KR20030026218A - 박막형성장치 및 박막형성방법 - Google Patents
박막형성장치 및 박막형성방법 Download PDFInfo
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- KR20030026218A KR20030026218A KR1020020052542A KR20020052542A KR20030026218A KR 20030026218 A KR20030026218 A KR 20030026218A KR 1020020052542 A KR1020020052542 A KR 1020020052542A KR 20020052542 A KR20020052542 A KR 20020052542A KR 20030026218 A KR20030026218 A KR 20030026218A
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- Prior art keywords
- thin film
- film forming
- substrate
- forming chamber
- pressure
- Prior art date
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- 239000010409 thin film Substances 0.000 title claims abstract description 195
- 238000000034 method Methods 0.000 title claims abstract description 35
- 239000010408 film Substances 0.000 claims abstract description 126
- 239000000758 substrate Substances 0.000 claims abstract description 111
- 238000012546 transfer Methods 0.000 claims abstract description 80
- 238000012545 processing Methods 0.000 claims abstract description 13
- 230000015572 biosynthetic process Effects 0.000 claims description 42
- 238000006073 displacement reaction Methods 0.000 claims description 9
- 238000003825 pressing Methods 0.000 claims description 7
- 230000004044 response Effects 0.000 claims description 4
- 230000006837 decompression Effects 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 description 15
- 230000008569 process Effects 0.000 description 15
- 239000010453 quartz Substances 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 239000007789 gas Substances 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 7
- 229910001873 dinitrogen Inorganic materials 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 7
- 239000002904 solvent Substances 0.000 description 6
- 230000001276 controlling effect Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000000059 patterning Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000001771 impaired effect Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229920005992 thermoplastic resin Polymers 0.000 description 2
- 230000037303 wrinkles Effects 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B37/00—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
- B32B37/10—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the pressing technique, e.g. using action of vacuum or fluid pressure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/28—Processes for applying liquids or other fluent materials performed by transfer from the surfaces of elements carrying the liquid or other fluent material, e.g. brushes, pads, rollers
- B05D1/286—Processes for applying liquids or other fluent materials performed by transfer from the surfaces of elements carrying the liquid or other fluent material, e.g. brushes, pads, rollers using a temporary backing to which the coating has been applied
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2309/00—Parameters for the laminating or treatment process; Apparatus details
- B32B2309/12—Pressure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2309/00—Parameters for the laminating or treatment process; Apparatus details
- B32B2309/60—In a particular environment
- B32B2309/68—Vacuum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/14—Semiconductor wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B37/00—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
- B32B37/02—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by a sequence of laminating steps, e.g. by adding new layers at consecutive laminating stations
- B32B37/025—Transfer laminating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/0036—Heat treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B41/00—Arrangements for controlling or monitoring lamination processes; Safety arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Fluid Mechanics (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (12)
- 그 내부가 박막형성실로 되는 처리용기와;상기 박막형성실 내에서 기판을 유지하는 기판유지수단과;상기 박막형성실 내에서 상기 기판유지수단에 대향 배치되고, 시트필름에 형성되는 박막을 상기 기판에 향한 상태로 상기 시트필름을 유지하는 필름유지수단과;상기 기판유지수단 및 필름유지수단 중 적어도 한쪽을 이동시킴으로써, 상기 기판과 상기 시트필름을 서로 눌러 상기 박막을 상기 기판에 전사하는 가중수단과;상기 가중수단의 동작상황에 따라 상기 박막형성실 내의 압력을 조정하는 압력제어수단과;를 구비한 것을 특징으로 하는 박막형성장치.
- 제1항에 있어서,상기 압력제어수단은,상기 박막형성실에 통하여 상기 박막형성실의 내부를 배기하는 배기부와;상기 배기부와 상기 박막형성실 사이에 개재되어, 상기 박막형성실로부터 상기 배기부로의 단위시간당 배기량을 조정가능한 배기조정부와;상기 가중수단의 동작상황에 따라 상기 배기조정부를 제어하여, 상기 박막형성실 내의 압력을 조정하는 압력조정부와;를 구비한 것을 특징으로 하는 박막형성장치.
- 제2항에 있어서,상기 압력조정부는,상기 기판으로 박막을 전사하기 전의 단위시간당 배기량이, 상기 기판에 박막을 전사하는 도중의 단위시간당 배기량보다 작게 설정된 것을 특징으로 하는 박막형성장치.
- 제1항에 있어서,상기 압력제어수단은,상기 박막형성실에 통하여 상기 박막형성실 내부를 배기하는 배기펌프와;상기 가중수단의 동작상황에 따라 상기 배기펌프에 인가하는 전압을 제어하여 상기 박막형성실 내의 압력을 조정하는 압력조정부와;를 구비한 것을 특징으로 하는 박막형성장치.
- 제4항에 있어서,상기 압력조정부는,상기 기판으로 박막을 전사하기 전의 상기 배기펌프의 인가전압이, 상기 박막을 기판에 전사하는 도중의 상기 배기펌프의 인가전압보다 낮게 설정된 것을 특징으로 하는 박막형성장치.
- 제1항에 있어서,상기 압력제어수단은, 상기 박막형성실에 통하여 상기 박막형성실에 가스를 공급하는 가스공급수단을 더 구비한 것을 특징으로 하는 박막형성장치.
- 박막형성실 내에서 기판과 시트필름을 서로 누름으로써, 상기 시트필름의 기판측 주면(主面)에 형성된 박막을 상기 기판에 전사하여 박막을 형성하는 박막형성장치에 있어서,상기 박막형성실을 배기하는 배기수단과;상기 배기수단에 의한 상기 박막형성실로부터 단위시간당 배기량을 조정하여, 상기 박막형성실 내의 압력이 전사 전과 전사 중에 서로 다르도록, 상기 박막형성실 내의 압력을 제어하는 압력제어수단과;를 구비한 것을 특징으로 하는 박막형성장치.
- 제7항에 있어서,상기 압력제어수단은, 전사 전부터 상기 박막형성실을 배기하여 압력을 감소시키고, 전사개시에 대응하여 상기 박막형성실로부터 단위시간당 배기량을 전사 전보다 증대시킴으로써 상기 박막형성실 내의 압력을 더 저하시키는 것을 특징으로 하는 박막형성장치.
- 제7항에 있어서,상기 압력제어수단은, 상기 박막형성실에 가스를 공급하는 가스공급수단을 더 구비한 것을 특징으로 하는 박막형성장치.
- 박막형성실 내에서 기판과 시트필름을 서로 누름으로써, 상기 시트필름의 기판측 주면에 형성된 박막을 상기 기판에 전사하여 박막을 형성하는 박막형성방법에 있어서,상기 박막형성실 내의 압력을, 전사 전과 전사 중에 서로 다르게 하는 것을 특징으로 하는 박막형성방법.
- 제10항에 있어서,전사 전부터 상기 박막형성실의 감압을 개시하고, 전사개시에 대응하여 상기 박막형성실을 전사 전보다 더 감압하는 것을 특징으로 하는 박막형성방법.
- 제11항에 있어서,상기 박막형성실로부터의 단위시간당 배기량을 조정함으로써, 상기 박막형성실 내의 압력을 제어하는 것을 특징으로 하는 박막형성방법.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001290772 | 2001-09-25 | ||
JPJP-P-2001-00290772 | 2001-09-25 | ||
JPJP-P-2002-00228343 | 2002-08-06 | ||
JP2002228343A JP3883929B2 (ja) | 2001-09-25 | 2002-08-06 | 薄膜形成装置および薄膜形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030026218A true KR20030026218A (ko) | 2003-03-31 |
KR100566790B1 KR100566790B1 (ko) | 2006-04-03 |
Family
ID=26622781
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020052542A KR100566790B1 (ko) | 2001-09-25 | 2002-09-02 | 박막형성장치 및 박막형성방법 |
Country Status (4)
Country | Link |
---|---|
US (2) | US7017637B2 (ko) |
JP (1) | JP3883929B2 (ko) |
KR (1) | KR100566790B1 (ko) |
TW (1) | TW565891B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150016671A (ko) * | 2013-08-05 | 2015-02-13 | 주식회사 엘지화학 | 전극조립체용 사행보정장치 |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006103868A1 (ja) * | 2005-03-25 | 2006-10-05 | Kitagawa Seiki Kabushiki Kaisha | プレス装置 |
JP4852476B2 (ja) * | 2007-05-30 | 2012-01-11 | 大日本スクリーン製造株式会社 | 薄膜形成装置および薄膜形成方法 |
US20090114346A1 (en) * | 2007-11-05 | 2009-05-07 | Hitachi Kokusai Electric Inc. | Substrate processing apparatus |
US9656450B2 (en) * | 2008-01-02 | 2017-05-23 | Tpk Touch Solutions, Inc. | Apparatus for laminating substrates |
US7927975B2 (en) | 2009-02-04 | 2011-04-19 | Micron Technology, Inc. | Semiconductor material manufacture |
US9300003B2 (en) * | 2013-08-05 | 2016-03-29 | Lg Chem, Ltd. | Meandering correction apparatus for electrode assembly |
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WO2015041688A1 (en) * | 2013-09-20 | 2015-03-26 | Apple Inc. | Pressure-sensing stages for lamination systems |
KR102330225B1 (ko) * | 2016-10-17 | 2021-11-22 | 신에츠 엔지니어링 가부시키가이샤 | 첩합 디바이스의 진공 첩합 장치 |
US10576493B2 (en) * | 2017-03-14 | 2020-03-03 | Tokyo Electron Limited | Substrate processing apparatus and substrate processing method |
CN108682646A (zh) * | 2018-07-11 | 2018-10-19 | 苏州焜原光电有限公司 | InSb薄膜转移装置 |
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-
2002
- 2002-08-06 JP JP2002228343A patent/JP3883929B2/ja not_active Expired - Fee Related
- 2002-08-21 TW TW091118871A patent/TW565891B/zh not_active IP Right Cessation
- 2002-09-02 KR KR1020020052542A patent/KR100566790B1/ko active IP Right Grant
- 2002-09-18 US US10/251,475 patent/US7017637B2/en not_active Expired - Lifetime
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2006
- 2006-01-12 US US11/330,449 patent/US20060113021A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150016671A (ko) * | 2013-08-05 | 2015-02-13 | 주식회사 엘지화학 | 전극조립체용 사행보정장치 |
Also Published As
Publication number | Publication date |
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JP3883929B2 (ja) | 2007-02-21 |
KR100566790B1 (ko) | 2006-04-03 |
US20060113021A1 (en) | 2006-06-01 |
US7017637B2 (en) | 2006-03-28 |
JP2003174022A (ja) | 2003-06-20 |
TW565891B (en) | 2003-12-11 |
US20030056725A1 (en) | 2003-03-27 |
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