KR100286782B1 - 반도체장치 - Google Patents

반도체장치 Download PDF

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Publication number
KR100286782B1
KR100286782B1 KR1019970021230A KR19970021230A KR100286782B1 KR 100286782 B1 KR100286782 B1 KR 100286782B1 KR 1019970021230 A KR1019970021230 A KR 1019970021230A KR 19970021230 A KR19970021230 A KR 19970021230A KR 100286782 B1 KR100286782 B1 KR 100286782B1
Authority
KR
South Korea
Prior art keywords
node
power supply
voltage
parasitic capacitance
resistance element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019970021230A
Other languages
English (en)
Korean (ko)
Other versions
KR19980041747A (ko
Inventor
마코토 수와
Original Assignee
다니구찌 이찌로오, 기타오카 다카시
미쓰비시덴키 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 다니구찌 이찌로오, 기타오카 다카시, 미쓰비시덴키 가부시키가이샤 filed Critical 다니구찌 이찌로오, 기타오카 다카시
Publication of KR19980041747A publication Critical patent/KR19980041747A/ko
Application granted granted Critical
Publication of KR100286782B1 publication Critical patent/KR100286782B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/40—Resistors
    • H10D1/43—Resistors having PN junctions

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1019970021230A 1996-11-29 1997-05-28 반도체장치 Expired - Fee Related KR100286782B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP96-319402 1996-11-29
JP8319402A JPH10163429A (ja) 1996-11-29 1996-11-29 半導体装置

Publications (2)

Publication Number Publication Date
KR19980041747A KR19980041747A (ko) 1998-08-17
KR100286782B1 true KR100286782B1 (ko) 2001-04-16

Family

ID=18109791

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970021230A Expired - Fee Related KR100286782B1 (ko) 1996-11-29 1997-05-28 반도체장치

Country Status (6)

Country Link
US (1) US5903033A (enExample)
JP (1) JPH10163429A (enExample)
KR (1) KR100286782B1 (enExample)
CN (1) CN1087497C (enExample)
DE (1) DE19729601A1 (enExample)
TW (1) TW335547B (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3547955B2 (ja) * 1997-10-16 2004-07-28 株式会社ルネサステクノロジ 半導体装置
US6121104A (en) * 1997-12-12 2000-09-19 Texas Instruments Incorporated Charge cancellation technique for integrated circuit resistors
US6335899B1 (en) * 2000-04-19 2002-01-01 Lsi Logic Corporation Compensation capacitance for minimizing bit line coupling in multiport memory
JP4024990B2 (ja) * 2000-04-28 2007-12-19 株式会社ルネサステクノロジ 半導体装置
IT1316269B1 (it) 2000-12-28 2003-04-03 Micron Technology Inc Riduzione di rumore di alimentazione nella selezione di colonna indispositivi di memoria.
JP2006202830A (ja) * 2005-01-18 2006-08-03 Kawasaki Microelectronics Kk 半導体装置
DE102006007040A1 (de) * 2006-02-15 2007-08-16 Austriamicrosystems Ag Bauelement mit integriertem Heizelement und Verfahren zum Beheizen eines Halbleiterkörpers
JP5237549B2 (ja) * 2006-12-27 2013-07-17 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 定電流回路
JP2012109535A (ja) * 2010-10-20 2012-06-07 Asahi Kasei Electronics Co Ltd 抵抗素子及び反転バッファ回路
JP5763670B2 (ja) * 2010-11-04 2015-08-12 株式会社ソシオネクスト 半導体集積回路
US8786050B2 (en) * 2011-05-04 2014-07-22 Taiwan Semiconductor Manufacturing Company, Ltd. High voltage resistor with biased-well
CN105263853B (zh) 2013-06-07 2017-03-08 卡文迪什动力有限公司 具有均匀工作特性的mems数字可变电容器的非对称阵列
JP6445374B2 (ja) * 2015-04-01 2018-12-26 ローム株式会社 コンデンサ構造
JP7027176B2 (ja) * 2018-01-22 2022-03-01 ラピスセミコンダクタ株式会社 半導体装置
TWI816359B (zh) * 2019-03-15 2023-09-21 日商鎧俠股份有限公司 半導體裝置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0316164A (ja) * 1988-11-22 1991-01-24 Seiko Epson Corp 半導体装置
JPH03129762A (ja) * 1989-10-16 1991-06-03 Hitachi Ltd 半導体集積回路装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS577150A (en) * 1980-06-16 1982-01-14 Fujitsu Ltd Manufacture of semiconductor device
JP2748070B2 (ja) * 1992-05-20 1998-05-06 三菱電機株式会社 半導体装置およびその製造方法
US5479044A (en) * 1993-06-25 1995-12-26 Nec Corporation Semiconductor circuit device capable of reducing influence of a parasitic capacitor
US5440162A (en) * 1994-07-26 1995-08-08 Rockwell International Corporation ESD protection for submicron CMOS circuits

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0316164A (ja) * 1988-11-22 1991-01-24 Seiko Epson Corp 半導体装置
JPH03129762A (ja) * 1989-10-16 1991-06-03 Hitachi Ltd 半導体集積回路装置

Also Published As

Publication number Publication date
CN1087497C (zh) 2002-07-10
US5903033A (en) 1999-05-11
TW335547B (en) 1998-07-01
JPH10163429A (ja) 1998-06-19
CN1184336A (zh) 1998-06-10
DE19729601A1 (de) 1998-06-04
KR19980041747A (ko) 1998-08-17

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