JP6153828B2 - 発振回路、それを用いた半導体集積回路装置および回転角検出装置 - Google Patents

発振回路、それを用いた半導体集積回路装置および回転角検出装置 Download PDF

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Publication number
JP6153828B2
JP6153828B2 JP2013187544A JP2013187544A JP6153828B2 JP 6153828 B2 JP6153828 B2 JP 6153828B2 JP 2013187544 A JP2013187544 A JP 2013187544A JP 2013187544 A JP2013187544 A JP 2013187544A JP 6153828 B2 JP6153828 B2 JP 6153828B2
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terminal
capacitor
circuit
oscillation
output
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JP2013187544A
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Japanese (ja)
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JP2015056692A5 (enExample
JP2015056692A (ja
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奥津　光彦
光彦 奥津
一朗 大坂
一朗 大坂
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Hitachi Astemo Ltd
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Hitachi Automotive Systems Ltd
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Priority to JP2013187544A priority Critical patent/JP6153828B2/ja
Priority to PCT/JP2014/052389 priority patent/WO2015037252A1/ja
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Publication of JP2015056692A5 publication Critical patent/JP2015056692A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5776—Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/023—Generators characterised by the type of circuit or by the means used for producing pulses by the use of differential amplifiers or comparators, with internal or external positive feedback
    • H03K3/0231—Astable circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K4/00—Generating pulses having essentially a finite slope or stepped portions
    • H03K4/06—Generating pulses having essentially a finite slope or stepped portions having triangular shape

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Gyroscopes (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
JP2013187544A 2013-09-10 2013-09-10 発振回路、それを用いた半導体集積回路装置および回転角検出装置 Active JP6153828B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013187544A JP6153828B2 (ja) 2013-09-10 2013-09-10 発振回路、それを用いた半導体集積回路装置および回転角検出装置
PCT/JP2014/052389 WO2015037252A1 (ja) 2013-09-10 2014-02-03 発振回路、それを用いた半導体集積回路装置および回転角検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013187544A JP6153828B2 (ja) 2013-09-10 2013-09-10 発振回路、それを用いた半導体集積回路装置および回転角検出装置

Publications (3)

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JP2015056692A JP2015056692A (ja) 2015-03-23
JP2015056692A5 JP2015056692A5 (enExample) 2016-04-14
JP6153828B2 true JP6153828B2 (ja) 2017-06-28

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JP2013187544A Active JP6153828B2 (ja) 2013-09-10 2013-09-10 発振回路、それを用いた半導体集積回路装置および回転角検出装置

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JP (1) JP6153828B2 (enExample)
WO (1) WO2015037252A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6552908B2 (ja) * 2015-08-07 2019-07-31 株式会社東芝 発振器
JP6602274B2 (ja) * 2016-08-08 2019-11-06 日立オートモティブシステムズ株式会社 慣性検出装置
JP6869813B2 (ja) * 2017-05-31 2021-05-12 エイブリック株式会社 弛張型発振器、および弛張型発振器を備えた無線機器
JP6666380B2 (ja) * 2018-05-01 2020-03-13 ファナック株式会社 アブソリュート型エンコーダ
JP2022139692A (ja) * 2021-03-12 2022-09-26 オムロン株式会社 距離センサ
JP2022143734A (ja) * 2021-03-18 2022-10-03 セイコーエプソン株式会社 半導体集積回路
CN113258903B (zh) * 2021-04-27 2024-03-22 瑞萨集成电路设计(北京)有限公司 振荡器及其工作方法
CN114388017B (zh) * 2021-12-29 2024-08-02 中天弘宇集成电路有限责任公司 振荡电路及存储器
CN116996045A (zh) * 2022-04-26 2023-11-03 长鑫存储技术有限公司 信号产生器和存储器
US12254941B2 (en) 2022-04-26 2025-03-18 Changxin Memory Technologies, Inc. Test circuit, test method and memory
US11703905B1 (en) 2022-04-26 2023-07-18 Changxin Memory Technologies, Inc. Clock generation circuit, equidistant four-phase signal generation method, and memory
US12231129B2 (en) 2022-04-26 2025-02-18 Changxin Memory Technologies, Inc. Signal generator and memory
CN116990594A (zh) 2022-04-26 2023-11-03 长鑫存储技术有限公司 信号检测系统和存储器检测方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0738388A (ja) * 1993-07-16 1995-02-07 Toshiba Corp クロック発生回路
EP0735677B1 (en) * 1995-03-31 1999-12-22 Co.Ri.M.Me. Consorzio Per La Ricerca Sulla Microelettronica Nel Mezzogiorno Oscillator circuit having oscillation frequency independent from the supply voltage value
US5990753A (en) * 1996-01-29 1999-11-23 Stmicroelectronics, Inc. Precision oscillator circuit having a controllable duty cycle and related methods
JP2002135086A (ja) * 2000-10-27 2002-05-10 Asahi Kasei Microsystems Kk 発振器
JP2007243922A (ja) * 2006-02-09 2007-09-20 Matsushita Electric Ind Co Ltd 発振回路
JP5120154B2 (ja) * 2007-11-01 2013-01-16 株式会社デンソー 信号形成回路
JP2009232059A (ja) * 2008-03-21 2009-10-08 Denso Corp 三角波発振回路
JP2011087064A (ja) * 2009-10-14 2011-04-28 Sharp Corp 検知装置及びそれを内蔵した電子機器
US8085099B2 (en) * 2010-04-06 2011-12-27 Sandisk Technologies Inc. Self-calibrating relaxation oscillator based clock source
JP2011259167A (ja) * 2010-06-08 2011-12-22 On Semiconductor Trading Ltd 三角波発生回路

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WO2015037252A1 (ja) 2015-03-19
JP2015056692A (ja) 2015-03-23

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