JP4943152B2 - エレクトロルミネセント・ディスプレイをテストする装置 - Google Patents

エレクトロルミネセント・ディスプレイをテストする装置 Download PDF

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Publication number
JP4943152B2
JP4943152B2 JP2006529510A JP2006529510A JP4943152B2 JP 4943152 B2 JP4943152 B2 JP 4943152B2 JP 2006529510 A JP2006529510 A JP 2006529510A JP 2006529510 A JP2006529510 A JP 2006529510A JP 4943152 B2 JP4943152 B2 JP 4943152B2
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Japan
Prior art keywords
electrode
subset
extensions
electrode extensions
row
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Expired - Fee Related
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JP2006529510A
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English (en)
Japanese (ja)
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JP2007507836A (ja
JP2007507836A5 (enExample
Inventor
寿 阿部
デレック・ルーク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
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Sanyo Electric Co Ltd
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Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Publication of JP2007507836A publication Critical patent/JP2007507836A/ja
Publication of JP2007507836A5 publication Critical patent/JP2007507836A5/ja
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/179—Interconnections, e.g. wiring lines or terminals
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2006529510A 2003-10-03 2004-09-21 エレクトロルミネセント・ディスプレイをテストする装置 Expired - Fee Related JP4943152B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US50860203P 2003-10-03 2003-10-03
US60/508,602 2003-10-03
PCT/CA2004/001716 WO2005034584A1 (en) 2003-10-03 2004-09-21 Electrode arrangement for testing electroluminescent display

Publications (3)

Publication Number Publication Date
JP2007507836A JP2007507836A (ja) 2007-03-29
JP2007507836A5 JP2007507836A5 (enExample) 2007-11-08
JP4943152B2 true JP4943152B2 (ja) 2012-05-30

Family

ID=34421763

Family Applications (1)

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JP2006529510A Expired - Fee Related JP4943152B2 (ja) 2003-10-03 2004-09-21 エレクトロルミネセント・ディスプレイをテストする装置

Country Status (7)

Country Link
US (1) US7497755B2 (enExample)
JP (1) JP4943152B2 (enExample)
KR (1) KR20070015110A (enExample)
CN (1) CN1891015A (enExample)
CA (1) CA2539589A1 (enExample)
TW (1) TW200518622A (enExample)
WO (1) WO2005034584A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011152361A1 (ja) 2010-06-04 2011-12-08 ショーワグローブ株式会社 編針案内構造、編針、編成方法、編み地、および手袋

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008541349A (ja) * 2005-05-04 2008-11-20 オーテーベー、グループ、ベスローテン、フェンノートシャップ Ｏｌｅｄを製造するための方法、ｏｌｅｄを製造するための中間生成物、およびｏｌｅｄ
WO2014162454A1 (ja) * 2013-04-01 2014-10-09 パイオニア株式会社 接合構造および発光装置
CN105355633B (zh) * 2015-10-26 2018-08-03 京东方科技集团股份有限公司 制作阵列基板的方法和阵列基板
WO2020039554A1 (ja) * 2018-08-23 2020-02-27 シャープ株式会社 アクティブマトリクス基板、表示装置及び母基板
CN208805652U (zh) * 2018-10-30 2019-04-30 惠科股份有限公司 一种引脚组件及显示面板

Citations (3)

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JP2000155302A (ja) * 1998-11-24 2000-06-06 Matsushita Electric Ind Co Ltd 液晶表示装置の検査方法およびその検査装置
JP2000200053A (ja) * 1999-01-07 2000-07-18 Futaba Corp 表示素子用基板の製造方法及び表示素子用基板
JP2003243173A (ja) * 2002-02-07 2003-08-29 Samsung Nec Mobile Display Co Ltd 有機電子発光素子及びその基板、並びに基板切断方法

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US3028442A (en) * 1959-10-01 1962-04-03 Owens Corning Fiberglass Corp Method and apparatus for melting and feeding heat-softenable materials
JPH0685341B2 (ja) * 1991-09-27 1994-10-26 帝国通信工業株式会社 フレキシブル基板の端子構造
US5432015A (en) * 1992-05-08 1995-07-11 Westaim Technologies, Inc. Electroluminescent laminate with thick film dielectric
JP3213472B2 (ja) * 1994-04-26 2001-10-02 シャープ株式会社 アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置
JP3031527B2 (ja) * 1995-06-19 2000-04-10 カシオ計算機株式会社 液晶表示装置
KR0182184B1 (en) 1996-04-24 1999-04-15 Samsung Electronics Co Ltd Disconnection/short test apparatus and its method of signal line using metrix
US6111424A (en) * 1997-09-04 2000-08-29 Lucent Technologies Inc. Testing method and apparatus for flat panel displays using infrared imaging
US6407502B2 (en) * 1997-09-16 2002-06-18 Lite Array, Inc. EL display with electrodes normal to the surface
US6771019B1 (en) 1999-05-14 2004-08-03 Ifire Technology, Inc. Electroluminescent laminate with patterned phosphor structure and thick film dielectric with improved dielectric properties
TW589455B (en) * 2000-11-24 2004-06-01 Hannstar Display Corp Testing method for LCD panel
KR100353955B1 (ko) * 2000-12-20 2002-09-28 엘지.필립스 엘시디 주식회사 신호라인 검사를 위한 액정표시장치
KR100800330B1 (ko) * 2001-12-20 2008-02-01 엘지.필립스 엘시디 주식회사 라인 온 글래스형 신호라인 검사를 위한 액정표시패널
EP1455985A1 (en) 2001-12-21 2004-09-15 iFire Technology Inc. Method of laser ablation for patterning thin film layers for electroluminescent displays
WO2003056879A1 (en) 2001-12-21 2003-07-10 Ifire Technology Inc. Low firing temperature thick film dielectric layer for electroluminescent display
JP2006505764A (ja) * 2002-01-23 2006-02-16 マレナ システムズ コーポレーション 欠陥検出及び解析用赤外線サーモグラフィ
CN100401518C (zh) * 2002-09-20 2008-07-09 皇家飞利浦电子股份有限公司 一种电子器件以及制造电子器件的方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000155302A (ja) * 1998-11-24 2000-06-06 Matsushita Electric Ind Co Ltd 液晶表示装置の検査方法およびその検査装置
JP2000200053A (ja) * 1999-01-07 2000-07-18 Futaba Corp 表示素子用基板の製造方法及び表示素子用基板
JP2003243173A (ja) * 2002-02-07 2003-08-29 Samsung Nec Mobile Display Co Ltd 有機電子発光素子及びその基板、並びに基板切断方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011152361A1 (ja) 2010-06-04 2011-12-08 ショーワグローブ株式会社 編針案内構造、編針、編成方法、編み地、および手袋

Also Published As

Publication number Publication date
WO2005034584A1 (en) 2005-04-14
WO2005034584B1 (en) 2005-06-02
CN1891015A (zh) 2007-01-03
KR20070015110A (ko) 2007-02-01
US20050073250A1 (en) 2005-04-07
CA2539589A1 (en) 2005-04-14
US7497755B2 (en) 2009-03-03
WO2005034584A9 (en) 2005-10-27
TW200518622A (en) 2005-06-01
JP2007507836A (ja) 2007-03-29

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