TWI427311B - Magnetic sensor circuit - Google Patents

Magnetic sensor circuit Download PDF

Info

Publication number
TWI427311B
TWI427311B TW097126654A TW97126654A TWI427311B TW I427311 B TWI427311 B TW I427311B TW 097126654 A TW097126654 A TW 097126654A TW 97126654 A TW97126654 A TW 97126654A TW I427311 B TWI427311 B TW I427311B
Authority
TW
Taiwan
Prior art keywords
voltage
circuit
output
hall
magnetic sensor
Prior art date
Application number
TW097126654A
Other languages
English (en)
Chinese (zh)
Other versions
TW200925629A (en
Inventor
Masakazu Sugiura
Original Assignee
Seiko Instr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr Inc filed Critical Seiko Instr Inc
Publication of TW200925629A publication Critical patent/TW200925629A/zh
Application granted granted Critical
Publication of TWI427311B publication Critical patent/TWI427311B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
TW097126654A 2007-07-25 2008-07-14 Magnetic sensor circuit TWI427311B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007193084A JP5052982B2 (ja) 2007-07-25 2007-07-25 磁気センサ回路

Publications (2)

Publication Number Publication Date
TW200925629A TW200925629A (en) 2009-06-16
TWI427311B true TWI427311B (zh) 2014-02-21

Family

ID=40281271

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097126654A TWI427311B (zh) 2007-07-25 2008-07-14 Magnetic sensor circuit

Country Status (8)

Country Link
US (1) US8274281B2 (enExample)
EP (1) EP2101184B1 (enExample)
JP (1) JP5052982B2 (enExample)
KR (1) KR101118457B1 (enExample)
CN (1) CN101802632B (enExample)
AT (1) ATE527551T1 (enExample)
TW (1) TWI427311B (enExample)
WO (1) WO2009014013A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101406772B1 (ko) 2007-10-22 2014-06-19 다우 글로벌 테크놀로지스 엘엘씨 중합체 조성물 및 제품의 성형방법
JP2010281764A (ja) * 2009-06-08 2010-12-16 Sanyo Electric Co Ltd オフセットキャンセル回路
JP2011075338A (ja) 2009-09-29 2011-04-14 Seiko Instruments Inc 磁気センサ回路
JP5411818B2 (ja) * 2010-08-26 2014-02-12 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体装置
TWI439046B (zh) 2011-08-12 2014-05-21 Richtek Technology Corp 自動調零放大器及相關的偵測模組
JP5926081B2 (ja) * 2012-03-22 2016-05-25 エスアイアイ・セミコンダクタ株式会社 センサ装置
US9638548B2 (en) 2012-05-07 2017-05-02 Infineon Technologies Ag Output switching systems and methods for magnetic field sensors
EP2848957B1 (en) 2012-05-11 2017-03-29 Asahi Kasei Microdevices Corporation Magnetism detection device and magnetism detection method
JP6004758B2 (ja) * 2012-06-07 2016-10-12 エスアイアイ・セミコンダクタ株式会社 磁気センサ
CN102854535B (zh) * 2012-08-24 2015-03-11 中国船舶重工集团公司第七二二研究所 一种宽带磁性传感器
JP6503198B2 (ja) * 2015-03-05 2019-04-17 エイブリック株式会社 比較回路およびセンサ装置
JP2018054473A (ja) * 2016-09-29 2018-04-05 アイシン精機株式会社 磁気センサ及び磁気センサシステム
US11016151B2 (en) * 2018-03-14 2021-05-25 Ablic Inc. Semiconductor device and method of adjusting the same

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004037221A (ja) * 2002-07-03 2004-02-05 Toko Inc センサ回路
JP2005260629A (ja) * 2004-03-12 2005-09-22 Toko Inc 磁気センサ回路
JP2005300303A (ja) * 2004-04-09 2005-10-27 Toko Inc センサ回路
TW200640135A (en) * 2005-02-08 2006-11-16 Rohm Co Ltd Magnetic sensor circuit and portable terminal provided with such magnetic sensor circuit

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2776783B2 (ja) 1995-12-19 1998-07-16 埼玉日本電気株式会社 移動状態検出回路
US6777932B2 (en) * 2000-03-23 2004-08-17 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor
JP4451577B2 (ja) * 2001-07-26 2010-04-14 パナソニック株式会社 磁界センサ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004037221A (ja) * 2002-07-03 2004-02-05 Toko Inc センサ回路
JP2005260629A (ja) * 2004-03-12 2005-09-22 Toko Inc 磁気センサ回路
JP2005300303A (ja) * 2004-04-09 2005-10-27 Toko Inc センサ回路
TW200640135A (en) * 2005-02-08 2006-11-16 Rohm Co Ltd Magnetic sensor circuit and portable terminal provided with such magnetic sensor circuit

Also Published As

Publication number Publication date
US20100117640A1 (en) 2010-05-13
CN101802632B (zh) 2013-04-24
ATE527551T1 (de) 2011-10-15
JP2009031027A (ja) 2009-02-12
EP2101184A1 (en) 2009-09-16
CN101802632A (zh) 2010-08-11
US8274281B2 (en) 2012-09-25
JP5052982B2 (ja) 2012-10-17
EP2101184A4 (en) 2010-09-15
KR101118457B1 (ko) 2012-03-06
TW200925629A (en) 2009-06-16
EP2101184B1 (en) 2011-10-05
KR20100039269A (ko) 2010-04-15
WO2009014013A1 (ja) 2009-01-29

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees