KR101756904B1 - 광학 필름 첩부 위치 측정 장치 - Google Patents

광학 필름 첩부 위치 측정 장치 Download PDF

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Publication number
KR101756904B1
KR101756904B1 KR1020150034962A KR20150034962A KR101756904B1 KR 101756904 B1 KR101756904 B1 KR 101756904B1 KR 1020150034962 A KR1020150034962 A KR 1020150034962A KR 20150034962 A KR20150034962 A KR 20150034962A KR 101756904 B1 KR101756904 B1 KR 101756904B1
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KR
South Korea
Prior art keywords
optical film
optical
display device
position measuring
light source
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KR1020150034962A
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English (en)
Korean (ko)
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KR20160018328A (ko
Inventor
토모카즈 유라
사토루 고시오
Original Assignee
닛토덴코 가부시키가이샤
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Publication of KR20160018328A publication Critical patent/KR20160018328A/ko
Application granted granted Critical
Publication of KR101756904B1 publication Critical patent/KR101756904B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mathematical Physics (AREA)
KR1020150034962A 2014-08-07 2015-03-13 광학 필름 첩부 위치 측정 장치 KR101756904B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201420442537.9U CN204128496U (zh) 2014-08-07 2014-08-07 光学膜贴合位置测定装置及光学显示装置生产线
CN201420442537.9 2014-08-07

Publications (2)

Publication Number Publication Date
KR20160018328A KR20160018328A (ko) 2016-02-17
KR101756904B1 true KR101756904B1 (ko) 2017-07-11

Family

ID=52384845

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020150034962A KR101756904B1 (ko) 2014-08-07 2015-03-13 광학 필름 첩부 위치 측정 장치

Country Status (5)

Country Link
JP (1) JP5924511B2 (zh)
KR (1) KR101756904B1 (zh)
CN (1) CN204128496U (zh)
TW (1) TWI592715B (zh)
WO (1) WO2016021463A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101955757B1 (ko) * 2016-06-08 2019-03-07 삼성에스디아이 주식회사 필름 처리장치 및 처리방법
WO2018003578A1 (ja) * 2016-06-30 2018-01-04 日本電産サンキョー株式会社 アライメント装置
TWI745129B (zh) * 2020-10-20 2021-11-01 住華科技股份有限公司 光學膜偵測系統及應用其之光學膜偵測方法
JP2022090247A (ja) * 2020-12-07 2022-06-17 日東電工株式会社 光学フィルムの縁部検出方法
JP2022090281A (ja) * 2020-12-07 2022-06-17 日東電工株式会社 光学フィルムの縁部検出方法
CN112596286B (zh) * 2020-12-15 2022-11-04 滁州惠科光电科技有限公司 一种偏光片检测方法、装置及偏光片贴附机
CN114111607B (zh) * 2021-09-30 2024-01-23 杭州徐睿机械有限公司 一种跳转接头压装组件间隙的检测装置及检测方法
CN114505813B (zh) * 2022-01-19 2023-05-05 业成科技（成都）有限公司 贴合装置及贴合方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005165097A (ja) 2003-12-04 2005-06-23 Yamatake Corp 偏光板貼り付け位置検査装置
JP2006126483A (ja) 2004-10-28 2006-05-18 Sharp Corp 液晶表示パネルの製造方法および液晶表示パネルの製造装置
JP2007212939A (ja) 2006-02-13 2007-08-23 Hitachi High-Technologies Corp 位置ずれ検査方法、プログラム及び位置ずれ検査装置
WO2013174112A1 (zh) 2012-05-22 2013-11-28 北京京东方光电科技有限公司 偏光板贴附精度检测装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3948522B2 (ja) 2003-01-30 2007-07-25 株式会社タカトリ 液晶パネルの偏光板貼付け精度検査方法
KR100955486B1 (ko) * 2004-01-30 2010-04-30 삼성전자주식회사 디스플레이 패널의 검사장치 및 검사방법
JP4774123B1 (ja) 2010-03-18 2011-09-14 住友化学株式会社 偏光板の貼合精度検査方法および貼合精度検査装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005165097A (ja) 2003-12-04 2005-06-23 Yamatake Corp 偏光板貼り付け位置検査装置
JP2006126483A (ja) 2004-10-28 2006-05-18 Sharp Corp 液晶表示パネルの製造方法および液晶表示パネルの製造装置
JP2007212939A (ja) 2006-02-13 2007-08-23 Hitachi High-Technologies Corp 位置ずれ検査方法、プログラム及び位置ずれ検査装置
WO2013174112A1 (zh) 2012-05-22 2013-11-28 北京京东方光电科技有限公司 偏光板贴附精度检测装置及方法

Also Published As

Publication number Publication date
JP5924511B2 (ja) 2016-05-25
TWI592715B (zh) 2017-07-21
TW201606382A (zh) 2016-02-16
CN204128496U (zh) 2015-01-28
JP2016038565A (ja) 2016-03-22
KR20160018328A (ko) 2016-02-17
WO2016021463A1 (ja) 2016-02-11

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