ATE527551T1 - Magnetsensorschaltung - Google Patents

Magnetsensorschaltung

Info

Publication number
ATE527551T1
ATE527551T1 AT08791070T AT08791070T ATE527551T1 AT E527551 T1 ATE527551 T1 AT E527551T1 AT 08791070 T AT08791070 T AT 08791070T AT 08791070 T AT08791070 T AT 08791070T AT E527551 T1 ATE527551 T1 AT E527551T1
Authority
AT
Austria
Prior art keywords
sensor circuit
magnetic sensor
eliminated
offset
charge
Prior art date
Application number
AT08791070T
Other languages
German (de)
English (en)
Inventor
Masakazu Sugiura
Original Assignee
Seiko Instr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr Inc filed Critical Seiko Instr Inc
Application granted granted Critical
Publication of ATE527551T1 publication Critical patent/ATE527551T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
AT08791070T 2007-07-25 2008-07-10 Magnetsensorschaltung ATE527551T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007193084A JP5052982B2 (ja) 2007-07-25 2007-07-25 磁気センサ回路
PCT/JP2008/062522 WO2009014013A1 (ja) 2007-07-25 2008-07-10 磁気センサ回路

Publications (1)

Publication Number Publication Date
ATE527551T1 true ATE527551T1 (de) 2011-10-15

Family

ID=40281271

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08791070T ATE527551T1 (de) 2007-07-25 2008-07-10 Magnetsensorschaltung

Country Status (8)

Country Link
US (1) US8274281B2 (enExample)
EP (1) EP2101184B1 (enExample)
JP (1) JP5052982B2 (enExample)
KR (1) KR101118457B1 (enExample)
CN (1) CN101802632B (enExample)
AT (1) ATE527551T1 (enExample)
TW (1) TWI427311B (enExample)
WO (1) WO2009014013A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101406772B1 (ko) 2007-10-22 2014-06-19 다우 글로벌 테크놀로지스 엘엘씨 중합체 조성물 및 제품의 성형방법
JP2010281764A (ja) * 2009-06-08 2010-12-16 Sanyo Electric Co Ltd オフセットキャンセル回路
JP2011075338A (ja) 2009-09-29 2011-04-14 Seiko Instruments Inc 磁気センサ回路
JP5411818B2 (ja) * 2010-08-26 2014-02-12 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体装置
TWI439046B (zh) 2011-08-12 2014-05-21 Richtek Technology Corp 自動調零放大器及相關的偵測模組
JP5926081B2 (ja) * 2012-03-22 2016-05-25 エスアイアイ・セミコンダクタ株式会社 センサ装置
US9638548B2 (en) 2012-05-07 2017-05-02 Infineon Technologies Ag Output switching systems and methods for magnetic field sensors
EP2848957B1 (en) 2012-05-11 2017-03-29 Asahi Kasei Microdevices Corporation Magnetism detection device and magnetism detection method
JP6004758B2 (ja) * 2012-06-07 2016-10-12 エスアイアイ・セミコンダクタ株式会社 磁気センサ
CN102854535B (zh) * 2012-08-24 2015-03-11 中国船舶重工集团公司第七二二研究所 一种宽带磁性传感器
JP6503198B2 (ja) * 2015-03-05 2019-04-17 エイブリック株式会社 比較回路およびセンサ装置
JP2018054473A (ja) * 2016-09-29 2018-04-05 アイシン精機株式会社 磁気センサ及び磁気センサシステム
US11016151B2 (en) * 2018-03-14 2021-05-25 Ablic Inc. Semiconductor device and method of adjusting the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2776783B2 (ja) 1995-12-19 1998-07-16 埼玉日本電気株式会社 移動状態検出回路
US6777932B2 (en) * 2000-03-23 2004-08-17 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor
JP4451577B2 (ja) * 2001-07-26 2010-04-14 パナソニック株式会社 磁界センサ
JP3887275B2 (ja) * 2002-07-03 2007-02-28 東光株式会社 センサ回路
JP4049757B2 (ja) * 2004-03-12 2008-02-20 東光株式会社 磁気センサ回路
JP4303631B2 (ja) * 2004-04-09 2009-07-29 東光株式会社 センサ回路
JP4901720B2 (ja) * 2005-02-08 2012-03-21 ローム株式会社 磁気センサ回路、及び、その磁気センサ回路を有する携帯端末

Also Published As

Publication number Publication date
US20100117640A1 (en) 2010-05-13
TWI427311B (zh) 2014-02-21
CN101802632B (zh) 2013-04-24
JP2009031027A (ja) 2009-02-12
EP2101184A1 (en) 2009-09-16
CN101802632A (zh) 2010-08-11
US8274281B2 (en) 2012-09-25
JP5052982B2 (ja) 2012-10-17
EP2101184A4 (en) 2010-09-15
KR101118457B1 (ko) 2012-03-06
TW200925629A (en) 2009-06-16
EP2101184B1 (en) 2011-10-05
KR20100039269A (ko) 2010-04-15
WO2009014013A1 (ja) 2009-01-29

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Legal Events

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