JP5052982B2 - 磁気センサ回路 - Google Patents
磁気センサ回路 Download PDFInfo
- Publication number
- JP5052982B2 JP5052982B2 JP2007193084A JP2007193084A JP5052982B2 JP 5052982 B2 JP5052982 B2 JP 5052982B2 JP 2007193084 A JP2007193084 A JP 2007193084A JP 2007193084 A JP2007193084 A JP 2007193084A JP 5052982 B2 JP5052982 B2 JP 5052982B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- circuit
- output
- switch
- magnetic sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000004907 flux Effects 0.000 claims description 29
- 238000001514 detection method Methods 0.000 claims description 18
- 230000000149 penetrating effect Effects 0.000 claims description 7
- 230000005389 magnetism Effects 0.000 claims description 6
- 238000012935 Averaging Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims description 2
- 239000003990 capacitor Substances 0.000 abstract description 25
- 238000010586 diagram Methods 0.000 description 9
- 239000000696 magnetic material Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
- Geophysics And Detection Of Objects (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007193084A JP5052982B2 (ja) | 2007-07-25 | 2007-07-25 | 磁気センサ回路 |
| CN2008801005999A CN101802632B (zh) | 2007-07-25 | 2008-07-10 | 磁性传感器电路 |
| EP08791070A EP2101184B1 (en) | 2007-07-25 | 2008-07-10 | Magnetic sensor circuit |
| AT08791070T ATE527551T1 (de) | 2007-07-25 | 2008-07-10 | Magnetsensorschaltung |
| PCT/JP2008/062522 WO2009014013A1 (ja) | 2007-07-25 | 2008-07-10 | 磁気センサ回路 |
| US12/594,894 US8274281B2 (en) | 2007-07-25 | 2008-07-10 | Magnetic sensor circuit for detecting and monitoring a magnetic field |
| KR1020097014905A KR101118457B1 (ko) | 2007-07-25 | 2008-07-10 | 자기 센서 회로 |
| TW097126654A TWI427311B (zh) | 2007-07-25 | 2008-07-14 | Magnetic sensor circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007193084A JP5052982B2 (ja) | 2007-07-25 | 2007-07-25 | 磁気センサ回路 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009031027A JP2009031027A (ja) | 2009-02-12 |
| JP2009031027A5 JP2009031027A5 (enExample) | 2010-06-03 |
| JP5052982B2 true JP5052982B2 (ja) | 2012-10-17 |
Family
ID=40281271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007193084A Expired - Fee Related JP5052982B2 (ja) | 2007-07-25 | 2007-07-25 | 磁気センサ回路 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8274281B2 (enExample) |
| EP (1) | EP2101184B1 (enExample) |
| JP (1) | JP5052982B2 (enExample) |
| KR (1) | KR101118457B1 (enExample) |
| CN (1) | CN101802632B (enExample) |
| AT (1) | ATE527551T1 (enExample) |
| TW (1) | TWI427311B (enExample) |
| WO (1) | WO2009014013A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101406772B1 (ko) | 2007-10-22 | 2014-06-19 | 다우 글로벌 테크놀로지스 엘엘씨 | 중합체 조성물 및 제품의 성형방법 |
| JP2010281764A (ja) * | 2009-06-08 | 2010-12-16 | Sanyo Electric Co Ltd | オフセットキャンセル回路 |
| JP2011075338A (ja) | 2009-09-29 | 2011-04-14 | Seiko Instruments Inc | 磁気センサ回路 |
| JP5411818B2 (ja) * | 2010-08-26 | 2014-02-12 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | 半導体装置 |
| TWI439046B (zh) | 2011-08-12 | 2014-05-21 | Richtek Technology Corp | 自動調零放大器及相關的偵測模組 |
| JP5926081B2 (ja) * | 2012-03-22 | 2016-05-25 | エスアイアイ・セミコンダクタ株式会社 | センサ装置 |
| US9638548B2 (en) | 2012-05-07 | 2017-05-02 | Infineon Technologies Ag | Output switching systems and methods for magnetic field sensors |
| EP2848957B1 (en) | 2012-05-11 | 2017-03-29 | Asahi Kasei Microdevices Corporation | Magnetism detection device and magnetism detection method |
| JP6004758B2 (ja) * | 2012-06-07 | 2016-10-12 | エスアイアイ・セミコンダクタ株式会社 | 磁気センサ |
| CN102854535B (zh) * | 2012-08-24 | 2015-03-11 | 中国船舶重工集团公司第七二二研究所 | 一种宽带磁性传感器 |
| JP6503198B2 (ja) * | 2015-03-05 | 2019-04-17 | エイブリック株式会社 | 比較回路およびセンサ装置 |
| JP2018054473A (ja) * | 2016-09-29 | 2018-04-05 | アイシン精機株式会社 | 磁気センサ及び磁気センサシステム |
| US11016151B2 (en) * | 2018-03-14 | 2021-05-25 | Ablic Inc. | Semiconductor device and method of adjusting the same |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2776783B2 (ja) | 1995-12-19 | 1998-07-16 | 埼玉日本電気株式会社 | 移動状態検出回路 |
| US6777932B2 (en) * | 2000-03-23 | 2004-08-17 | Matsushita Electric Industrial Co., Ltd. | Magnetic field sensor |
| JP4451577B2 (ja) * | 2001-07-26 | 2010-04-14 | パナソニック株式会社 | 磁界センサ |
| JP3887275B2 (ja) * | 2002-07-03 | 2007-02-28 | 東光株式会社 | センサ回路 |
| JP4049757B2 (ja) * | 2004-03-12 | 2008-02-20 | 東光株式会社 | 磁気センサ回路 |
| JP4303631B2 (ja) * | 2004-04-09 | 2009-07-29 | 東光株式会社 | センサ回路 |
| JP4901720B2 (ja) * | 2005-02-08 | 2012-03-21 | ローム株式会社 | 磁気センサ回路、及び、その磁気センサ回路を有する携帯端末 |
-
2007
- 2007-07-25 JP JP2007193084A patent/JP5052982B2/ja not_active Expired - Fee Related
-
2008
- 2008-07-10 KR KR1020097014905A patent/KR101118457B1/ko not_active Expired - Fee Related
- 2008-07-10 EP EP08791070A patent/EP2101184B1/en not_active Not-in-force
- 2008-07-10 WO PCT/JP2008/062522 patent/WO2009014013A1/ja not_active Ceased
- 2008-07-10 US US12/594,894 patent/US8274281B2/en not_active Expired - Fee Related
- 2008-07-10 CN CN2008801005999A patent/CN101802632B/zh not_active Expired - Fee Related
- 2008-07-10 AT AT08791070T patent/ATE527551T1/de not_active IP Right Cessation
- 2008-07-14 TW TW097126654A patent/TWI427311B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US20100117640A1 (en) | 2010-05-13 |
| TWI427311B (zh) | 2014-02-21 |
| CN101802632B (zh) | 2013-04-24 |
| ATE527551T1 (de) | 2011-10-15 |
| JP2009031027A (ja) | 2009-02-12 |
| EP2101184A1 (en) | 2009-09-16 |
| CN101802632A (zh) | 2010-08-11 |
| US8274281B2 (en) | 2012-09-25 |
| EP2101184A4 (en) | 2010-09-15 |
| KR101118457B1 (ko) | 2012-03-06 |
| TW200925629A (en) | 2009-06-16 |
| EP2101184B1 (en) | 2011-10-05 |
| KR20100039269A (ko) | 2010-04-15 |
| WO2009014013A1 (ja) | 2009-01-29 |
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