KR100413103B1 - 본딩장치 및 본딩방법 - Google Patents
본딩장치 및 본딩방법 Download PDFInfo
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- KR100413103B1 KR100413103B1 KR10-2001-0002320A KR20010002320A KR100413103B1 KR 100413103 B1 KR100413103 B1 KR 100413103B1 KR 20010002320 A KR20010002320 A KR 20010002320A KR 100413103 B1 KR100413103 B1 KR 100413103B1
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- position detecting
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- 238000000034 method Methods 0.000 title claims description 13
- 238000012937 correction Methods 0.000 claims abstract description 52
- 230000003287 optical effect Effects 0.000 claims abstract description 41
- 238000012545 processing Methods 0.000 claims description 65
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- 238000003384 imaging method Methods 0.000 claims description 44
- 238000005259 measurement Methods 0.000 claims description 6
- 238000006073 displacement reaction Methods 0.000 abstract description 3
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- 239000000126 substance Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- H—ELECTRICITY
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
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- H01L2224/78301—Capillary
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/852—Applying energy for connecting
- H01L2224/85201—Compression bonding
- H01L2224/85205—Ultrasonic bonding
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
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- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
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- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
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- Power Engineering (AREA)
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Wire Bonding (AREA)
- Die Bonding (AREA)
Abstract
Description
Claims (10)
- XY 테이블에 탑재된 본딩헤드,상기 본딩헤드에 고정된 카메라홀더에 의해 지지되어 본딩부품을 촬상하는 위치검출용 촬상기,레퍼런스 지지대위의 소정 위치에 배치된 레퍼런스부재, 및상기 본딩헤드에 설치된 본딩암에 의해 지지되어 상기 본딩부품을 처리하는 처리부재 및 상기 레퍼런스부재의 상광을 상기 위치검출용 촬상기에 유도하는 광학부재를 구비하여 이루어진 것을 특징으로 하는 본딩장치.
- 제 1 항에 있어서, 상기 광학부재는 상기 처리부재 및 상기 레퍼런스부재를 복수의 서로 다른 방향으로부터 포착한 상광을 상기 위치검출용 촬상기로 유도하는 것을 특징으로 하는 본딩장치.
- 제 1 항 또는 제 2 항에 있어서, 상기 위치검출용 촬상기는 텔레센트릭 렌즈를 구비하고 있는 것을 특징으로 하는 본딩장치.
- 제 1 항 또는 제 2 항에 있어서,상기 위치검출용 촬상기로의 광로중에 보정렌즈를 더 구비하고,당해 보정렌즈를 통하여 상기 위치검출용 촬상기의 결상면상에 레퍼런스부재 및 처리부재의 상이 결상되는 것을 특징으로 하는 본딩장치.
- 제 4 항에 있어서, 상기 보정렌즈는 상기 레퍼런스부재와 일체적으로 유지되어 있는 것을 특징으로 하는 본딩장치.
- XY 테이블에 탑재된 본딩헤드,상기 본딩헤드에 고정된 카메라홀더에 의해 지지되어 본딩부품을 촬상하는 위치검출용 촬상기,레퍼런스 지지대위의 소정위치에 설치된 레퍼런스부재,상기 본딩헤드에 설치된 본딩암에 의해 지지되어 상기 본딩부품을 처리하는 처리부재 및 상기 레퍼런스부재를 조사하는 광원, 및상기 광원으로부터의 조사에 의해 상기 처리부재 및 상기 레퍼런스부재의 상이 사영되는 스크린부재를 구비하고,상기 위치검출용 촬상기에 의해 상기 본딩부품을 촬상하는 자세에 있어서의 상기 위치검출용 촬상기로부터 상기 본딩부품까지의 거리와, 상기 처리부재를 상기 레퍼런스부재에 근접시킨 자세에 있어서의 상기 위치검출용 촬상기로부터 상기 스크린부재까지의 거리가 대략 동등한 것을 특징으로 하는 본딩장치.
- 본딩부품을 촬상하는 위치검출용 촬상기, 당해 위치검출용 촬상기에 대해 오프셋되어 설치되고 상기 본딩부품을 처리하는 처리부재, 및 소정위치에 설치된 레퍼런스부재를 구비한 본딩장치에 있어서의 본딩방법에 있어서,상기 위치검출용 촬상기를 상기 레퍼런스부재에 근접시킨 제 1의 자세에 있어서의 상기 위치검출용 촬상기와 상기 레퍼런스부재의 위치관계를 상기 위치검출용 촬상기로 측정하는 스텝,상기 처리부재를 상기 레퍼런스부재에 근접시킨 제 2의 자세에 있어서의 상기 처리부재 및 상기 레퍼런스부재의 상광을 상기 위치검출용 촬상기로 유도하여 상기 처리부재와 상기 레퍼런스부재의 위치관계를 상기 위치검출용 촬상기에 의해 측정하는 스텝, 및이들의 측정결과와 상기 제 1의 자세와 제 2의 자세의 사이에 있어서의 상기 위치검출용 촬상기 및 상기 처리부재의 이동량에 근거하여 정확한 오프셋량을 구하는 스텝을 구비한 것을 특징으로 하는 본딩방법.
- 본딩부품을 촬상하는 위치검출용 촬상기, 당해 위치검출용 촬상기에 대해 오프셋되어 설치되고 상기 본딩부품을 처리하는 처리부재, 및 소정위치에 설치된 레퍼런스부재를 구비한 본딩장치에 있어서,상기 위치검출용 촬상기를 상기 레퍼런스부재에 근접시킨 제 1의 자세에 있어서의 상기 위치검출용 촬상기와 상기 레퍼런스부재의 위치관계를 상기 위치검출용 촬상기로 측정한 측정값,상기 처리부재를 상기 레퍼런스부재에 근접시킨 제 2의 자세에 있어서의 상기 처리부재 및 상기 레퍼런스부재의 상광을 상기 위치검출용 촬상기로 유도하여 상기 처리부재와 상기 레퍼런스부재의 위치관계를 상기 위치검출용 촬상기에 의해 측정한 측정값, 및이들의 측정결과와 상기 제 1의 자세와 제 2의 자세의 사이에 있어서의 상기 위치검출용 촬상기 및 상기 처리부재의 이동량에 근거하여 오프셋량을 구하는 연산제어장치를 구비한 것을 특징으로 하는 본딩장치.
- 제 3 항에 있어서,상기 위치검출용 촬상기로의 광로중에 보정렌즈를 더 구비하고,당해 보정렌즈를 통하여 상기 위치검출용 촬상기의 결상면상에 레퍼런스부재 및 처리부재의 상이 결상되는 것을 특징으로 하는 본딩장치.
- 제 9 항에 있어서, 상기 보정렌즈는 상기 레퍼런스부재와 일체적으로 유지되어 있는 것을 특징으로 하는 본딩장치.
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Application Number | Priority Date | Filing Date | Title |
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JP2000-12738 | 2000-01-21 | ||
JP2000012738A JP3416091B2 (ja) | 2000-01-21 | 2000-01-21 | ボンディング装置およびボンディング方法 |
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KR20010076276A KR20010076276A (ko) | 2001-08-11 |
KR100413103B1 true KR100413103B1 (ko) | 2003-12-31 |
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KR10-2001-0002320A KR100413103B1 (ko) | 2000-01-21 | 2001-01-16 | 본딩장치 및 본딩방법 |
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US (1) | US6464126B2 (ko) |
JP (1) | JP3416091B2 (ko) |
KR (1) | KR100413103B1 (ko) |
TW (1) | TW473885B (ko) |
Cited By (1)
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KR20200000689A (ko) * | 2018-06-25 | 2020-01-03 | 주식회사 윈텍오토메이션 | 미러 및 비전시스템을 이용한 물체의 선단부 위치정렬장치 및 그 방법 |
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JP3967518B2 (ja) * | 2000-03-06 | 2007-08-29 | 株式会社新川 | オフセット測定方法、ツール位置検出方法およびボンディング装置 |
JP2002221404A (ja) * | 2001-01-26 | 2002-08-09 | Shinkawa Ltd | 画像処理方法および装置 |
US7527186B2 (en) * | 2001-07-24 | 2009-05-05 | Kulicke And Soffa Industries, Inc. | Method and apparatus for mapping a position of a capillary tool tip using a prism |
US6705507B2 (en) * | 2001-07-24 | 2004-03-16 | Kulicke & Soffa Investments, Inc. | Die attach system and process using cornercube offset tool |
US7523848B2 (en) * | 2001-07-24 | 2009-04-28 | Kulicke And Soffa Industries, Inc. | Method and apparatus for measuring the size of free air balls on a wire bonder |
JP4672211B2 (ja) * | 2001-08-23 | 2011-04-20 | 株式会社カイジョー | ボンディング装置 |
JP3802403B2 (ja) * | 2001-11-27 | 2006-07-26 | 株式会社新川 | ワイヤボンディング方法及び装置 |
JP2003163236A (ja) * | 2001-11-27 | 2003-06-06 | Shinkawa Ltd | ワイヤボンディング装置 |
JP3813088B2 (ja) | 2001-12-28 | 2006-08-23 | 株式会社新川 | ボンディング装置 |
EP1346793A1 (de) * | 2002-03-19 | 2003-09-24 | ESEC Trading S.A. | Verfahren und Einrichtung für die Bestimmung der vektoriellen Distanz zwischen der Kapillare und dem Bilderkennungssystem eines Wire Bonders |
TWI221648B (en) | 2002-03-19 | 2004-10-01 | Esec Trading Sa | Method and device for determining the vectorial distance between the capillary and the image recognition system of a wire bonder |
JP4105926B2 (ja) * | 2002-09-30 | 2008-06-25 | 株式会社新川 | ボンディング装置におけるオフセット測定機構及びボンディング装置におけるオフセット測定方法 |
JP3827645B2 (ja) * | 2003-02-19 | 2006-09-27 | 株式会社新川 | ボンディング装置及びボンディング外観検査装置 |
KR20040089480A (ko) * | 2003-04-14 | 2004-10-21 | 에섹 트레이딩 에스에이 | 모세관과 이미지 인식 시스템 사이의 벡터 거리를결정하는 장치를 갖는 와이어 본더 및 그 방법 |
JP4128540B2 (ja) * | 2003-06-05 | 2008-07-30 | 株式会社新川 | ボンディング装置 |
DE10338809B4 (de) * | 2003-08-21 | 2008-05-21 | Hesse & Knipps Gmbh | Verfahren und Vorrichtung zur Justage von Bondkopfelementen |
JP2007049489A (ja) * | 2005-08-10 | 2007-02-22 | Daishowa Seiki Co Ltd | 撮像装置 |
KR101113850B1 (ko) * | 2005-08-11 | 2012-02-29 | 삼성테크윈 주식회사 | 플립 칩 본딩 방법 및 이를 채택한 플립 칩 본딩 장치 |
JP5236223B2 (ja) * | 2007-07-25 | 2013-07-17 | キヤノンマシナリー株式会社 | ダイボンダ及びダイボンディング方法 |
KR20090057654A (ko) * | 2007-12-03 | 2009-06-08 | 삼성전자주식회사 | 정렬 검사 방법 및 정렬 검사 장치 |
JP4343985B2 (ja) * | 2008-01-24 | 2009-10-14 | 株式会社新川 | ボンディング装置及びボンディング装置のボンディングステージ高さ調整方法 |
JP2010256341A (ja) * | 2009-03-31 | 2010-11-11 | Toshiba Mach Co Ltd | 刃先位置検出方法および刃先位置検出装置 |
WO2011046557A1 (en) * | 2009-10-15 | 2011-04-21 | Kulicke And Soffa Industries, Inc. | Wire bonding machine, and method of calibrating a crosshair offset for a wire bonding operation |
TWI419762B (zh) * | 2010-09-02 | 2013-12-21 | Univ Nat Yunlin Sci & Tech | 工具機工件線上量測方法及其裝置 |
KR20130061427A (ko) * | 2011-12-01 | 2013-06-11 | 삼성전자주식회사 | 칩 본딩장치 및 이를 이용한 칩 본딩방법 |
US8777086B2 (en) * | 2012-04-20 | 2014-07-15 | Asm Technology Singapore Pte. Ltd. | Image-assisted system for adjusting a bonding tool |
JP6019817B2 (ja) * | 2012-06-29 | 2016-11-02 | 澁谷工業株式会社 | ボンディング装置 |
CN103552131B (zh) * | 2013-09-30 | 2015-09-09 | 哈尔滨博真科技有限公司 | 一种具有检测功能的高压水切割装置 |
TWI580511B (zh) * | 2014-06-10 | 2017-05-01 | Shinkawa Kk | A bonding device, and a method of estimating the placement position of the engagement tool |
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US11540399B1 (en) * | 2020-04-09 | 2022-12-27 | Hrl Laboratories, Llc | System and method for bonding a cable to a substrate using a die bonder |
WO2023050064A1 (zh) * | 2021-09-28 | 2023-04-06 | 宁德时代新能源科技股份有限公司 | 偏移检测方法及偏移检测装置 |
NL2033017B1 (en) * | 2022-09-13 | 2024-03-22 | Xyztec B V | determining a position of a tool in a work area of a bond tester. |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4671446A (en) * | 1982-12-02 | 1987-06-09 | Stanley Electric Company, Ltd. | Method and system for automatically bonding a leadwire on a semiconductor |
JPS59129453A (ja) * | 1983-01-14 | 1984-07-25 | Fuji Electric Co Ltd | 混成集積回路 |
JPH05347326A (ja) * | 1992-06-15 | 1993-12-27 | Sony Corp | ワイヤボンディング装置におけるキャピラリのセッティング方法 |
JP2541489B2 (ja) * | 1993-12-06 | 1996-10-09 | 日本電気株式会社 | ワイヤボンディング装置 |
JP3255807B2 (ja) * | 1994-10-21 | 2002-02-12 | 松下電器産業株式会社 | Tcp実装方法 |
US5702049A (en) * | 1995-06-07 | 1997-12-30 | West Bond Inc. | Angled wire bonding tool and alignment method |
JPH11218412A (ja) * | 1998-02-02 | 1999-08-10 | Shinkawa Ltd | ボンディング装置 |
JP2982000B1 (ja) * | 1998-07-03 | 1999-11-22 | 株式会社新川 | ボンディング方法及びその装置 |
JP2000164626A (ja) * | 1998-09-25 | 2000-06-16 | Fuji Photo Film Co Ltd | 部品のボンディング方法および装置 |
JP3328878B2 (ja) * | 1998-10-26 | 2002-09-30 | 澁谷工業株式会社 | ボンディング装置 |
JP3757254B2 (ja) * | 1999-12-28 | 2006-03-22 | 株式会社新川 | ボンディング装置およびボンディング方法 |
JP2001203233A (ja) * | 2000-01-21 | 2001-07-27 | Shinkawa Ltd | ツール位置検出子、検出装置および検出方法、ならびにオフセット測定方法 |
-
2000
- 2000-01-21 JP JP2000012738A patent/JP3416091B2/ja not_active Expired - Lifetime
- 2000-12-14 TW TW089126699A patent/TW473885B/zh not_active IP Right Cessation
-
2001
- 2001-01-16 KR KR10-2001-0002320A patent/KR100413103B1/ko active IP Right Grant
- 2001-01-22 US US09/766,950 patent/US6464126B2/en not_active Expired - Lifetime
Cited By (2)
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KR20200000689A (ko) * | 2018-06-25 | 2020-01-03 | 주식회사 윈텍오토메이션 | 미러 및 비전시스템을 이용한 물체의 선단부 위치정렬장치 및 그 방법 |
KR102087037B1 (ko) | 2018-06-25 | 2020-03-10 | 주식회사 윈텍오토메이션 | 미러 및 비전시스템을 이용한 물체의 선단부 위치정렬장치 및 그 방법 |
Also Published As
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KR20010076276A (ko) | 2001-08-11 |
JP2001203234A (ja) | 2001-07-27 |
US6464126B2 (en) | 2002-10-15 |
JP3416091B2 (ja) | 2003-06-16 |
TW473885B (en) | 2002-01-21 |
US20010011669A1 (en) | 2001-08-09 |
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