JPH10289023A5 - - Google Patents

Info

Publication number
JPH10289023A5
JPH10289023A5 JP1997093598A JP9359897A JPH10289023A5 JP H10289023 A5 JPH10289023 A5 JP H10289023A5 JP 1997093598 A JP1997093598 A JP 1997093598A JP 9359897 A JP9359897 A JP 9359897A JP H10289023 A5 JPH10289023 A5 JP H10289023A5
Authority
JP
Japan
Prior art keywords
voltage
circuit
unit
voltage drop
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1997093598A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10289023A (ja
JP3676904B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP09359897A priority Critical patent/JP3676904B2/ja
Priority claimed from JP09359897A external-priority patent/JP3676904B2/ja
Priority to US08/927,796 priority patent/US6008674A/en
Priority to DE19744686A priority patent/DE19744686C2/de
Priority to KR1019970051992A priority patent/KR100286184B1/ko
Publication of JPH10289023A publication Critical patent/JPH10289023A/ja
Publication of JPH10289023A5 publication Critical patent/JPH10289023A5/ja
Application granted granted Critical
Publication of JP3676904B2 publication Critical patent/JP3676904B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP09359897A 1997-04-11 1997-04-11 半導体集積回路 Expired - Fee Related JP3676904B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP09359897A JP3676904B2 (ja) 1997-04-11 1997-04-11 半導体集積回路
US08/927,796 US6008674A (en) 1997-04-11 1997-09-11 Semiconductor integrated circuit device with adjustable high voltage detection circuit
DE19744686A DE19744686C2 (de) 1997-04-11 1997-10-09 Integrierte Halbleiterschaltungseinrichtung mit einer einstellbaren Hochspannungserfassungsschaltung zum Erfassen hoher Spannungspegel
KR1019970051992A KR100286184B1 (ko) 1997-04-11 1997-10-10 고전압레벨검출용고전압검출회로를구비한반도체직접회로장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP09359897A JP3676904B2 (ja) 1997-04-11 1997-04-11 半導体集積回路

Publications (3)

Publication Number Publication Date
JPH10289023A JPH10289023A (ja) 1998-10-27
JPH10289023A5 true JPH10289023A5 (enExample) 2005-03-10
JP3676904B2 JP3676904B2 (ja) 2005-07-27

Family

ID=14086763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP09359897A Expired - Fee Related JP3676904B2 (ja) 1997-04-11 1997-04-11 半導体集積回路

Country Status (4)

Country Link
US (1) US6008674A (enExample)
JP (1) JP3676904B2 (enExample)
KR (1) KR100286184B1 (enExample)
DE (1) DE19744686C2 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2851767B2 (ja) * 1992-10-15 1999-01-27 三菱電機株式会社 電圧供給回路および内部降圧回路
US5949253A (en) * 1997-04-18 1999-09-07 Adaptec, Inc. Low voltage differential driver with multiple drive strengths
JP2000019200A (ja) * 1998-07-01 2000-01-21 Mitsubishi Electric Corp 電位検出回路
US6300810B1 (en) * 1999-02-05 2001-10-09 United Microelectronics, Corp. Voltage down converter with switched hysteresis
US6448823B1 (en) * 1999-11-30 2002-09-10 Xilinx, Inc. Tunable circuit for detection of negative voltages
JP5102413B2 (ja) * 2000-07-12 2012-12-19 ユナイテッド・マイクロエレクトロニクス・コーポレイション 第１の電源電圧から第２の電源電圧を生成する装置、基準電圧発生器、ならびに、所望の電圧を生成するための方法および装置
JP4503150B2 (ja) * 2000-07-13 2010-07-14 ユナイテッド・マイクロエレクトロニクス・コーポレイション 電圧ダウンコンバータおよび電圧ｖｃｃを変換するための方法
KR100550637B1 (ko) * 2000-12-30 2006-02-10 주식회사 하이닉스반도체 저전압 감지기를 내장한 고전압 검출기
US6385109B1 (en) * 2001-01-30 2002-05-07 Motorola, Inc. Reference voltage generator for MRAM and method
US20030197546A1 (en) * 2001-07-09 2003-10-23 Samsung Electronics Co., Ltd. Negative voltage generator for a semiconductor memory device
KR100675273B1 (ko) * 2001-05-17 2007-01-26 삼성전자주식회사 반도체 메모리 장치 및 이 장치의 전압 레벨 및 지연 시간 조절회로
US6636082B1 (en) * 2002-04-16 2003-10-21 Texas Instruments Incorporated System and method for detecting a negative supply fault
DE10218097B4 (de) 2002-04-23 2004-02-26 Infineon Technologies Ag Schaltungsanordnung zur Spannungsregelung
JP3947044B2 (ja) * 2002-05-31 2007-07-18 富士通株式会社 入出力バッファ
US6586984B1 (en) * 2002-07-12 2003-07-01 Lsi Logic Corporation Method for preventing damage to IO devices due to over voltage at pin
DE10356420A1 (de) * 2002-12-02 2004-06-24 Samsung Electronics Co., Ltd., Suwon Spannungsgeneratorschaltung
US6909642B2 (en) * 2003-03-14 2005-06-21 Infineon Technologies North American Corp. Self trimming voltage generator
US6861895B1 (en) * 2003-06-17 2005-03-01 Xilinx Inc High voltage regulation circuit to minimize voltage overshoot
EP1659690B1 (en) * 2004-11-22 2013-11-06 Semiconductor Components Industries, LLC Comparator for input voltages higher than supply voltage
KR100675886B1 (ko) * 2005-03-29 2007-02-02 주식회사 하이닉스반도체 전압레벨 검출회로
JP2007226938A (ja) * 2006-01-25 2007-09-06 Citizen Holdings Co Ltd 不揮発性半導体記憶装置
WO2008047416A1 (fr) * 2006-10-18 2008-04-24 Spansion Llc Circuit de détection de tension
US7589568B2 (en) * 2007-05-04 2009-09-15 Microchip Technology Incorporated Variable power and response time brown-out-reset circuit
JP5867065B2 (ja) 2011-12-22 2016-02-24 株式会社ソシオネクスト 降圧型電源回路
US9379709B2 (en) 2014-06-30 2016-06-28 Finisar Corporation Signal conversion
JP2014225267A (ja) * 2014-06-30 2014-12-04 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． 電圧検知回路
WO2016201596A1 (en) 2015-06-15 2016-12-22 Micron Technology, Inc. Apparatuses and methods for providing reference voltages
JP6707477B2 (ja) * 2017-02-07 2020-06-10 株式会社東芝 コンパレータ
US10763839B2 (en) * 2018-07-12 2020-09-01 Texas Instruments Incorporated Buffer Circuit
US11393512B2 (en) 2019-11-15 2022-07-19 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device
CN111521861B (zh) * 2020-04-10 2022-07-22 南开大学深圳研究院 一种用于过压保护的高电压检测电路
DE112021006258T5 (de) * 2021-02-03 2023-09-14 Rohm Co., Ltd. Stromversorgungsvorrichtung

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5083045A (en) * 1987-02-25 1992-01-21 Samsung Electronics Co., Ltd. High voltage follower and sensing circuit
US5283762A (en) * 1990-05-09 1994-02-01 Mitsubishi Denki Kabushiki Kaisha Semiconductor device containing voltage converting circuit and operating method thereof
KR940008286B1 (ko) * 1991-08-19 1994-09-09 삼성전자 주식회사 내부전원발생회로
US5280198A (en) * 1992-11-06 1994-01-18 Intel Corporation Power supply level detector
TW239190B (enExample) * 1993-04-30 1995-01-21 Philips Electronics Nv
JPH07226075A (ja) * 1994-02-10 1995-08-22 Toshiba Corp 半導体記憶装置
JP3597281B2 (ja) * 1995-11-28 2004-12-02 株式会社ルネサステクノロジ 電位検出回路及び半導体集積回路

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