- South Korea
- Prior art keywords
- gan
- substrate
- angle
- gaas
- single crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- E—FIXED CONSTRUCTIONS
- E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
- E05B—LOCKS; ACCESSORIES THEREFOR; HANDCUFFS
- E05B47/00—Operating or controlling locks or other fastening devices by electric or magnetic means
- E05B47/02—Movement of the bolt by electromagnetic means; Adaptation of locks, latches, or parts thereof, for movement of the bolt by electromagnetic means
- E05B47/026—Movement of the bolt by electromagnetic means; Adaptation of locks, latches, or parts thereof, for movement of the bolt by electromagnetic means the bolt moving rectilinearly
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/183—Epitaxial-layer growth characterised by the substrate being provided with a buffer layer, e.g. a lattice matching layer
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- E—FIXED CONSTRUCTIONS
- E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
- E05B—LOCKS; ACCESSORIES THEREFOR; HANDCUFFS
- E05B17/00—Accessories in connection with locks
- E05B17/20—Means independent of the locking mechanism for preventing unauthorised opening, e.g. for securing the bolt in the fastening position
- E05B17/2084—Means to prevent forced opening by attack, tampering or jimmying
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Electromagnetism (AREA)
- Physics & Mathematics (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
- Led Devices (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2004-00075674 | 2004-03-17 | ||
| JP2004075674 | 2004-03-17 | ||
| JPJP-P-2004-00276337 | 2004-09-24 | ||
| JP2004276337A JP3888374B2 (ja) | 2004-03-17 | 2004-09-24 | GaN単結晶基板の製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020110069032A Division KR20110088483A (ko) | 2004-03-17 | 2011-07-12 | GaN 단결정 기판의 제조 방법 및 GaN 단결정 기판 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20060043770A true KR20060043770A (ko) | 2006-05-15 |
Family
ID=34840249
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020050022331A Ceased KR20060043770A (ko) | 2004-03-17 | 2005-03-17 | GaN 단결정 기판의 제조 방법 및 GaN 단결정 기판 |
| KR1020110069032A Ceased KR20110088483A (ko) | 2004-03-17 | 2011-07-12 | GaN 단결정 기판의 제조 방법 및 GaN 단결정 기판 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020110069032A Ceased KR20110088483A (ko) | 2004-03-17 | 2011-07-12 | GaN 단결정 기판의 제조 방법 및 GaN 단결정 기판 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20050208687A1 (enExample) |
| EP (1) | EP1577933A3 (enExample) |
| JP (1) | JP3888374B2 (enExample) |
| KR (2) | KR20060043770A (enExample) |
| CN (1) | CN1670918A (enExample) |
| TW (1) | TW200532776A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101250660B1 (ko) * | 2008-10-17 | 2013-04-03 | 스미토모덴키고교가부시키가이샤 | 질화물계 반도체 발광 소자, 질화물계 반도체 발광 소자를 제작하는 방법, 및 발광 장치 |
Families Citing this family (62)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4581490B2 (ja) * | 2004-05-31 | 2010-11-17 | 日立電線株式会社 | Iii−v族窒化物系半導体自立基板の製造方法、及びiii−v族窒化物系半導体の製造方法 |
| JP4691911B2 (ja) * | 2004-06-11 | 2011-06-01 | 日立電線株式会社 | Iii−v族窒化物系半導体自立基板の製造方法 |
| KR100728533B1 (ko) * | 2004-11-23 | 2007-06-15 | 삼성코닝 주식회사 | 질화갈륨 단결정 후막 및 이의 제조방법 |
| JP4735949B2 (ja) * | 2005-04-08 | 2011-07-27 | 日立電線株式会社 | Iii−v族窒化物半導体結晶の製造方法およびiii−v族窒化物半導体基板の製造方法 |
| DE102005021099A1 (de) * | 2005-05-06 | 2006-12-07 | Universität Ulm | GaN-Schichten |
| KR100707166B1 (ko) * | 2005-10-12 | 2007-04-13 | 삼성코닝 주식회사 | GaN 기판의 제조방법 |
| JP2007119325A (ja) * | 2005-10-31 | 2007-05-17 | Sumitomo Electric Ind Ltd | Iii族窒化物結晶およびその成長方法 |
| KR100695118B1 (ko) * | 2005-12-27 | 2007-03-14 | 삼성코닝 주식회사 | 다중-프리스탠딩 GaN 웨이퍼의 제조방법 |
| GB2436398B (en) * | 2006-03-23 | 2011-08-24 | Univ Bath | Growth method using nanostructure compliant layers and HVPE for producing high quality compound semiconductor materials |
| US7803344B2 (en) * | 2006-10-25 | 2010-09-28 | The Regents Of The University Of California | Method for growing group III-nitride crystals in a mixture of supercritical ammonia and nitrogen, and group III-nitride crystals grown thereby |
| EP2016209B1 (en) * | 2006-05-08 | 2011-01-12 | Freiberger Compound Materials GmbH | Process for producing a iii-n bulk crystal and a free-standing iii -n substrate, and iii -n bulk crystal and free-standing iii-n substrate |
| JP4939844B2 (ja) * | 2006-06-08 | 2012-05-30 | ローム株式会社 | ZnO系半導体素子 |
| US8980445B2 (en) * | 2006-07-06 | 2015-03-17 | Cree, Inc. | One hundred millimeter SiC crystal grown on off-axis seed |
| JP2008028259A (ja) * | 2006-07-24 | 2008-02-07 | Mitsubishi Chemicals Corp | 単結晶GaN基板の製造方法 |
| JP4873467B2 (ja) * | 2006-07-27 | 2012-02-08 | 独立行政法人産業技術総合研究所 | オフ角を有する単結晶基板の製造方法 |
| EP1883103A3 (en) * | 2006-07-27 | 2008-03-05 | Interuniversitair Microelektronica Centrum | Deposition of group III-nitrides on Ge |
| JP5125098B2 (ja) * | 2006-12-26 | 2013-01-23 | 信越半導体株式会社 | 窒化物半導体自立基板の製造方法 |
| US8740670B2 (en) | 2006-12-28 | 2014-06-03 | Saint-Gobain Ceramics & Plastics, Inc. | Sapphire substrates and methods of making same |
| EP2094439A2 (en) | 2006-12-28 | 2009-09-02 | Saint-Gobain Ceramics & Plastics, Inc. | Sapphire substrates and methods of making same |
| KR101715024B1 (ko) | 2006-12-28 | 2017-03-10 | 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 | 사파이어 기판 |
| CA2673660C (en) | 2006-12-28 | 2012-07-24 | Saint-Gobain Ceramics & Plastics, Inc. | Sapphire substrates and methods of making same |
| EP2003696B1 (en) | 2007-06-14 | 2012-02-29 | Sumitomo Electric Industries, Ltd. | GaN substrate, substrate with epitaxial layer, semiconductor device and method of manufacturing GaN substrate |
| EP2003230A2 (en) | 2007-06-14 | 2008-12-17 | Sumitomo Electric Industries, Ltd. | GaN substrate, substrate with an epitaxial layer, semiconductor device, and GaN substrate manufacturing method |
| JP4952547B2 (ja) * | 2007-06-14 | 2012-06-13 | 住友電気工業株式会社 | GaN基板、エピタキシャル層付き基板、半導体装置、およびGaN基板の製造方法 |
| TWI604512B (zh) | 2007-06-15 | 2017-11-01 | 美國加利福尼亞大學董事會 | 非極性三族氮化物膜、使用其製造之裝置及生長其之方法 |
| EP2176878A4 (en) * | 2007-08-08 | 2010-11-17 | Univ California | PLANAR NON-POLAR PLAN M GROUP III NITRIDE FILMS THAT ARE GROWN ON CUTTING ANGLE SUBSTRATES |
| JP2009057247A (ja) * | 2007-08-31 | 2009-03-19 | Sumitomo Electric Ind Ltd | Iii族窒化物結晶の成長方法およびiii族窒化物結晶基板 |
| JP5181885B2 (ja) * | 2007-10-05 | 2013-04-10 | 住友電気工業株式会社 | GaN基板の製造方法、エピウエハの製造方法、半導体素子の製造方法およびエピウエハ |
| EP2045374A3 (en) | 2007-10-05 | 2011-02-16 | Sumitomo Electric Industries, Ltd. | Method of manufacturing a GaN substrate and a GaN epitaxial wafer |
| JP2009167066A (ja) * | 2008-01-18 | 2009-07-30 | Sumitomo Electric Ind Ltd | 窒化ガリウムの結晶成長方法および窒化ガリウム基板の製造方法 |
| JP2009170798A (ja) * | 2008-01-18 | 2009-07-30 | Sumitomo Electric Ind Ltd | Iii族窒化物半導体レーザ |
| WO2009097611A1 (en) | 2008-02-01 | 2009-08-06 | The Regents Of The University Of California | Enhancement of optical polarization of nitride light-emitting diodes by wafer off-axis cut |
| JP4730422B2 (ja) | 2008-10-24 | 2011-07-20 | 住友電気工業株式会社 | Iii族窒化物半導体電子デバイス、iii族窒化物半導体電子デバイスを作製する方法、及びiii族窒化物半導体エピタキシャルウエハ |
| JP5120285B2 (ja) * | 2009-02-05 | 2013-01-16 | 日立電線株式会社 | Iii−v族窒化物系半導体自立基板の製造方法 |
| WO2010140564A1 (ja) * | 2009-06-01 | 2010-12-09 | 三菱化学株式会社 | 窒化物半導体結晶およびその製造方法 |
| WO2010141943A1 (en) * | 2009-06-05 | 2010-12-09 | The Regents Of The University Of California | LONG WAVELENGTH NONPOLAR AND SEMIPOLAR (Al,Ga,In)N BASED LASER DIODES |
| JP5206699B2 (ja) | 2010-01-18 | 2013-06-12 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子、及びiii族窒化物半導体レーザ素子を作製する方法 |
| US7933303B2 (en) | 2009-06-17 | 2011-04-26 | Sumitomo Electric Industries, Ltd. | Group-III nitride semiconductor laser device, and method for fabricating group-III nitride semiconductor laser device |
| JP5212283B2 (ja) * | 2009-07-08 | 2013-06-19 | 日立電線株式会社 | Iii族窒化物半導体自立基板の製造方法、iii族窒化物半導体自立基板、iii族窒化物半導体デバイスの製造方法及びiii族窒化物半導体デバイス |
| DE102009042349B4 (de) * | 2009-09-20 | 2011-06-16 | Otto-Von-Guericke-Universität Magdeburg | Semipolare wurtzitische Gruppe-III-Nitrid basierte Halbleiterschichten und darauf basierende Halbleiterbauelemente |
| JP5365454B2 (ja) | 2009-09-30 | 2013-12-11 | 住友電気工業株式会社 | Iii族窒化物半導体基板、エピタキシャル基板及び半導体デバイス |
| JP4513927B1 (ja) | 2009-09-30 | 2010-07-28 | 住友電気工業株式会社 | Iii族窒化物半導体基板、エピタキシャル基板及び半導体デバイス |
| PL224995B1 (pl) * | 2010-04-06 | 2017-02-28 | Inst Wysokich Ciśnień Polskiej Akademii Nauk | Podłoże do wzrostu epitaksjalnego |
| JP5833297B2 (ja) * | 2010-05-11 | 2015-12-16 | 住友電気工業株式会社 | Iii族窒化物半導体基板、エピタキシャル基板及び半導体デバイス |
| JP6031733B2 (ja) * | 2010-09-27 | 2016-11-24 | 住友電気工業株式会社 | GaN結晶の製造方法 |
| JP5678653B2 (ja) | 2010-12-28 | 2015-03-04 | 三菱化学株式会社 | 六方晶系半導体板状結晶の製造方法 |
| JP5458037B2 (ja) * | 2011-02-18 | 2014-04-02 | 日本電信電話株式会社 | 窒化物半導体薄膜の成長方法 |
| JP5440546B2 (ja) * | 2011-04-28 | 2014-03-12 | 住友電気工業株式会社 | 結晶成長方法 |
| US20130082274A1 (en) * | 2011-09-29 | 2013-04-04 | Bridgelux, Inc. | Light emitting devices having dislocation density maintaining buffer layers |
| JP5382742B2 (ja) * | 2011-10-20 | 2014-01-08 | 独立行政法人産業技術総合研究所 | オフ角を有する単結晶基板の製造方法 |
| EP2783390A4 (en) | 2011-11-21 | 2015-12-23 | Saint Gobain Cristaux Et Detecteurs | SEMICONDUCTOR SUBSTRATE AND METHOD FOR THE PRODUCTION THEREOF |
| JP2012109624A (ja) * | 2012-03-06 | 2012-06-07 | Sumitomo Electric Ind Ltd | Iii族窒化物発光素子、及びiii族窒化物系半導体発光素子を作製する方法 |
| KR102192130B1 (ko) * | 2012-03-21 | 2020-12-17 | 프라이베르게르 컴파운드 마터리얼스 게엠베하 | Iii-n 단결정 |
| CN103378239B (zh) | 2012-04-25 | 2016-06-08 | 清华大学 | 外延结构体 |
| US9368582B2 (en) * | 2013-11-04 | 2016-06-14 | Avogy, Inc. | High power gallium nitride electronics using miscut substrates |
| GB2526078A (en) * | 2014-05-07 | 2015-11-18 | Infiniled Ltd | Methods and apparatus for improving micro-LED devices |
| FR3029942B1 (fr) * | 2014-12-11 | 2020-12-25 | Saint Gobain Lumilog | Procede de fabrication de plaquettes de nitrure d'element 13 a angle de troncature non nul |
| CN107227490B (zh) * | 2016-03-23 | 2021-06-18 | 松下知识产权经营株式会社 | Iii族氮化物半导体及其制造方法 |
| KR102680861B1 (ko) * | 2016-12-15 | 2024-07-03 | 삼성전자주식회사 | 질화 갈륨 기판의 제조 방법 |
| JP7079683B2 (ja) * | 2018-07-11 | 2022-06-02 | 住友電気工業株式会社 | 窒化ガリウム結晶基板およびその結晶評価方法 |
| EP4116468B1 (en) * | 2020-03-02 | 2024-03-06 | Sumitomo Electric Industries, Ltd. | Gallium arsenide single crystal substrate and method for producing gallium arsenide single crystal substrate |
| WO2022181322A1 (ja) | 2021-02-25 | 2022-09-01 | 日本碍子株式会社 | Iii族元素窒化物半導体基板 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH039515A (ja) * | 1989-06-07 | 1991-01-17 | Sharp Corp | 半導体装置 |
| JP3599896B2 (ja) * | 1995-05-19 | 2004-12-08 | 三洋電機株式会社 | 半導体レーザ素子および半導体レーザ素子の製造方法 |
| KR100629558B1 (ko) * | 1997-10-30 | 2006-09-27 | 스미토모덴키고교가부시키가이샤 | GaN단결정기판 및 그 제조방법 |
| JP4145437B2 (ja) * | 1999-09-28 | 2008-09-03 | 住友電気工業株式会社 | 単結晶GaNの結晶成長方法及び単結晶GaN基板の製造方法と単結晶GaN基板 |
| JP3929008B2 (ja) * | 2000-01-14 | 2007-06-13 | シャープ株式会社 | 窒化物系化合物半導体発光素子およびその製造方法 |
| US6596079B1 (en) * | 2000-03-13 | 2003-07-22 | Advanced Technology Materials, Inc. | III-V nitride substrate boule and method of making and using the same |
| US6576932B2 (en) * | 2001-03-01 | 2003-06-10 | Lumileds Lighting, U.S., Llc | Increasing the brightness of III-nitride light emitting devices |
| JP3631724B2 (ja) * | 2001-03-27 | 2005-03-23 | 日本電気株式会社 | Iii族窒化物半導体基板およびその製造方法 |
| US6773504B2 (en) * | 2001-04-12 | 2004-08-10 | Sumitomo Electric Industries, Ltd. | Oxygen doping method to gallium nitride single crystal substrate and oxygen-doped N-type gallium nitride freestanding single crystal substrate |
| US6936357B2 (en) * | 2001-07-06 | 2005-08-30 | Technologies And Devices International, Inc. | Bulk GaN and ALGaN single crystals |
| US7118813B2 (en) * | 2003-11-14 | 2006-10-10 | Cree, Inc. | Vicinal gallium nitride substrate for high quality homoepitaxy |
-
2004
- 2004-09-24 JP JP2004276337A patent/JP3888374B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-22 TW TW094105270A patent/TW200532776A/zh unknown
- 2005-03-10 EP EP05251462A patent/EP1577933A3/en not_active Withdrawn
- 2005-03-16 CN CNA2005100563144A patent/CN1670918A/zh active Pending
- 2005-03-17 US US10/907,033 patent/US20050208687A1/en not_active Abandoned
- 2005-03-17 KR KR1020050022331A patent/KR20060043770A/ko not_active Ceased
-
2008
- 2008-05-16 US US12/121,806 patent/US20080219910A1/en not_active Abandoned
-
2011
- 2011-07-12 KR KR1020110069032A patent/KR20110088483A/ko not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101250660B1 (ko) * | 2008-10-17 | 2013-04-03 | 스미토모덴키고교가부시키가이샤 | 질화물계 반도체 발광 소자, 질화물계 반도체 발광 소자를 제작하는 방법, 및 발광 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20050208687A1 (en) | 2005-09-22 |
| CN1670918A (zh) | 2005-09-21 |
| JP2005298319A (ja) | 2005-10-27 |
| TW200532776A (en) | 2005-10-01 |
| EP1577933A3 (en) | 2009-03-04 |
| EP1577933A2 (en) | 2005-09-21 |
| KR20110088483A (ko) | 2011-08-03 |
| JP3888374B2 (ja) | 2007-02-28 |
| US20080219910A1 (en) | 2008-09-11 |
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