JP5112499B2 - 位相同期ループのジッタ検出装置 - Google Patents
位相同期ループのジッタ検出装置 Download PDFInfo
- Publication number
- JP5112499B2 JP5112499B2 JP2010256931A JP2010256931A JP5112499B2 JP 5112499 B2 JP5112499 B2 JP 5112499B2 JP 2010256931 A JP2010256931 A JP 2010256931A JP 2010256931 A JP2010256931 A JP 2010256931A JP 5112499 B2 JP5112499 B2 JP 5112499B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- output
- phase
- input
- jitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/095—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using a lock detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Description
12 比較器
14 電荷ポンプ部
16 ループフィルタ
18 電圧制御発振器
20 分周器
30 ジッタ検出部
32、38、50 ノアゲート
34、40、42、62、64、66 インバータ
36 可変位相遅延部
46 ロック検出部
48 ロジック回路
Claims (3)
- 基準クロックとフィードバッククロックとの位相差信号を検出し、その位相差信号によって一定の周波数の発振信号を生成する位相同期ループと、
前記位相差信号を入力遅延制御信号によって遅延させた後、前記位相差信号がロック範囲にあることを示すロック検出信号を出力し、前記ロック検出信号がロック出力を維持するとき、前記入力遅延制御信号に設定される遅延量が前記位相同期ループのジッタ量として用いられるようにするジッタ検出部と
を備え、
前記ジッタ検出部は、
前記位相差信号をノア(NOR)演算して出力する第1ノアゲートと、
前記第1の上ゲートの出力を反転させて出力する第1インバータと、
前記入力遅延制御信号によって複数のキャパシタをスイッチングし、前記第1インバータの出力を前記入力遅延制御信号によって遅延させる可変位相遅延部と、
前記第1ノアゲートの出力と前記可変位相遅延部の出力をノア演算することにより前記位相差信号の遅延期間を検出して前記遅延期間を示すイネーブル信号を生成し、そのイネーブル信号を第2インバータを通じて出力する第2ノアゲートと、
第3インバータを通じて入力される前記基準クロックと前記ロック検出信号をノア演算して出力する第3ノアゲートと、
前記第2インバータを通じて供給される前記イネーブル信号をリセット端子に入力し、前記第2ノアゲートの出力をクロック端子に入力し、自身の出力端子からロジック回路を通じてフィードバックされる出力を入力端子に入力し、前記イネーブル信号が示す遅延期間以後に前記ロック検出信号を、反転出力端子及び第4ノアゲートを通じて出力するD−フリップフロップと
を備える位相同期ループのジッタ検出装置。 - 前記可変位相遅延部は、
入出力ラインに直列に接続された複数のインバータバッファと、
前記複数のインバータバッファの連結ラインに並列に接続された複数のキャパシタと、
前記入力遅延制御信号の各ビットに応答して前記複数のキャパシタをそれぞれスイッチングする複数のスィッチと
を備えることを特徴とする、請求項1に記載の位相同期ループのジッタ検出装置。 - 前記ロック範囲は、前記位相差信号の遅延時間に従って決定される
ことを特徴とする、請求項1または2に記載の位相同期ループのジッタ検出装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2009-0135688 | 2009-12-31 | ||
KR1020090135688A KR101264729B1 (ko) | 2009-12-31 | 2009-12-31 | 위상 동기 루프의 지터 검출 방법 및 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011139436A JP2011139436A (ja) | 2011-07-14 |
JP5112499B2 true JP5112499B2 (ja) | 2013-01-09 |
Family
ID=44186747
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010256931A Expired - Fee Related JP5112499B2 (ja) | 2009-12-31 | 2010-11-17 | 位相同期ループのジッタ検出装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8179176B2 (ja) |
JP (1) | JP5112499B2 (ja) |
KR (1) | KR101264729B1 (ja) |
CN (1) | CN102118161B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009278528A (ja) * | 2008-05-16 | 2009-11-26 | Elpida Memory Inc | Dll回路、および半導体装置 |
WO2012101776A1 (ja) * | 2011-01-26 | 2012-08-02 | 富士通株式会社 | 半導体装置、及び情報処理装置 |
CN102445698B (zh) * | 2011-11-07 | 2013-06-05 | 东南大学 | 一种gps接收机卫星跟踪失锁的判定方法 |
US9207705B2 (en) | 2012-11-07 | 2015-12-08 | Apple Inc. | Selectable phase or cycle jitter detector |
TWI503807B (zh) * | 2013-09-04 | 2015-10-11 | Mstar Semiconductor Inc | 運用於影像顯示的時序控制器及其控制方法 |
US9337848B2 (en) | 2014-02-27 | 2016-05-10 | Industry-Academic Cooperation Foundation, Yonsei University | Clock and data recovery device |
CN108318809B (zh) * | 2017-01-16 | 2020-09-01 | 奇景光电股份有限公司 | 频率抖动的内建自我测试电路 |
CN109120258B (zh) * | 2018-08-03 | 2022-03-15 | 北京大学深圳研究生院 | 一种温度自补偿环形振荡器和一种时钟产生电路 |
US11133920B2 (en) | 2019-09-03 | 2021-09-28 | Samsung Electronics Co., Ltd. | Clock and data recovery circuit and a display apparatus having the same |
CN114910733B (zh) * | 2022-07-15 | 2022-09-30 | 深圳益实科技有限公司 | 一种基于人工智能的显示器故障智能诊断分析系统 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6424630A (en) * | 1987-07-21 | 1989-01-26 | Yokogawa Electric Corp | Pll circuit |
US5686864A (en) * | 1995-09-05 | 1997-11-11 | Motorola, Inc. | Method and apparatus for controlling a voltage controlled oscillator tuning range in a frequency synthesizer |
JPH1174783A (ja) * | 1997-06-18 | 1999-03-16 | Mitsubishi Electric Corp | 内部クロック信号発生回路、および同期型半導体記憶装置 |
JPH11120768A (ja) * | 1997-10-09 | 1999-04-30 | Toshiba Corp | 半導体集積回路 |
WO2001095492A1 (fr) * | 2000-06-05 | 2001-12-13 | Mitsubishi Denki Kabushiki Kaisha | Dispositif synchrone |
US6831523B1 (en) * | 2000-07-10 | 2004-12-14 | Silicon Laboratories Inc. | Auto-detection between referenceless and reference clock mode of operation |
JP2003258632A (ja) * | 2002-03-01 | 2003-09-12 | Fujitsu Ltd | ロック検出回路 |
KR100630342B1 (ko) * | 2004-07-27 | 2006-09-29 | 삼성전자주식회사 | 락 검출기능을 구비한 위상동기루프 회로 및 위상동기루프회로의 락 검출방법 |
US7742554B2 (en) * | 2006-07-10 | 2010-06-22 | Mediatek Inc. | PLL device with leakage current compensation unit |
US8736323B2 (en) * | 2007-01-11 | 2014-05-27 | International Business Machines Corporation | Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops |
US8076979B2 (en) * | 2008-04-04 | 2011-12-13 | Freescale Semiconductor, Inc. | Lock detection circuit for phase locked loop |
KR101020513B1 (ko) * | 2008-09-04 | 2011-03-09 | 한국전자통신연구원 | 락 검출 회로 및 락 검출 방법 |
KR101231743B1 (ko) * | 2009-04-24 | 2013-02-08 | 한국전자통신연구원 | 디지털 락 검출장치 및 이를 포함하는 주파수 합성기 |
KR101631164B1 (ko) * | 2010-03-18 | 2016-06-16 | 삼성전자주식회사 | 위상 동기 루프 회로, 락 검출 방법 및 이를 포함한 시스템 |
US8222933B2 (en) * | 2010-05-07 | 2012-07-17 | Texas Instruments Incorporated | Low power digital phase lock loop circuit |
-
2009
- 2009-12-31 KR KR1020090135688A patent/KR101264729B1/ko active IP Right Grant
-
2010
- 2010-08-10 US US12/853,704 patent/US8179176B2/en not_active Expired - Fee Related
- 2010-09-28 CN CN201010502816.6A patent/CN102118161B/zh not_active Expired - Fee Related
- 2010-11-17 JP JP2010256931A patent/JP5112499B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR101264729B1 (ko) | 2013-05-15 |
KR20110078790A (ko) | 2011-07-07 |
JP2011139436A (ja) | 2011-07-14 |
US20110156780A1 (en) | 2011-06-30 |
US8179176B2 (en) | 2012-05-15 |
CN102118161B (zh) | 2016-09-28 |
CN102118161A (zh) | 2011-07-06 |
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