JP6012311B2 - フィルムの歩留まり予測システム及び方法 - Google Patents

フィルムの歩留まり予測システム及び方法 Download PDF

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Publication number
JP6012311B2
JP6012311B2 JP2012154814A JP2012154814A JP6012311B2 JP 6012311 B2 JP6012311 B2 JP 6012311B2 JP 2012154814 A JP2012154814 A JP 2012154814A JP 2012154814 A JP2012154814 A JP 2012154814A JP 6012311 B2 JP6012311 B2 JP 6012311B2
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Prior art keywords
defect
defect data
optical film
data
defects
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Japanese (ja)
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JP2013024868A (ja
Inventor
ギュン ホン スン
ギュン ホン スン
ヒュン パク ジェ
ヒュン パク ジェ
グン ユン ヨン
グン ユン ヨン
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Dongwoo Fine Chem Co Ltd
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Dongwoo Fine Chem Co Ltd
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H7/00—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
    • B65H7/02—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
    • B65H7/06—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B65H2553/42—Cameras
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2701/00—Handled material; Storage means
    • B65H2701/10—Handled articles or webs
    • B65H2701/17—Nature of material
    • B65H2701/175—Plastic
    • B65H2701/1752—Polymer film

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  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Polarising Elements (AREA)
JP2012154814A 2011-07-25 2012-07-10 フィルムの歩留まり予測システム及び方法 Active JP6012311B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2011-0073536 2011-07-25
KR1020110073536A KR101315102B1 (ko) 2011-07-25 2011-07-25 필름의 수율 예측 시스템 및 방법

Publications (2)

Publication Number Publication Date
JP2013024868A JP2013024868A (ja) 2013-02-04
JP6012311B2 true JP6012311B2 (ja) 2016-10-25

Family

ID=47574087

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012154814A Active JP6012311B2 (ja) 2011-07-25 2012-07-10 フィルムの歩留まり予測システム及び方法

Country Status (3)

Country Link
JP (1) JP6012311B2 (zh)
KR (1) KR101315102B1 (zh)
CN (1) CN102901734B (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016013833A1 (ko) * 2014-07-22 2016-01-28 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
KR101717846B1 (ko) * 2014-07-22 2017-03-17 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
CN107074475B (zh) 2014-10-20 2019-08-13 株式会社Lg化学 裁剪产品的生产方法及生产系统
KR101746294B1 (ko) 2014-11-05 2017-06-12 주식회사 엘지화학 재단 제품의 생산방법 및 생산 시스템
KR20160084601A (ko) 2015-01-06 2016-07-14 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
KR20160107532A (ko) 2015-03-04 2016-09-19 동우 화인켐 주식회사 광학 필름 검사 시스템 및 방법, 광학 필름 품질 관리 장치 및 방법
CN107407642B (zh) * 2015-04-09 2020-04-03 住友化学株式会社 层叠光学膜的缺陷检查方法以及层叠光学膜的制造方法
KR20170103416A (ko) * 2016-03-04 2017-09-13 동우 화인켐 주식회사 광학필름의 결함 정보 통합 관리 장치 및 그 방법
JP2019215371A (ja) * 2019-08-26 2019-12-19 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法
CN113155862B (zh) * 2021-04-15 2023-04-18 恒美光电股份有限公司 一种偏光膜卷材良率的模拟方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004117062A (ja) * 2002-09-24 2004-04-15 Seiko Epson Corp 電気光学パネル用基板の検査方法、電気光学パネル用基板の製造方法、電気光学パネル用基板、電気光学装置および電子機器
WO2005065367A2 (en) * 2003-12-31 2005-07-21 3M Innovative Properties Company Maximation of yield for web-based articles
TWI431263B (zh) * 2005-03-28 2014-03-21 Shibaura Mechatronics Corp 應變矽晶圓表面檢查方法及檢查裝置
JP4707055B2 (ja) 2005-08-22 2011-06-22 住友化学株式会社 枚葉フィルム断裁配置評価装置及び枚葉フィルム断裁配置決定方法
US7605914B2 (en) * 2005-09-29 2009-10-20 Carl Zeiss Smt Ag Optical system and method for improving imaging properties thereof
JP5248052B2 (ja) * 2006-10-11 2013-07-31 日東電工株式会社 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム
JP4913838B2 (ja) * 2008-04-14 2012-04-11 日東電工株式会社 光学表示装置製造システム及び光学表示装置製造方法
JP2009281836A (ja) * 2008-05-21 2009-12-03 Olympus Corp 基板観察装置、基板観察方法、制御装置、およびプログラム
JP5305002B2 (ja) * 2008-12-05 2013-10-02 オムロン株式会社 外観検査装置
CN101545868B (zh) * 2009-04-30 2011-06-08 上海交通大学 有色金属加工质量控制中的产品表面缺陷检测方法

Also Published As

Publication number Publication date
JP2013024868A (ja) 2013-02-04
KR20130012379A (ko) 2013-02-04
CN102901734B (zh) 2017-04-12
KR101315102B1 (ko) 2013-10-07
CN102901734A (zh) 2013-01-30

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