KR20050026995A - 반도체 장치 및 그 제조방법 - Google Patents
반도체 장치 및 그 제조방법 Download PDFInfo
- Publication number
- KR20050026995A KR20050026995A KR1020040059025A KR20040059025A KR20050026995A KR 20050026995 A KR20050026995 A KR 20050026995A KR 1020040059025 A KR1020040059025 A KR 1020040059025A KR 20040059025 A KR20040059025 A KR 20040059025A KR 20050026995 A KR20050026995 A KR 20050026995A
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- semiconductor
- misfet
- silicide
- conductor layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 348
- 238000004519 manufacturing process Methods 0.000 title claims description 48
- 239000004020 conductor Substances 0.000 claims abstract description 196
- 229910052751 metal Inorganic materials 0.000 claims abstract description 141
- 239000002184 metal Substances 0.000 claims abstract description 141
- 239000012535 impurity Substances 0.000 claims abstract description 88
- 229910052721 tungsten Inorganic materials 0.000 claims abstract description 61
- 239000010937 tungsten Substances 0.000 claims abstract description 61
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims abstract description 52
- 239000000463 material Substances 0.000 claims abstract description 30
- WQJQOUPTWCFRMM-UHFFFAOYSA-N tungsten disilicide Chemical compound [Si]#[W]#[Si] WQJQOUPTWCFRMM-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910021342 tungsten silicide Inorganic materials 0.000 claims abstract description 18
- 230000015654 memory Effects 0.000 claims description 114
- 238000000034 method Methods 0.000 claims description 97
- 229910021332 silicide Inorganic materials 0.000 claims description 84
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims description 81
- 239000000758 substrate Substances 0.000 claims description 77
- 238000012546 transfer Methods 0.000 claims description 48
- 230000000295 complement effect Effects 0.000 claims description 31
- 239000003990 capacitor Substances 0.000 claims description 20
- 238000009792 diffusion process Methods 0.000 claims description 17
- 229910017052 cobalt Inorganic materials 0.000 claims description 16
- 239000010941 cobalt Substances 0.000 claims description 16
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 16
- 238000003860 storage Methods 0.000 claims description 13
- 238000000151 deposition Methods 0.000 claims description 11
- 230000006870 function Effects 0.000 claims description 11
- 238000009832 plasma treatment Methods 0.000 claims description 11
- 229910021334 nickel silicide Inorganic materials 0.000 claims description 9
- RUFLMLWJRZAWLJ-UHFFFAOYSA-N nickel silicide Chemical compound [Ni]=[Si]=[Ni] RUFLMLWJRZAWLJ-UHFFFAOYSA-N 0.000 claims description 9
- 229910021341 titanium silicide Inorganic materials 0.000 claims description 9
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 8
- 239000007789 gas Substances 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 239000011737 fluorine Substances 0.000 claims description 4
- 229910052731 fluorine Inorganic materials 0.000 claims description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 3
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 230000005669 field effect Effects 0.000 claims 13
- ZXEYZECDXFPJRJ-UHFFFAOYSA-N $l^{3}-silane;platinum Chemical compound [SiH3].[Pt] ZXEYZECDXFPJRJ-UHFFFAOYSA-N 0.000 claims 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims 2
- 229910001873 dinitrogen Inorganic materials 0.000 claims 2
- 229910021339 platinum silicide Inorganic materials 0.000 claims 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract description 66
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract description 21
- 229910052796 boron Inorganic materials 0.000 abstract description 21
- -1 tungsten nitride Chemical class 0.000 abstract description 12
- 239000010410 layer Substances 0.000 description 444
- 239000010408 film Substances 0.000 description 370
- 229910052710 silicon Inorganic materials 0.000 description 79
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 55
- 239000010703 silicon Substances 0.000 description 55
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 33
- 229910052814 silicon oxide Inorganic materials 0.000 description 33
- 230000008569 process Effects 0.000 description 29
- 238000005229 chemical vapour deposition Methods 0.000 description 28
- 229910052581 Si3N4 Inorganic materials 0.000 description 25
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 25
- 230000015572 biosynthetic process Effects 0.000 description 16
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 15
- 238000001312 dry etching Methods 0.000 description 15
- 238000005530 etching Methods 0.000 description 14
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 14
- 230000008018 melting Effects 0.000 description 13
- 238000002844 melting Methods 0.000 description 13
- 238000000206 photolithography Methods 0.000 description 13
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 11
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 11
- 230000002093 peripheral effect Effects 0.000 description 11
- 239000010936 titanium Substances 0.000 description 11
- 230000004888 barrier function Effects 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 9
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 8
- 230000002159 abnormal effect Effects 0.000 description 8
- 229910052785 arsenic Inorganic materials 0.000 description 8
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 8
- 238000002955 isolation Methods 0.000 description 8
- 229910052719 titanium Inorganic materials 0.000 description 8
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 7
- 239000013078 crystal Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- OKZIUSOJQLYFSE-UHFFFAOYSA-N difluoroboron Chemical compound F[B]F OKZIUSOJQLYFSE-UHFFFAOYSA-N 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 229910052759 nickel Inorganic materials 0.000 description 7
- 229910052698 phosphorus Inorganic materials 0.000 description 7
- 239000011574 phosphorus Substances 0.000 description 7
- 229910052697 platinum Inorganic materials 0.000 description 7
- 125000006850 spacer group Chemical group 0.000 description 7
- 239000010949 copper Substances 0.000 description 6
- 238000005468 ion implantation Methods 0.000 description 6
- 229910004298 SiO 2 Inorganic materials 0.000 description 5
- 238000000605 extraction Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 5
- 238000007254 oxidation reaction Methods 0.000 description 5
- 238000000059 patterning Methods 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- 239000010409 thin film Substances 0.000 description 5
- 229910019001 CoSi Inorganic materials 0.000 description 4
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- 229910052715 tantalum Inorganic materials 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910005881 NiSi 2 Inorganic materials 0.000 description 3
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 3
- 229910008484 TiSi Inorganic materials 0.000 description 3
- 229910021529 ammonia Inorganic materials 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 239000002356 single layer Substances 0.000 description 3
- VLJQDHDVZJXNQL-UHFFFAOYSA-N 4-methyl-n-(oxomethylidene)benzenesulfonamide Chemical compound CC1=CC=C(S(=O)(=O)N=C=O)C=C1 VLJQDHDVZJXNQL-UHFFFAOYSA-N 0.000 description 2
- 229910019974 CrSi Inorganic materials 0.000 description 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 2
- 229910017028 MnSi Inorganic materials 0.000 description 2
- 229910005883 NiSi Inorganic materials 0.000 description 2
- 229910019847 RhSi Inorganic materials 0.000 description 2
- 229910006249 ZrSi Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000002513 implantation Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 229910052748 manganese Inorganic materials 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- 229910021340 platinum monosilicide Inorganic materials 0.000 description 2
- 239000006104 solid solution Substances 0.000 description 2
- 229910052723 transition metal Inorganic materials 0.000 description 2
- 229910021350 transition metal silicide Inorganic materials 0.000 description 2
- 150000003624 transition metals Chemical class 0.000 description 2
- 238000009279 wet oxidation reaction Methods 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 206010010144 Completed suicide Diseases 0.000 description 1
- 229910005347 FeSi Inorganic materials 0.000 description 1
- 229910005329 FeSi 2 Inorganic materials 0.000 description 1
- 240000001973 Ficus microcarpa Species 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910016006 MoSi Inorganic materials 0.000 description 1
- 229910021140 PdSi Inorganic materials 0.000 description 1
- 229910019895 RuSi Inorganic materials 0.000 description 1
- KMTYGNUPYSXKGJ-UHFFFAOYSA-N [Si+4].[Si+4].[Ni++] Chemical compound [Si+4].[Si+4].[Ni++] KMTYGNUPYSXKGJ-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- IVHJCRXBQPGLOV-UHFFFAOYSA-N azanylidynetungsten Chemical compound [W]#N IVHJCRXBQPGLOV-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910000449 hafnium oxide Inorganic materials 0.000 description 1
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 1
- 230000012447 hatching Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
- H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
- H10B12/0335—Making a connection between the transistor and the capacitor, e.g. plug
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
- H10B12/48—Data lines or contacts therefor
- H10B12/485—Bit line contacts
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2003-00319727 | 2003-09-11 | ||
| JP2003319727A JP4606006B2 (ja) | 2003-09-11 | 2003-09-11 | 半導体装置の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20050026995A true KR20050026995A (ko) | 2005-03-17 |
Family
ID=34269882
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040059025A Withdrawn KR20050026995A (ko) | 2003-09-11 | 2004-07-28 | 반도체 장치 및 그 제조방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7179737B2 (enExample) |
| JP (1) | JP4606006B2 (enExample) |
| KR (1) | KR20050026995A (enExample) |
Families Citing this family (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7955972B2 (en) * | 2001-05-22 | 2011-06-07 | Novellus Systems, Inc. | Methods for growing low-resistivity tungsten for high aspect ratio and small features |
| US9076843B2 (en) | 2001-05-22 | 2015-07-07 | Novellus Systems, Inc. | Method for producing ultra-thin tungsten layers with improved step coverage |
| JP2004214607A (ja) * | 2002-12-19 | 2004-07-29 | Renesas Technology Corp | 半導体装置及びその製造方法 |
| KR100467027B1 (ko) * | 2003-01-07 | 2005-01-24 | 삼성전자주식회사 | 수직 트랜지스터로 구성된 에스램 소자 및 그 제조방법 |
| US7768044B2 (en) * | 2004-07-30 | 2010-08-03 | Agere Systems Inc. | Metal capacitor stacked with a MOS capacitor to provide increased capacitance density |
| US7575959B2 (en) * | 2004-11-26 | 2009-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
| US20060197088A1 (en) * | 2005-03-07 | 2006-09-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method of the same |
| US8405216B2 (en) * | 2005-06-29 | 2013-03-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interconnect structure for integrated circuits |
| JP5060037B2 (ja) * | 2005-10-07 | 2012-10-31 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| JP4637733B2 (ja) * | 2005-11-30 | 2011-02-23 | 富士通セミコンダクター株式会社 | 半導体装置およびその製造方法 |
| US20080090402A1 (en) * | 2006-09-29 | 2008-04-17 | Griselda Bonilla | Densifying surface of porous dielectric layer using gas cluster ion beam |
| JP5352081B2 (ja) * | 2006-12-20 | 2013-11-27 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US7772048B2 (en) * | 2007-02-23 | 2010-08-10 | Freescale Semiconductor, Inc. | Forming semiconductor fins using a sacrificial fin |
| KR101320518B1 (ko) * | 2007-10-24 | 2013-12-19 | 삼성전자주식회사 | 적층 레벨의 트랜지스터들을 갖는 집적 회로 반도체 소자및 그 제조방법 |
| US7772114B2 (en) * | 2007-12-05 | 2010-08-10 | Novellus Systems, Inc. | Method for improving uniformity and adhesion of low resistivity tungsten film |
| US8053365B2 (en) | 2007-12-21 | 2011-11-08 | Novellus Systems, Inc. | Methods for forming all tungsten contacts and lines |
| US8062977B1 (en) | 2008-01-31 | 2011-11-22 | Novellus Systems, Inc. | Ternary tungsten-containing resistive thin films |
| US8058170B2 (en) | 2008-06-12 | 2011-11-15 | Novellus Systems, Inc. | Method for depositing thin tungsten film with low resistivity and robust micro-adhesion characteristics |
| US8803245B2 (en) | 2008-06-30 | 2014-08-12 | Mcafee, Inc. | Method of forming stacked trench contacts and structures formed thereby |
| US8551885B2 (en) * | 2008-08-29 | 2013-10-08 | Novellus Systems, Inc. | Method for reducing tungsten roughness and improving reflectivity |
| JP5526529B2 (ja) * | 2008-11-18 | 2014-06-18 | 株式会社ニコン | 積層半導体装置及び積層半導体装置の製造方法 |
| KR101561059B1 (ko) | 2008-11-20 | 2015-10-16 | 삼성전자주식회사 | 반도체 소자 및 그 제조 방법 |
| US20100267230A1 (en) * | 2009-04-16 | 2010-10-21 | Anand Chandrashekar | Method for forming tungsten contacts and interconnects with small critical dimensions |
| US9159571B2 (en) | 2009-04-16 | 2015-10-13 | Lam Research Corporation | Tungsten deposition process using germanium-containing reducing agent |
| US10256142B2 (en) | 2009-08-04 | 2019-04-09 | Novellus Systems, Inc. | Tungsten feature fill with nucleation inhibition |
| US8207062B2 (en) * | 2009-09-09 | 2012-06-26 | Novellus Systems, Inc. | Method for improving adhesion of low resistivity tungsten/tungsten nitride layers |
| US8709948B2 (en) * | 2010-03-12 | 2014-04-29 | Novellus Systems, Inc. | Tungsten barrier and seed for copper filled TSV |
| JP2011210744A (ja) * | 2010-03-26 | 2011-10-20 | Toshiba Corp | 半導体装置及びその製造方法 |
| US20120153483A1 (en) * | 2010-12-20 | 2012-06-21 | Akolkar Rohan N | Barrierless single-phase interconnect |
| TWI657565B (zh) | 2011-01-14 | 2019-04-21 | 日商半導體能源研究所股份有限公司 | 半導體記憶裝置 |
| US11437269B2 (en) | 2012-03-27 | 2022-09-06 | Novellus Systems, Inc. | Tungsten feature fill with nucleation inhibition |
| US10381266B2 (en) | 2012-03-27 | 2019-08-13 | Novellus Systems, Inc. | Tungsten feature fill with nucleation inhibition |
| JP6273257B2 (ja) | 2012-03-27 | 2018-01-31 | ノベラス・システムズ・インコーポレーテッドＮｏｖｅｌｌｕｓ Ｓｙｓｔｅｍｓ Ｉｎｃｏｒｐｏｒａｔｅｄ | タングステンによるフィーチャ充填 |
| US9034760B2 (en) | 2012-06-29 | 2015-05-19 | Novellus Systems, Inc. | Methods of forming tensile tungsten films and compressive tungsten films |
| US8975184B2 (en) | 2012-07-27 | 2015-03-10 | Novellus Systems, Inc. | Methods of improving tungsten contact resistance in small critical dimension features |
| US8853080B2 (en) | 2012-09-09 | 2014-10-07 | Novellus Systems, Inc. | Method for depositing tungsten film with low roughness and low resistivity |
| US8969949B2 (en) | 2013-03-10 | 2015-03-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Structure and method for static random access memory device of vertical tunneling field effect transistor |
| US9153486B2 (en) | 2013-04-12 | 2015-10-06 | Lam Research Corporation | CVD based metal/semiconductor OHMIC contact for high volume manufacturing applications |
| US9589808B2 (en) | 2013-12-19 | 2017-03-07 | Lam Research Corporation | Method for depositing extremely low resistivity tungsten |
| US9748137B2 (en) | 2014-08-21 | 2017-08-29 | Lam Research Corporation | Method for void-free cobalt gap fill |
| US9349637B2 (en) | 2014-08-21 | 2016-05-24 | Lam Research Corporation | Method for void-free cobalt gap fill |
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| JPH05315333A (ja) | 1991-04-22 | 1993-11-26 | Toshiba Corp | 半導体装置の製造方法 |
| JP3403231B2 (ja) * | 1993-05-12 | 2003-05-06 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JPH08204009A (ja) | 1995-01-30 | 1996-08-09 | Ricoh Co Ltd | 半導体装置及び該半導体装置の製造方法 |
| JPH08264536A (ja) | 1995-03-27 | 1996-10-11 | Mitsubishi Electric Corp | 半導体装置及びその製造方法 |
| JP3391181B2 (ja) | 1996-04-11 | 2003-03-31 | 松下電器産業株式会社 | 半導体装置及びその製造方法 |
| JP3516558B2 (ja) * | 1996-08-26 | 2004-04-05 | シャープ株式会社 | 半導体装置の製造方法 |
| JP3376302B2 (ja) * | 1998-12-04 | 2003-02-10 | 株式会社東芝 | 半導体装置及びその製造方法 |
| JP2003068883A (ja) * | 2001-08-24 | 2003-03-07 | Hitachi Ltd | 半導体記憶装置 |
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| US7179737B2 (en) | 2007-02-20 |
| JP4606006B2 (ja) | 2011-01-05 |
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