KR102023358B1 - 저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법 - Google Patents

저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법 Download PDF

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KR102023358B1
KR102023358B1 KR1020120120534A KR20120120534A KR102023358B1 KR 102023358 B1 KR102023358 B1 KR 102023358B1 KR 1020120120534 A KR1020120120534 A KR 1020120120534A KR 20120120534 A KR20120120534 A KR 20120120534A KR 102023358 B1 KR102023358 B1 KR 102023358B1
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sensing node
clamping
memory cell
sense amplifier
resistive memory
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KR20140054714A (ko
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이승연
이영택
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삼성전자 주식회사
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Priority to KR1020120120534A priority Critical patent/KR102023358B1/ko
Priority to US13/963,417 priority patent/US9196358B2/en
Priority to CN201310484627.4A priority patent/CN103794247B/zh
Priority to JP2013217142A priority patent/JP6345405B2/ja
Publication of KR20140054714A publication Critical patent/KR20140054714A/ko
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/004—Reading or sensing circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5678—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using amorphous/crystalline phase transition storage elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5685—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using storage elements comprising metal oxide memory material, e.g. perovskites
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0061—Timing circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165—Auxiliary circuits
    • G11C11/1673—Reading or sensing circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165—Auxiliary circuits
    • G11C11/1693—Timing circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5607—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0007—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70—Resistive array aspects
    • G11C2213/71—Three dimensional array
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70—Resistive array aspects
    • G11C2213/72—Array wherein the access device being a diode

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Mram Or Spin Memory Techniques (AREA)
KR1020120120534A 2012-10-29 2012-10-29 저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법 Active KR102023358B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020120120534A KR102023358B1 (ko) 2012-10-29 2012-10-29 저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법
US13/963,417 US9196358B2 (en) 2012-10-29 2013-08-09 Nonvolatile memory device using variable resistance material and method for driving the same
CN201310484627.4A CN103794247B (zh) 2012-10-29 2013-10-16 使用可变电阻材料的非易失性存储器装置
JP2013217142A JP6345405B2 (ja) 2012-10-29 2013-10-18 抵抗体を利用した不揮発性メモリ装置及びその駆動方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020120120534A KR102023358B1 (ko) 2012-10-29 2012-10-29 저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법

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KR20140054714A KR20140054714A (ko) 2014-05-09
KR102023358B1 true KR102023358B1 (ko) 2019-09-20

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US (1) US9196358B2 (enExample)
JP (1) JP6345405B2 (enExample)
KR (1) KR102023358B1 (enExample)
CN (1) CN103794247B (enExample)

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KR102024523B1 (ko) * 2012-12-26 2019-09-24 삼성전자 주식회사 저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법
KR101753366B1 (ko) * 2014-10-29 2017-07-03 삼성전자 주식회사 저항성 메모리 장치 및 저항성 메모리 장치의 동작 방법
KR20160074238A (ko) * 2014-12-18 2016-06-28 에스케이하이닉스 주식회사 전자 장치 및 전자 장치의 동작 방법
US9786346B2 (en) 2015-05-20 2017-10-10 Micron Technology, Inc. Virtual ground sensing circuitry and related devices, systems, and methods for crosspoint ferroelectric memory
KR102358564B1 (ko) * 2015-09-02 2022-02-04 삼성전자주식회사 단락된 메모리 셀의 가변 저항 소자를 갖는 반도체 메모리 장치
US9478277B1 (en) * 2015-09-03 2016-10-25 Bo Liu Tri-level-cell DRAM and sense amplifier with alternating offset voltage
KR20170048892A (ko) * 2015-10-27 2017-05-10 에스케이하이닉스 주식회사 보정회로 및 보정방법
DE102016110049A1 (de) * 2016-05-31 2017-11-30 Infineon Technologies Ag Ermitteln eines Zustands einer Speicherzelle
KR102619682B1 (ko) * 2016-12-13 2023-12-28 삼성전자주식회사 메모리 장치 및 그 동작 방법
US10032489B1 (en) 2017-03-15 2018-07-24 Sandisk Technologies Llc Sensing amplifier to detect the memory cell current transition
JP2019057347A (ja) * 2017-09-20 2019-04-11 東芝メモリ株式会社 抵抗変化メモリ装置
KR102401183B1 (ko) * 2017-12-05 2022-05-24 삼성전자주식회사 메모리 장치 및 그 동작 방법
US10345841B1 (en) * 2018-06-12 2019-07-09 Nxp Usa, Inc. Current source with variable resistor circuit
WO2020000231A1 (zh) * 2018-06-27 2020-01-02 江苏时代全芯存储科技股份有限公司 记忆体驱动装置
US11416416B2 (en) * 2019-01-13 2022-08-16 Ememory Technology Inc. Random code generator with non-volatile memory

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JP2014089792A (ja) 2014-05-15
KR20140054714A (ko) 2014-05-09
CN103794247A (zh) 2014-05-14
JP6345405B2 (ja) 2018-06-20
US20140119095A1 (en) 2014-05-01
CN103794247B (zh) 2018-11-23
US9196358B2 (en) 2015-11-24

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