JP6012311B2 - フィルムの歩留まり予測システム及び方法 - Google Patents
フィルムの歩留まり予測システム及び方法 Download PDFInfo
- Publication number
- JP6012311B2 JP6012311B2 JP2012154814A JP2012154814A JP6012311B2 JP 6012311 B2 JP6012311 B2 JP 6012311B2 JP 2012154814 A JP2012154814 A JP 2012154814A JP 2012154814 A JP2012154814 A JP 2012154814A JP 6012311 B2 JP6012311 B2 JP 6012311B2
- Authority
- JP
- Japan
- Prior art keywords
- defect
- defect data
- optical film
- data
- defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H7/00—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
- B65H7/02—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
- B65H7/06—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/8921—Streaks
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2553/00—Sensing or detecting means
- B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
- B65H2553/42—Cameras
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2701/00—Handled material; Storage means
- B65H2701/10—Handled articles or webs
- B65H2701/17—Nature of material
- B65H2701/175—Plastic
- B65H2701/1752—Polymer film
Landscapes
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Textile Engineering (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2011-0073536 | 2011-07-25 | ||
KR1020110073536A KR101315102B1 (ko) | 2011-07-25 | 2011-07-25 | 필름의 수율 예측 시스템 및 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013024868A JP2013024868A (ja) | 2013-02-04 |
JP6012311B2 true JP6012311B2 (ja) | 2016-10-25 |
Family
ID=47574087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012154814A Active JP6012311B2 (ja) | 2011-07-25 | 2012-07-10 | フィルムの歩留まり予測システム及び方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6012311B2 (zh) |
KR (1) | KR101315102B1 (zh) |
CN (1) | CN102901734B (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016013833A1 (ko) * | 2014-07-22 | 2016-01-28 | 주식회사 엘지화학 | 재단 제품의 생산방법 및 재단 시스템 |
KR101717846B1 (ko) * | 2014-07-22 | 2017-03-17 | 주식회사 엘지화학 | 재단 제품의 생산방법 및 재단 시스템 |
CN107074475B (zh) | 2014-10-20 | 2019-08-13 | 株式会社Lg化学 | 裁剪产品的生产方法及生产系统 |
KR101746294B1 (ko) | 2014-11-05 | 2017-06-12 | 주식회사 엘지화학 | 재단 제품의 생산방법 및 생산 시스템 |
KR20160084601A (ko) | 2015-01-06 | 2016-07-14 | 주식회사 엘지화학 | 재단 제품의 생산방법 및 재단 시스템 |
KR20160107532A (ko) | 2015-03-04 | 2016-09-19 | 동우 화인켐 주식회사 | 광학 필름 검사 시스템 및 방법, 광학 필름 품질 관리 장치 및 방법 |
CN107407642B (zh) * | 2015-04-09 | 2020-04-03 | 住友化学株式会社 | 层叠光学膜的缺陷检查方法以及层叠光学膜的制造方法 |
KR20170103416A (ko) * | 2016-03-04 | 2017-09-13 | 동우 화인켐 주식회사 | 광학필름의 결함 정보 통합 관리 장치 및 그 방법 |
JP2019215371A (ja) * | 2019-08-26 | 2019-12-19 | 住友化学株式会社 | 光学フィルム及び積層光学フィルムの欠陥検査方法 |
CN113155862B (zh) * | 2021-04-15 | 2023-04-18 | 恒美光电股份有限公司 | 一种偏光膜卷材良率的模拟方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004117062A (ja) * | 2002-09-24 | 2004-04-15 | Seiko Epson Corp | 電気光学パネル用基板の検査方法、電気光学パネル用基板の製造方法、電気光学パネル用基板、電気光学装置および電子機器 |
WO2005065367A2 (en) * | 2003-12-31 | 2005-07-21 | 3M Innovative Properties Company | Maximation of yield for web-based articles |
TWI431263B (zh) * | 2005-03-28 | 2014-03-21 | Shibaura Mechatronics Corp | 應變矽晶圓表面檢查方法及檢查裝置 |
JP4707055B2 (ja) | 2005-08-22 | 2011-06-22 | 住友化学株式会社 | 枚葉フィルム断裁配置評価装置及び枚葉フィルム断裁配置決定方法 |
US7605914B2 (en) * | 2005-09-29 | 2009-10-20 | Carl Zeiss Smt Ag | Optical system and method for improving imaging properties thereof |
JP5248052B2 (ja) * | 2006-10-11 | 2013-07-31 | 日東電工株式会社 | 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム |
JP4913838B2 (ja) * | 2008-04-14 | 2012-04-11 | 日東電工株式会社 | 光学表示装置製造システム及び光学表示装置製造方法 |
JP2009281836A (ja) * | 2008-05-21 | 2009-12-03 | Olympus Corp | 基板観察装置、基板観察方法、制御装置、およびプログラム |
JP5305002B2 (ja) * | 2008-12-05 | 2013-10-02 | オムロン株式会社 | 外観検査装置 |
CN101545868B (zh) * | 2009-04-30 | 2011-06-08 | 上海交通大学 | 有色金属加工质量控制中的产品表面缺陷检测方法 |
-
2011
- 2011-07-25 KR KR1020110073536A patent/KR101315102B1/ko active IP Right Grant
-
2012
- 2012-07-10 JP JP2012154814A patent/JP6012311B2/ja active Active
- 2012-07-25 CN CN201210260972.5A patent/CN102901734B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
JP2013024868A (ja) | 2013-02-04 |
KR20130012379A (ko) | 2013-02-04 |
CN102901734B (zh) | 2017-04-12 |
KR101315102B1 (ko) | 2013-10-07 |
CN102901734A (zh) | 2013-01-30 |
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