JP6134522B2 - 気相成長装置および気相成長方法 - Google Patents
気相成長装置および気相成長方法 Download PDFInfo
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- JP6134522B2 JP6134522B2 JP2013016015A JP2013016015A JP6134522B2 JP 6134522 B2 JP6134522 B2 JP 6134522B2 JP 2013016015 A JP2013016015 A JP 2013016015A JP 2013016015 A JP2013016015 A JP 2013016015A JP 6134522 B2 JP6134522 B2 JP 6134522B2
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- 238000000034 method Methods 0.000 title claims description 149
- 230000008569 process Effects 0.000 claims description 122
- 238000001947 vapour-phase growth Methods 0.000 claims description 55
- 239000012530 fluid Substances 0.000 claims description 36
- 239000004065 semiconductor Substances 0.000 claims description 34
- 239000000758 substrate Substances 0.000 claims description 21
- 238000010438 heat treatment Methods 0.000 claims description 10
- 238000002347 injection Methods 0.000 claims description 4
- 239000007924 injection Substances 0.000 claims description 4
- 239000012071 phase Substances 0.000 claims 2
- 238000007740 vapor deposition Methods 0.000 claims 2
- 239000007789 gas Substances 0.000 description 553
- 239000010408 film Substances 0.000 description 50
- 235000012431 wafers Nutrition 0.000 description 47
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 30
- 239000001257 hydrogen Substances 0.000 description 20
- 229910052739 hydrogen Inorganic materials 0.000 description 20
- 229910002601 GaN Inorganic materials 0.000 description 17
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 17
- 229910021529 ammonia Inorganic materials 0.000 description 15
- 230000015572 biosynthetic process Effects 0.000 description 13
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 12
- 238000009826 distribution Methods 0.000 description 11
- 239000013078 crystal Substances 0.000 description 10
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 9
- 238000000926 separation method Methods 0.000 description 9
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 9
- 230000005484 gravity Effects 0.000 description 8
- 150000002431 hydrogen Chemical class 0.000 description 8
- 230000004048 modification Effects 0.000 description 6
- 238000012986 modification Methods 0.000 description 6
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 4
- 239000012159 carrier gas Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052733 gallium Inorganic materials 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000007865 diluting Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 2
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 229910001256 stainless steel alloy Inorganic materials 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C23C16/303—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/12—Substrate holders or susceptors
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013016015A JP6134522B2 (ja) | 2013-01-30 | 2013-01-30 | 気相成長装置および気相成長方法 |
| TW103101697A TWI494469B (zh) | 2013-01-30 | 2014-01-17 | 氣相成長裝置以及氣相成長方法 |
| US14/164,498 US9624603B2 (en) | 2013-01-30 | 2014-01-27 | Vapor phase growth apparatus having shower plate with multi gas flow passages and vapor phase growth method using the same |
| KR1020140010238A KR101610638B1 (ko) | 2013-01-30 | 2014-01-28 | 기상 성장 장치 및 기상 성장 방법 |
| CN201410041218.1A CN103966574B (zh) | 2013-01-30 | 2014-01-28 | 气相生长装置及气相生长方法 |
| DE102014201554.5A DE102014201554A1 (de) | 2013-01-30 | 2014-01-29 | Dampfphasenepitaxievorrichtung und Dampfphasenepitaxieverfahren |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013016015A JP6134522B2 (ja) | 2013-01-30 | 2013-01-30 | 気相成長装置および気相成長方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014146767A JP2014146767A (ja) | 2014-08-14 |
| JP2014146767A5 JP2014146767A5 (enExample) | 2014-12-04 |
| JP6134522B2 true JP6134522B2 (ja) | 2017-05-24 |
Family
ID=51163737
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013016015A Active JP6134522B2 (ja) | 2013-01-30 | 2013-01-30 | 気相成長装置および気相成長方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9624603B2 (enExample) |
| JP (1) | JP6134522B2 (enExample) |
| KR (1) | KR101610638B1 (enExample) |
| CN (1) | CN103966574B (enExample) |
| DE (1) | DE102014201554A1 (enExample) |
| TW (1) | TWI494469B (enExample) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6199619B2 (ja) * | 2013-06-13 | 2017-09-20 | 株式会社ニューフレアテクノロジー | 気相成長装置 |
| JP6153401B2 (ja) * | 2013-07-02 | 2017-06-28 | 株式会社ニューフレアテクノロジー | 気相成長装置および気相成長方法 |
| JP6495025B2 (ja) | 2014-01-31 | 2019-04-03 | ラム リサーチ コーポレーションLam Research Corporation | 真空統合ハードマスク処理および装置 |
| KR102215965B1 (ko) * | 2014-04-11 | 2021-02-18 | 주성엔지니어링(주) | 가스 분사 장치 및 이를 포함하는 기판 처리 장치 |
| CN104120408B (zh) * | 2014-08-06 | 2016-09-07 | 上海世山科技有限公司 | 一种改进衬底气流方向的hvpe反应器 |
| KR102267923B1 (ko) * | 2014-08-26 | 2021-06-22 | 에이에스엠 아이피 홀딩 비.브이. | 증착 장치 |
| JP6386901B2 (ja) * | 2014-12-17 | 2018-09-05 | 株式会社ニューフレアテクノロジー | 気相成長装置及び気相成長方法 |
| JP6193284B2 (ja) * | 2015-03-18 | 2017-09-06 | 株式会社東芝 | 流路構造、吸排気部材、及び処理装置 |
| JP6054471B2 (ja) | 2015-05-26 | 2016-12-27 | 株式会社日本製鋼所 | 原子層成長装置および原子層成長装置排気部 |
| JP6054470B2 (ja) | 2015-05-26 | 2016-12-27 | 株式会社日本製鋼所 | 原子層成長装置 |
| JP5990626B1 (ja) * | 2015-05-26 | 2016-09-14 | 株式会社日本製鋼所 | 原子層成長装置 |
| KR102269479B1 (ko) * | 2016-12-08 | 2021-06-24 | 어플라이드 머티어리얼스, 인코포레이티드 | 시간적 원자 층 증착 프로세싱 챔버 |
| US10796912B2 (en) | 2017-05-16 | 2020-10-06 | Lam Research Corporation | Eliminating yield impact of stochastics in lithography |
| WO2019044440A1 (ja) | 2017-09-01 | 2019-03-07 | 株式会社ニューフレアテクノロジー | 気相成長装置、及び、気相成長方法 |
| US11149350B2 (en) * | 2018-01-10 | 2021-10-19 | Asm Ip Holding B.V. | Shower plate structure for supplying carrier and dry gas |
| JP7012613B2 (ja) * | 2018-07-13 | 2022-01-28 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| JP7365761B2 (ja) * | 2018-08-24 | 2023-10-20 | 株式会社ニューフレアテクノロジー | 気相成長装置 |
| US11921427B2 (en) | 2018-11-14 | 2024-03-05 | Lam Research Corporation | Methods for making hard masks useful in next-generation lithography |
| CN113227909B (zh) | 2018-12-20 | 2025-07-04 | 朗姆研究公司 | 抗蚀剂的干式显影 |
| US12125711B2 (en) | 2019-03-18 | 2024-10-22 | Lam Research Corporation | Reducing roughness of extreme ultraviolet lithography resists |
| KR20210149893A (ko) | 2019-04-30 | 2021-12-09 | 램 리써치 코포레이션 | 극자외선 리소그래피 레지스트 개선을 위한 원자 층 에칭 및 선택적인 증착 프로세스 |
| CN110158055B (zh) * | 2019-05-15 | 2022-01-14 | 拓荆科技股份有限公司 | 多段喷淋组件 |
| TWI837391B (zh) | 2019-06-26 | 2024-04-01 | 美商蘭姆研究公司 | 利用鹵化物化學品的光阻顯影 |
| US20220308462A1 (en) * | 2019-06-27 | 2022-09-29 | Lam Research Corporation | Apparatus for photoresist dry deposition |
| US12060652B2 (en) | 2019-11-27 | 2024-08-13 | Sino Nitride Semiconductor Co., Ltd. | Linear showerhead for growing GaN |
| CN111020693B (zh) * | 2019-12-27 | 2021-01-29 | 季华实验室 | 一种碳化硅外延生长设备的进气装置 |
| WO2021146138A1 (en) | 2020-01-15 | 2021-07-22 | Lam Research Corporation | Underlayer for photoresist adhesion and dose reduction |
| US12261044B2 (en) | 2020-02-28 | 2025-03-25 | Lam Research Corporation | Multi-layer hardmask for defect reduction in EUV patterning |
| CN111321463B (zh) | 2020-03-06 | 2021-10-15 | 北京北方华创微电子装备有限公司 | 反应腔室 |
| WO2022010809A1 (en) | 2020-07-07 | 2022-01-13 | Lam Research Corporation | Integrated dry processes for patterning radiation photoresist patterning |
| KR102797476B1 (ko) | 2020-11-13 | 2025-04-21 | 램 리써치 코포레이션 | 포토레지스트의 건식 제거를 위한 프로세스 툴 |
| CN114107953A (zh) * | 2021-09-18 | 2022-03-01 | 江苏微导纳米科技股份有限公司 | 原子层沉积装置及其喷淋板 |
| US20250163581A1 (en) * | 2022-03-17 | 2025-05-22 | Lam Research Corporation | Dual plenum showerhead with center to edge tunability |
| CN116240525B (zh) * | 2022-12-15 | 2025-06-24 | 江苏微导纳米科技股份有限公司 | 喷淋板及处理装置 |
| JP7769144B2 (ja) | 2023-03-17 | 2025-11-12 | ラム リサーチ コーポレーション | Euvパターニングのための乾式現像およびエッチングプロセスの単一プロセスチャンバへの統合 |
| CN116695098B (zh) * | 2023-08-07 | 2023-11-17 | 江苏微导纳米科技股份有限公司 | 一种喷淋板、喷淋方法及处理装置 |
| CN117403210B (zh) * | 2023-11-02 | 2025-12-05 | 希科半导体科技(苏州)有限公司 | 一种外延炉喷淋装置 |
| CN117966129A (zh) * | 2024-01-26 | 2024-05-03 | 江苏微导纳米科技股份有限公司 | 喷淋装置及处理设备 |
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| JP3572211B2 (ja) | 1998-12-28 | 2004-09-29 | 京セラ株式会社 | 半導体製造装置用ガス導入ノズル |
| JP3962509B2 (ja) * | 1999-09-16 | 2007-08-22 | 株式会社東芝 | 気相成長装置 |
| KR100513920B1 (ko) | 2003-10-31 | 2005-09-08 | 주식회사 시스넥스 | 화학기상증착 반응기 |
| CN102154628B (zh) * | 2004-08-02 | 2014-05-07 | 维高仪器股份有限公司 | 用于化学气相沉积反应器的多气体分配喷射器 |
| JP4981485B2 (ja) * | 2007-03-05 | 2012-07-18 | 株式会社ニューフレアテクノロジー | 気相成長方法および気相成長装置 |
| JP5140321B2 (ja) * | 2007-05-31 | 2013-02-06 | 株式会社アルバック | シャワーヘッド |
| KR20090011978A (ko) * | 2007-07-27 | 2009-02-02 | 주식회사 아이피에스 | 샤워헤드 및 그를 가지는 반도체처리장치 |
| JP4865672B2 (ja) * | 2007-10-22 | 2012-02-01 | シャープ株式会社 | 気相成長装置及び半導体素子の製造方法 |
| WO2010024814A1 (en) | 2008-08-28 | 2010-03-04 | Applied Materials, Inc. | Methods and apparatus for depositing a uniform silicon film with flow gradient designs |
| JP4576466B2 (ja) * | 2009-03-27 | 2010-11-10 | シャープ株式会社 | 気相成長装置及び気相成長方法 |
| JP2010238831A (ja) | 2009-03-31 | 2010-10-21 | Sharp Corp | 気相成長装置及び気相成長方法 |
| US20120012049A1 (en) * | 2010-07-16 | 2012-01-19 | Wei-Yung Hsu | Hvpe chamber |
| JP5622477B2 (ja) * | 2010-08-06 | 2014-11-12 | 三菱重工業株式会社 | 真空処理装置 |
| JP2011109141A (ja) * | 2011-02-28 | 2011-06-02 | Masayoshi Murata | プラズマcvd装置及びプラズマcvd装置を用いたシリコン系膜の製造方法 |
| JP5691889B2 (ja) | 2011-07-04 | 2015-04-01 | 富士通セミコンダクター株式会社 | メモリアクセス制御装置、及びメモリアクセス制御方法 |
| JP5259804B2 (ja) | 2011-11-08 | 2013-08-07 | シャープ株式会社 | 気相成長装置及び気相成長方法 |
| JP6038618B2 (ja) | 2011-12-15 | 2016-12-07 | 株式会社ニューフレアテクノロジー | 成膜装置および成膜方法 |
-
2013
- 2013-01-30 JP JP2013016015A patent/JP6134522B2/ja active Active
-
2014
- 2014-01-17 TW TW103101697A patent/TWI494469B/zh active
- 2014-01-27 US US14/164,498 patent/US9624603B2/en active Active
- 2014-01-28 KR KR1020140010238A patent/KR101610638B1/ko active Active
- 2014-01-28 CN CN201410041218.1A patent/CN103966574B/zh active Active
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| Publication number | Publication date |
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| JP2014146767A (ja) | 2014-08-14 |
| US20140209015A1 (en) | 2014-07-31 |
| KR20140098000A (ko) | 2014-08-07 |
| CN103966574B (zh) | 2017-04-12 |
| KR101610638B1 (ko) | 2016-04-08 |
| DE102014201554A1 (de) | 2014-07-31 |
| US9624603B2 (en) | 2017-04-18 |
| TWI494469B (zh) | 2015-08-01 |
| TW201430166A (zh) | 2014-08-01 |
| CN103966574A (zh) | 2014-08-06 |
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