KR100682003B1 - 반도체 장치 및 그 제조 방법 - Google Patents
반도체 장치 및 그 제조 방법 Download PDFInfo
- Publication number
- KR100682003B1 KR100682003B1 KR1020050018007A KR20050018007A KR100682003B1 KR 100682003 B1 KR100682003 B1 KR 100682003B1 KR 1020050018007 A KR1020050018007 A KR 1020050018007A KR 20050018007 A KR20050018007 A KR 20050018007A KR 100682003 B1 KR100682003 B1 KR 100682003B1
- Authority
- KR
- South Korea
- Prior art keywords
- dicing
- semiconductor device
- pair
- cutting
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M3/00—Medical syringes, e.g. enemata; Irrigators
- A61M3/02—Enemata; Irrigators
- A61M3/0233—Enemata; Irrigators characterised by liquid supply means, e.g. from pressurised reservoirs
- A61M3/0254—Enemata; Irrigators characterised by liquid supply means, e.g. from pressurised reservoirs the liquid being pumped
- A61M3/0262—Enemata; Irrigators characterised by liquid supply means, e.g. from pressurised reservoirs the liquid being pumped manually, e.g. by squeezing a bulb
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M3/00—Medical syringes, e.g. enemata; Irrigators
- A61M3/02—Enemata; Irrigators
- A61M3/0233—Enemata; Irrigators characterised by liquid supply means, e.g. from pressurised reservoirs
- A61M3/025—Enemata; Irrigators characterised by liquid supply means, e.g. from pressurised reservoirs supplied directly from the pressurised water source, e.g. with medicament supply
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M3/00—Medical syringes, e.g. enemata; Irrigators
- A61M3/02—Enemata; Irrigators
- A61M3/0279—Cannula; Nozzles; Tips; their connection means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/014—Manufacture or treatment using batch processing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/129—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed forming a chip-scale package [CSP]
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M2205/00—General characteristics of the apparatus
- A61M2205/07—General characteristics of the apparatus having air pumping means
- A61M2205/071—General characteristics of the apparatus having air pumping means hand operated
- A61M2205/075—Bulb type
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M2205/00—General characteristics of the apparatus
- A61M2205/33—Controlling, regulating or measuring
- A61M2205/3331—Pressure; Flow
- A61M2205/3334—Measuring or controlling the flow rate
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M2210/00—Anatomical parts of the body
- A61M2210/10—Trunk
- A61M2210/1042—Alimentary tract
- A61M2210/1064—Large intestine
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61M—DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY; DEVICES FOR TRANSDUCING BODY MEDIA OR FOR TAKING MEDIA FROM THE BODY; DEVICES FOR PRODUCING OR ENDING SLEEP OR STUPOR
- A61M2210/00—Anatomical parts of the body
- A61M2210/14—Female reproductive, genital organs
- A61M2210/1475—Vagina
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/501—Marks applied to devices, e.g. for alignment or identification for use before dicing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing
- H10W46/603—Formed on wafers or substrates before dicing and remaining on chips after dicing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
- H10W72/244—Dispositions, e.g. layouts relative to underlying supporting features, e.g. bond pads, RDLs or vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/922—Bond pads being integral with underlying chip-level interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Anesthesiology (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Hematology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Animal Behavior & Ethology (AREA)
- General Health & Medical Sciences (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Dicing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004062323A JP4753170B2 (ja) | 2004-03-05 | 2004-03-05 | 半導体装置及びその製造方法 |
| JPJP-P-2004-00062323 | 2004-03-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20060043788A KR20060043788A (ko) | 2006-05-15 |
| KR100682003B1 true KR100682003B1 (ko) | 2007-02-15 |
Family
ID=34824512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020050018007A Expired - Fee Related KR100682003B1 (ko) | 2004-03-05 | 2005-03-04 | 반도체 장치 및 그 제조 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7456083B2 (https=) |
| EP (1) | EP1575086A3 (https=) |
| JP (1) | JP4753170B2 (https=) |
| KR (1) | KR100682003B1 (https=) |
| CN (1) | CN100446187C (https=) |
| SG (1) | SG114787A1 (https=) |
| TW (1) | TWI288956B (https=) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI232560B (en) * | 2002-04-23 | 2005-05-11 | Sanyo Electric Co | Semiconductor device and its manufacture |
| TWI229435B (en) * | 2002-06-18 | 2005-03-11 | Sanyo Electric Co | Manufacture of semiconductor device |
| TWI227550B (en) * | 2002-10-30 | 2005-02-01 | Sanyo Electric Co | Semiconductor device manufacturing method |
| JP4401181B2 (ja) * | 2003-08-06 | 2010-01-20 | 三洋電機株式会社 | 半導体装置及びその製造方法 |
| JP3962713B2 (ja) * | 2003-09-30 | 2007-08-22 | キヤノン株式会社 | アライメントマークの形成方法、およびデバイスが構成される基板 |
| JP4322181B2 (ja) * | 2004-07-29 | 2009-08-26 | 三洋電機株式会社 | 半導体装置の製造方法 |
| US20060258051A1 (en) * | 2005-05-10 | 2006-11-16 | Texas Instruments Incorporated | Method and system for solder die attach |
| KR100652435B1 (ko) * | 2005-10-07 | 2006-12-01 | 삼성전자주식회사 | 첫 번째 다이의 위치를 구분할 수 있는 표시수단을구비하는 웨이퍼 및 웨이퍼의 다이 부착 방법 |
| US8153464B2 (en) * | 2005-10-18 | 2012-04-10 | International Rectifier Corporation | Wafer singulation process |
| TWI324800B (en) * | 2005-12-28 | 2010-05-11 | Sanyo Electric Co | Method for manufacturing semiconductor device |
| TW200737506A (en) * | 2006-03-07 | 2007-10-01 | Sanyo Electric Co | Semiconductor device and manufacturing method of the same |
| JP2007329153A (ja) * | 2006-06-06 | 2007-12-20 | Fujitsu Ltd | デバイスの製造方法、ダイシング方法、およびダイシング装置 |
| CN100524719C (zh) * | 2006-08-03 | 2009-08-05 | 南茂科技股份有限公司 | 阵列封装基板及封装体阵列的切割方式的判断方法 |
| TWI367557B (en) | 2006-08-11 | 2012-07-01 | Sanyo Electric Co | Semiconductor device and manufaturing method thereof |
| JP5076407B2 (ja) * | 2006-09-05 | 2012-11-21 | ミツミ電機株式会社 | 半導体装置及びその製造方法 |
| KR100784388B1 (ko) * | 2006-11-14 | 2007-12-11 | 삼성전자주식회사 | 반도체 패키지 및 제조방법 |
| JP5010247B2 (ja) | 2006-11-20 | 2012-08-29 | オンセミコンダクター・トレーディング・リミテッド | 半導体装置及びその製造方法 |
| US7569409B2 (en) * | 2007-01-04 | 2009-08-04 | Visera Technologies Company Limited | Isolation structures for CMOS image sensor chip scale packages |
| US7679167B2 (en) * | 2007-01-08 | 2010-03-16 | Visera Technologies Company, Limited | Electronic assembly for image sensor device and fabrication method thereof |
| JP2008294405A (ja) * | 2007-04-25 | 2008-12-04 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
| JP2008288285A (ja) * | 2007-05-15 | 2008-11-27 | Sharp Corp | 積層基板の切断方法、半導体装置の製造方法、半導体装置、発光装置及びバックライト装置 |
| DE102007030284B4 (de) * | 2007-06-29 | 2009-12-31 | Schott Ag | Verfahren zum Verpacken von Halbleiter-Bauelementen und verfahrensgemäß hergestelltes Zwischenprodukt |
| US8338267B2 (en) * | 2007-07-11 | 2012-12-25 | Sematech, Inc. | Systems and methods for vertically integrating semiconductor devices |
| CN101689542A (zh) | 2007-07-12 | 2010-03-31 | Nxp股份有限公司 | 晶片上的集成电路和分离晶片上的集成电路的方法 |
| TWI375321B (en) * | 2007-08-24 | 2012-10-21 | Xintec Inc | Electronic device wafer level scale packages and fabrication methods thereof |
| CN101950729B (zh) * | 2007-09-05 | 2012-09-26 | 精材科技股份有限公司 | 电子元件的晶圆级封装及其制造方法 |
| JP2010103300A (ja) * | 2008-10-23 | 2010-05-06 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
| US8289388B2 (en) * | 2009-05-14 | 2012-10-16 | Asm Assembly Automation Ltd | Alignment method for singulation system |
| CN102800656B (zh) * | 2011-05-20 | 2015-11-25 | 精材科技股份有限公司 | 晶片封装体、晶片封装体的形成方法以及封装晶圆 |
| DE102011112659B4 (de) * | 2011-09-06 | 2022-01-27 | Vishay Semiconductor Gmbh | Oberflächenmontierbares elektronisches Bauelement |
| JP6096442B2 (ja) * | 2012-09-10 | 2017-03-15 | ラピスセミコンダクタ株式会社 | 半導体装置および半導体装置の製造方法 |
| JP6193665B2 (ja) * | 2013-07-26 | 2017-09-06 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| JP6257291B2 (ja) * | 2013-12-04 | 2018-01-10 | 株式会社ディスコ | パッケージ基板の加工方法 |
| CN104977745B (zh) * | 2015-06-24 | 2018-05-25 | 武汉华星光电技术有限公司 | 液晶显示面板用基板及液晶显示面板切割方法 |
| JP2017053999A (ja) * | 2015-09-09 | 2017-03-16 | 株式会社東芝 | 半導体装置および検査パターン配置方法 |
| JP6607639B2 (ja) * | 2015-12-24 | 2019-11-20 | 株式会社ディスコ | ウェーハの加工方法 |
| US10163954B2 (en) * | 2016-04-11 | 2018-12-25 | Omnivision Technologies, Inc. | Trenched device wafer, stepped-sidewall device die, and associated method |
| JP2019054172A (ja) * | 2017-09-15 | 2019-04-04 | 東芝メモリ株式会社 | 半導体装置 |
| JP7075652B2 (ja) * | 2017-12-28 | 2022-05-26 | 三星ダイヤモンド工業株式会社 | スクライブ装置およびスクライブ方法 |
| DE102019204457B4 (de) | 2019-03-29 | 2024-01-25 | Disco Corporation | Substratbearbeitungsverfahren |
| CN110549351B (zh) * | 2019-09-19 | 2020-10-30 | 中国科学院合肥物质科学研究院 | 一种物料氧化层打磨机器人控制系统及其控制方法 |
| CN111128966A (zh) * | 2019-12-25 | 2020-05-08 | 华天科技(昆山)电子有限公司 | 对位结构及封装切割方法 |
| CN117672886A (zh) * | 2022-08-25 | 2024-03-08 | 群创光电股份有限公司 | 电子装置的制造方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6030314A (ja) * | 1983-07-08 | 1985-02-15 | 富士通株式会社 | ダイシング装置 |
| JPH04177715A (ja) * | 1990-11-10 | 1992-06-24 | Fujitsu Ltd | 半導体装置 |
| JP2666761B2 (ja) | 1995-03-28 | 1997-10-22 | 日本電気株式会社 | 半導体ウェハ |
| US5777392A (en) * | 1995-03-28 | 1998-07-07 | Nec Corporation | Semiconductor device having improved alignment marks |
| KR970008386A (ko) * | 1995-07-07 | 1997-02-24 | 하라 세이지 | 기판의 할단(割斷)방법 및 그 할단장치 |
| IL123207A0 (en) * | 1998-02-06 | 1998-09-24 | Shellcase Ltd | Integrated circuit device |
| US6271102B1 (en) * | 1998-02-27 | 2001-08-07 | International Business Machines Corporation | Method and system for dicing wafers, and semiconductor structures incorporating the products thereof |
| JP3065309B1 (ja) * | 1999-03-11 | 2000-07-17 | 沖電気工業株式会社 | 半導体装置の製造方法 |
| WO2001009927A1 (en) * | 1999-07-28 | 2001-02-08 | Infineon Technologies North America Corp. | Semiconductor structures and manufacturing methods |
| US6309943B1 (en) * | 2000-04-25 | 2001-10-30 | Amkor Technology, Inc. | Precision marking and singulation method |
| US6579738B2 (en) * | 2000-12-15 | 2003-06-17 | Micron Technology, Inc. | Method of alignment for buried structures formed by surface transformation of empty spaces in solid state materials |
| US6869861B1 (en) * | 2001-03-08 | 2005-03-22 | Amkor Technology, Inc. | Back-side wafer singulation method |
| JP3603828B2 (ja) * | 2001-05-28 | 2004-12-22 | 富士ゼロックス株式会社 | インクジェット式記録ヘッド及びその製造方法並びにインクジェット式記録装置 |
| JP3872319B2 (ja) * | 2001-08-21 | 2007-01-24 | 沖電気工業株式会社 | 半導体装置及びその製造方法 |
| JP2003100666A (ja) * | 2001-09-26 | 2003-04-04 | Toshiba Corp | 半導体装置の製造方法 |
| JP2004006820A (ja) * | 2002-04-23 | 2004-01-08 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
| JP3877700B2 (ja) * | 2002-04-23 | 2007-02-07 | 三洋電機株式会社 | 半導体装置及びその製造方法 |
| JP2003347476A (ja) * | 2002-05-22 | 2003-12-05 | Sanyo Electric Co Ltd | 半導体集積装置及びその製造方法 |
| CN2552163Y (zh) * | 2002-05-23 | 2003-05-21 | 立卫科技股份有限公司 | 封装切单的辨识点电镀线的结构 |
| JP3796202B2 (ja) * | 2002-07-05 | 2006-07-12 | 三洋電機株式会社 | 半導体集積装置の製造方法 |
-
2004
- 2004-03-05 JP JP2004062323A patent/JP4753170B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-18 TW TW094104769A patent/TWI288956B/zh not_active IP Right Cessation
- 2005-03-02 US US11/069,061 patent/US7456083B2/en not_active Expired - Lifetime
- 2005-03-04 CN CNB2005100530225A patent/CN100446187C/zh not_active Expired - Fee Related
- 2005-03-04 KR KR1020050018007A patent/KR100682003B1/ko not_active Expired - Fee Related
- 2005-03-05 SG SG200501359A patent/SG114787A1/en unknown
- 2005-03-07 EP EP05004918A patent/EP1575086A3/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| TW200535941A (en) | 2005-11-01 |
| TWI288956B (en) | 2007-10-21 |
| CN1664991A (zh) | 2005-09-07 |
| US20050208735A1 (en) | 2005-09-22 |
| KR20060043788A (ko) | 2006-05-15 |
| EP1575086A3 (en) | 2006-06-14 |
| US7456083B2 (en) | 2008-11-25 |
| JP2005252078A (ja) | 2005-09-15 |
| CN100446187C (zh) | 2008-12-24 |
| JP4753170B2 (ja) | 2011-08-24 |
| EP1575086A2 (en) | 2005-09-14 |
| SG114787A1 (en) | 2005-09-28 |
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