JPS61222093A - 不揮発性半導体記憶装置 - Google Patents
不揮発性半導体記憶装置Info
- Publication number
- JPS61222093A JPS61222093A JP60062103A JP6210385A JPS61222093A JP S61222093 A JPS61222093 A JP S61222093A JP 60062103 A JP60062103 A JP 60062103A JP 6210385 A JP6210385 A JP 6210385A JP S61222093 A JPS61222093 A JP S61222093A
- Authority
- JP
- Japan
- Prior art keywords
- cell
- load
- data
- transistor
- memory cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 27
- 238000010586 diagram Methods 0.000 description 13
- 238000013500 data storage Methods 0.000 description 8
- 230000007423 decrease Effects 0.000 description 5
- 230000006870 function Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60062103A JPS61222093A (ja) | 1985-03-28 | 1985-03-28 | 不揮発性半導体記憶装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60062103A JPS61222093A (ja) | 1985-03-28 | 1985-03-28 | 不揮発性半導体記憶装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61222093A true JPS61222093A (ja) | 1986-10-02 |
JPH0325876B2 JPH0325876B2 (enrdf_load_stackoverflow) | 1991-04-09 |
Family
ID=13190377
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60062103A Granted JPS61222093A (ja) | 1985-03-28 | 1985-03-28 | 不揮発性半導体記憶装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61222093A (enrdf_load_stackoverflow) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62222498A (ja) * | 1986-03-10 | 1987-09-30 | Fujitsu Ltd | 消去及び書き込み可能な読み出し専用メモリ |
JPS63293800A (ja) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | 不揮発性半導体メモリ |
JPS6488998A (en) * | 1987-09-29 | 1989-04-03 | Toshiba Corp | Nonvolatile semiconductor memory |
JPH01263997A (ja) * | 1988-04-13 | 1989-10-20 | Toshiba Corp | 半導体記憶装置 |
US6233189B1 (en) | 1999-06-10 | 2001-05-15 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
US6535427B1 (en) | 1999-11-12 | 2003-03-18 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device with initialization circuit and control method thereof |
WO2004109710A1 (ja) * | 2003-06-05 | 2004-12-16 | Fujitsu Limited | 隣接セルの状態に依存したテストを可能にした仮想接地型不揮発性メモリ |
JP2011159355A (ja) * | 2010-02-01 | 2011-08-18 | Sanyo Electric Co Ltd | 半導体記憶装置 |
JP2012079399A (ja) * | 2010-09-10 | 2012-04-19 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
US8437194B2 (en) | 2009-10-01 | 2013-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of semiconductor device |
-
1985
- 1985-03-28 JP JP60062103A patent/JPS61222093A/ja active Granted
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62222498A (ja) * | 1986-03-10 | 1987-09-30 | Fujitsu Ltd | 消去及び書き込み可能な読み出し専用メモリ |
JPS63293800A (ja) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | 不揮発性半導体メモリ |
JPS6488998A (en) * | 1987-09-29 | 1989-04-03 | Toshiba Corp | Nonvolatile semiconductor memory |
JPH01263997A (ja) * | 1988-04-13 | 1989-10-20 | Toshiba Corp | 半導体記憶装置 |
US6233189B1 (en) | 1999-06-10 | 2001-05-15 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
US6337825B2 (en) | 1999-06-10 | 2002-01-08 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
US6535427B1 (en) | 1999-11-12 | 2003-03-18 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device with initialization circuit and control method thereof |
WO2004109710A1 (ja) * | 2003-06-05 | 2004-12-16 | Fujitsu Limited | 隣接セルの状態に依存したテストを可能にした仮想接地型不揮発性メモリ |
US8437194B2 (en) | 2009-10-01 | 2013-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of semiconductor device |
JP2011159355A (ja) * | 2010-02-01 | 2011-08-18 | Sanyo Electric Co Ltd | 半導体記憶装置 |
JP2012079399A (ja) * | 2010-09-10 | 2012-04-19 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2016042407A (ja) * | 2010-09-10 | 2016-03-31 | 株式会社半導体エネルギー研究所 | 半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0325876B2 (enrdf_load_stackoverflow) | 1991-04-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |