JP5547615B2 - 配線基板、半導体装置及び配線基板の製造方法 - Google Patents
配線基板、半導体装置及び配線基板の製造方法 Download PDFInfo
- Publication number
- JP5547615B2 JP5547615B2 JP2010254494A JP2010254494A JP5547615B2 JP 5547615 B2 JP5547615 B2 JP 5547615B2 JP 2010254494 A JP2010254494 A JP 2010254494A JP 2010254494 A JP2010254494 A JP 2010254494A JP 5547615 B2 JP5547615 B2 JP 5547615B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- wiring
- insulating layer
- wiring layer
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49822—Multilayer substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010254494A JP5547615B2 (ja) | 2010-11-15 | 2010-11-15 | 配線基板、半導体装置及び配線基板の製造方法 |
| US13/293,857 US9741647B2 (en) | 2010-11-15 | 2011-11-10 | Wiring substrate, semiconductor device, and method of manufacturing wiring substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010254494A JP5547615B2 (ja) | 2010-11-15 | 2010-11-15 | 配線基板、半導体装置及び配線基板の製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012104774A JP2012104774A (ja) | 2012-05-31 |
| JP2012104774A5 JP2012104774A5 (enExample) | 2013-07-25 |
| JP5547615B2 true JP5547615B2 (ja) | 2014-07-16 |
Family
ID=46047057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010254494A Active JP5547615B2 (ja) | 2010-11-15 | 2010-11-15 | 配線基板、半導体装置及び配線基板の製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US9741647B2 (enExample) |
| JP (1) | JP5547615B2 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9275925B2 (en) * | 2013-03-12 | 2016-03-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | System and method for an improved interconnect structure |
| JP6169955B2 (ja) * | 2013-04-17 | 2017-07-26 | 新光電気工業株式会社 | 配線基板及びその製造方法 |
| JP6269661B2 (ja) | 2013-05-08 | 2018-01-31 | 株式会社村田製作所 | 多層配線基板 |
| KR102163041B1 (ko) * | 2013-11-19 | 2020-10-08 | 삼성전기주식회사 | 회로기판, 회로기판 제조방법 및 2단 비아 구조 |
| JP5662551B1 (ja) | 2013-12-20 | 2015-01-28 | 新光電気工業株式会社 | 配線基板、半導体装置及び配線基板の製造方法 |
| TWI504320B (zh) * | 2014-06-17 | 2015-10-11 | 矽品精密工業股份有限公司 | 線路結構及其製法 |
| JP7112877B2 (ja) * | 2018-04-20 | 2022-08-04 | 新光電気工業株式会社 | センサモジュール |
| US10643943B2 (en) * | 2018-06-25 | 2020-05-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure, package-on-package structure and manufacturing method thereof |
| JP2021125643A (ja) * | 2020-02-07 | 2021-08-30 | キオクシア株式会社 | 半導体装置およびその製造方法 |
| TWI781049B (zh) * | 2022-01-24 | 2022-10-11 | 欣興電子股份有限公司 | 電路板結構及其製作方法 |
| US20250038093A1 (en) * | 2023-07-27 | 2025-01-30 | Taiwan Semiconductor Manufacturing Company Limited | Interposers including line-on-via and line-in-via interconnect structures and methods of forming the same |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2720865B2 (ja) | 1996-01-22 | 1998-03-04 | 日立エーアイシー株式会社 | 多層印刷配線板およびその製造方法 |
| US6492719B2 (en) * | 1999-07-30 | 2002-12-10 | Hitachi, Ltd. | Semiconductor device |
| JP4869488B2 (ja) | 2000-12-15 | 2012-02-08 | イビデン株式会社 | 多層プリント配線板の製造方法 |
| JP2004273575A (ja) | 2003-03-05 | 2004-09-30 | Sony Corp | 多層プリント配線基板及びその製造方法 |
| US7211289B2 (en) * | 2003-12-18 | 2007-05-01 | Endicott Interconnect Technologies, Inc. | Method of making multilayered printed circuit board with filled conductive holes |
| KR100688701B1 (ko) | 2005-12-14 | 2007-03-02 | 삼성전기주식회사 | 랜드리스 비아홀을 구비한 인쇄회로기판의 제조방법 |
| JP5324051B2 (ja) * | 2007-03-29 | 2013-10-23 | 新光電気工業株式会社 | 配線基板の製造方法及び半導体装置の製造方法及び配線基板 |
| JP2008283140A (ja) * | 2007-05-14 | 2008-11-20 | Shinko Electric Ind Co Ltd | 配線基板の製造方法及び配線基板 |
| KR100990618B1 (ko) | 2008-04-15 | 2010-10-29 | 삼성전기주식회사 | 랜드리스 비아홀을 갖는 인쇄회로기판 및 그 제조방법 |
| JP2010103435A (ja) | 2008-10-27 | 2010-05-06 | Shinko Electric Ind Co Ltd | 配線基板及びその製造方法 |
| JP2011165741A (ja) * | 2010-02-05 | 2011-08-25 | Renesas Electronics Corp | 半導体装置およびその製造方法 |
| US8541693B2 (en) * | 2010-03-31 | 2013-09-24 | Ibiden Co., Ltd. | Wiring board and method for manufacturing the same |
-
2010
- 2010-11-15 JP JP2010254494A patent/JP5547615B2/ja active Active
-
2011
- 2011-11-10 US US13/293,857 patent/US9741647B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20120119377A1 (en) | 2012-05-17 |
| US9741647B2 (en) | 2017-08-22 |
| JP2012104774A (ja) | 2012-05-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5547615B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6158676B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6298722B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6375159B2 (ja) | 配線基板、半導体パッケージ | |
| JP6324876B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6247032B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6752553B2 (ja) | 配線基板 | |
| JP6375121B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6584939B2 (ja) | 配線基板、半導体パッケージ、半導体装置、配線基板の製造方法及び半導体パッケージの製造方法 | |
| JP6173781B2 (ja) | 配線基板及び配線基板の製造方法 | |
| CN103369816B (zh) | 电路板及其制造方法 | |
| JP6170832B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6162458B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP5981232B2 (ja) | 半導体パッケージ、半導体装置及び半導体パッケージの製造方法 | |
| JP6780933B2 (ja) | 端子構造、端子構造の製造方法、及び配線基板 | |
| JP6228785B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| TWI543676B (zh) | 印刷電路板及其製造方法 | |
| KR20080088403A (ko) | 배선 기판의 제조 방법, 반도체 장치의 제조 방법 및 배선기판 | |
| JP6550260B2 (ja) | 配線基板及び配線基板の製造方法 | |
| JP6341714B2 (ja) | 配線基板及びその製造方法 | |
| JP2017112209A (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| JP6418757B2 (ja) | 配線基板及びその製造方法と半導体装置 | |
| JP7265877B2 (ja) | 配線基板 | |
| JP6505521B2 (ja) | 配線基板、半導体装置及び配線基板の製造方法 | |
| KR20150065029A (ko) | 인쇄회로기판, 그 제조방법 및 반도체 패키지 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130612 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130612 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20140116 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140128 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140312 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140507 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140515 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5547615 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |