JP6377459B2 - ウエーハ検査方法、研削研磨装置 - Google Patents
ウエーハ検査方法、研削研磨装置 Download PDFInfo
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- JP6377459B2 JP6377459B2 JP2014175158A JP2014175158A JP6377459B2 JP 6377459 B2 JP6377459 B2 JP 6377459B2 JP 2014175158 A JP2014175158 A JP 2014175158A JP 2014175158 A JP2014175158 A JP 2014175158A JP 6377459 B2 JP6377459 B2 JP 6377459B2
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- Prior art keywords
- wafer
- grinding
- polishing
- imaging
- processed surface
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0076—Other grinding machines or devices grinding machines comprising two or more grinding tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/26—Acting in response to an ongoing measurement without interruption of processing, e.g. endpoint detection, in-situ thickness measurement
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20048—Transform domain processing
- G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
Description
42 チャックテーブル
46 粗研削手段(研削手段)
48 粗研削砥石(研削砥石)
51 仕上げ研削手段(研削手段)
53 仕上げ研削砥石(研削砥石)
56 研磨手段
91 ウエーハ検査機構
92 撮像カメラ
93 判断手段
99 研削痕
W ウエーハ
Claims (3)
- 研磨加工されたウエーハの加工面を撮像し研磨加工結果を検査するウエーハ検査方法であって、
チャックテーブルで保持したウエーハの研削砥石で研削した面を研磨する研磨工程と、
該研磨工程を経たウエーハの該加工面で、少なくともウエーハの中心を中心とする360度の領域を撮像する撮像工程と、
該撮像工程から得られた該加工面における高低差を示す撮像データをフーリエ変換して、フーリエ変換後のデータを、研削加工の加工条件に応じて予測される周波数帯であり、該加工面に対して円弧状の研削痕が周方向に周期的に表れる該周波数帯でフィルタリングして、研削痕の高低差を示す周波数分布を抽出し、抽出した周波数分布を逆フーリエ変換して得られる振幅が予め規定する規定幅より大きい場合に研磨不良と判断する判断工程と、からなるウエーハ検査方法。 - ウエーハの下面を保持する保持面を有するチャックテーブルと、該チャックテーブルを回転させる回転手段と、該チャックテーブルが保持するウエーハの上面に環状に配設する研削砥石を当接させ研削する研削手段と、該研削手段で研削されたウエーハの上面を研磨する研磨手段と、該研磨手段で研磨したウエーハの加工面を検査する請求項1記載のウエーハ検査方法を可能にするウエーハ検査機構と、を備え、
該ウエーハ検査機構は、ウエーハの加工面を上方から撮像する撮像カメラと、該撮像カメラが撮像するウエーハの撮像エリアを横から照射する光源と、該撮像カメラから得られた該撮像データから該研磨不良を判断する判断手段と、を備える研削研磨装置。 - 該ウエーハ検査機構でウエーハを検査した結果、該研磨不良と該判断手段が判断した時には、再び該研磨手段でウエーハを研磨する請求項2記載の研削研磨装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014175158A JP6377459B2 (ja) | 2014-08-29 | 2014-08-29 | ウエーハ検査方法、研削研磨装置 |
TW104122016A TWI667099B (zh) | 2014-08-29 | 2015-07-07 | Wafer inspection method and grinding and polishing device |
KR1020150113346A KR102318784B1 (ko) | 2014-08-29 | 2015-08-11 | 웨이퍼 검사 방법 및 연삭 연마 장치 |
DE102015216194.3A DE102015216194A1 (de) | 2014-08-29 | 2015-08-25 | Waferprüfverfahren und Schleif- und Poliervorrichtung |
US14/837,199 US9616544B2 (en) | 2014-08-29 | 2015-08-27 | Wafer inspection method and grinding and polishing apparatus |
CN201510542261.0A CN105390410B (zh) | 2014-08-29 | 2015-08-28 | 晶片检查方法以及磨削研磨装置 |
Applications Claiming Priority (1)
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JP2014175158A JP6377459B2 (ja) | 2014-08-29 | 2014-08-29 | ウエーハ検査方法、研削研磨装置 |
Publications (2)
Publication Number | Publication Date |
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JP2016049581A JP2016049581A (ja) | 2016-04-11 |
JP6377459B2 true JP6377459B2 (ja) | 2018-08-22 |
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JP2014175158A Active JP6377459B2 (ja) | 2014-08-29 | 2014-08-29 | ウエーハ検査方法、研削研磨装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9616544B2 (ja) |
JP (1) | JP6377459B2 (ja) |
KR (1) | KR102318784B1 (ja) |
CN (1) | CN105390410B (ja) |
DE (1) | DE102015216194A1 (ja) |
TW (1) | TWI667099B (ja) |
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JP6707291B2 (ja) * | 2016-10-14 | 2020-06-10 | 株式会社ディスコ | ウェーハの加工方法 |
JP6760820B2 (ja) * | 2016-11-01 | 2020-09-23 | 株式会社ディスコ | スクラッチ検出方法 |
JP6791551B2 (ja) * | 2016-11-01 | 2020-11-25 | 株式会社ディスコ | 研削装置 |
US9925604B1 (en) * | 2016-12-07 | 2018-03-27 | Design Ready Controls, Inc. | Automated DIN rail shear system |
JP6879747B2 (ja) * | 2017-01-16 | 2021-06-02 | 株式会社ディスコ | チャックテーブルの詰まり検出方法及び加工装置 |
JP2018140469A (ja) * | 2017-02-28 | 2018-09-13 | 株式会社ディスコ | 被加工物の検査方法、被加工物の検査装置及び加工装置 |
JP6807254B2 (ja) * | 2017-03-08 | 2021-01-06 | 株式会社ディスコ | 研削装置 |
JP6860416B2 (ja) * | 2017-05-18 | 2021-04-14 | 株式会社ディスコ | 加工装置 |
JP6906859B2 (ja) | 2017-09-13 | 2021-07-21 | 株式会社ディスコ | 加工装置 |
US10879077B2 (en) * | 2017-10-30 | 2020-12-29 | Taiwan Semiconductor Manufacturing Company Ltd. | Planarization apparatus and planarization method thereof |
JP7096674B2 (ja) * | 2018-01-31 | 2022-07-06 | 株式会社ディスコ | 研削研磨装置及び研削研磨方法 |
DE102018105133A1 (de) * | 2018-03-06 | 2019-09-12 | Karl Heesemann Maschinenfabrik Gmbh & Co. Kg | Verfahren zum Betreiben einer Schleifvorrichtung |
JP7061021B2 (ja) * | 2018-06-06 | 2022-04-27 | 株式会社ディスコ | ウェーハの加工方法及び研削装置 |
JP7125746B2 (ja) * | 2018-09-28 | 2022-08-25 | 学校法人同志社 | びびり振動抑制方法およびびびり振動抑制システム |
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JP7216613B2 (ja) * | 2019-05-16 | 2023-02-01 | 株式会社ディスコ | 加工装置 |
JP2021015850A (ja) | 2019-07-10 | 2021-02-12 | 株式会社ディスコ | ウェーハ検査装置 |
JP7341022B2 (ja) * | 2019-10-03 | 2023-09-08 | 株式会社荏原製作所 | 基板研磨装置および膜厚マップ作成方法 |
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JP2022123325A (ja) * | 2021-02-12 | 2022-08-24 | 株式会社ディスコ | 研削装置 |
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2014
- 2014-08-29 JP JP2014175158A patent/JP6377459B2/ja active Active
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2015
- 2015-07-07 TW TW104122016A patent/TWI667099B/zh active
- 2015-08-11 KR KR1020150113346A patent/KR102318784B1/ko active IP Right Grant
- 2015-08-25 DE DE102015216194.3A patent/DE102015216194A1/de active Pending
- 2015-08-27 US US14/837,199 patent/US9616544B2/en active Active
- 2015-08-28 CN CN201510542261.0A patent/CN105390410B/zh active Active
Also Published As
Publication number | Publication date |
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US20160059375A1 (en) | 2016-03-03 |
KR102318784B1 (ko) | 2021-10-27 |
CN105390410B (zh) | 2020-08-14 |
KR20160026691A (ko) | 2016-03-09 |
DE102015216194A1 (de) | 2016-03-03 |
CN105390410A (zh) | 2016-03-09 |
JP2016049581A (ja) | 2016-04-11 |
US9616544B2 (en) | 2017-04-11 |
TW201607683A (zh) | 2016-03-01 |
TWI667099B (zh) | 2019-08-01 |
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