KR101118457B1 - 자기 센서 회로 - Google Patents

자기 센서 회로 Download PDF

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Publication number
KR101118457B1
KR101118457B1 KR1020097014905A KR20097014905A KR101118457B1 KR 101118457 B1 KR101118457 B1 KR 101118457B1 KR 1020097014905 A KR1020097014905 A KR 1020097014905A KR 20097014905 A KR20097014905 A KR 20097014905A KR 101118457 B1 KR101118457 B1 KR 101118457B1
Authority
KR
South Korea
Prior art keywords
voltage
output
circuit
switch
hall
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020097014905A
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English (en)
Korean (ko)
Other versions
KR20100039269A (ko
Inventor
마사카즈 스기우라
Original Assignee
세이코 인스트루 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 세이코 인스트루 가부시키가이샤 filed Critical 세이코 인스트루 가부시키가이샤
Publication of KR20100039269A publication Critical patent/KR20100039269A/ko
Application granted granted Critical
Publication of KR101118457B1 publication Critical patent/KR101118457B1/ko
Expired - Fee Related legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
KR1020097014905A 2007-07-25 2008-07-10 자기 센서 회로 Expired - Fee Related KR101118457B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2007-193084 2007-07-25
JP2007193084A JP5052982B2 (ja) 2007-07-25 2007-07-25 磁気センサ回路

Publications (2)

Publication Number Publication Date
KR20100039269A KR20100039269A (ko) 2010-04-15
KR101118457B1 true KR101118457B1 (ko) 2012-03-06

Family

ID=40281271

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020097014905A Expired - Fee Related KR101118457B1 (ko) 2007-07-25 2008-07-10 자기 센서 회로

Country Status (8)

Country Link
US (1) US8274281B2 (enExample)
EP (1) EP2101184B1 (enExample)
JP (1) JP5052982B2 (enExample)
KR (1) KR101118457B1 (enExample)
CN (1) CN101802632B (enExample)
AT (1) ATE527551T1 (enExample)
TW (1) TWI427311B (enExample)
WO (1) WO2009014013A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009055486A1 (en) 2007-10-22 2009-04-30 Dow Global Technologies, Inc. Polymeric compositions and processes for molding articles
JP2010281764A (ja) * 2009-06-08 2010-12-16 Sanyo Electric Co Ltd オフセットキャンセル回路
JP2011075338A (ja) * 2009-09-29 2011-04-14 Seiko Instruments Inc 磁気センサ回路
JP5411818B2 (ja) * 2010-08-26 2014-02-12 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体装置
TWI439046B (zh) 2011-08-12 2014-05-21 Richtek Technology Corp 自動調零放大器及相關的偵測模組
JP5926081B2 (ja) * 2012-03-22 2016-05-25 エスアイアイ・セミコンダクタ株式会社 センサ装置
US9638548B2 (en) 2012-05-07 2017-05-02 Infineon Technologies Ag Output switching systems and methods for magnetic field sensors
US9395422B2 (en) 2012-05-11 2016-07-19 Asahi Kasei Microdevices Corporation Magnetism detection device and magnetism detection method
JP6004758B2 (ja) * 2012-06-07 2016-10-12 エスアイアイ・セミコンダクタ株式会社 磁気センサ
CN102854535B (zh) * 2012-08-24 2015-03-11 中国船舶重工集团公司第七二二研究所 一种宽带磁性传感器
JP6503198B2 (ja) * 2015-03-05 2019-04-17 エイブリック株式会社 比較回路およびセンサ装置
JP2018054473A (ja) * 2016-09-29 2018-04-05 アイシン精機株式会社 磁気センサ及び磁気センサシステム
US11016151B2 (en) * 2018-03-14 2021-05-25 Ablic Inc. Semiconductor device and method of adjusting the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005260629A (ja) 2004-03-12 2005-09-22 Toko Inc 磁気センサ回路
JP2005300303A (ja) 2004-04-09 2005-10-27 Toko Inc センサ回路

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2776783B2 (ja) 1995-12-19 1998-07-16 埼玉日本電気株式会社 移動状態検出回路
US6777932B2 (en) * 2000-03-23 2004-08-17 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor
JP4451577B2 (ja) * 2001-07-26 2010-04-14 パナソニック株式会社 磁界センサ
JP3887275B2 (ja) * 2002-07-03 2007-02-28 東光株式会社 センサ回路
KR100909925B1 (ko) * 2005-02-08 2009-07-29 로무 가부시키가이샤 자기 센서 회로 및 그 자기 센서 회로를 갖는 휴대 단말기

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005260629A (ja) 2004-03-12 2005-09-22 Toko Inc 磁気センサ回路
JP2005300303A (ja) 2004-04-09 2005-10-27 Toko Inc センサ回路

Also Published As

Publication number Publication date
ATE527551T1 (de) 2011-10-15
KR20100039269A (ko) 2010-04-15
TW200925629A (en) 2009-06-16
JP5052982B2 (ja) 2012-10-17
EP2101184A4 (en) 2010-09-15
JP2009031027A (ja) 2009-02-12
EP2101184B1 (en) 2011-10-05
WO2009014013A1 (ja) 2009-01-29
CN101802632A (zh) 2010-08-11
US8274281B2 (en) 2012-09-25
CN101802632B (zh) 2013-04-24
US20100117640A1 (en) 2010-05-13
TWI427311B (zh) 2014-02-21
EP2101184A1 (en) 2009-09-16

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