JP7068957B2 - 配線基板、半導体装置及び配線基板の製造方法 - Google Patents

配線基板、半導体装置及び配線基板の製造方法 Download PDF

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Publication number
JP7068957B2
JP7068957B2 JP2018143361A JP2018143361A JP7068957B2 JP 7068957 B2 JP7068957 B2 JP 7068957B2 JP 2018143361 A JP2018143361 A JP 2018143361A JP 2018143361 A JP2018143361 A JP 2018143361A JP 7068957 B2 JP7068957 B2 JP 7068957B2
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Japan
Prior art keywords
layer
opening
wiring
base plating
plating layer
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JP2018143361A
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English (en)
Japanese (ja)
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JP2020021796A (ja
JP2020021796A5 (enExample
Inventor
貴志 荒井
史雅 片桐
克哉 深瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Industries Co Ltd
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Shinko Electric Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Priority to JP2018143361A priority Critical patent/JP7068957B2/ja
Priority to US16/523,573 priority patent/US10892217B2/en
Publication of JP2020021796A publication Critical patent/JP2020021796A/ja
Publication of JP2020021796A5 publication Critical patent/JP2020021796A5/ja
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
    • H01L21/4814Conductive parts
    • H01L21/4846Leads on or in insulating or insulated substrates, e.g. metallisation
    • H01L21/4853Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49838Geometry or layout
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
    • H01L21/4803Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
    • H01L21/481Insulating layers on insulating parts, with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
    • H01L21/4814Conductive parts
    • H01L21/4846Leads on or in insulating or insulated substrates, e.g. metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Geometry (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
JP2018143361A 2018-07-31 2018-07-31 配線基板、半導体装置及び配線基板の製造方法 Active JP7068957B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2018143361A JP7068957B2 (ja) 2018-07-31 2018-07-31 配線基板、半導体装置及び配線基板の製造方法
US16/523,573 US10892217B2 (en) 2018-07-31 2019-07-26 Wiring substrate and semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018143361A JP7068957B2 (ja) 2018-07-31 2018-07-31 配線基板、半導体装置及び配線基板の製造方法

Publications (3)

Publication Number Publication Date
JP2020021796A JP2020021796A (ja) 2020-02-06
JP2020021796A5 JP2020021796A5 (enExample) 2021-07-29
JP7068957B2 true JP7068957B2 (ja) 2022-05-17

Family

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JP2018143361A Active JP7068957B2 (ja) 2018-07-31 2018-07-31 配線基板、半導体装置及び配線基板の製造方法

Country Status (2)

Country Link
US (1) US10892217B2 (enExample)
JP (1) JP7068957B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021093417A (ja) * 2019-12-09 2021-06-17 イビデン株式会社 プリント配線板、及び、プリント配線板の製造方法
US10741483B1 (en) * 2020-01-28 2020-08-11 Advanced Semiconductor Engineering, Inc. Substrate structure and method for manufacturing the same
CN112002752B (zh) 2020-07-27 2023-04-21 北海惠科光电技术有限公司 源漏电极的制备方法、阵列基板的制备方法和显示机构
JP7638812B2 (ja) * 2021-07-19 2025-03-04 新光電気工業株式会社 配線基板及び配線基板の製造方法
KR20230030995A (ko) * 2021-08-26 2023-03-07 엘지이노텍 주식회사 회로 기판 및 이를 포함하는 패키지 기판
KR20240059139A (ko) * 2022-10-27 2024-05-07 삼성전기주식회사 인쇄회로기판

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005191131A (ja) 2003-12-24 2005-07-14 Ngk Spark Plug Co Ltd 配線基板の製造方法
US20070007665A1 (en) 2005-07-05 2007-01-11 Interantional Business Machines Corporation Structure and method for producing multiple size interconnections
JP2008227355A (ja) 2007-03-15 2008-09-25 Shinko Electric Ind Co Ltd 電子装置及びその製造方法
JP2013229523A (ja) 2012-04-26 2013-11-07 Shinko Electric Ind Co Ltd パッド形成方法及び配線基板

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8614143B2 (en) * 2008-12-03 2013-12-24 Texas Instruments Incorporated Simultaneous via and trench patterning using different etch rates
KR101278426B1 (ko) 2010-09-02 2013-06-24 삼성전기주식회사 반도체 패키지 기판의 제조방법
US9245834B2 (en) * 2012-03-16 2016-01-26 Stats Chippac, Ltd. Semiconductor device and method of forming compliant conductive interconnect structure in flipchip package
JP2016051747A (ja) * 2014-08-29 2016-04-11 京セラサーキットソリューションズ株式会社 配線基板

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005191131A (ja) 2003-12-24 2005-07-14 Ngk Spark Plug Co Ltd 配線基板の製造方法
US20070007665A1 (en) 2005-07-05 2007-01-11 Interantional Business Machines Corporation Structure and method for producing multiple size interconnections
JP2008227355A (ja) 2007-03-15 2008-09-25 Shinko Electric Ind Co Ltd 電子装置及びその製造方法
JP2013229523A (ja) 2012-04-26 2013-11-07 Shinko Electric Ind Co Ltd パッド形成方法及び配線基板

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US20200043841A1 (en) 2020-02-06
US10892217B2 (en) 2021-01-12
JP2020021796A (ja) 2020-02-06

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