KR100545225B1 - 자체수리회로를 채용한 메모리 동작 테스트 방법 및 메모리 위치를 영구적으로 디스에이블하는 방법 - Google Patents

자체수리회로를 채용한 메모리 동작 테스트 방법 및 메모리 위치를 영구적으로 디스에이블하는 방법 Download PDF

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Publication number
KR100545225B1
KR100545225B1 KR1019980016166A KR19980016166A KR100545225B1 KR 100545225 B1 KR100545225 B1 KR 100545225B1 KR 1019980016166 A KR1019980016166 A KR 1019980016166A KR 19980016166 A KR19980016166 A KR 19980016166A KR 100545225 B1 KR100545225 B1 KR 100545225B1
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memory
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KR19980086794A (ko
Inventor
브이. 스와미 이린키
토마스 알 윅
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엘에스아이 로직 코포레이션
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0405—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals comprising complete test loop

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  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
KR1019980016166A 1997-05-07 1998-05-06 자체수리회로를 채용한 메모리 동작 테스트 방법 및 메모리 위치를 영구적으로 디스에이블하는 방법 Expired - Fee Related KR100545225B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/852,692 US5987632A (en) 1997-05-07 1997-05-07 Method of testing memory operations employing self-repair circuitry and permanently disabling memory locations
US8/852,692 1997-05-07
US08/852,692 1997-05-07

Publications (2)

Publication Number Publication Date
KR19980086794A KR19980086794A (ko) 1998-12-05
KR100545225B1 true KR100545225B1 (ko) 2006-04-10

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Application Number Title Priority Date Filing Date
KR1019980016166A Expired - Fee Related KR100545225B1 (ko) 1997-05-07 1998-05-06 자체수리회로를 채용한 메모리 동작 테스트 방법 및 메모리 위치를 영구적으로 디스에이블하는 방법

Country Status (5)

Country Link
US (1) US5987632A (enExample)
JP (1) JP4716530B2 (enExample)
KR (1) KR100545225B1 (enExample)
DE (1) DE19820442A1 (enExample)
TW (1) TW376558B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190102580A (ko) * 2018-02-26 2019-09-04 고려대학교 산학협력단 결함 정보 저장 테이블을 이용한 리페어 분석 시스템 및 그의 리페어 분석 방법

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KR102122821B1 (ko) 2018-02-26 2020-06-15 고려대학교 산학협력단 결함 정보 저장 테이블을 이용한 리페어 분석 시스템 및 그의 리페어 분석 방법

Also Published As

Publication number Publication date
JPH11120787A (ja) 1999-04-30
TW376558B (en) 1999-12-11
DE19820442A1 (de) 1998-11-12
KR19980086794A (ko) 1998-12-05
US5987632A (en) 1999-11-16
JP4716530B2 (ja) 2011-07-06

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