JP5105041B2 - 絶縁膜形成用組成物およびその製造方法、ならびにシリカ系絶縁膜およびその形成方法 - Google Patents
絶縁膜形成用組成物およびその製造方法、ならびにシリカ系絶縁膜およびその形成方法 Download PDFInfo
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- JP5105041B2 JP5105041B2 JP2005517077A JP2005517077A JP5105041B2 JP 5105041 B2 JP5105041 B2 JP 5105041B2 JP 2005517077 A JP2005517077 A JP 2005517077A JP 2005517077 A JP2005517077 A JP 2005517077A JP 5105041 B2 JP5105041 B2 JP 5105041B2
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- insulating film
- allyl
- glycidyl
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- ASEHKQZNVUOPRW-UHFFFAOYSA-N tert-butyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C(C)(C)C ASEHKQZNVUOPRW-UHFFFAOYSA-N 0.000 description 1
- HXLWJGIPGJFBEZ-UHFFFAOYSA-N tert-butyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C(C)(C)C HXLWJGIPGJFBEZ-UHFFFAOYSA-N 0.000 description 1
- YBCWQJZHAOTDLY-UHFFFAOYSA-N tert-butyl(triphenoxy)silane Chemical compound C=1C=CC=CC=1O[Si](OC=1C=CC=CC=1)(C(C)(C)C)OC1=CC=CC=C1 YBCWQJZHAOTDLY-UHFFFAOYSA-N 0.000 description 1
- HVEXJEOBOQONBC-UHFFFAOYSA-N tert-butyl-tri(propan-2-yloxy)silane Chemical compound CC(C)O[Si](OC(C)C)(OC(C)C)C(C)(C)C HVEXJEOBOQONBC-UHFFFAOYSA-N 0.000 description 1
- ULXGRUZMLVGCGL-UHFFFAOYSA-N tert-butyl-tris[(2-methylpropan-2-yl)oxy]silane Chemical compound CC(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)C(C)(C)C ULXGRUZMLVGCGL-UHFFFAOYSA-N 0.000 description 1
- BIMIJXSZMVGEJR-UHFFFAOYSA-M tetra(nonyl)azanium;hydroxide Chemical compound [OH-].CCCCCCCCC[N+](CCCCCCCCC)(CCCCCCCCC)CCCCCCCCC BIMIJXSZMVGEJR-UHFFFAOYSA-M 0.000 description 1
- DVDPRLCDQQNFKT-UHFFFAOYSA-M tetra(undecyl)azanium;hydroxide Chemical compound [OH-].CCCCCCCCCCC[N+](CCCCCCCCCCC)(CCCCCCCCCCC)CCCCCCCCCCC DVDPRLCDQQNFKT-UHFFFAOYSA-M 0.000 description 1
- OQTSOKXAWXRIAC-UHFFFAOYSA-N tetrabutan-2-yl silicate Chemical compound CCC(C)O[Si](OC(C)CC)(OC(C)CC)OC(C)CC OQTSOKXAWXRIAC-UHFFFAOYSA-N 0.000 description 1
- UQMOLLPKNHFRAC-UHFFFAOYSA-N tetrabutyl silicate Chemical compound CCCCO[Si](OCCCC)(OCCCC)OCCCC UQMOLLPKNHFRAC-UHFFFAOYSA-N 0.000 description 1
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 1
- NHGXDBSUJJNIRV-UHFFFAOYSA-M tetrabutylammonium chloride Chemical compound [Cl-].CCCC[N+](CCCC)(CCCC)CCCC NHGXDBSUJJNIRV-UHFFFAOYSA-M 0.000 description 1
- BRGJIIMZXMWMCC-UHFFFAOYSA-N tetradecan-2-ol Chemical compound CCCCCCCCCCCCC(C)O BRGJIIMZXMWMCC-UHFFFAOYSA-N 0.000 description 1
- WRNABFFKQDPPOM-UHFFFAOYSA-M tetradodecylazanium;hydroxide Chemical compound [OH-].CCCCCCCCCCCC[N+](CCCCCCCCCCCC)(CCCCCCCCCCCC)CCCCCCCCCCCC WRNABFFKQDPPOM-UHFFFAOYSA-M 0.000 description 1
- HWCKGOZZJDHMNC-UHFFFAOYSA-M tetraethylammonium bromide Chemical compound [Br-].CC[N+](CC)(CC)CC HWCKGOZZJDHMNC-UHFFFAOYSA-M 0.000 description 1
- YMBCJWGVCUEGHA-UHFFFAOYSA-M tetraethylammonium chloride Chemical compound [Cl-].CC[N+](CC)(CC)CC YMBCJWGVCUEGHA-UHFFFAOYSA-M 0.000 description 1
- FNSGKPBAZVBJRX-UHFFFAOYSA-M tetraheptylazanium;hydroxide Chemical compound [OH-].CCCCCCC[N+](CCCCCCC)(CCCCCCC)CCCCCCC FNSGKPBAZVBJRX-UHFFFAOYSA-M 0.000 description 1
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- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 1
- DCFYRBLFVWYBIJ-UHFFFAOYSA-M tetraoctylazanium;hydroxide Chemical compound [OH-].CCCCCCCC[N+](CCCCCCCC)(CCCCCCCC)CCCCCCCC DCFYRBLFVWYBIJ-UHFFFAOYSA-M 0.000 description 1
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- YBNXDKRALACDIA-UHFFFAOYSA-N tributoxy-(4-tributoxysilylphenyl)silane Chemical compound CCCCO[Si](OCCCC)(OCCCC)C1=CC=C([Si](OCCCC)(OCCCC)OCCCC)C=C1 YBNXDKRALACDIA-UHFFFAOYSA-N 0.000 description 1
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- 125000002827 triflate group Chemical group FC(S(=O)(=O)O*)(F)F 0.000 description 1
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- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 1
- FZGRTEYZSVFFSE-UHFFFAOYSA-L trimethyl(octadecyl)azanium dibromide Chemical compound [Br-].C(CCCCCCCCCCCCCCCCC)[N+](C)(C)C.[Br-].C(CCCCCCCCCCCCCCCCC)[N+](C)(C)C FZGRTEYZSVFFSE-UHFFFAOYSA-L 0.000 description 1
- FLXZVVQJJIGXRS-UHFFFAOYSA-M trimethyl(octadecyl)azanium;hydroxide Chemical compound [OH-].CCCCCCCCCCCCCCCCCC[N+](C)(C)C FLXZVVQJJIGXRS-UHFFFAOYSA-M 0.000 description 1
- IXJNGXCZSCHDFE-UHFFFAOYSA-N triphenoxy(phenyl)silane Chemical compound C=1C=CC=CC=1O[Si](C=1C=CC=CC=1)(OC=1C=CC=CC=1)OC1=CC=CC=C1 IXJNGXCZSCHDFE-UHFFFAOYSA-N 0.000 description 1
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- AMUIJRKZTXWCEA-UHFFFAOYSA-N triphenoxy(propyl)silane Chemical compound C=1C=CC=CC=1O[Si](OC=1C=CC=CC=1)(CCC)OC1=CC=CC=C1 AMUIJRKZTXWCEA-UHFFFAOYSA-N 0.000 description 1
- MUCRQDBOUNQJFE-UHFFFAOYSA-N triphenoxy(triphenoxysilyl)silane Chemical compound C=1C=CC=CC=1O[Si]([Si](OC=1C=CC=CC=1)(OC=1C=CC=CC=1)OC=1C=CC=CC=1)(OC=1C=CC=CC=1)OC1=CC=CC=C1 MUCRQDBOUNQJFE-UHFFFAOYSA-N 0.000 description 1
- QDOHRQCMIFOPEY-UHFFFAOYSA-N tripropoxy(2-tripropoxysilylethyl)silane Chemical compound CCCO[Si](OCCC)(OCCC)CC[Si](OCCC)(OCCC)OCCC QDOHRQCMIFOPEY-UHFFFAOYSA-N 0.000 description 1
- VUWVDNLZJXLQPT-UHFFFAOYSA-N tripropoxy(propyl)silane Chemical compound CCCO[Si](CCC)(OCCC)OCCC VUWVDNLZJXLQPT-UHFFFAOYSA-N 0.000 description 1
- BZIXIRYKSIMLOB-UHFFFAOYSA-N tripropoxy(tripropoxysilylmethyl)silane Chemical compound CCCO[Si](OCCC)(OCCC)C[Si](OCCC)(OCCC)OCCC BZIXIRYKSIMLOB-UHFFFAOYSA-N 0.000 description 1
- YMAKWPVRMIUZBP-UHFFFAOYSA-N tripropoxy-(3-tripropoxysilylphenyl)silane Chemical compound CCCO[Si](OCCC)(OCCC)C1=CC=CC([Si](OCCC)(OCCC)OCCC)=C1 YMAKWPVRMIUZBP-UHFFFAOYSA-N 0.000 description 1
- FOUOZDXPXSKVEL-UHFFFAOYSA-N tripropoxy-(4-tripropoxysilylphenyl)silane Chemical compound CCCO[Si](OCCC)(OCCC)C1=CC=C([Si](OCCC)(OCCC)OCCC)C=C1 FOUOZDXPXSKVEL-UHFFFAOYSA-N 0.000 description 1
- OZWKZRFXJPGDFM-UHFFFAOYSA-N tripropoxysilane Chemical compound CCCO[SiH](OCCC)OCCC OZWKZRFXJPGDFM-UHFFFAOYSA-N 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- GBGOZMPAPWGNGR-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-[2-[tris[(2-methylpropan-2-yl)oxy]silyl]ethyl]silane Chemical compound CC(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)CC[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C GBGOZMPAPWGNGR-UHFFFAOYSA-N 0.000 description 1
- ZZEMYLNHCSTIPH-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-[2-[tris[(2-methylpropan-2-yl)oxy]silyl]phenyl]silane Chemical compound CC(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)C1=CC=CC=C1[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C ZZEMYLNHCSTIPH-UHFFFAOYSA-N 0.000 description 1
- NNKMRNUOGTXRCM-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-[3-[tris[(2-methylpropan-2-yl)oxy]silyl]phenyl]silane Chemical compound CC(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)C1=CC=CC([Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)=C1 NNKMRNUOGTXRCM-UHFFFAOYSA-N 0.000 description 1
- PITXUFPLSLHXRV-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-[4-[tris[(2-methylpropan-2-yl)oxy]silyl]phenyl]silane Chemical compound CC(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)C1=CC=C([Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)C=C1 PITXUFPLSLHXRV-UHFFFAOYSA-N 0.000 description 1
- KGOOITCIBGXHJO-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-phenylsilane Chemical compound CC(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)C1=CC=CC=C1 KGOOITCIBGXHJO-UHFFFAOYSA-N 0.000 description 1
- MJIHPVLPZKWFBL-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-propan-2-ylsilane Chemical compound CC(C)(C)O[Si](C(C)C)(OC(C)(C)C)OC(C)(C)C MJIHPVLPZKWFBL-UHFFFAOYSA-N 0.000 description 1
- DIZPPYBTFPZSGK-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]-propylsilane Chemical compound CCC[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C DIZPPYBTFPZSGK-UHFFFAOYSA-N 0.000 description 1
- QCKKBOHAYRLMQP-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]silane Chemical compound CC(C)(C)O[SiH](OC(C)(C)C)OC(C)(C)C QCKKBOHAYRLMQP-UHFFFAOYSA-N 0.000 description 1
- XMUJIPOFTAHSOK-UHFFFAOYSA-N undecan-2-ol Chemical compound CCCCCCCCCC(C)O XMUJIPOFTAHSOK-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/48—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule in which at least two but not all the silicon atoms are connected by linkages other than oxygen atoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/20—Manufacture of shaped structures of ion-exchange resins
- C08J5/22—Films, membranes or diaphragms
-
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Description
(B)ポリカルボシラン(本出願において単に、「(B)成分」ともいう)および(C)塩基性触媒の存在下、(A)加水分解性基含有シランモノマー(本出願において単に、「(A)成分」ともいう)を加水分解縮合して得られた加水分解縮合物と、有機溶媒と、を含む。
RaSi(OR1)4−a ・・・・・(1)
(式中、Rは水素原子、フッ素原子または1価の有機基を示し、R1は1価の有機基を示し、aは1〜2の整数を示す。)
Si(OR2)4 ・・・・・(2)
(式中、R2は1価の有機基を示す。)
R3 b(R4O)3−bSi−(R7)d−Si(OR5)3−cR6 c ・・・(3)
(式中、R3〜R6は同一または異なり、それぞれ1価の有機基を示し、bおよびcは同一または異なり、0〜2の数を示し、R7は酸素原子、フェニレン基または−(CH2)m−で表される基(ここで、mは1〜6の整数である)を示し、dは0または1を示す。)
(式中、X1,X2,X3,X4は同一または異なり、それぞれ水素原子、炭素数1〜20のアルキル基、ヒドロキシアルキル基、アリール基およびアリールアルキル基からなる群より選ばれる基を示し、Yはハロゲン原子または1〜4価のアニオン性基を示し、aは1〜4の整数を示す。)
(B)ポリカルボシランおよび(C)塩基性触媒の存在下、(A)加水分解性基含有シランモノマーを加水分解縮合する工程を含むことができる。
RaSi(OR1)4−a ・・・・・(1)
(式中、Rは水素原子、フッ素原子または1価の有機基を示し、R1は1価の有機基を示し、aは1〜2の整数を示す。)
Si(OR2)4 ・・・・・(2)
(式中、R2は1価の有機基を示す。)
R3 b(R4O)3−bSi−(R7)d−Si(OR5)3−cR6 c ・・・(3)
(式中、R3〜R6は同一または異なり、それぞれ1価の有機基を示し、bおよびcは同一または異なり、0〜2の数を示し、R7は酸素原子、フェニレン基または−(CH2)m−で表される基(ここで、mは1〜6の整数である)を示し、dは0または1を示す。)
(式中、X1,X2,X3,X4は同一または異なり、それぞれ水素原子、炭素数1〜20のアルキル基、ヒドロキシアルキル基、アリール基およびアリールアルキル基からなる群より選ばれる基を示し、Yはハロゲン原子または1〜4価のアニオン性基を示し、aは1〜4の整数を示す。)
上記本発明の絶縁膜形成用組成物を基板に塗布し、塗膜を形成する工程と、
前記塗膜について、加熱、電子線照射、紫外線照射、および酸素プラズマから選ばれる少なくとも1種の硬化処理を行なう工程と、を含む。
本発明に係る膜形成用組成物(絶縁膜形成用組成物)は、(A)成分を、(B)成分および(C)塩基性触媒の存在下で加水分解し、縮合した加水分解縮合物(以下、「特定加水分解縮合物」という)と、有機溶媒とを含む。以下、各成分について説明する。
(A)成分は、下記一般式(1)で表される化合物(以下、「化合物1」という)、下記一般式(2)で表される化合物(以下、「化合物2」という)および下記一般式(3)で表される化合物(以下、「化合物3」という)の群から選ばれた少なくとも1種のシラン化合物である。
RaSi(OR1)4−a ・・・・・(1)
(式中、Rは水素原子、フッ素原子または1価の有機基を示し、R1は1価の有機基を示し、aは1〜2の整数を示す。)
Si(OR2)4 ・・・・・(2)
(式中、R2は1価の有機基を示す。)
R3 b(R4O)3−bSi−(R7)d−Si(OR5)3−cR6 c・・・(3)
(式中、R3〜R6は同一または異なり、それぞれ1価の有機基を示し、bおよびcは同一または異なり、0〜2の数を示し、R7は酸素原子、フェニレン基または−(CH2)m−で表される基(ここで、mは1〜6の整数である)を示し、dは0または1を示す。)
前記一般式(1)において、R,R1で表される1価の有機基としては、アルキル基、アリール基、アリル基、グリシジル基、ビニル基などを挙げることができる。なかでも、一般式(1)において、Rの1価の有機基は、特にアルキル基またはフェニル基であることが好ましい。ここで、アルキル基としては、メチル基、エチル基、プロピル基、ブチル基などが挙げられ、好ましくは炭素数1〜5であり、これらのアルキル基は鎖状でも、分岐していてもよく、さらに水素原子がフッ素原子、アミノ基などに置換されていてもよい。前記一般式(1)において、アリール基としては、フェニル基、ナフチル基、メチルフェニル基、エチルフェニル基、クロロフェニル基、ブロモフェニル基、フルオロフェニル基などを挙げることができる。
一般式(2)において、R2の1価の有機基としては、前記一般式(1)においてR,R1として例示した1価の有機基と同様の基を挙げることができる。
一般式(3)において、R3〜R6の1価の有機基としては、前記一般式(1)においてR,R1として例示した1価の有機基と同様の基を挙げることができる。
次に(B)成分について説明する。本発明において、(B)成分とは、前記(A)成分と縮合し、Si−O−Si結合を形成できるポリカルボシランである。(B)成分は、例えば、下記一般式(4)で表されるポリカルボシラン化合物(以下、「化合物4」ということもある)であることができる。なお、以下の説明において、(B)成分というとき、前記ポリカルボシラン化合物が有機溶媒に溶解している場合も含まれるものとする。
本発明の膜形成用組成物に含まれる加水分解縮合物を製造する際、(C)塩基性触媒を使用することにより、得られる加水分解縮合物の分子構造に存在する分子鎖の分岐度を高くすることができ、かつ、その分子量をより大きくすることができる。これにより、上述した構造を有する加水分解縮合物を得ることができる。
前記一般式(5)において、X1,X2,X3,X4は同一または異なり、それぞれ水素原子、炭素数1〜20のアルキル基(好ましくはメチル基、エチル基、プロピル基、ブチル基、ヘキシル基など)、ヒドロキシアルキル基(好ましくはヒドロキシエチル基など)、アリール基(好ましくはフェニル基など)、アリールアルキル基(好ましくはフェニルメチル基など)を示し、Yはハロゲン原子(好ましくはフッ素原子、塩素原子、臭素原子、ヨウ素原子など)、1〜4価のアニオン性基(好ましくはヒドロキシ基など)を示し、aは1〜4の整数を示す。
特定加水分解縮合物は、上記(B)成分および(C)塩基性触媒の存在下に、上記(A)成分を加水分解縮合することにより得られる。
本発明の絶縁膜形成用組成物に含まれる有機溶媒としては、アルコール系溶媒、ケトン系溶媒、アミド系溶媒、エーテル系溶媒、エステル系溶媒、脂肪族炭化水素系溶媒、芳香族系溶媒および含ハロゲン溶媒の群から選ばれた少なくとも1種が挙げられる。
エチレングリコール、1,2−プロピレングリコール、1,3−ブチレングリコール、2,4−ペンタンジオール、2−メチル−2,4−ペンタンジオール、2,5−ヘキサンジオール、2,4−ヘプタンジオール、2−エチル−1,3−ヘキサンジオール、ジエチレングリコール、ジプロピレングリコール、トリエチレングリコール、トリプロピレングリコールなどの多価アルコール系溶媒;
エチレングリコールモノメチルエーテル、エチレングリコールモノエチルエーテル、エチレングリコールモノプロピルエーテル、エチレングリコールモノブチルエーテル、エチレングリコールモノヘキシルエーテル、エチレングリコールモノフェニルエーテル、エチレングリコールモノ−2−エチルブチルエーテル、ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールモノプロピルエーテル、ジエチレングリコールモノブチルエーテル、ジエチレングリコールモノヘキシルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノエチルエーテル、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル、ジプロピレングリコールモノメチルエーテル、ジプロピレングリコールモノエチルエーテル、ジプロピレングリコールモノプロピルエーテルなどの多価アルコール部分エーテル系溶媒;などを挙げることができる。これらのアルコール系溶媒は、1種あるいは2種以上を同時に使用してもよい。
本発明の絶縁膜形成用組成物には、さらに有機ポリマーや界面活性剤などの成分を添加してもよい。また、これらの添加物は、(A)成分および(B)成分を混合する前の各成分が溶解もしくは分散された溶剤中に添加されていてもよい。
有機ポリマーとしては、例えば、糖鎖構造を有する重合体、ビニルアミド系重合体、(メタ)アクリル系重合体、芳香族ビニル化合物系重合体、デンドリマー、ポリイミド,ポリアミック酸、ポリアリーレン、ポリアミド、ポリキノキサリン、ポリオキサジアゾール、フッ素系重合体、ポリアルキレンオキサイド構造を有する重合体などを挙げることができる。
−(X′)l−(Y′)m−(X′)n−
(式中、X′は−CH2CH2O−で表される基を、Y′は−CH2CH(CH3)O−で表される基を示し、lは1〜90、mは10〜99、nは0〜90の数を示す。)
これらの中で、ポリオキシエチレンアルキルエーテル、ポリオキシエチレンポリオキシプロピレンブロックコポリマー、ポリオキシエチレンポリオキシプロピレンアルキルエーテル、ポリオキシエチレングリセリン脂肪酸エステル、ポリオキシエチレンソルビタン脂肪酸エステル、ポリオキシエチレンソルビトール脂肪酸エステル、などのエーテル型化合物をより好ましい例として挙げることができる。前述の有機ポリマーは、1種あるいは2種以上を同時に使用しても良い。
界面活性剤としては、たとえば、ノニオン系界面活性剤、アニオン系界面活性剤、カチオン系界面活性剤、両性界面活性剤などが挙げられ、さらには、フッ素系界面活性剤、シリコーン系界面活性剤、ポリアルキレンオキシド系界面活性剤、ポリ(メタ)アクリレート系界面活性剤などを挙げることができ、好ましくはフッ素系界面活性剤、シリコーン系界面活性剤を挙げることができる。
本発明の膜(絶縁膜)の形成方法は、膜形成用組成物を基材に塗布し、塗膜を形成する工程と、前記塗膜に加熱処理を行なう工程と、を含む。
本発明のシリカ系膜は、低誘電率であり、かつ表面平坦性に優れるため、LSI、システムLSI、DRAM、SDRAM、RDRAM、D−RDRAMなどの半導体素子用層間絶縁膜として特に優れており、かつ、エッチングストッパー膜、半導体素子の表面コート膜などの保護膜、多層レジストを用いた半導体作製工程の中間層、多層配線基板の層間絶縁膜、液晶表示素子用の保護膜や絶縁膜などに好適に用いることができる。
以下、本発明を、実施例を挙げてさらに具体的に説明する。本発明は以下の実施例に限定されるものではない。なお、実施例および比較例中の「部」および「%」は、特記しない限り、それぞれ重量部および重量%であることを示している。
各種の評価は、次のようにして行った。
8インチシリコンウエハ上に、スピンコート法を用いて膜形成用組成物を塗布し、ホットプレート上にて90℃で3分間、次いで窒素雰囲気下200℃で3分間乾燥し、さらに50mTorrの減圧下(真空雰囲気)420℃の縦型ファーネスで1時間焼成した。得られた膜に、蒸着法によりアルミニウム電極パターンを形成し、比誘電率測定用サンプルを作成した。該サンプルについて、周波数100kHzの周波数で、横河・ヒューレットパッカード(株)製、HP16451B電極およびHP4284AプレシジョンLCRメータを用いてCV法により当該膜の比誘電率を測定した。
MTS社製超微少硬度計(Nanoindentator XP)にバーコビッチ型圧子を取り付け、得られた絶縁膜のユニバーサル硬度を求めた。また、弾性率は連続剛性測定法により測定した。
40℃で30日保存した膜形成用組成物を、スピンコート法を用いて基材に塗布し、ホットプレート上にて90℃で3分間、次いで窒素雰囲気下200℃で3分間基板を乾燥し、さらに50mTorrの減圧下にて420℃の縦型ファーネスで1時間焼成した。このようにして得られた塗膜の膜厚を、光学式膜厚計(Rudolph Technologies社製、Spectra Laser200)を用いて塗膜面内で50点測定した。得られた膜の膜厚を測定し、下式により求めた膜厚増加率により、保存安定性を評価した。
A:膜厚増加率が4%以下である。
B:膜厚増加率が4%を超える。
シリカ系膜が形成された8インチウエハを、室温で0.2%の希フッ酸水溶液中に1分間浸漬し、浸漬前後のシリカ系膜の膜厚変化を観察した。下記に定義する残膜率が99%以上であれば、薬液耐性が良好であると判断する。
A:残膜率が99%以上である。
B:残膜率が99%未満である。
絶縁膜の断面を、集束イオンビーム法で観察用に加工し、TEMを用いて18000倍にて外観を調べた。判断結果を以下のようにして示す。
B:塗膜に海島状のドメイン相分離が確認される。
4.2.1.実施例1
コンデンサーを備えた石英製フラスコ中に、40%メチルアミン水溶液2.71g、超純水187.36g、およびエタノール425.22gを秤取り、60℃で攪拌した。次いで、メチルトリメトキシシラン48.77g、テトラエトキシシラン31.96g、および下記構造式(6)を有するポリカルボシラン(Mw=800)3.98gを加えた後、60℃で6時間攪拌し、ポリスチレン換算重量平均分子量45,000の加水分解縮合物を含む反応液を得た。反応液を室温に冷却後、プロピレングリコールモノプロピルエーテル612.58gおよび20%酢酸水溶液31.49gを加えた。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物1を得た。
コンデンサーを備えた石英製フラスコ中に、20%水酸化テトラプロピルアンモニウム水溶液14.68g、超純水161.71g、およびイソプロパノール474.70gを秤取り、60℃で攪拌した。次いで、メチルトリメトキシシラン27.86g、テトラプロポキシシラン13.52g、および下記構造式(7)を有するポリカルボシラン(Mw=840)7.53gを加えた後、60℃で4時間攪拌し、ポリスチレン換算重量平均分子量55,000の加水分解縮合物を含む反応液を得た。反応液を室温に冷却後、プロピレングリコールモノプロピルエーテル636.41gおよび20%酢酸水溶液13.01gを加えた。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物2を得た。
コンデンサーを備えた石英製フラスコ中に、25%水酸化テトラメチルアンモニウム水溶液6.77g、超純水162.26g、およびエタノール488.58gを秤取り、60℃で攪拌した。次いで、ジメチルジメトキシシラン6.08g、メチルトリメトキシシラン17.23g、テトラメトキシシラン11.55g、および下記構造式(8)を有するポリカルボシラン(Mw=840)7.53gを連続的に1時間かけて加えた後、さらに60℃で2時間攪拌し、ポリスチレン換算重量平均分子量40,000の加水分解縮合物を含む反応液を得た。反応液を室温に冷却後、プロピレングリコールモノプロピルエーテル650.84gおよび20%酢酸水溶液12.83gを加えた。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物3を得た。
コンデンサーを備えた石英製フラスコ中に、20%水酸化テトラプロピルアンモニウム水溶液21.80g、超純水175.77g、およびイソプロパノール448.39gを秤取り、80℃で攪拌した。次いで、メチルトリメトキシシラン20.24g、テトラエトキシシラン30.95g、および下記構造式(9)を有するポリカルボシラン(Mw=1200)2.84gを加えた後、80℃で8時間攪拌し、ポリスチレン換算重量平均分子量48,000の加水分解縮合物を含む反応液を得た。反応液を室温に冷却後、プロピレングリコールモノプロピルエーテル624.16gおよび20%酢酸水溶液19.32gを加えた。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物4を得た。
コンデンサーを備えた石英製フラスコ中に、25%水酸化テトラメチルアンモニウム水溶液12.03g、超純水14.76g、およびメチルイソブチルケトン635.58gを秤取り、40℃で攪拌した。次いで、メチルトリエトキシシラン24.19g、テトラエトキシシラン12.11g、および下記構造式(10)を有するポリカルボシラン(Mw=1000)1.32gを連続的に1時間かけて加えた後、さらに80℃で1時間攪拌し、ポリスチレン換算重量平均分子量37,000の加水分解縮合物を含む反応液を得た。反応液を室温に冷却後、プロピレングリコールモノプロピルエーテル1300.68gおよび20%酢酸水溶液29.73gを加えた。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物5を得た。
温度計、冷却コンデンサー、滴下ロートおよび攪拌装置を取り付けた内容量が4Lの4つ口フラスコ内をアルゴンガスで置換した後、乾燥したテトラヒドロフラン1.5Lおよび金属マグネシウム71gを仕込み、アルゴンガスでバブリングした。これに、0℃で攪拌しながら、クロロメチルトリエトキシシラン500gを滴下ロートからゆっくり添加した。
コンデンサーを備えた石英製フラスコ中で、メチルトリエトキシシラン58.87g、テトラメトキシシラン50.26g、および下記構造式(11)を有するポリカルボシラン(Mw=1000)26.42gを、イソプロパノール232.99gおよびメチルイソブチルケトン232.99gの混合溶媒に溶解させた後、スリーワンモーターで攪拌して溶液の温度を55℃に安定させた。次に、シュウ酸0.41gを溶解させたイオン交換水98.06gを1時間かけて溶液に添加した。その後、55℃で3時間反応させ、ポリスチレン換算重量平均分子量2000の加水分解縮合物を含む反応液を得た後、プロピレングリコールモノエチルエーテル931.96gを加え、反応液を室温まで冷却した。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物7を得た。
コンデンサーを備えた石英製フラスコ中で、メチルトリメトキシシラン123.21g、テトラメトキシシラン59.01g、および下記構造式(12)を有するポリカルボシラン(Mw=840)100.39gを、プロピレングリコールモノエチルエーテル193.35gに溶解させた後、スリーワンモーターで攪拌して溶液の温度を55℃に安定させた。次に、シュウ酸0.93gを溶解させたイオン交換水223.12gを1時間かけて溶液に添加した。その後、55℃で1時間反応させ、ポリスチレン換算重量平均分子2300の加水分解縮合物を含む反応液を得た後、プロピレングリコールモノエチルエーテル825.50gを加え、反応液を室温まで冷却した。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物8を得た。
コンデンサーを備えた石英製フラスコ中で、メチルトリメトキシシラン92.40g、テトラメトキシシラン44.25g、および下記構造式(13)を有するポリカルボシラン(Mw=1200)56.85gを、プロピレングリコールモノエチルエーテル402.05gに溶解させた後、スリーワンモーターで攪拌して溶液の温度を55℃に安定させた。次に、シュウ酸0.58gを溶解させたイオン交換水103.85gを1時間かけて溶液に添加した。その後、55℃で1時間反応させ、ポリスチレン換算重量平均分子量2500の加水分解縮合物を含む反応液を得た後、プロピレングリコールモノエチルエーテル1007.25gを加え、反応液を室温まで冷却した。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物9を得た。
コンデンサーを備えた石英製フラスコ中で、メチルトリメトキシシラン139.30g、テトラメトキシシラン38.92g、および下記構造式(14)を有するポリカルボシラン(Mw=800)127.42gをプロピレングリコールモノエチルエーテル105.34gに溶解させた。次に、イオン交換水216.87gを溶液に加え、室温で1時間攪拌した。その後テトラキス(アセチルアセトナート)チタン0.141gをプロピレングリコールモノエチルエーテル37.01gに溶解したものを添加し、温度50℃で3時間反応させ、ポリスチレン換算重量平均分子量1200の加水分解縮合物を含む反応液を得た後、プロピレングリコールモノエチルエーテル718.44gを加え、反応液を室温まで冷却した。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物10を得た。
コンデンサーを備えた石英製フラスコ中で、ジメチルジメトキシシラン19.01g、メチルトリメトキシシラン53.84g、テトラメトキシシラン36.10g、および下記構造式(15)を有するポリカルボシラン(Mw=840)94.12gをプロピレングリコールモノエチルエーテル256.34gに溶解させた。次に、イオン交換水115.07gを溶液に加え、室温で1時間攪拌した。その後、テトラキス(アセチルアセトナート)チタン0.106gをプロピレングリコールモノエチルエーテル90.16gに溶解したものを添加し、温度50℃で6時間反応させ、ポリスチレン換算重量平均分子量1500の加水分解縮合物を含む反応液を得た後、プロピレングリコールモノエチルエーテル923.68gを加え、反応液を室温まで冷却した。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物11を得た。
コンデンサーを備えた石英製フラスコ中に、40%メチルアミン水溶液2.51g、超純水173.26g、およびエタノール444.43gを秤取り、60℃で攪拌した。次いで、メチルトリメトキシシラン42.83gおよびテトラエトキシシラン28.07gを加えた後、60℃で6時間攪拌し、ポリスチレン換算重量平均分子量60,000の加水分解縮合物を含む反応液を得た。反応液を室温に冷却後、プロピレングリコールモノプロピルエーテル617.69gおよび20%酢酸水溶液26.47gを加えた。この反応液を固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物12を得た。
比較例6で得られた固形分濃度10%の絶縁膜形成用組成物(組成物7)111.90gに、下記構造式(16)を有するポリカルボシラン(Mw=840)17.86gを加え、50℃で6時間攪拌した。その後、プロピレングリコールモノプロピルエーテル415.72gを加え、その後固形分濃度が10%となるまで減圧下で濃縮し、膜形成用組成物13を得た。
実施例1〜6および比較例1〜7で得られた膜形成用組成物1〜13を用いて、比誘電率、弾性率、硬度、薬液耐性、保存安定性および断面観察結果について評価を行った。評価結果を表1に示す。
Claims (7)
- (B)加水分解性基を有する重量平均分子量が400〜50000のポリカルボシランおよび(C)下記一般式(5)で表される含窒素化合物である塩基性触媒の存在下、(A)加水分解性基含有シランモノマーを加水分解縮合して得られた、重量平均分子量が1500〜500000である加水分解縮合物と、
有機溶媒と、を含み、
前記(A)成分を(A)成分の完全加水分解縮合物に換算した100重量部に対して、前記(B)成分が1〜1000重量部である、絶縁膜形成用組成物。
(X1X2X3X4N)aY ・・・・・(5)
(式中、X1,X2,X3,X4は同一または異なり、それぞれ水素原子、炭素数1〜20のアルキル基、ヒドロキシアルキル基、アリール基およびアリールアルキル基からなる群より選ばれる基を示し、Yはハロゲン原子またはヒドロキシ基を示し、aは1の整数を示す。) - 請求項1において、
前記(A)成分は、下記一般式(1)〜(3)で表される化合物の群から選ばれた少なくとも1種のシラン化合物であり、
前記(B)成分は、下記一般式(4)で表されるポリカルボシラン化合物である、絶縁膜形成用組成物。
RaSi(OR1)4−a ・・・・・(1)
(式中、Rは水素原子、フッ素原子、アルキル基、アリール基、アリル基、グリシジル基またはビニル基を示し、R1はアルキル基、アリール基、アリル基、グリシジル基またはビニル基を示し、aは1〜2の整数を示す。)
Si(OR2)4 ・・・・・(2)
(式中、R2はアルキル基、アリール基、アリル基、グリシジル基またはビニル基を示す。)
R3 b(R4O)3−bSi−(R7)d−Si(OR5)3−cR6 c ・・・(3)
(式中、R3〜R6は同一または異なり、それぞれアルキル基、アリール基、アリル基
、グリシジル基またはビニル基を示し、bおよびcは同一または異なり、0〜2の数を示し、R7は酸素原子、フェニレン基または−(CH2)m−で表される基(ここで、mは1〜6の整数である)を示し、dは0または1を示す。)
- (B)加水分解性基を有する重量平均分子量が400〜50000のポリカルボシランおよび(C)下記一般式(5)で表される含窒素化合物である塩基性触媒の存在下、(A)加水分解性基含有シランモノマーを加水分解縮合する工程を含み、
前記(A)成分を(A)成分の完全加水分解縮合物に換算した100重量部に対して、前記(B)成分が1〜1000重量部であり、
前記加水分解縮合により得られた加水分解縮合物の重量平均分子量が1500〜500000である、絶縁膜形成用組成物の製造方法。
(X1X2X3X4N)aY ・・・・・(5)
(式中、X1,X2,X3,X4は同一または異なり、それぞれ水素原子、炭素数1〜20のアルキル基、ヒドロキシアルキル基、アリール基およびアリールアルキル基からなる群より選ばれる基を示し、Yはハロゲン原子またはヒドロキシ基を示し、aは1の整数を示す。) - 請求項3において、
前記加水分解縮合により得られた加水分解縮合物を有機溶媒に溶解させる工程をさらに含む、絶縁膜形成用組成物の製造方法。 - 請求項3または請求項4において、
前記(A)成分は、下記一般式(1)〜(3)で表される化合物の群から選ばれた少なくとも1種のシラン化合物であり、
前記(B)成分は、下記一般式(4)で表されるポリカルボシラン化合物である、絶縁膜形成用組成物の製造方法。
RaSi(OR1)4−a ・・・・・(1)
(式中、Rは水素原子、フッ素原子、アルキル基、アリール基、アリル基、グリシジル基またはビニル基を示し、R1はアルキル基、アリール基、アリル基、グリシジル基またはビニル基を示し、aは1〜2の整数を示す。)
Si(OR2)4 ・・・・・(2)
(式中、R2はアルキル基、アリール基、アリル基、グリシジル基またはビニル基を示す。)
R3 b(R4O)3−bSi−(R7)d−Si(OR5)3−cR6 c ・・・(3)
(式中、R3〜R6は同一または異なり、それぞれアルキル基、アリール基、アリル基、グリシジル基またはビニル基を示し、bおよびcは同一または異なり、0〜2の数を示し、R7は酸素原子、フェニレン基または−(CH2)m−で表される基(ここで、mは1〜6の整数である)を示し、dは0または1を示す。)
- 請求項1または請求項2に記載の絶縁膜形成用組成物を基板に塗布し、塗膜を形成する工程と、
前記塗膜について、加熱、電子線照射、紫外線照射、および酸素プラズマから選ばれる少なくとも1種の硬化処理を行なう工程と、を含む、シリカ系絶縁膜の形成方法。 - 請求項6に記載のシリカ系絶縁膜の形成方法により得られる、シリカ系絶縁膜。
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KR20070010011A (ko) * | 2004-02-26 | 2007-01-19 | 제이에스알 가부시끼가이샤 | 중합체 및 그의 제조 방법, 절연막 형성용 조성물, 및절연막 및 그의 형성 방법 |
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KR20060123547A (ko) | 2006-12-01 |
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KR101185644B1 (ko) | 2012-09-24 |
WO2005068540A1 (ja) | 2005-07-28 |
TW200538491A (en) | 2005-12-01 |
EP1705208B1 (en) | 2013-03-20 |
EP1705208A4 (en) | 2012-03-28 |
US7875317B2 (en) | 2011-01-25 |
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