JP5181626B2 - 多層プリント基板およびインバータ装置 - Google Patents

多層プリント基板およびインバータ装置 Download PDF

Info

Publication number
JP5181626B2
JP5181626B2 JP2007286911A JP2007286911A JP5181626B2 JP 5181626 B2 JP5181626 B2 JP 5181626B2 JP 2007286911 A JP2007286911 A JP 2007286911A JP 2007286911 A JP2007286911 A JP 2007286911A JP 5181626 B2 JP5181626 B2 JP 5181626B2
Authority
JP
Japan
Prior art keywords
chip
package
circuit board
printed circuit
multilayer printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007286911A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009117501A5 (pt
JP2009117501A (ja
Inventor
友和 本田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Original Assignee
Yaskawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yaskawa Electric Corp filed Critical Yaskawa Electric Corp
Priority to JP2007286911A priority Critical patent/JP5181626B2/ja
Publication of JP2009117501A publication Critical patent/JP2009117501A/ja
Publication of JP2009117501A5 publication Critical patent/JP2009117501A5/ja
Application granted granted Critical
Publication of JP5181626B2 publication Critical patent/JP5181626B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1418Disposition being disposed on at least two different sides of the body, e.g. dual array
    • H01L2224/14181On opposite sides of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45117Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
    • H01L2224/45124Aluminium (Al) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1532Connection portion the connection portion being formed on the die mounting surface of the substrate
    • H01L2924/1533Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
    • H01L2924/15331Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)
JP2007286911A 2007-11-05 2007-11-05 多層プリント基板およびインバータ装置 Expired - Fee Related JP5181626B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007286911A JP5181626B2 (ja) 2007-11-05 2007-11-05 多層プリント基板およびインバータ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007286911A JP5181626B2 (ja) 2007-11-05 2007-11-05 多層プリント基板およびインバータ装置

Publications (3)

Publication Number Publication Date
JP2009117501A JP2009117501A (ja) 2009-05-28
JP2009117501A5 JP2009117501A5 (pt) 2011-08-18
JP5181626B2 true JP5181626B2 (ja) 2013-04-10

Family

ID=40784320

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007286911A Expired - Fee Related JP5181626B2 (ja) 2007-11-05 2007-11-05 多層プリント基板およびインバータ装置

Country Status (1)

Country Link
JP (1) JP5181626B2 (pt)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4973761B2 (ja) * 2009-05-25 2012-07-11 株式会社デンソー 半導体装置
JP6007485B2 (ja) * 2011-12-05 2016-10-12 大日本印刷株式会社 部品内蔵配線基板、及びその製造方法
WO2014185204A1 (ja) 2013-05-14 2014-11-20 株式会社村田製作所 部品内蔵基板及び通信モジュール
US20210378097A1 (en) * 2020-06-01 2021-12-02 Steering Solutions Ip Holding Corporation Redundant printed circuit board with built in isolation

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005317903A (ja) * 2004-03-31 2005-11-10 Alps Electric Co Ltd 回路部品モジュール、回路部品モジュールスタック、記録媒体およびこれらの製造方法
JP4285364B2 (ja) * 2004-08-20 2009-06-24 パナソニック株式会社 立体回路モジュールとこれを用いた携帯端末機器および立体回路モジュールの製造方法
JP2006310421A (ja) * 2005-04-27 2006-11-09 Cmk Corp 部品内蔵型プリント配線板とその製造方法
JP2007227586A (ja) * 2006-02-23 2007-09-06 Cmk Corp 半導体素子内蔵基板及びその製造方法

Also Published As

Publication number Publication date
JP2009117501A (ja) 2009-05-28

Similar Documents

Publication Publication Date Title
US11605609B2 (en) Ultra-thin embedded semiconductor device package and method of manufacturing thereof
KR100966684B1 (ko) 반도체 장치와 그것을 이용한 반도체 모듈
US8796831B2 (en) Complex semiconductor packages and methods of fabricating the same
KR101978512B1 (ko) 리드프레임 접속을 갖는 pol 구조체
TWI276192B (en) Stack structure of semiconductor component embedded in supporting board and method for fabricating the same
JP2010080752A (ja) 半導体装置の製造方法
JP2006196709A (ja) 半導体装置およびその製造方法
JP2932432B2 (ja) 半導体パッケージの構造及びパッケージ方法
KR100744146B1 (ko) 연성 접속판을 이용하여 배선 기판과 칩을 연결하는 반도체패키지
JP5358089B2 (ja) 半導体装置
JP5181626B2 (ja) 多層プリント基板およびインバータ装置
KR20160093248A (ko) 반도체 패키지 및 제조 방법
KR100673379B1 (ko) 적층 패키지와 그 제조 방법
JP5567452B2 (ja) スタックチップ半導体装置の製造方法、スタックチップ半導体装置の実装方法、及びスタックチップ半導体装置
TWI442522B (zh) 凹穴晶片封裝結構及使用凹穴晶片封裝結構之層疊封裝結構
JP2008085032A (ja) 半導体装置
JP4083376B2 (ja) 半導体モジュール
JP2008171895A (ja) 半導体素子埋め込み支持基板の積層構造とその製造方法
KR20010073345A (ko) 적층 패키지
JPH10242379A (ja) 半導体モジュール
JP2002026240A (ja) 半導体装置及びその製造方法、並びに電子機器
JP2004087895A (ja) パッケージ部品およびその製造方法
JP2003037244A (ja) 半導体装置用テープキャリア及びそれを用いた半導体装置
JP2001291818A (ja) 半導体装置およびその製造方法
JP2004214285A (ja) 部品内蔵モジュール

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100915

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110701

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120208

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120215

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20120216

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120410

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121218

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20121231

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160125

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees