CN104246526B - 传感器装置 - Google Patents
传感器装置 Download PDFInfo
- Publication number
- CN104246526B CN104246526B CN201380015694.XA CN201380015694A CN104246526B CN 104246526 B CN104246526 B CN 104246526B CN 201380015694 A CN201380015694 A CN 201380015694A CN 104246526 B CN104246526 B CN 104246526B
- Authority
- CN
- China
- Prior art keywords
- terminal
- amplifier
- input
- voltage
- differential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
- G01R33/0029—Treating the measured signals, e.g. removing offset or noise
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/945—Proximity switches
- H03K17/95—Proximity switches using a magnetic detector
- H03K17/9517—Proximity switches using a magnetic detector using galvanomagnetic devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
Abstract
Description
Claims (6)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012-066004 | 2012-03-22 | ||
JP2012066004A JP5926081B2 (ja) | 2012-03-22 | 2012-03-22 | センサ装置 |
JPJP2012-066004 | 2012-03-22 | ||
PCT/JP2013/051704 WO2013140851A1 (ja) | 2012-03-22 | 2013-01-28 | センサ装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104246526A CN104246526A (zh) | 2014-12-24 |
CN104246526B true CN104246526B (zh) | 2017-09-05 |
Family
ID=49222318
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201380015694.XA Active CN104246526B (zh) | 2012-03-22 | 2013-01-28 | 传感器装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9128127B2 (zh) |
EP (1) | EP2829889B1 (zh) |
JP (1) | JP5926081B2 (zh) |
KR (1) | KR101918338B1 (zh) |
CN (1) | CN104246526B (zh) |
TW (1) | TWI554743B (zh) |
WO (1) | WO2013140851A1 (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6180752B2 (ja) * | 2012-04-27 | 2017-08-16 | エスアイアイ・セミコンダクタ株式会社 | センサ装置 |
KR20140079046A (ko) * | 2012-12-18 | 2014-06-26 | 에스케이하이닉스 주식회사 | 차동 증폭 회로 |
JP2014163691A (ja) * | 2013-02-21 | 2014-09-08 | Seiko Instruments Inc | 磁気センサ装置 |
JP6158682B2 (ja) * | 2013-10-25 | 2017-07-05 | エスアイアイ・セミコンダクタ株式会社 | 磁気センサ回路 |
JP6454065B2 (ja) * | 2013-11-11 | 2019-01-16 | エイブリック株式会社 | 比較回路 |
US9217780B2 (en) * | 2014-01-07 | 2015-12-22 | Qualcomm Incorporated | Compensation technique for amplifiers in a current sensing circuit for a battery |
JP6503198B2 (ja) * | 2015-03-05 | 2019-04-17 | エイブリック株式会社 | 比較回路およびセンサ装置 |
US20170003315A1 (en) * | 2015-06-30 | 2017-01-05 | Freescale Semiconductor, Inc. | Mems sensor devices having a self-test mode |
JP2020171162A (ja) * | 2019-04-04 | 2020-10-15 | 日本電産株式会社 | モータ |
CN113328711B (zh) * | 2021-06-21 | 2022-07-26 | 浙江大学 | 恒定跨导轨到轨输入差分输出的高速可编程增益放大器 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101907691A (zh) * | 2009-06-08 | 2010-12-08 | 精工电子有限公司 | 磁性传感器装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3315397B2 (ja) | 2000-03-23 | 2002-08-19 | 松下電器産業株式会社 | 磁界センサおよび磁界検出方法 |
JP2004340782A (ja) * | 2003-05-16 | 2004-12-02 | Toko Inc | 磁界センサ |
JP4049757B2 (ja) * | 2004-03-12 | 2008-02-20 | 東光株式会社 | 磁気センサ回路 |
US7570044B2 (en) * | 2007-02-19 | 2009-08-04 | Kabushiki Kaisha Toshiba | Signal detecting circuit |
JP5052982B2 (ja) * | 2007-07-25 | 2012-10-17 | セイコーインスツル株式会社 | 磁気センサ回路 |
JP5284875B2 (ja) * | 2009-06-03 | 2013-09-11 | 新日本無線株式会社 | オフセット電圧補正回路 |
JP5285585B2 (ja) * | 2009-12-02 | 2013-09-11 | セイコーインスツル株式会社 | 磁気センサ装置 |
JP5736288B2 (ja) * | 2011-09-27 | 2015-06-17 | セイコーインスツル株式会社 | 磁気センサ装置 |
JP6180752B2 (ja) * | 2012-04-27 | 2017-08-16 | エスアイアイ・セミコンダクタ株式会社 | センサ装置 |
-
2012
- 2012-03-22 JP JP2012066004A patent/JP5926081B2/ja active Active
-
2013
- 2013-01-28 KR KR1020147026276A patent/KR101918338B1/ko active IP Right Grant
- 2013-01-28 EP EP13765075.0A patent/EP2829889B1/en active Active
- 2013-01-28 CN CN201380015694.XA patent/CN104246526B/zh active Active
- 2013-01-28 WO PCT/JP2013/051704 patent/WO2013140851A1/ja active Application Filing
- 2013-02-05 TW TW102104382A patent/TWI554743B/zh active
-
2014
- 2014-09-18 US US14/490,377 patent/US9128127B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101907691A (zh) * | 2009-06-08 | 2010-12-08 | 精工电子有限公司 | 磁性传感器装置 |
Also Published As
Publication number | Publication date |
---|---|
JP5926081B2 (ja) | 2016-05-25 |
CN104246526A (zh) | 2014-12-24 |
EP2829889B1 (en) | 2019-07-31 |
WO2013140851A1 (ja) | 2013-09-26 |
US9128127B2 (en) | 2015-09-08 |
KR20140146079A (ko) | 2014-12-24 |
TWI554743B (zh) | 2016-10-21 |
KR101918338B1 (ko) | 2018-11-13 |
EP2829889A1 (en) | 2015-01-28 |
TW201346224A (zh) | 2013-11-16 |
EP2829889A4 (en) | 2015-12-30 |
JP2013195379A (ja) | 2013-09-30 |
US20150022241A1 (en) | 2015-01-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20160324 Address after: Chiba County, Japan Applicant after: DynaFine Semiconductor Co.,Ltd. Address before: Chiba County, Japan Applicant before: Seiko Instruments Inc. |
|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: ABLIC Inc. Address before: Chiba County, Japan Patentee before: DynaFine Semiconductor Co.,Ltd. |
|
CP02 | Change in the address of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: Nagano Patentee after: ABLIC Inc. Address before: Chiba County, Japan Patentee before: ABLIC Inc. |