JPH0568103B2 - - Google Patents

Info

Publication number
JPH0568103B2
JPH0568103B2 JP62269552A JP26955287A JPH0568103B2 JP H0568103 B2 JPH0568103 B2 JP H0568103B2 JP 62269552 A JP62269552 A JP 62269552A JP 26955287 A JP26955287 A JP 26955287A JP H0568103 B2 JPH0568103 B2 JP H0568103B2
Authority
JP
Japan
Prior art keywords
input
output
terminal
buffer
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62269552A
Other languages
English (en)
Japanese (ja)
Other versions
JPH01111365A (ja
Inventor
Fusao Tsubokura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP62269552A priority Critical patent/JPH01111365A/ja
Publication of JPH01111365A publication Critical patent/JPH01111365A/ja
Publication of JPH0568103B2 publication Critical patent/JPH0568103B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP62269552A 1987-10-26 1987-10-26 半導体集積回路 Granted JPH01111365A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62269552A JPH01111365A (ja) 1987-10-26 1987-10-26 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62269552A JPH01111365A (ja) 1987-10-26 1987-10-26 半導体集積回路

Publications (2)

Publication Number Publication Date
JPH01111365A JPH01111365A (ja) 1989-04-28
JPH0568103B2 true JPH0568103B2 (pl) 1993-09-28

Family

ID=17473966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62269552A Granted JPH01111365A (ja) 1987-10-26 1987-10-26 半導体集積回路

Country Status (1)

Country Link
JP (1) JPH01111365A (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0372381U (pl) * 1989-11-15 1991-07-22
JPH03279880A (ja) * 1990-03-28 1991-12-11 Matsushita Electric Ind Co Ltd 検査機能付集積回路素子
JPH0474977A (ja) * 1990-07-16 1992-03-10 Nec Corp 半導体集積回路
JP2012073166A (ja) * 2010-09-29 2012-04-12 Advantest Corp 試験装置および試験方法
US8896332B2 (en) 2011-12-09 2014-11-25 Advantest Corporation Test apparatus with voltage margin test

Also Published As

Publication number Publication date
JPH01111365A (ja) 1989-04-28

Similar Documents

Publication Publication Date Title
JP2827229B2 (ja) 半導体集積回路
EP0838689A2 (en) Test of circuits with Schmitt inputs
US5783947A (en) Semiconductor integrated circuit
JP2958992B2 (ja) 半導体集積回路
US5796260A (en) Parametric test circuit
JPH0568103B2 (pl)
US5225774A (en) Semiconductor integrated circuit
JPH0862294A (ja) 半導体装置及び半導体装置のテスト方法
KR0157900B1 (ko) 집적 회로내의 입출력 장치
JP3161357B2 (ja) 半導体集積回路装置
JP2972515B2 (ja) 入出力バッファテスト回路
JP2818546B2 (ja) 半導体集積回路
JP3132635B2 (ja) 半導体集積回路の試験方法
JP3207639B2 (ja) 半導体集積回路
JP3945641B2 (ja) 半導体装置
JP5614354B2 (ja) 半導体装置及び出力回路
JP2671832B2 (ja) 入力レベル試験回路
JPH10253710A (ja) 半導体装置及びその測定方法
JPH04172273A (ja) 半導体集積回路
JPS6218051A (ja) 集積回路
JP2000315773A (ja) 半導体回路のテスト装置およびテスト方法
JP2003139823A (ja) 半導体集積回路
JP2003057312A (ja) 半導体回路
JPH0737956A (ja) Ｃｍｏｓ型集積回路およびその検査方法
JPH03197883A (ja) 半導体集積回路