WO2009014013A1 - 磁気センサ回路 - Google Patents

磁気センサ回路 Download PDF

Info

Publication number
WO2009014013A1
WO2009014013A1 PCT/JP2008/062522 JP2008062522W WO2009014013A1 WO 2009014013 A1 WO2009014013 A1 WO 2009014013A1 JP 2008062522 W JP2008062522 W JP 2008062522W WO 2009014013 A1 WO2009014013 A1 WO 2009014013A1
Authority
WO
WIPO (PCT)
Prior art keywords
sensor circuit
magnetic sensor
configures
comparator
eliminating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/062522
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Masakazu Sugiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to CN2008801005999A priority Critical patent/CN101802632B/zh
Priority to EP08791070A priority patent/EP2101184B1/en
Priority to AT08791070T priority patent/ATE527551T1/de
Priority to US12/594,894 priority patent/US8274281B2/en
Publication of WO2009014013A1 publication Critical patent/WO2009014013A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
PCT/JP2008/062522 2007-07-25 2008-07-10 磁気センサ回路 Ceased WO2009014013A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN2008801005999A CN101802632B (zh) 2007-07-25 2008-07-10 磁性传感器电路
EP08791070A EP2101184B1 (en) 2007-07-25 2008-07-10 Magnetic sensor circuit
AT08791070T ATE527551T1 (de) 2007-07-25 2008-07-10 Magnetsensorschaltung
US12/594,894 US8274281B2 (en) 2007-07-25 2008-07-10 Magnetic sensor circuit for detecting and monitoring a magnetic field

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007193084A JP5052982B2 (ja) 2007-07-25 2007-07-25 磁気センサ回路
JP2007-193084 2007-07-25

Publications (1)

Publication Number Publication Date
WO2009014013A1 true WO2009014013A1 (ja) 2009-01-29

Family

ID=40281271

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/062522 Ceased WO2009014013A1 (ja) 2007-07-25 2008-07-10 磁気センサ回路

Country Status (8)

Country Link
US (1) US8274281B2 (enExample)
EP (1) EP2101184B1 (enExample)
JP (1) JP5052982B2 (enExample)
KR (1) KR101118457B1 (enExample)
CN (1) CN101802632B (enExample)
AT (1) ATE527551T1 (enExample)
TW (1) TWI427311B (enExample)
WO (1) WO2009014013A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102033212A (zh) * 2009-09-29 2011-04-27 精工电子有限公司 磁性传感器电路

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101406772B1 (ko) 2007-10-22 2014-06-19 다우 글로벌 테크놀로지스 엘엘씨 중합체 조성물 및 제품의 성형방법
JP2010281764A (ja) * 2009-06-08 2010-12-16 Sanyo Electric Co Ltd オフセットキャンセル回路
JP5411818B2 (ja) * 2010-08-26 2014-02-12 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体装置
TWI439046B (zh) 2011-08-12 2014-05-21 Richtek Technology Corp 自動調零放大器及相關的偵測模組
JP5926081B2 (ja) * 2012-03-22 2016-05-25 エスアイアイ・セミコンダクタ株式会社 センサ装置
US9638548B2 (en) 2012-05-07 2017-05-02 Infineon Technologies Ag Output switching systems and methods for magnetic field sensors
EP2848957B1 (en) 2012-05-11 2017-03-29 Asahi Kasei Microdevices Corporation Magnetism detection device and magnetism detection method
JP6004758B2 (ja) * 2012-06-07 2016-10-12 エスアイアイ・セミコンダクタ株式会社 磁気センサ
CN102854535B (zh) * 2012-08-24 2015-03-11 中国船舶重工集团公司第七二二研究所 一种宽带磁性传感器
JP6503198B2 (ja) * 2015-03-05 2019-04-17 エイブリック株式会社 比較回路およびセンサ装置
JP2018054473A (ja) * 2016-09-29 2018-04-05 アイシン精機株式会社 磁気センサ及び磁気センサシステム
US11016151B2 (en) * 2018-03-14 2021-05-25 Ablic Inc. Semiconductor device and method of adjusting the same

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09166405A (ja) 1995-12-19 1997-06-24 Saitama Nippon Denki Kk 移動状態検出回路
JP2004037221A (ja) * 2002-07-03 2004-02-05 Toko Inc センサ回路
JP2005260629A (ja) * 2004-03-12 2005-09-22 Toko Inc 磁気センサ回路
JP2005300303A (ja) * 2004-04-09 2005-10-27 Toko Inc センサ回路

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6777932B2 (en) * 2000-03-23 2004-08-17 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor
JP4451577B2 (ja) * 2001-07-26 2010-04-14 パナソニック株式会社 磁界センサ
JP4901720B2 (ja) * 2005-02-08 2012-03-21 ローム株式会社 磁気センサ回路、及び、その磁気センサ回路を有する携帯端末

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09166405A (ja) 1995-12-19 1997-06-24 Saitama Nippon Denki Kk 移動状態検出回路
JP2004037221A (ja) * 2002-07-03 2004-02-05 Toko Inc センサ回路
JP2005260629A (ja) * 2004-03-12 2005-09-22 Toko Inc 磁気センサ回路
JP2005300303A (ja) * 2004-04-09 2005-10-27 Toko Inc センサ回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102033212A (zh) * 2009-09-29 2011-04-27 精工电子有限公司 磁性传感器电路

Also Published As

Publication number Publication date
US20100117640A1 (en) 2010-05-13
TWI427311B (zh) 2014-02-21
CN101802632B (zh) 2013-04-24
ATE527551T1 (de) 2011-10-15
JP2009031027A (ja) 2009-02-12
EP2101184A1 (en) 2009-09-16
CN101802632A (zh) 2010-08-11
US8274281B2 (en) 2012-09-25
JP5052982B2 (ja) 2012-10-17
EP2101184A4 (en) 2010-09-15
KR101118457B1 (ko) 2012-03-06
TW200925629A (en) 2009-06-16
EP2101184B1 (en) 2011-10-05
KR20100039269A (ko) 2010-04-15

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