JP5900913B2 - 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット - Google Patents

研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット Download PDF

Info

Publication number
JP5900913B2
JP5900913B2 JP2015506749A JP2015506749A JP5900913B2 JP 5900913 B2 JP5900913 B2 JP 5900913B2 JP 2015506749 A JP2015506749 A JP 2015506749A JP 2015506749 A JP2015506749 A JP 2015506749A JP 5900913 B2 JP5900913 B2 JP 5900913B2
Authority
JP
Japan
Prior art keywords
water
polishing composition
polishing
soluble polymer
agent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2015506749A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2014148399A1 (ja
Inventor
公亮 土屋
公亮 土屋
久典 丹所
久典 丹所
大輝 市坪
大輝 市坪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toagosei Co Ltd
Fujimi Inc
Original Assignee
Toagosei Co Ltd
Fujimi Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=51580082&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP5900913(B2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Toagosei Co Ltd, Fujimi Inc filed Critical Toagosei Co Ltd
Priority to JP2015506749A priority Critical patent/JP5900913B2/ja
Application granted granted Critical
Publication of JP5900913B2 publication Critical patent/JP5900913B2/ja
Publication of JPWO2014148399A1 publication Critical patent/JPWO2014148399A1/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F216/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal or ketal radical
    • C08F216/02Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal or ketal radical by an alcohol radical
    • C08F216/04Acyclic compounds
    • C08F216/06Polyvinyl alcohol ; Vinyl alcohol
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/06Other polishing compositions
    • C09G1/14Other polishing compositions based on non-waxy substances
    • C09G1/16Other polishing compositions based on non-waxy substances on natural or synthetic resins
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1436Composite particles, e.g. coated particles
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02024Mirror polishing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Composite Materials (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
JP2015506749A 2013-03-19 2014-03-14 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット Active JP5900913B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015506749A JP5900913B2 (ja) 2013-03-19 2014-03-14 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
JP2013057228 2013-03-19
JP2013057225 2013-03-19
JP2013057226 2013-03-19
JP2013057228 2013-03-19
JP2013057227 2013-03-19
JP2013057225 2013-03-19
JP2013057226 2013-03-19
JP2013057227 2013-03-19
PCT/JP2014/057008 WO2014148399A1 (ja) 2013-03-19 2014-03-14 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2015506749A JP5900913B2 (ja) 2013-03-19 2014-03-14 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP2016038585A Division JP6514653B2 (ja) 2013-03-19 2016-03-01 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2016038586A Division JP6513591B2 (ja) 2013-03-19 2016-03-01 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット

Publications (2)

Publication Number Publication Date
JP5900913B2 true JP5900913B2 (ja) 2016-04-06
JPWO2014148399A1 JPWO2014148399A1 (ja) 2017-02-16

Family

ID=51580082

Family Applications (5)

Application Number Title Priority Date Filing Date
JP2015506749A Active JP5900913B2 (ja) 2013-03-19 2014-03-14 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2016038586A Active JP6513591B2 (ja) 2013-03-19 2016-03-01 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2016038585A Active JP6514653B2 (ja) 2013-03-19 2016-03-01 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2019076438A Active JP7246235B2 (ja) 2013-03-19 2019-04-12 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2022087516A Pending JP2022118024A (ja) 2013-03-19 2022-05-30 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット

Family Applications After (4)

Application Number Title Priority Date Filing Date
JP2016038586A Active JP6513591B2 (ja) 2013-03-19 2016-03-01 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2016038585A Active JP6514653B2 (ja) 2013-03-19 2016-03-01 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2019076438A Active JP7246235B2 (ja) 2013-03-19 2019-04-12 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2022087516A Pending JP2022118024A (ja) 2013-03-19 2022-05-30 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット

Country Status (8)

Country Link
US (1) US10351732B2 (enExample)
EP (2) EP3967736B1 (enExample)
JP (5) JP5900913B2 (enExample)
KR (1) KR102330030B1 (enExample)
CN (1) CN105051145B (enExample)
SG (1) SG11201507438YA (enExample)
TW (2) TWI640586B (enExample)
WO (1) WO2014148399A1 (enExample)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10717899B2 (en) 2013-03-19 2020-07-21 Fujimi Incorporated Polishing composition, method for producing polishing composition and polishing composition preparation kit
KR102330030B1 (ko) * 2013-03-19 2021-11-24 가부시키가이샤 후지미인코퍼레이티드 연마용 조성물, 연마용 조성물 제조 방법 및 연마용 조성물 조제용 키트
JP6367113B2 (ja) * 2014-12-25 2018-08-01 花王株式会社 シリコンウェーハ用研磨液組成物
JP6655354B2 (ja) * 2014-12-26 2020-02-26 花王株式会社 シリコンウェーハ用研磨液組成物、又はシリコンウェーハ用研磨液組成物キット
US10748778B2 (en) * 2015-02-12 2020-08-18 Fujimi Incorporated Method for polishing silicon wafer and surface treatment composition
SG11201803364WA (en) * 2015-10-23 2018-05-30 Nitta Haas Inc Polishing composition
JP6856535B2 (ja) * 2015-10-23 2021-04-07 ニッタ・デュポン株式会社 研磨用組成物
JP6801964B2 (ja) 2016-01-19 2020-12-16 株式会社フジミインコーポレーテッド 研磨用組成物及びシリコン基板の研磨方法
JP6572830B2 (ja) * 2016-06-13 2019-09-11 信越半導体株式会社 シリコンウェーハの搬送・保管方法
WO2018025656A1 (ja) * 2016-08-02 2018-02-08 株式会社フジミインコーポレーテッド シリコンウェーハ粗研磨用組成物の製造方法、シリコンウェーハ粗研磨用組成物セット、およびシリコンウェーハの研磨方法
WO2018025655A1 (ja) * 2016-08-02 2018-02-08 株式会社フジミインコーポレーテッド シリコンウェーハ粗研磨用組成物の濃縮液
JP7050684B2 (ja) 2016-08-31 2022-04-08 株式会社フジミインコーポレーテッド 研磨用組成物および研磨用組成物セット
NZ754331A (en) 2016-12-22 2025-09-26 Illumina Inc Flow cell package and method for making the same
JP7185533B2 (ja) * 2017-02-20 2022-12-07 株式会社フジミインコーポレーテッド シリコン基板中間研磨用組成物およびシリコン基板研磨用組成物セット
JP7074525B2 (ja) * 2017-03-30 2022-05-24 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
CN108499963A (zh) * 2017-05-18 2018-09-07 苏州权素船舶电子有限公司 一种电子材料研磨清洗方法
EP3708630A4 (en) 2017-11-06 2021-08-18 Fujimi Incorporated COMPOSITION FOR POLISHING, AND METHOD FOR MANUFACTURING THE SAME
WO2019098257A1 (ja) 2017-11-16 2019-05-23 日揮触媒化成株式会社 シリカ粒子の分散液及びその製造方法
JP6929239B2 (ja) * 2018-03-30 2021-09-01 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
JP7221479B2 (ja) * 2018-08-31 2023-02-14 日化精工株式会社 ダイシング加工用製剤及び加工処理液
EP3950876A4 (en) * 2019-03-26 2022-11-02 Fujimi Incorporated POLISHING COMPOSITION
JP7384592B2 (ja) * 2019-08-22 2023-11-21 株式会社三共 遊技機
US11492512B2 (en) * 2019-09-26 2022-11-08 Fujimi Incorporated Polishing composition and polishing method
JP6884898B1 (ja) * 2020-01-22 2021-06-09 日本酢ビ・ポバール株式会社 研磨用組成物
KR20220150963A (ko) * 2020-03-13 2022-11-11 가부시키가이샤 후지미인코퍼레이티드 연마용 조성물 및 연마 방법
JP7720137B2 (ja) * 2020-09-30 2025-08-07 株式会社フジミインコーポレーテッド ポリビニルアルコール組成物を含む半導体用濡れ剤の製造方法
KR20240166015A (ko) * 2022-03-31 2024-11-25 가부시키가이샤 후지미인코퍼레이티드 연마용 조성물
TWI841000B (zh) 2022-10-14 2024-05-01 財團法人工業技術研究院 懸浮磨料噴射流的加工方法及加工系統
TWI878955B (zh) 2023-07-05 2025-04-01 財團法人工業技術研究院 廢熱固性材料回收裝置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003321671A (ja) * 2002-04-30 2003-11-14 Sumitomo Bakelite Co Ltd 研磨用組成物
WO2004068570A1 (ja) * 2003-01-31 2004-08-12 Hitachi Chemical Co., Ltd. Cmp研磨剤及び研磨方法
JP2006186356A (ja) * 2004-12-17 2006-07-13 Rohm & Haas Electronic Materials Cmp Holdings Inc 半導体ウェーハにおけるエロージョンを減らすための研磨組成物
JP2009147267A (ja) * 2007-12-18 2009-07-02 Dai Ichi Kogyo Seiyaku Co Ltd 化学機械研磨用研磨剤
JP2010274348A (ja) * 2009-05-27 2010-12-09 Nihon Micro Coating Co Ltd 研磨フィルム及びこれを用いた研磨方法
WO2010143579A1 (ja) * 2009-06-09 2010-12-16 日立化成工業株式会社 研磨剤、研磨剤セット及び基板の研磨方法
WO2011111421A1 (ja) * 2010-03-12 2011-09-15 日立化成工業株式会社 スラリ、研磨液セット、研磨液及びこれらを用いた基板の研磨方法
JP2013222863A (ja) * 2012-04-17 2013-10-28 Kao Corp シリコンウェーハ用研磨液組成物

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2247067C3 (de) 1972-09-26 1979-08-09 Wacker-Chemitronic Gesellschaft Fuer Elektronik-Grundstoffe Mbh, 8263 Burghausen Verwendung einer Poliersuspension zum schleierfreien Polieren von Halbleiteroberflächen
JPS539910A (en) 1976-07-14 1978-01-28 Hitachi Ltd Function generating circuit for gas turbine engine control
JP4115562B2 (ja) 1997-10-14 2008-07-09 株式会社フジミインコーポレーテッド 研磨用組成物
JPH11140427A (ja) 1997-11-13 1999-05-25 Kobe Steel Ltd 研磨液および研磨方法
JP2004067869A (ja) * 2002-08-06 2004-03-04 Sumitomo Bakelite Co Ltd 研磨用組成物
JP2004311967A (ja) * 2003-03-27 2004-11-04 Nippon Shokubai Co Ltd Cmp研磨剤用ポリマー及び組成物
TWI361218B (en) * 2005-04-14 2012-04-01 Showa Denko Kk Polishing composition
EP1956642A4 (en) * 2005-11-11 2011-04-06 Hitachi Chemical Co Ltd POLISHING AGENT FOR SILICONE OXIDE, LIQUID ADDITIVE AND POLISHING PROCESS
JP5335183B2 (ja) 2006-08-24 2013-11-06 株式会社フジミインコーポレーテッド 研磨用組成物及び研磨方法
US20110081780A1 (en) 2008-02-18 2011-04-07 Jsr Corporation Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method
JP2011171689A (ja) 2009-07-07 2011-09-01 Kao Corp シリコンウエハ用研磨液組成物
WO2011093223A1 (ja) * 2010-01-29 2011-08-04 株式会社 フジミインコーポレーテッド 半導体ウェーハの再生方法及び研磨用組成物
JP4772156B1 (ja) 2010-07-05 2011-09-14 花王株式会社 シリコンウエハ用研磨液組成物
US9881801B2 (en) 2010-11-22 2018-01-30 Hitachi Chemical Company, Ltd. Slurry, polishing liquid set, polishing liquid, method for polishing substrate, and substrate
JP2013057227A (ja) 2011-09-06 2013-03-28 Takao Suzuki 管渠等沈下測定小型マンホール設置工
JP2013057226A (ja) 2011-09-06 2013-03-28 Masaru Hiyamizu 外壁材、屋根材の省エネルギ−材
JP2013057225A (ja) 2011-09-07 2013-03-28 Yanagisawa Concrete Kogyo Kk アーチ甲蓋
JP2013057228A (ja) 2011-09-09 2013-03-28 Hiroaki Matsuda 排水口用ゴミ取り器
JP6077209B2 (ja) * 2011-11-25 2017-02-08 株式会社フジミインコーポレーテッド 研磨用組成物
CN108831830B (zh) 2012-02-21 2024-05-17 株式会社力森诺科 研磨剂、研磨剂组和基体的研磨方法
KR102123906B1 (ko) 2012-05-25 2020-06-17 닛산 가가쿠 가부시키가이샤 웨이퍼용 연마액 조성물
JP5927059B2 (ja) * 2012-06-19 2016-05-25 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた基板の製造方法
JP5897200B2 (ja) 2013-02-13 2016-03-30 株式会社フジミインコーポレーテッド 研磨用組成物、研磨用組成物製造方法および研磨物製造方法
KR102330030B1 (ko) 2013-03-19 2021-11-24 가부시키가이샤 후지미인코퍼레이티드 연마용 조성물, 연마용 조성물 제조 방법 및 연마용 조성물 조제용 키트

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003321671A (ja) * 2002-04-30 2003-11-14 Sumitomo Bakelite Co Ltd 研磨用組成物
WO2004068570A1 (ja) * 2003-01-31 2004-08-12 Hitachi Chemical Co., Ltd. Cmp研磨剤及び研磨方法
JP2006186356A (ja) * 2004-12-17 2006-07-13 Rohm & Haas Electronic Materials Cmp Holdings Inc 半導体ウェーハにおけるエロージョンを減らすための研磨組成物
JP2009147267A (ja) * 2007-12-18 2009-07-02 Dai Ichi Kogyo Seiyaku Co Ltd 化学機械研磨用研磨剤
JP2010274348A (ja) * 2009-05-27 2010-12-09 Nihon Micro Coating Co Ltd 研磨フィルム及びこれを用いた研磨方法
WO2010143579A1 (ja) * 2009-06-09 2010-12-16 日立化成工業株式会社 研磨剤、研磨剤セット及び基板の研磨方法
WO2011111421A1 (ja) * 2010-03-12 2011-09-15 日立化成工業株式会社 スラリ、研磨液セット、研磨液及びこれらを用いた基板の研磨方法
JP2013222863A (ja) * 2012-04-17 2013-10-28 Kao Corp シリコンウェーハ用研磨液組成物

Also Published As

Publication number Publication date
KR102330030B1 (ko) 2021-11-24
TW201900795A (zh) 2019-01-01
TWI640586B (zh) 2018-11-11
JP2022118024A (ja) 2022-08-12
EP3967736A1 (en) 2022-03-16
JP7246235B2 (ja) 2023-03-27
JP2019151849A (ja) 2019-09-12
JP6513591B2 (ja) 2019-05-15
US20160272846A1 (en) 2016-09-22
CN105051145B (zh) 2018-06-26
CN105051145A (zh) 2015-11-11
EP2977423A4 (en) 2017-03-22
US10351732B2 (en) 2019-07-16
JP6514653B2 (ja) 2019-05-15
TWI665275B (zh) 2019-07-11
EP3967736B1 (en) 2023-10-11
KR20150133694A (ko) 2015-11-30
TW201500492A (zh) 2015-01-01
SG11201507438YA (en) 2015-10-29
WO2014148399A1 (ja) 2014-09-25
EP2977423B1 (en) 2022-09-28
JP2016166343A (ja) 2016-09-15
JP2016135882A (ja) 2016-07-28
JPWO2014148399A1 (ja) 2017-02-16
EP2977423A1 (en) 2016-01-27

Similar Documents

Publication Publication Date Title
JP5900913B2 (ja) 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
JP2022118024A5 (enExample)
JP5890583B2 (ja) 研磨用組成物および研磨物製造方法
JP6360108B2 (ja) シリコンウエハ研磨用組成物
JP6185432B2 (ja) シリコンウェーハ研磨用組成物
JP6110681B2 (ja) 研磨用組成物、研磨用組成物製造方法および研磨物製造方法
JP6279593B2 (ja) 研磨用組成物、研磨用組成物の製造方法およびシリコンウェーハ製造方法
JP2017101248A (ja) 研磨用組成物、研磨用組成物製造方法および研磨物製造方法
JP6348927B2 (ja) シリコンウェーハ研磨用組成物
JP6691774B2 (ja) 研磨用組成物およびその製造方法
JP5920840B2 (ja) 研磨用組成物およびその製造方法
JP5859055B2 (ja) シリコンウェーハ研磨用組成物
JP6562605B2 (ja) 研磨用組成物の製造方法

Legal Events

Date Code Title Description
TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160204

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160301

R150 Certificate of patent or registration of utility model

Ref document number: 5900913

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R157 Certificate of patent or utility model (correction)

Free format text: JAPANESE INTERMEDIATE CODE: R157

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250