JPS56108242A - Master slice semiconductor device - Google Patents
Master slice semiconductor deviceInfo
- Publication number
- JPS56108242A JPS56108242A JP1028180A JP1028180A JPS56108242A JP S56108242 A JPS56108242 A JP S56108242A JP 1028180 A JP1028180 A JP 1028180A JP 1028180 A JP1028180 A JP 1028180A JP S56108242 A JPS56108242 A JP S56108242A
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- polycrystalline
- master slice
- layer
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 2
- 238000004519 manufacturing process Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/528—Layout of the interconnection structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Bipolar Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1028180A JPS56108242A (en) | 1980-01-31 | 1980-01-31 | Master slice semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1028180A JPS56108242A (en) | 1980-01-31 | 1980-01-31 | Master slice semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56108242A true JPS56108242A (en) | 1981-08-27 |
JPH0120537B2 JPH0120537B2 (enrdf_load_stackoverflow) | 1989-04-17 |
Family
ID=11745921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1028180A Granted JPS56108242A (en) | 1980-01-31 | 1980-01-31 | Master slice semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56108242A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5874052A (ja) * | 1981-10-29 | 1983-05-04 | Nec Corp | マスタ−スライス半導体集積回路装置 |
JPS58139445A (ja) * | 1982-02-15 | 1983-08-18 | Nec Corp | 半導体集積回路装置 |
JPH06112447A (ja) * | 1992-11-13 | 1994-04-22 | Seiko Epson Corp | 半導体装置 |
US8407539B2 (en) | 2009-03-03 | 2013-03-26 | Renesas Electronics Corporation | Semiconductor device test circuit, semiconductor device, and its manufacturing method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5024597A (enrdf_load_stackoverflow) * | 1973-03-14 | 1975-03-15 | ||
JPS5120268A (en) * | 1974-08-08 | 1976-02-18 | Takashi Ishikawa | Taika * tainetsusei goseijushi |
JPS5493344A (en) * | 1977-12-30 | 1979-07-24 | Fujitsu Ltd | Semiconductor integrated circuit |
-
1980
- 1980-01-31 JP JP1028180A patent/JPS56108242A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5024597A (enrdf_load_stackoverflow) * | 1973-03-14 | 1975-03-15 | ||
JPS5120268A (en) * | 1974-08-08 | 1976-02-18 | Takashi Ishikawa | Taika * tainetsusei goseijushi |
JPS5493344A (en) * | 1977-12-30 | 1979-07-24 | Fujitsu Ltd | Semiconductor integrated circuit |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5874052A (ja) * | 1981-10-29 | 1983-05-04 | Nec Corp | マスタ−スライス半導体集積回路装置 |
JPS58139445A (ja) * | 1982-02-15 | 1983-08-18 | Nec Corp | 半導体集積回路装置 |
JPH06112447A (ja) * | 1992-11-13 | 1994-04-22 | Seiko Epson Corp | 半導体装置 |
US8407539B2 (en) | 2009-03-03 | 2013-03-26 | Renesas Electronics Corporation | Semiconductor device test circuit, semiconductor device, and its manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
JPH0120537B2 (enrdf_load_stackoverflow) | 1989-04-17 |
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