JP6289859B2 - トラップ装置及び基板処理装置 - Google Patents
トラップ装置及び基板処理装置 Download PDFInfo
- Publication number
- JP6289859B2 JP6289859B2 JP2013218718A JP2013218718A JP6289859B2 JP 6289859 B2 JP6289859 B2 JP 6289859B2 JP 2013218718 A JP2013218718 A JP 2013218718A JP 2013218718 A JP2013218718 A JP 2013218718A JP 6289859 B2 JP6289859 B2 JP 6289859B2
- Authority
- JP
- Japan
- Prior art keywords
- trap
- downstream
- upstream
- opening
- gas flow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000758 substrate Substances 0.000 title claims description 16
- 238000011144 upstream manufacturing Methods 0.000 claims description 130
- 230000007423 decrease Effects 0.000 claims description 4
- 230000004308 accommodation Effects 0.000 claims description 2
- 239000007789 gas Substances 0.000 description 82
- 239000007795 chemical reaction product Substances 0.000 description 24
- 238000012986 modification Methods 0.000 description 17
- 230000004048 modification Effects 0.000 description 17
- 238000000034 method Methods 0.000 description 12
- 238000001020 plasma etching Methods 0.000 description 8
- 238000009792 diffusion process Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 239000003507 refrigerant Substances 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 238000005530 etching Methods 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 239000012466 permeate Substances 0.000 description 3
- 238000000427 thin-film deposition Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 238000004080 punching Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D46/00—Filters or filtering processes specially modified for separating dispersed particles from gases or vapours
- B01D46/56—Filters or filtering processes specially modified for separating dispersed particles from gases or vapours with multiple filtering elements, characterised by their mutual disposition
- B01D46/62—Filters or filtering processes specially modified for separating dispersed particles from gases or vapours with multiple filtering elements, characterised by their mutual disposition connected in series
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32834—Exhausting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32834—Exhausting
- H01J37/32844—Treating effluent gases
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02C—CAPTURE, STORAGE, SEQUESTRATION OR DISPOSAL OF GREENHOUSE GASES [GHG]
- Y02C20/00—Capture or disposal of greenhouse gases
- Y02C20/30—Capture or disposal of greenhouse gases of perfluorocarbons [PFC], hydrofluorocarbons [HFC] or sulfur hexafluoride [SF6]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013218718A JP6289859B2 (ja) | 2013-10-21 | 2013-10-21 | トラップ装置及び基板処理装置 |
| TW103135921A TWI659123B (zh) | 2013-10-21 | 2014-10-17 | 補集裝置及基板處理裝置 |
| US14/518,079 US20150107771A1 (en) | 2013-10-21 | 2014-10-20 | Trap apparatus and substrate processing apparatus |
| KR1020140142632A KR102301024B1 (ko) | 2013-10-21 | 2014-10-21 | 트랩 장치 및 기판 처리 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013218718A JP6289859B2 (ja) | 2013-10-21 | 2013-10-21 | トラップ装置及び基板処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015080738A JP2015080738A (ja) | 2015-04-27 |
| JP2015080738A5 JP2015080738A5 (enExample) | 2016-11-04 |
| JP6289859B2 true JP6289859B2 (ja) | 2018-03-07 |
Family
ID=52825133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013218718A Expired - Fee Related JP6289859B2 (ja) | 2013-10-21 | 2013-10-21 | トラップ装置及び基板処理装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20150107771A1 (enExample) |
| JP (1) | JP6289859B2 (enExample) |
| KR (1) | KR102301024B1 (enExample) |
| TW (1) | TWI659123B (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106191812B (zh) * | 2015-05-05 | 2019-01-22 | 中微半导体设备(上海)有限公司 | 化学气相沉积装置及清洁其排气口的方法 |
| DE102015219925A1 (de) * | 2015-10-14 | 2017-04-20 | Wacker Chemie Ag | Reaktor zur Abscheidung von polykristallinem Silicium |
| JP6628653B2 (ja) * | 2016-03-17 | 2020-01-15 | 東京エレクトロン株式会社 | トラップ装置及びこれを用いた排気系、並びに基板処理装置 |
| JP6642259B2 (ja) * | 2016-05-13 | 2020-02-05 | 株式会社Ihi | トラップ装置 |
| CN109097755A (zh) * | 2017-06-20 | 2018-12-28 | 华邦电子股份有限公司 | 工艺腔室气体检测系统及其操作方法 |
| KR101957054B1 (ko) * | 2017-10-31 | 2019-03-11 | 안호상 | 승화정제기용 ln2 트랩 장치 |
| KR101957055B1 (ko) * | 2017-10-31 | 2019-03-11 | 안호상 | 승화정제기 |
| KR102036273B1 (ko) * | 2017-12-27 | 2019-10-24 | 주식회사 미래보 | 반도체 공정 부산물 포집장치 |
| KR102209205B1 (ko) * | 2019-08-21 | 2021-02-01 | 주식회사 미래보 | 반도체 공정용 유로방향 전환식 반응부산물 포집장치 |
| US11583793B2 (en) | 2019-10-08 | 2023-02-21 | Utica Leaseco, Llc | Gas trap system having a conical inlet condensation region |
| JP2021186785A (ja) | 2020-06-03 | 2021-12-13 | 東京エレクトロン株式会社 | トラップ装置及び基板処理装置 |
| CN113990730B (zh) * | 2020-07-27 | 2023-10-31 | 中微半导体设备(上海)股份有限公司 | 等离子体处理装置及其中的气流调节盖和气流调节方法 |
| US12060637B2 (en) * | 2020-12-01 | 2024-08-13 | Applied Materials, Inc. | Actively cooled foreline trap to reduce throttle valve drift |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4944331B1 (enExample) | 1971-05-31 | 1974-11-27 | ||
| US4487618A (en) * | 1982-08-19 | 1984-12-11 | La-Man Corporation | Airline vapor trap |
| JP2544655Y2 (ja) * | 1990-11-30 | 1997-08-20 | アマノ株式会社 | ミストコレクタ |
| JPH0775713A (ja) * | 1993-09-07 | 1995-03-20 | Teijin Ltd | 液滴除去装置 |
| US5593479A (en) * | 1995-02-02 | 1997-01-14 | Hmi Industries, Inc. | Filter system |
| US5669949A (en) * | 1995-04-21 | 1997-09-23 | Donaldson Company, Inc. | Air filtration arrangement |
| US5820641A (en) * | 1996-02-09 | 1998-10-13 | Mks Instruments, Inc. | Fluid cooled trap |
| US6093228A (en) * | 1998-11-18 | 2000-07-25 | Winbond Electronics Corp. | Method and device for collecting by-products individually |
| US6197119B1 (en) * | 1999-02-18 | 2001-03-06 | Mks Instruments, Inc. | Method and apparatus for controlling polymerized teos build-up in vacuum pump lines |
| US6238514B1 (en) * | 1999-02-18 | 2001-05-29 | Mks Instruments, Inc. | Apparatus and method for removing condensable aluminum vapor from aluminum etch effluent |
| JP2000256856A (ja) * | 1999-03-11 | 2000-09-19 | Tokyo Electron Ltd | 処理装置及び処理装置用真空排気システム及び減圧cvd装置及び減圧cvd装置用真空排気システム及びトラップ装置 |
| US7857883B2 (en) * | 2007-10-17 | 2010-12-28 | Cummins Filtration Ip, Inc. | Inertial gas-liquid separator with constrictable and expansible nozzle valve sidewall |
| DE112009003819T5 (de) * | 2008-12-23 | 2012-06-06 | Mks Instruments, Inc. | Containment- bzw. Sicherheitsbehältersystem für reaktive Chemikalien |
| KR101024504B1 (ko) * | 2009-04-01 | 2011-03-31 | 주식회사 미래보 | 입자 관성을 이용한 반도체 공정에서의 잔류 케미칼 및 부산물 포집장치 |
| KR101362439B1 (ko) * | 2012-03-30 | 2014-02-13 | (주)아인스 | 반도체 제조용 트랩장치 |
-
2013
- 2013-10-21 JP JP2013218718A patent/JP6289859B2/ja not_active Expired - Fee Related
-
2014
- 2014-10-17 TW TW103135921A patent/TWI659123B/zh not_active IP Right Cessation
- 2014-10-20 US US14/518,079 patent/US20150107771A1/en not_active Abandoned
- 2014-10-21 KR KR1020140142632A patent/KR102301024B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW201527581A (zh) | 2015-07-16 |
| TWI659123B (zh) | 2019-05-11 |
| KR102301024B1 (ko) | 2021-09-09 |
| US20150107771A1 (en) | 2015-04-23 |
| JP2015080738A (ja) | 2015-04-27 |
| KR20150045906A (ko) | 2015-04-29 |
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