JP7136334B2 - チップ型セラミック電子部品およびその製造方法 - Google Patents
チップ型セラミック電子部品およびその製造方法 Download PDFInfo
- Publication number
- JP7136334B2 JP7136334B2 JP2021508856A JP2021508856A JP7136334B2 JP 7136334 B2 JP7136334 B2 JP 7136334B2 JP 2021508856 A JP2021508856 A JP 2021508856A JP 2021508856 A JP2021508856 A JP 2021508856A JP 7136334 B2 JP7136334 B2 JP 7136334B2
- Authority
- JP
- Japan
- Prior art keywords
- glass
- conductive paste
- free
- ceramic body
- electronic component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000919 ceramic Substances 0.000 title claims description 135
- 238000004519 manufacturing process Methods 0.000 title claims description 18
- 239000002184 metal Substances 0.000 claims description 74
- 229910052751 metal Inorganic materials 0.000 claims description 74
- 239000011521 glass Substances 0.000 claims description 68
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 61
- 229920005989 resin Polymers 0.000 claims description 61
- 239000011347 resin Substances 0.000 claims description 61
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 50
- 239000000843 powder Substances 0.000 claims description 48
- 229920001187 thermosetting polymer Polymers 0.000 claims description 42
- 239000011135 tin Substances 0.000 claims description 34
- 229910052718 tin Inorganic materials 0.000 claims description 34
- 239000004020 conductor Substances 0.000 claims description 30
- 230000008018 melting Effects 0.000 claims description 24
- 238000002844 melting Methods 0.000 claims description 24
- 239000003985 ceramic capacitor Substances 0.000 claims description 23
- 229910052759 nickel Inorganic materials 0.000 claims description 20
- 238000010438 heat treatment Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 15
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 13
- 238000007747 plating Methods 0.000 claims description 12
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 11
- 229910052802 copper Inorganic materials 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 11
- 229910052709 silver Inorganic materials 0.000 claims description 10
- 239000004332 silver Substances 0.000 claims description 10
- 229910052797 bismuth Inorganic materials 0.000 claims description 9
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 9
- 239000000203 mixture Substances 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 83
- 238000001035 drying Methods 0.000 description 9
- 238000005245 sintering Methods 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- VNWKTOKETHGBQD-AKLPVKDBSA-N carbane Chemical compound [15CH4] VNWKTOKETHGBQD-AKLPVKDBSA-N 0.000 description 5
- 239000002344 surface layer Substances 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000005304 joining Methods 0.000 description 2
- 238000013507 mapping Methods 0.000 description 2
- 239000005011 phenolic resin Substances 0.000 description 2
- 238000000550 scanning electron microscopy energy dispersive X-ray spectroscopy Methods 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 238000000992 sputter etching Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 229920003987 resole Polymers 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
- H01G13/006—Apparatus or processes for applying terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/228—Terminals
- H01G4/232—Terminals electrically connecting two or more layers of a stacked or rolled capacitor
- H01G4/2325—Terminals electrically connecting two or more layers of a stacked or rolled capacitor characterised by the material of the terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/692—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/02—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
- H01B1/026—Alloys based on copper
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
- H01G4/1218—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates
- H01G4/1227—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates based on alkaline earth titanates
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019062901 | 2019-03-28 | ||
| JP2019062901 | 2019-03-28 | ||
| PCT/JP2020/008132 WO2020195523A1 (ja) | 2019-03-28 | 2020-02-27 | チップ型セラミック電子部品およびその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2020195523A1 JPWO2020195523A1 (https=) | 2020-10-01 |
| JP7136334B2 true JP7136334B2 (ja) | 2022-09-13 |
Family
ID=72608992
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021508856A Active JP7136334B2 (ja) | 2019-03-28 | 2020-02-27 | チップ型セラミック電子部品およびその製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US12243689B2 (https=) |
| JP (1) | JP7136334B2 (https=) |
| KR (2) | KR102558658B1 (https=) |
| CN (1) | CN113614866B (https=) |
| WO (1) | WO2020195523A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101652850B1 (ko) * | 2015-01-30 | 2016-08-31 | 삼성전기주식회사 | 칩 전자부품, 그 제조방법 및 이를 구비한 기판 |
| TWI628678B (zh) * | 2016-04-21 | 2018-07-01 | Tdk 股份有限公司 | 電子零件 |
| JP7136333B2 (ja) * | 2019-03-28 | 2022-09-13 | 株式会社村田製作所 | チップ型セラミック電子部品およびその製造方法 |
| WO2022065004A1 (ja) * | 2020-09-25 | 2022-03-31 | 株式会社村田製作所 | チップ型セラミック電子部品およびその製造方法 |
| KR102911094B1 (ko) * | 2021-02-05 | 2026-01-13 | 삼성전기주식회사 | 적층 세라믹 전자부품 |
| JP2023099275A (ja) * | 2021-12-30 | 2023-07-12 | サムソン エレクトロ-メカニックス カンパニーリミテッド. | セラミック電子部品 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000216046A (ja) | 1999-01-26 | 2000-08-04 | Murata Mfg Co Ltd | 積層セラミック電子部品 |
| JP2010199168A (ja) | 2009-02-24 | 2010-09-09 | Murata Mfg Co Ltd | セラミックコンデンサの製造方法 |
| WO2012111479A1 (ja) | 2011-02-16 | 2012-08-23 | 株式会社 村田製作所 | 導電性ペースト、太陽電池、及び太陽電池の製造方法 |
| JP2015109411A (ja) | 2013-10-25 | 2015-06-11 | 株式会社村田製作所 | セラミック電子部品 |
| JP2018098327A (ja) | 2016-12-13 | 2018-06-21 | 太陽誘電株式会社 | 積層セラミックコンデンサおよびその製造方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1051862C (zh) * | 1991-04-20 | 2000-04-26 | 旭化成工业株式会社 | 高温烧结用糊剂及其应用 |
| JPH05290622A (ja) * | 1992-04-09 | 1993-11-05 | Sumitomo Metal Mining Co Ltd | Niペースト組成物 |
| JP4083971B2 (ja) * | 2000-11-22 | 2008-04-30 | Tdk株式会社 | 積層セラミック電子部品及びその製造方法 |
| CN100383899C (zh) * | 2003-01-30 | 2008-04-23 | 广东风华高新科技股份有限公司 | 高频多层片式陶瓷电容器的制造方法 |
| CN100583328C (zh) * | 2004-04-23 | 2010-01-20 | 株式会社村田制作所 | 电子元件及其制造方法 |
| WO2007072894A1 (ja) * | 2005-12-22 | 2007-06-28 | Namics Corporation | 熱硬化性導電ペースト及びそれを用いて形成した外部電極を有する積層セラミック部品 |
| JP5266874B2 (ja) | 2008-05-23 | 2013-08-21 | パナソニック株式会社 | セラミック電子部品の製造方法 |
| JP5211970B2 (ja) * | 2008-09-17 | 2013-06-12 | 株式会社村田製作所 | セラミック電子部品の製造方法 |
| CN102044344A (zh) * | 2009-10-13 | 2011-05-04 | 东莞市长凌电子材料有限公司 | 贴片电容 |
| KR20110067509A (ko) * | 2009-12-14 | 2011-06-22 | 삼성전기주식회사 | 외부전극용 도전성 페이스트 조성물, 이를 포함하는 적층 세라믹 커패시터 및 그 제조방법 |
| KR20130005518A (ko) * | 2011-07-06 | 2013-01-16 | 삼성전기주식회사 | 내부전극용 도전성 페이스트 조성물 및 이를 포함하는 적층 세라믹 전자부품 |
| KR20140012322A (ko) * | 2012-07-19 | 2014-02-03 | 삼성전기주식회사 | 적층 세라믹 전자 부품 및 그 제조 방법 |
| JP2015046644A (ja) * | 2014-12-11 | 2015-03-12 | 株式会社村田製作所 | 積層セラミック電子部品 |
| TWI665691B (zh) * | 2017-01-25 | 2019-07-11 | 禾伸堂企業股份有限公司 | 積層陶瓷電容器及其製造方法 |
| KR101941954B1 (ko) * | 2017-07-04 | 2019-01-24 | 삼성전기 주식회사 | 적층 세라믹 커패시터 |
| JP6787364B2 (ja) * | 2018-05-16 | 2020-11-18 | 株式会社村田製作所 | 導電性ペースト |
-
2020
- 2020-02-27 WO PCT/JP2020/008132 patent/WO2020195523A1/ja not_active Ceased
- 2020-02-27 KR KR1020217026670A patent/KR102558658B1/ko active Active
- 2020-02-27 CN CN202080024137.4A patent/CN113614866B/zh active Active
- 2020-02-27 JP JP2021508856A patent/JP7136334B2/ja active Active
- 2020-02-27 KR KR1020237022740A patent/KR102678767B1/ko active Active
-
2021
- 2021-08-18 US US17/405,064 patent/US12243689B2/en active Active
-
2024
- 2024-04-03 US US18/625,324 patent/US12278050B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000216046A (ja) | 1999-01-26 | 2000-08-04 | Murata Mfg Co Ltd | 積層セラミック電子部品 |
| JP2010199168A (ja) | 2009-02-24 | 2010-09-09 | Murata Mfg Co Ltd | セラミックコンデンサの製造方法 |
| WO2012111479A1 (ja) | 2011-02-16 | 2012-08-23 | 株式会社 村田製作所 | 導電性ペースト、太陽電池、及び太陽電池の製造方法 |
| JP2015109411A (ja) | 2013-10-25 | 2015-06-11 | 株式会社村田製作所 | セラミック電子部品 |
| JP2018098327A (ja) | 2016-12-13 | 2018-06-21 | 太陽誘電株式会社 | 積層セラミックコンデンサおよびその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102558658B1 (ko) | 2023-07-24 |
| US12243689B2 (en) | 2025-03-04 |
| CN113614866B (zh) | 2023-06-27 |
| US20210375545A1 (en) | 2021-12-02 |
| WO2020195523A1 (ja) | 2020-10-01 |
| US12278050B2 (en) | 2025-04-15 |
| JPWO2020195523A1 (https=) | 2020-10-01 |
| KR20210114531A (ko) | 2021-09-23 |
| US20240266112A1 (en) | 2024-08-08 |
| KR20230107899A (ko) | 2023-07-18 |
| KR102678767B1 (ko) | 2024-06-26 |
| CN113614866A (zh) | 2021-11-05 |
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