JPWO2022064306A5 - - Google Patents

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Publication number
JPWO2022064306A5
JPWO2022064306A5 JP2022551438A JP2022551438A JPWO2022064306A5 JP WO2022064306 A5 JPWO2022064306 A5 JP WO2022064306A5 JP 2022551438 A JP2022551438 A JP 2022551438A JP 2022551438 A JP2022551438 A JP 2022551438A JP WO2022064306 A5 JPWO2022064306 A5 JP WO2022064306A5
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JP
Japan
Prior art keywords
metal oxide
oxide film
oxygen
conductor
zirconium
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Pending
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JP2022551438A
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English (en)
Japanese (ja)
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JPWO2022064306A1 (https=
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Priority claimed from PCT/IB2021/058179 external-priority patent/WO2022064306A1/ja
Publication of JPWO2022064306A1 publication Critical patent/JPWO2022064306A1/ja
Publication of JPWO2022064306A5 publication Critical patent/JPWO2022064306A5/ja
Pending legal-status Critical Current

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JP2022551438A 2020-09-22 2021-09-09 Pending JPWO2022064306A1 (https=)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2020158058 2020-09-22
JP2020158057 2020-09-22
JP2020161542 2020-09-26
PCT/IB2021/058179 WO2022064306A1 (ja) 2020-09-22 2021-09-09 強誘電体デバイス、および半導体装置

Publications (2)

Publication Number Publication Date
JPWO2022064306A1 JPWO2022064306A1 (https=) 2022-03-31
JPWO2022064306A5 true JPWO2022064306A5 (https=) 2024-09-13

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ID=80846286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022551438A Pending JPWO2022064306A1 (https=) 2020-09-22 2021-09-09

Country Status (7)

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US (2) US12550332B2 (https=)
JP (1) JPWO2022064306A1 (https=)
KR (1) KR20230069933A (https=)
CN (1) CN116171484A (https=)
DE (1) DE112021005000T5 (https=)
TW (1) TW202213766A (https=)
WO (1) WO2022064306A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12538495B2 (en) 2020-09-06 2026-01-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, capacitor, and manufacturing method thereof
DE112021005537T5 (de) * 2020-10-20 2023-08-17 Semiconductor Energy Laboratory Co., Ltd. Ferroelektrische Vorrichtung und Halbleitervorrichtung
US20230200075A1 (en) * 2021-12-22 2023-06-22 Intel Corporation Memory with vertical transistors and wrap-around control lines
US12471289B2 (en) 2021-12-22 2025-11-11 Intel Corporation Diagonal memory with vertical transistors and wrap-around control lines
KR102929695B1 (ko) 2022-04-14 2026-02-20 삼성전자주식회사 반도체 장치
CN117222306A (zh) * 2022-05-30 2023-12-12 华为技术有限公司 铁电单元、三维铁电结构和铁电存储器
CN117241589A (zh) * 2022-06-02 2023-12-15 华为技术有限公司 铁电存储器及其制备方法、电子设备
US12119035B2 (en) * 2022-07-29 2024-10-15 Taiwan Semiconductor Manufacturing Company, Ltd. Spacer film scheme for polarization improvement
CN117794250A (zh) * 2022-09-19 2024-03-29 华为技术有限公司 铁电存储阵列及其制备方法、存储器、电子设备
TW202441602A (zh) * 2022-12-22 2024-10-16 日商半導體能源研究所股份有限公司 半導體裝置
US11741428B1 (en) * 2022-12-23 2023-08-29 Kepler Computing Inc. Iterative monetization of process development of non-linear polar material and devices
WO2024252246A1 (ja) * 2023-06-09 2024-12-12 株式会社半導体エネルギー研究所 半導体装置、半導体装置の作製方法
US20250227935A1 (en) * 2024-01-10 2025-07-10 Macronix International Co., Ltd. Semiconductor structure and manufacturing method thereof

Family Cites Families (18)

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Publication number Priority date Publication date Assignee Title
JPH11251535A (ja) * 1998-02-27 1999-09-17 Fujitsu Ltd 半導体装置およびその製造方法
JP2003086776A (ja) * 2001-09-10 2003-03-20 Fujitsu Ltd 半導体装置及びその製造方法
JP4331442B2 (ja) * 2002-06-14 2009-09-16 富士通マイクロエレクトロニクス株式会社 強誘電体キャパシタ及びその製造方法並びに強誘電体メモリ
JP4861627B2 (ja) * 2005-01-25 2012-01-25 ラピスセミコンダクタ株式会社 強誘電体キャパシタの製造方法
JP2011124478A (ja) * 2009-12-14 2011-06-23 Panasonic Corp 半導体記憶装置及びその製造方法
JP5633346B2 (ja) * 2009-12-25 2014-12-03 株式会社リコー 電界効果型トランジスタ、半導体メモリ、表示素子、画像表示装置及びシステム
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JP6121819B2 (ja) * 2013-07-04 2017-04-26 株式会社東芝 半導体装置および誘電体膜
JP6067524B2 (ja) 2013-09-25 2017-01-25 株式会社東芝 半導体装置および誘電体膜
US10242989B2 (en) * 2014-05-20 2019-03-26 Micron Technology, Inc. Polar, chiral, and non-centro-symmetric ferroelectric materials, memory cells including such materials, and related devices and methods
JP6887307B2 (ja) * 2017-05-19 2021-06-16 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
JP2019212793A (ja) 2018-06-06 2019-12-12 ソニー株式会社 強誘電記憶装置
JP7066585B2 (ja) * 2018-09-19 2022-05-13 キオクシア株式会社 記憶装置
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JP7638643B2 (ja) 2020-08-21 2025-03-04 株式会社半導体エネルギー研究所 半導体装置および電子機器
TW202210653A (zh) 2020-09-07 2022-03-16 日商半導體能源研究所股份有限公司 金屬氧化物膜、半導體裝置以及其製造方法

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