CN101802632B - 磁性传感器电路 - Google Patents

磁性传感器电路 Download PDF

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Publication number
CN101802632B
CN101802632B CN2008801005999A CN200880100599A CN101802632B CN 101802632 B CN101802632 B CN 101802632B CN 2008801005999 A CN2008801005999 A CN 2008801005999A CN 200880100599 A CN200880100599 A CN 200880100599A CN 101802632 B CN101802632 B CN 101802632B
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CN
China
Prior art keywords
voltage
circuit
output
hall
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2008801005999A
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English (en)
Chinese (zh)
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CN101802632A (zh
Inventor
杉浦正一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Seiko Instruments Inc
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Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Publication of CN101802632A publication Critical patent/CN101802632A/zh
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Publication of CN101802632B publication Critical patent/CN101802632B/zh
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
CN2008801005999A 2007-07-25 2008-07-10 磁性传感器电路 Expired - Fee Related CN101802632B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007193084A JP5052982B2 (ja) 2007-07-25 2007-07-25 磁気センサ回路
JP2007-193084 2007-07-25
PCT/JP2008/062522 WO2009014013A1 (ja) 2007-07-25 2008-07-10 磁気センサ回路

Publications (2)

Publication Number Publication Date
CN101802632A CN101802632A (zh) 2010-08-11
CN101802632B true CN101802632B (zh) 2013-04-24

Family

ID=40281271

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008801005999A Expired - Fee Related CN101802632B (zh) 2007-07-25 2008-07-10 磁性传感器电路

Country Status (8)

Country Link
US (1) US8274281B2 (enExample)
EP (1) EP2101184B1 (enExample)
JP (1) JP5052982B2 (enExample)
KR (1) KR101118457B1 (enExample)
CN (1) CN101802632B (enExample)
AT (1) ATE527551T1 (enExample)
TW (1) TWI427311B (enExample)
WO (1) WO2009014013A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101406772B1 (ko) 2007-10-22 2014-06-19 다우 글로벌 테크놀로지스 엘엘씨 중합체 조성물 및 제품의 성형방법
JP2010281764A (ja) * 2009-06-08 2010-12-16 Sanyo Electric Co Ltd オフセットキャンセル回路
JP2011075338A (ja) 2009-09-29 2011-04-14 Seiko Instruments Inc 磁気センサ回路
JP5411818B2 (ja) * 2010-08-26 2014-02-12 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体装置
TWI439046B (zh) 2011-08-12 2014-05-21 Richtek Technology Corp 自動調零放大器及相關的偵測模組
JP5926081B2 (ja) * 2012-03-22 2016-05-25 エスアイアイ・セミコンダクタ株式会社 センサ装置
US9638548B2 (en) 2012-05-07 2017-05-02 Infineon Technologies Ag Output switching systems and methods for magnetic field sensors
EP2848957B1 (en) 2012-05-11 2017-03-29 Asahi Kasei Microdevices Corporation Magnetism detection device and magnetism detection method
JP6004758B2 (ja) * 2012-06-07 2016-10-12 エスアイアイ・セミコンダクタ株式会社 磁気センサ
CN102854535B (zh) * 2012-08-24 2015-03-11 中国船舶重工集团公司第七二二研究所 一种宽带磁性传感器
JP6503198B2 (ja) * 2015-03-05 2019-04-17 エイブリック株式会社 比較回路およびセンサ装置
JP2018054473A (ja) * 2016-09-29 2018-04-05 アイシン精機株式会社 磁気センサ及び磁気センサシステム
US11016151B2 (en) * 2018-03-14 2021-05-25 Ablic Inc. Semiconductor device and method of adjusting the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1319765A (zh) * 2000-03-23 2001-10-31 松下电器产业株式会社 磁场传感器
US6727684B2 (en) * 2001-07-26 2004-04-27 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2776783B2 (ja) 1995-12-19 1998-07-16 埼玉日本電気株式会社 移動状態検出回路
JP3887275B2 (ja) * 2002-07-03 2007-02-28 東光株式会社 センサ回路
JP4049757B2 (ja) * 2004-03-12 2008-02-20 東光株式会社 磁気センサ回路
JP4303631B2 (ja) * 2004-04-09 2009-07-29 東光株式会社 センサ回路
JP4901720B2 (ja) * 2005-02-08 2012-03-21 ローム株式会社 磁気センサ回路、及び、その磁気センサ回路を有する携帯端末

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1319765A (zh) * 2000-03-23 2001-10-31 松下电器产业株式会社 磁场传感器
US6727684B2 (en) * 2001-07-26 2004-04-27 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
JP特开2004-37221A 2004.02.05
JP特开2005-260629A 2005.09.22
JP特开2005-300303A 2005.10.27

Also Published As

Publication number Publication date
US20100117640A1 (en) 2010-05-13
TWI427311B (zh) 2014-02-21
ATE527551T1 (de) 2011-10-15
JP2009031027A (ja) 2009-02-12
EP2101184A1 (en) 2009-09-16
CN101802632A (zh) 2010-08-11
US8274281B2 (en) 2012-09-25
JP5052982B2 (ja) 2012-10-17
EP2101184A4 (en) 2010-09-15
KR101118457B1 (ko) 2012-03-06
TW200925629A (en) 2009-06-16
EP2101184B1 (en) 2011-10-05
KR20100039269A (ko) 2010-04-15
WO2009014013A1 (ja) 2009-01-29

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SE01 Entry into force of request for substantive examination
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C41 Transfer of patent application or patent right or utility model
TR01 Transfer of patent right

Effective date of registration: 20160311

Address after: Chiba County, Japan

Patentee after: SEIKO INSTR INC

Address before: Chiba County, Japan

Patentee before: Seiko Instruments Inc.

CP01 Change in the name or title of a patent holder

Address after: Chiba County, Japan

Patentee after: EPPs Lingke Co. Ltd.

Address before: Chiba County, Japan

Patentee before: SEIKO INSTR INC

CP01 Change in the name or title of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130424

Termination date: 20200710

CF01 Termination of patent right due to non-payment of annual fee