JP6349897B2 - 駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路 - Google Patents

駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路 Download PDF

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Publication number
JP6349897B2
JP6349897B2 JP2014081890A JP2014081890A JP6349897B2 JP 6349897 B2 JP6349897 B2 JP 6349897B2 JP 2014081890 A JP2014081890 A JP 2014081890A JP 2014081890 A JP2014081890 A JP 2014081890A JP 6349897 B2 JP6349897 B2 JP 6349897B2
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Japan
Prior art keywords
voltage
circuit
delay time
semiconductor element
delay
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Expired - Fee Related
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JP2014081890A
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English (en)
Japanese (ja)
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JP2015204659A5 (enExample
JP2015204659A (ja
Inventor
小林　敦
敦 小林
聖 山本
聖 山本
金森　淳
淳 金森
貞洋 赤間
貞洋 赤間
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Denso Corp
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Denso Corp
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Publication date
Application filed by Denso Corp filed Critical Denso Corp
Priority to JP2014081890A priority Critical patent/JP6349897B2/ja
Priority to CN201580019183.4A priority patent/CN106165295B/zh
Priority to US15/122,438 priority patent/US9979384B2/en
Priority to PCT/JP2015/001889 priority patent/WO2015155962A1/ja
Publication of JP2015204659A publication Critical patent/JP2015204659A/ja
Publication of JP2015204659A5 publication Critical patent/JP2015204659A5/ja
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16—Modifications for eliminating interference voltages or currents
    • H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16—Modifications for eliminating interference voltages or currents
    • H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
    • H03K17/163—Soft switching
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16—Modifications for eliminating interference voltages or currents
    • H03K17/168—Modifications for eliminating interference voltages or currents in composite switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/28—Modifications for introducing a time delay before switching
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
    • H03K5/1534—Transition or edge detectors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/023—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in clock generator or timing circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/00019—Variable delay
    • H03K2005/00058—Variable delay controlled by a digital setting
    • H03K2005/00065—Variable delay controlled by a digital setting by current control, e.g. by parallel current control transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/0015—Layout of the delay element
    • H03K2005/00234—Layout of the delay element using circuits having two logic levels
    • H03K2005/00247—Layout of the delay element using circuits having two logic levels using counters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/0015—Layout of the delay element
    • H03K2005/00234—Layout of the delay element using circuits having two logic levels
    • H03K2005/00273—Layout of the delay element using circuits having two logic levels using digital comparators

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)
JP2014081890A 2014-04-11 2014-04-11 駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路 Expired - Fee Related JP6349897B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2014081890A JP6349897B2 (ja) 2014-04-11 2014-04-11 駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路
CN201580019183.4A CN106165295B (zh) 2014-04-11 2015-04-02 驱动电路的定时调整方法以及驱动电路的定时调整电路
US15/122,438 US9979384B2 (en) 2014-04-11 2015-04-02 Timing adjustment method for drive circuit and timing adjustment circuit for drive circuit
PCT/JP2015/001889 WO2015155962A1 (ja) 2014-04-11 2015-04-02 駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014081890A JP6349897B2 (ja) 2014-04-11 2014-04-11 駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路

Publications (3)

Publication Number Publication Date
JP2015204659A JP2015204659A (ja) 2015-11-16
JP2015204659A5 JP2015204659A5 (enExample) 2016-06-02
JP6349897B2 true JP6349897B2 (ja) 2018-07-04

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JP2014081890A Expired - Fee Related JP6349897B2 (ja) 2014-04-11 2014-04-11 駆動回路のタイミング調整方法及び駆動回路のタイミング調整回路

Country Status (4)

Country Link
US (1) US9979384B2 (enExample)
JP (1) JP6349897B2 (enExample)
CN (1) CN106165295B (enExample)
WO (1) WO2015155962A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9305905B2 (en) * 2013-09-06 2016-04-05 Micron Technology, Inc. Apparatuses and related methods for staggering power-up of a stack of semiconductor dies
JP6237570B2 (ja) 2014-03-27 2017-11-29 株式会社デンソー 駆動装置
JP6187428B2 (ja) 2014-03-27 2017-08-30 株式会社デンソー 駆動装置
JP6168253B1 (ja) 2017-05-01 2017-07-26 富士電機株式会社 駆動装置およびスイッチ装置
JP2019057757A (ja) * 2017-09-19 2019-04-11 株式会社東芝 制御回路、制御方法、およびプログラム
JP7073706B2 (ja) 2017-12-19 2022-05-24 富士電機株式会社 駆動装置および半導体装置
CN108667453B (zh) * 2018-04-09 2021-08-31 上海集成电路研发中心有限公司 一种压摆率可调的低功耗驱动器电路
CN112640277B (zh) 2019-01-10 2024-12-24 富士电机株式会社 栅极驱动装置、开关装置
JP7251335B2 (ja) * 2019-06-10 2023-04-04 富士電機株式会社 ゲート駆動装置、スイッチング装置、および、ゲート駆動方法
JP7472645B2 (ja) 2020-05-13 2024-04-23 富士電機株式会社 駆動回路内蔵型パワーモジュール
JP2022043655A (ja) * 2020-09-04 2022-03-16 株式会社デンソー ゲート駆動装置および負荷給電回路
JP7825951B2 (ja) * 2021-07-07 2026-03-09 株式会社東芝 ゲート駆動回路および電力変換装置
CN114665822A (zh) * 2022-03-28 2022-06-24 长鑫存储技术有限公司 一种振荡电路
CN115296651B (zh) * 2022-10-09 2023-04-18 深圳英集芯科技股份有限公司 压控频率电路及相关产品
CN120236623B (zh) * 2025-05-29 2026-01-23 北京青耘科技有限公司 堆叠型存储芯片及芯片内部上电方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3141613B2 (ja) 1993-03-31 2001-03-05 株式会社日立製作所 電圧駆動形素子の駆動方法及びその回路
JP3421507B2 (ja) * 1996-07-05 2003-06-30 三菱電機株式会社 半導体素子の駆動回路
JP2002369495A (ja) 2001-06-12 2002-12-20 Nissan Motor Co Ltd 電圧駆動型素子の駆動回路
JP3979096B2 (ja) * 2002-01-22 2007-09-19 株式会社日立製作所 半導体素子の駆動装置ならびにそれを用いた電力変換装置
JP2004072635A (ja) 2002-08-08 2004-03-04 Nissan Motor Co Ltd 半導体素子のゲート駆動回路
JP3891070B2 (ja) * 2002-08-09 2007-03-07 セイコーエプソン株式会社 タイミング調整回路、駆動回路、電気光学装置および電子機器
JP4742828B2 (ja) * 2005-11-18 2011-08-10 日産自動車株式会社 電圧駆動型スイッチング回路
JP4935266B2 (ja) * 2006-09-19 2012-05-23 トヨタ自動車株式会社 電圧駆動型半導体素子の駆動方法、及び、ゲート駆動回路
JP4356781B2 (ja) * 2007-05-17 2009-11-04 ソニー株式会社 駆動装置
WO2008155917A1 (ja) * 2007-06-19 2008-12-24 Panasonic Corporation スイッチング素子駆動回路
US8461881B2 (en) * 2010-01-27 2013-06-11 Larry A. Park High power, high speed solid state relay
JP5168413B2 (ja) * 2011-05-19 2013-03-21 トヨタ自動車株式会社 電圧駆動型素子を駆動する駆動装置
JP5452546B2 (ja) * 2011-05-26 2014-03-26 三菱電機株式会社 半導体デバイス駆動回路及び半導体装置

Also Published As

Publication number Publication date
WO2015155962A1 (ja) 2015-10-15
US20170093392A1 (en) 2017-03-30
CN106165295B (zh) 2019-03-29
JP2015204659A (ja) 2015-11-16
US9979384B2 (en) 2018-05-22
CN106165295A (zh) 2016-11-23

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