JP5346259B2 - 半導体集積回路 - Google Patents
半導体集積回路 Download PDFInfo
- Publication number
- JP5346259B2 JP5346259B2 JP2009206881A JP2009206881A JP5346259B2 JP 5346259 B2 JP5346259 B2 JP 5346259B2 JP 2009206881 A JP2009206881 A JP 2009206881A JP 2009206881 A JP2009206881 A JP 2009206881A JP 5346259 B2 JP5346259 B2 JP 5346259B2
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- JP
- Japan
- Prior art keywords
- data
- circuit
- transmission
- reception
- switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/419—Read-write [R-W] circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/02—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding parasitic signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0005—Modifications of input or output impedance
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/017545—Coupling arrangements; Impedance matching circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Dram (AREA)
- Memory System (AREA)
- Logic Circuits (AREA)
Priority Applications (10)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009206881A JP5346259B2 (ja) | 2009-09-08 | 2009-09-08 | 半導体集積回路 |
| US12/876,747 US8102186B2 (en) | 2009-09-08 | 2010-09-07 | Semiconductor integrated circuit with first and second transmitter-receivers |
| CN201410260671.1A CN104113321B (zh) | 2009-09-08 | 2010-09-08 | 半导体集成电路 |
| CN201010279144.7A CN102012875B (zh) | 2009-09-08 | 2010-09-08 | 半导体集成电路 |
| US13/271,819 US8558572B2 (en) | 2009-09-08 | 2011-10-12 | Memory with termination circuit |
| US14/031,462 US8952719B2 (en) | 2009-09-08 | 2013-09-19 | Memory with termination circuit |
| US14/579,364 US9286958B2 (en) | 2009-09-08 | 2014-12-22 | Memory with termination circuit |
| US15/016,594 US9767884B2 (en) | 2009-09-08 | 2016-02-05 | Memory with termination circuit |
| US15/684,461 US10134462B2 (en) | 2009-09-08 | 2017-08-23 | Memory with termination circuit |
| US16/170,209 US10490254B2 (en) | 2009-09-08 | 2018-10-25 | Semiconductor integrated circuit system with termination circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009206881A JP5346259B2 (ja) | 2009-09-08 | 2009-09-08 | 半導体集積回路 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013169075A Division JP5591387B2 (ja) | 2013-08-16 | 2013-08-16 | 記憶装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011061351A JP2011061351A (ja) | 2011-03-24 |
| JP2011061351A5 JP2011061351A5 (enExample) | 2012-04-05 |
| JP5346259B2 true JP5346259B2 (ja) | 2013-11-20 |
Family
ID=43647258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009206881A Active JP5346259B2 (ja) | 2009-09-08 | 2009-09-08 | 半導体集積回路 |
Country Status (3)
| Country | Link |
|---|---|
| US (7) | US8102186B2 (enExample) |
| JP (1) | JP5346259B2 (enExample) |
| CN (2) | CN102012875B (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7486104B2 (en) | 2006-06-02 | 2009-02-03 | Rambus Inc. | Integrated circuit with graduated on-die termination |
| JP5390310B2 (ja) | 2009-09-08 | 2014-01-15 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| JP5346259B2 (ja) | 2009-09-08 | 2013-11-20 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| JP5363252B2 (ja) | 2009-09-09 | 2013-12-11 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| WO2011159465A2 (en) | 2010-06-17 | 2011-12-22 | Rambus Inc. | Balanced on-die termination |
| CN103066987A (zh) * | 2011-10-24 | 2013-04-24 | 三星电子株式会社 | 输出驱动器、集成电路及系统 |
| KR20130045144A (ko) * | 2011-10-24 | 2013-05-03 | 삼성전자주식회사 | 출력 드라이버와 이를 포함하는 장치들, 및 접지 터미네이션 |
| FR3001310B1 (fr) * | 2013-01-21 | 2015-02-27 | Commissariat Energie Atomique | Interface de reseau sur puce dotee d'un systeme adaptatif de declenchement d'envoi de donnees |
| CN104517625B (zh) * | 2013-09-29 | 2017-07-28 | 瑞昱半导体股份有限公司 | 电子装置与用于电子装置的控制方法 |
| JP6402579B2 (ja) * | 2014-10-17 | 2018-10-10 | 株式会社ソシオネクスト | 送受信回路及び制御方法 |
| KR20160105093A (ko) | 2015-02-27 | 2016-09-06 | 에스케이하이닉스 주식회사 | 고속 통신을 위한 인터페이스 회로 및 이를 포함하는 시스템 |
| JP6509711B2 (ja) * | 2015-10-29 | 2019-05-08 | 東芝メモリ株式会社 | 不揮発性半導体記憶装置及びメモリシステム |
| KR102529187B1 (ko) * | 2016-03-31 | 2023-05-04 | 삼성전자주식회사 | 복수의 통신 규격들을 지원하는 수신 인터페이스 회로 및 이를 포함하는 메모리 시스템 |
| KR102646905B1 (ko) * | 2016-07-21 | 2024-03-12 | 삼성전자주식회사 | 온 다이 터미네이션 회로, 이를 구비하는 메모리 장치 및 메모리 시스템 |
| US10128841B2 (en) * | 2016-09-19 | 2018-11-13 | Mediatek Inc. | Termination circuit, receiver and associated terminating method capable of suppressing crosstalk |
| KR102656219B1 (ko) * | 2016-11-07 | 2024-04-11 | 삼성전자주식회사 | 메모리 장치, 그것을 포함하는 메모리 시스템, 및 그것의 슬루 레이트 조정 방법 |
| KR102717627B1 (ko) * | 2016-12-26 | 2024-10-16 | 에스케이하이닉스 주식회사 | 동적 터미네이션 회로, 이를 포함하는 반도체 장치 및 시스템 |
| US10424356B2 (en) | 2017-11-22 | 2019-09-24 | Micron Technology, Inc. | Methods for on-die memory termination and memory devices and systems employing the same |
| JP2020102286A (ja) * | 2018-12-21 | 2020-07-02 | キオクシア株式会社 | 半導体記憶装置 |
| KR102767988B1 (ko) * | 2020-05-19 | 2025-02-14 | 에스케이하이닉스 주식회사 | 전자시스템 및 반도체시스템 |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0485791A (ja) | 1990-07-27 | 1992-03-18 | Hitachi Ltd | 半導体記憶装置 |
| US5467455A (en) * | 1993-11-03 | 1995-11-14 | Motorola, Inc. | Data processing system and method for performing dynamic bus termination |
| JPH09152923A (ja) | 1995-11-29 | 1997-06-10 | Fujitsu Ltd | 信号電極の駆動方法、電子装置、および半導体装置 |
| JPH11353228A (ja) | 1998-06-10 | 1999-12-24 | Mitsubishi Electric Corp | メモリモジュールシステム |
| JP3425890B2 (ja) | 1999-04-08 | 2003-07-14 | Necエレクトロニクス株式会社 | バッファ回路 |
| US6356106B1 (en) * | 2000-09-12 | 2002-03-12 | Micron Technology, Inc. | Active termination in a multidrop memory system |
| US6380758B1 (en) | 2000-09-29 | 2002-04-30 | Intel Corporation | Impedance control for wide range loaded signals using distributed methodology |
| JP2002222921A (ja) | 2001-01-25 | 2002-08-09 | Mitsubishi Electric Corp | 半導体集積回路 |
| US6904552B2 (en) | 2001-03-15 | 2005-06-07 | Micron Technolgy, Inc. | Circuit and method for test and repair |
| JP3799251B2 (ja) * | 2001-08-24 | 2006-07-19 | エルピーダメモリ株式会社 | メモリデバイス及びメモリシステム |
| JP3821678B2 (ja) * | 2001-09-06 | 2006-09-13 | エルピーダメモリ株式会社 | メモリ装置 |
| JP3721117B2 (ja) | 2001-10-29 | 2005-11-30 | エルピーダメモリ株式会社 | 入出力回路と基準電圧生成回路及び半導体集積回路 |
| KR100468728B1 (ko) * | 2002-04-19 | 2005-01-29 | 삼성전자주식회사 | 반도체 집적회로의 온-칩 터미네이터, 그 제어 회로 및 그제어 방법 |
| KR20050027118A (ko) | 2002-07-22 | 2005-03-17 | 가부시끼가이샤 르네사스 테크놀로지 | 반도체 집적회로 장치 데이터 처리 시스템 및 메모리시스템 |
| JP2004153690A (ja) | 2002-10-31 | 2004-05-27 | Nec Corp | トライステートバッファ回路 |
| US7142461B2 (en) | 2002-11-20 | 2006-11-28 | Micron Technology, Inc. | Active termination control though on module register |
| JP2004280926A (ja) | 2003-03-14 | 2004-10-07 | Renesas Technology Corp | 半導体記憶装置 |
| KR100487138B1 (ko) * | 2003-04-30 | 2005-05-04 | 주식회사 하이닉스반도체 | 입/출력 드라이버 |
| KR100626375B1 (ko) | 2003-07-21 | 2006-09-20 | 삼성전자주식회사 | 고주파로 동작하는 반도체 메모리 장치 및 모듈 |
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| JP4615896B2 (ja) * | 2004-05-25 | 2011-01-19 | 富士通セミコンダクター株式会社 | 半導体記憶装置および該半導体記憶装置の制御方法 |
| JP2006040318A (ja) | 2004-07-22 | 2006-02-09 | Canon Inc | メモリデバイス制御回路 |
| KR100574989B1 (ko) | 2004-11-04 | 2006-05-02 | 삼성전자주식회사 | 데이터 스트로브 버스라인의 효율을 향상시키는메모리장치 및 이를 구비하는 메모리 시스템, 및 데이터스트로브 신호 제어방법 |
| US7433992B2 (en) * | 2004-11-18 | 2008-10-07 | Intel Corporation | Command controlling different operations in different chips |
| JP2007193431A (ja) | 2006-01-17 | 2007-08-02 | Sharp Corp | バス制御装置 |
| JP5019573B2 (ja) | 2006-10-18 | 2012-09-05 | キヤノン株式会社 | メモリ制御回路とメモリシステム、及びそのメモリ制御方法、及び集積回路 |
| JP4384207B2 (ja) | 2007-06-29 | 2009-12-16 | 株式会社東芝 | 半導体集積回路 |
| KR100884604B1 (ko) | 2007-09-04 | 2009-02-19 | 주식회사 하이닉스반도체 | 충분한 내부 동작 마진을 확보하기 위한 반도체 메모리장치 및 그 방법 |
| JP5191218B2 (ja) | 2007-11-27 | 2013-05-08 | アルパイン株式会社 | メモリ制御回路 |
| JP2009171562A (ja) | 2007-12-17 | 2009-07-30 | Seiko Epson Corp | 演算比較器、差動出力回路、および半導体集積回路 |
| JP5731730B2 (ja) | 2008-01-11 | 2015-06-10 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体記憶装置及びその半導体記憶装置を含むデータ処理システム |
| KR20110001396A (ko) | 2009-06-30 | 2011-01-06 | 삼성전자주식회사 | 전력 소모를 줄일 수 있는 반도체 메모리 장치 |
| JP5390310B2 (ja) | 2009-09-08 | 2014-01-15 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| JP5346259B2 (ja) | 2009-09-08 | 2013-11-20 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| JP5363252B2 (ja) | 2009-09-09 | 2013-12-11 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| KR101093000B1 (ko) | 2010-05-28 | 2011-12-12 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 및 그 동작 방법 |
| CN102662782B (zh) | 2012-04-17 | 2014-09-03 | 华为技术有限公司 | 一种监控系统总线的方法及装置 |
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2009
- 2009-09-08 JP JP2009206881A patent/JP5346259B2/ja active Active
-
2010
- 2010-09-07 US US12/876,747 patent/US8102186B2/en active Active
- 2010-09-08 CN CN201010279144.7A patent/CN102012875B/zh active Active
- 2010-09-08 CN CN201410260671.1A patent/CN104113321B/zh active Active
-
2011
- 2011-10-12 US US13/271,819 patent/US8558572B2/en active Active
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2013
- 2013-09-19 US US14/031,462 patent/US8952719B2/en active Active
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2014
- 2014-12-22 US US14/579,364 patent/US9286958B2/en active Active
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2016
- 2016-02-05 US US15/016,594 patent/US9767884B2/en active Active
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2017
- 2017-08-23 US US15/684,461 patent/US10134462B2/en active Active
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2018
- 2018-10-25 US US16/170,209 patent/US10490254B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20170352401A1 (en) | 2017-12-07 |
| US8102186B2 (en) | 2012-01-24 |
| US20110057720A1 (en) | 2011-03-10 |
| CN102012875A (zh) | 2011-04-13 |
| US20120026812A1 (en) | 2012-02-02 |
| CN102012875B (zh) | 2014-07-09 |
| US8558572B2 (en) | 2013-10-15 |
| US20150109869A1 (en) | 2015-04-23 |
| CN104113321B (zh) | 2017-08-29 |
| US9767884B2 (en) | 2017-09-19 |
| US10134462B2 (en) | 2018-11-20 |
| US20160155489A1 (en) | 2016-06-02 |
| US8952719B2 (en) | 2015-02-10 |
| US20140016401A1 (en) | 2014-01-16 |
| US10490254B2 (en) | 2019-11-26 |
| US20190066756A1 (en) | 2019-02-28 |
| JP2011061351A (ja) | 2011-03-24 |
| CN104113321A (zh) | 2014-10-22 |
| US9286958B2 (en) | 2016-03-15 |
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