JP6177017B2 - 欠陥検査システム - Google Patents

欠陥検査システム Download PDF

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Publication number
JP6177017B2
JP6177017B2 JP2013124040A JP2013124040A JP6177017B2 JP 6177017 B2 JP6177017 B2 JP 6177017B2 JP 2013124040 A JP2013124040 A JP 2013124040A JP 2013124040 A JP2013124040 A JP 2013124040A JP 6177017 B2 JP6177017 B2 JP 6177017B2
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JP
Japan
Prior art keywords
film
defect inspection
defect
cover
recording
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JP2013124040A
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English (en)
Japanese (ja)
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JP2014240816A (ja
Inventor
綾子 笹本
綾子 笹本
圭太 井村
圭太 井村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
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Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP2013124040A priority Critical patent/JP6177017B2/ja
Priority to KR1020217010535A priority patent/KR102369758B1/ko
Priority to KR1020157034307A priority patent/KR20160018510A/ko
Priority to CN201480030723.4A priority patent/CN105247351B/zh
Priority to PCT/JP2014/065231 priority patent/WO2014199952A1/ja
Priority to TW103120087A priority patent/TWI626439B/zh
Publication of JP2014240816A publication Critical patent/JP2014240816A/ja
Application granted granted Critical
Publication of JP6177017B2 publication Critical patent/JP6177017B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Polarising Elements (AREA)
JP2013124040A 2013-06-12 2013-06-12 欠陥検査システム Active JP6177017B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2013124040A JP6177017B2 (ja) 2013-06-12 2013-06-12 欠陥検査システム
KR1020217010535A KR102369758B1 (ko) 2013-06-12 2014-06-09 결함 검사 시스템
KR1020157034307A KR20160018510A (ko) 2013-06-12 2014-06-09 결함 검사 시스템
CN201480030723.4A CN105247351B (zh) 2013-06-12 2014-06-09 缺陷检查系统
PCT/JP2014/065231 WO2014199952A1 (ja) 2013-06-12 2014-06-09 欠陥検査システム
TW103120087A TWI626439B (zh) 2013-06-12 2014-06-10 缺陷檢查系統

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013124040A JP6177017B2 (ja) 2013-06-12 2013-06-12 欠陥検査システム

Publications (2)

Publication Number Publication Date
JP2014240816A JP2014240816A (ja) 2014-12-25
JP6177017B2 true JP6177017B2 (ja) 2017-08-09

Family

ID=52022245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013124040A Active JP6177017B2 (ja) 2013-06-12 2013-06-12 欠陥検査システム

Country Status (5)

Country Link
JP (1) JP6177017B2 (zh)
KR (2) KR20160018510A (zh)
CN (1) CN105247351B (zh)
TW (1) TWI626439B (zh)
WO (1) WO2014199952A1 (zh)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6641093B2 (ja) * 2015-03-20 2020-02-05 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法
JP6704230B2 (ja) * 2015-09-30 2020-06-03 日東電工株式会社 長尺状偏光子の検査方法、検査システムおよび製造方法
KR101748208B1 (ko) * 2016-03-07 2017-06-19 동우 화인켐 주식회사 편광판, 시트상 제품 검사 시스템 및 방법
JP6774803B2 (ja) * 2016-07-14 2020-10-28 東京エレクトロン株式会社 液滴吐出装置及び吐出検査方法
JP6991721B2 (ja) * 2017-03-03 2022-01-12 住友化学株式会社 マーキング装置、欠陥検査システム及びフィルム製造方法
KR102469408B1 (ko) * 2017-03-03 2022-11-22 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
JP6934733B2 (ja) * 2017-03-03 2021-09-15 住友化学株式会社 マーキング装置、欠陥検査システム及びフィルム製造方法
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
JP6978842B2 (ja) * 2017-03-03 2021-12-08 住友化学株式会社 マーキング装置、欠陥検査システム及びフィルム製造方法
KR102475056B1 (ko) * 2017-03-03 2022-12-06 스미또모 가가꾸 가부시키가이샤 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트
JP6408654B1 (ja) * 2017-06-16 2018-10-17 株式会社オプトン 検査装置
KR102603009B1 (ko) * 2017-09-05 2023-11-15 스미또모 가가꾸 가부시키가이샤 결함 기록 시스템 및 필름 제조 시스템, 그리고 필름의 제조 방법
CN107703152A (zh) * 2017-10-27 2018-02-16 深圳精创视觉科技有限公司 光学膜缺点自动标示装置
JP7044583B2 (ja) 2018-02-22 2022-03-30 住友化学株式会社 フィルムの製造方法、フィルム捲回装置
CN108982530A (zh) * 2018-05-24 2018-12-11 京东方科技集团股份有限公司 一种背光卷料的检测系统
JP2019215371A (ja) * 2019-08-26 2019-12-19 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法
CN112874163A (zh) * 2021-01-14 2021-06-01 恒美光电股份有限公司 一种光学膜缺点喷印装置
CN113466256B (zh) * 2021-06-29 2022-04-15 深圳市楠轩光电科技有限公司 一种光学薄膜缺陷批量式检测设备
US11867639B2 (en) * 2021-09-15 2024-01-09 Te Connectivity Solutions Gmbh Method and apparatus for flattening and imaging a printed thin film product
CN113978139B (zh) * 2021-11-23 2023-01-10 深圳市盛波光电科技有限公司 一种薄膜缺陷喷码补喷处理方法及处理系统

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000062166A (ja) * 1998-08-18 2000-02-29 Dainippon Screen Mfg Co Ltd 描画ヘッド装置
JP3890430B2 (ja) * 1999-08-24 2007-03-07 富士フイルム株式会社 表面検査方法及び装置
JP2002292853A (ja) * 2001-03-29 2002-10-09 Tomoegawa Paper Co Ltd マーキングシステム、マーキング方法およびマーキング装置
KR20050013491A (ko) * 2003-07-28 2005-02-04 닛토덴코 가부시키가이샤 시트형상 제품의 검사 방법 및 검사 시스템
CN1989169B (zh) * 2004-07-30 2011-08-31 住友化学株式会社 高分子化合物、高分子薄膜和使用了其的高分子薄膜元件
JP4671773B2 (ja) * 2005-06-10 2011-04-20 株式会社Ｉｓｏｗａ 印刷装置
JP2008093849A (ja) * 2006-10-06 2008-04-24 Canon Inc 液滴吐出ヘッド及び液滴吐出装置
JP4514059B2 (ja) * 2006-12-11 2010-07-28 日東電工株式会社 シート状成形体の検査結果記録方法及び検査結果記録システム
JP2009244064A (ja) * 2008-03-31 2009-10-22 Sumitomo Chemical Co Ltd 偏光フィルムの検査方法
JP2010030768A (ja) * 2008-07-30 2010-02-12 Seiko Epson Corp 給送装置及び記録装置
JP2010262265A (ja) * 2009-04-10 2010-11-18 Nitto Denko Corp 光学フィルムロール原反、およびそれを用いた画像表示装置の製造方法
JP5588223B2 (ja) 2009-05-26 2014-09-10 旭化成イーマテリアルズ株式会社 ワイヤグリッド偏光フィルム用欠陥マーキング装置及び欠陥マーキング方法
JP5598654B2 (ja) * 2010-02-18 2014-10-01 セイコーエプソン株式会社 液体噴射ヘッド、液体噴射ヘッドユニット及び液体噴射装置
JP2011218712A (ja) * 2010-04-13 2011-11-04 Seiko Epson Corp インクジェット印刷装置
JP2013016398A (ja) * 2011-07-05 2013-01-24 Sumitomo Chemical Co Ltd 光学シートの製造方法

Also Published As

Publication number Publication date
JP2014240816A (ja) 2014-12-25
CN105247351B (zh) 2019-12-24
KR20160018510A (ko) 2016-02-17
TWI626439B (zh) 2018-06-11
KR20210043007A (ko) 2021-04-20
TW201502495A (zh) 2015-01-16
KR102369758B1 (ko) 2022-03-03
WO2014199952A1 (ja) 2014-12-18
CN105247351A (zh) 2016-01-13

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