KR100206675B1 - 반도체 집적 회로 장치 - Google Patents

반도체 집적 회로 장치 Download PDF

Info

Publication number
KR100206675B1
KR100206675B1 KR1019960053909A KR19960053909A KR100206675B1 KR 100206675 B1 KR100206675 B1 KR 100206675B1 KR 1019960053909 A KR1019960053909 A KR 1019960053909A KR 19960053909 A KR19960053909 A KR 19960053909A KR 100206675 B1 KR100206675 B1 KR 100206675B1
Authority
KR
South Korea
Prior art keywords
terminal
power supply
common wiring
supply terminal
protection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019960053909A
Other languages
English (en)
Korean (ko)
Other versions
KR970030780A (ko
Inventor
가오르 나리따
Original Assignee
가네꼬 히사시
닛본 덴기 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가네꼬 히사시, 닛본 덴기 가부시끼가이샤 filed Critical 가네꼬 히사시
Publication of KR970030780A publication Critical patent/KR970030780A/ko
Application granted granted Critical
Publication of KR100206675B1 publication Critical patent/KR100206675B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/711Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)
KR1019960053909A 1995-11-15 1996-11-14 반도체 집적 회로 장치 Expired - Fee Related KR100206675B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP95-296550 1995-11-15
JP7296550A JP3019760B2 (ja) 1995-11-15 1995-11-15 半導体集積回路装置

Publications (2)

Publication Number Publication Date
KR970030780A KR970030780A (ko) 1997-06-26
KR100206675B1 true KR100206675B1 (ko) 1999-07-01

Family

ID=17834993

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960053909A Expired - Fee Related KR100206675B1 (ko) 1995-11-15 1996-11-14 반도체 집적 회로 장치

Country Status (5)

Country Link
US (1) US5828107A (enExample)
EP (1) EP0774784A3 (enExample)
JP (1) JP3019760B2 (enExample)
KR (1) KR100206675B1 (enExample)
TW (1) TW314656B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100223923B1 (ko) * 1996-11-19 1999-10-15 구본준 정전기 방지장치
JP2954153B1 (ja) 1998-04-07 1999-09-27 日本電気アイシーマイコンシステム株式会社 半導体集積回路
KR100506970B1 (ko) * 1998-09-01 2005-10-26 삼성전자주식회사 정전기방전 방지용 반도체장치
US6268286B1 (en) 2000-02-01 2001-07-31 International Business Machines Corporation Method of fabricating MOSFET with lateral resistor with ballasting
US6700164B1 (en) 2000-07-07 2004-03-02 International Business Machines Corporation Tungsten hot wire current limiter for ESD protection
CN1244152C (zh) 2001-11-16 2006-03-01 松下电器产业株式会社 半导体装置
US8363365B2 (en) * 2008-06-17 2013-01-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP5595751B2 (ja) * 2009-03-11 2014-09-24 ルネサスエレクトロニクス株式会社 Esd保護素子
JP2014225483A (ja) 2011-09-16 2014-12-04 パナソニック株式会社 半導体集積回路装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL176322C (nl) * 1976-02-24 1985-03-18 Philips Nv Halfgeleiderinrichting met beveiligingsschakeling.
JPH061833B2 (ja) * 1982-11-11 1994-01-05 株式会社東芝 Mos形半導体装置
JPS6010765A (ja) * 1983-06-30 1985-01-19 Fujitsu Ltd 半導体装置
JP3318774B2 (ja) * 1992-06-29 2002-08-26 ソニー株式会社 半導体装置および固体撮像装置
JP2958202B2 (ja) * 1992-12-01 1999-10-06 シャープ株式会社 半導体装置
JP2972494B2 (ja) * 1993-06-30 1999-11-08 日本電気株式会社 半導体装置
US5616943A (en) * 1993-09-29 1997-04-01 At&T Global Information Solutions Company Electrostatic discharge protection system for mixed voltage application specific integrated circuit design
JP2638462B2 (ja) * 1993-12-29 1997-08-06 日本電気株式会社 半導体装置

Also Published As

Publication number Publication date
KR970030780A (ko) 1997-06-26
TW314656B (enExample) 1997-09-01
JPH09139468A (ja) 1997-05-27
EP0774784A3 (en) 2000-07-19
EP0774784A2 (en) 1997-05-21
US5828107A (en) 1998-10-27
JP3019760B2 (ja) 2000-03-13

Similar Documents

Publication Publication Date Title
US5623156A (en) Electrostatic discharge (ESD) protection circuit and structure for output drivers
US6605844B2 (en) Semiconductor device
US5717559A (en) Input/output protection device for use in semiconductor device
JP2638462B2 (ja) 半導体装置
US5786616A (en) Semiconductor integrated circuit having an SOI structure, provided with a protective circuit
KR100311578B1 (ko) 반도체장치
US4656491A (en) Protection circuit utilizing distributed transistors and resistors
US4609931A (en) Input protection MOS semiconductor device with zener breakdown mechanism
KR100194496B1 (ko) 반도체 장치
KR100206675B1 (ko) 반도체 집적 회로 장치
EP0253105A1 (en) Integrated circuit with improved protective device
EP1325519B1 (en) Semiconductor apparatus with improved ESD withstanding voltage
KR100387189B1 (ko) 절연체상반도체장치및그보호회로
US5909046A (en) Semiconductor integrated circuit device having stable input protection circuit
JP3559075B2 (ja) Cmos技術の集積電子回路用の極性反転保護装置
JP3665367B2 (ja) 半導体装置
US4922316A (en) Infant protection device
JPH05505060A (ja) 低トリガ電圧scr保護装置及び構造
KR20030035209A (ko) 정전방전 보호 회로용 반도체 제어 정류기
JP2611639B2 (ja) 半導体装置
US5384482A (en) Semiconductor integrated circuit device having input protective circuit
JP3795617B2 (ja) 半導体装置の保護回路
US5432369A (en) Input/output protection circuit
KR100236327B1 (ko) 이에스디(esd) 보호회로
JPS58186959A (ja) 半導体装置

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

R17-X000 Change to representative recorded

St.27 status event code: A-5-5-R10-R17-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

FPAY Annual fee payment

Payment date: 20130321

Year of fee payment: 15

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 15

FPAY Annual fee payment

Payment date: 20140403

Year of fee payment: 16

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 16

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 17

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20160410

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20160410

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000