CN1891015A - 用于测试电致发光显示器的设备 - Google Patents
用于测试电致发光显示器的设备 Download PDFInfo
- Publication number
- CN1891015A CN1891015A CNA2004800287951A CN200480028795A CN1891015A CN 1891015 A CN1891015 A CN 1891015A CN A2004800287951 A CNA2004800287951 A CN A2004800287951A CN 200480028795 A CN200480028795 A CN 200480028795A CN 1891015 A CN1891015 A CN 1891015A
- Authority
- CN
- China
- Prior art keywords
- electrode
- substrate
- subclass
- eld
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/17—Passive-matrix OLED displays
- H10K59/179—Interconnections, e.g. wiring lines or terminals
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0421—Structural details of the set of electrodes
- G09G2300/0426—Layout of electrodes and connections
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US50860203P | 2003-10-03 | 2003-10-03 | |
| US60/508,602 | 2003-10-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1891015A true CN1891015A (zh) | 2007-01-03 |
Family
ID=34421763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2004800287951A Pending CN1891015A (zh) | 2003-10-03 | 2004-09-21 | 用于测试电致发光显示器的设备 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7497755B2 (enExample) |
| JP (1) | JP4943152B2 (enExample) |
| KR (1) | KR20070015110A (enExample) |
| CN (1) | CN1891015A (enExample) |
| CA (1) | CA2539589A1 (enExample) |
| TW (1) | TW200518622A (enExample) |
| WO (1) | WO2005034584A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020087584A1 (zh) * | 2018-10-30 | 2020-05-07 | 惠科股份有限公司 | 引脚组件及显示装置 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008541349A (ja) * | 2005-05-04 | 2008-11-20 | オーテーベー、グループ、ベスローテン、フェンノートシャップ | Oledを製造するための方法、oledを製造するための中間生成物、およびoled |
| JP2012012757A (ja) | 2010-06-04 | 2012-01-19 | Showa Glove Kk | 編針案内構造、編針、編成方法、編み地、および手袋 |
| WO2014162454A1 (ja) * | 2013-04-01 | 2014-10-09 | パイオニア株式会社 | 接合構造および発光装置 |
| CN105355633B (zh) * | 2015-10-26 | 2018-08-03 | 京东方科技集团股份有限公司 | 制作阵列基板的方法和阵列基板 |
| WO2020039554A1 (ja) * | 2018-08-23 | 2020-02-27 | シャープ株式会社 | アクティブマトリクス基板、表示装置及び母基板 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3028442A (en) * | 1959-10-01 | 1962-04-03 | Owens Corning Fiberglass Corp | Method and apparatus for melting and feeding heat-softenable materials |
| JPH0685341B2 (ja) * | 1991-09-27 | 1994-10-26 | 帝国通信工業株式会社 | フレキシブル基板の端子構造 |
| US5432015A (en) * | 1992-05-08 | 1995-07-11 | Westaim Technologies, Inc. | Electroluminescent laminate with thick film dielectric |
| JP3213472B2 (ja) * | 1994-04-26 | 2001-10-02 | シャープ株式会社 | アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置 |
| JP3031527B2 (ja) * | 1995-06-19 | 2000-04-10 | カシオ計算機株式会社 | 液晶表示装置 |
| KR0182184B1 (en) | 1996-04-24 | 1999-04-15 | Samsung Electronics Co Ltd | Disconnection/short test apparatus and its method of signal line using metrix |
| US6111424A (en) * | 1997-09-04 | 2000-08-29 | Lucent Technologies Inc. | Testing method and apparatus for flat panel displays using infrared imaging |
| US6407502B2 (en) * | 1997-09-16 | 2002-06-18 | Lite Array, Inc. | EL display with electrodes normal to the surface |
| JP4128677B2 (ja) * | 1998-11-24 | 2008-07-30 | 東芝松下ディスプレイテクノロジー株式会社 | 液晶表示装置の検査方法 |
| JP2000200053A (ja) * | 1999-01-07 | 2000-07-18 | Futaba Corp | 表示素子用基板の製造方法及び表示素子用基板 |
| US6771019B1 (en) | 1999-05-14 | 2004-08-03 | Ifire Technology, Inc. | Electroluminescent laminate with patterned phosphor structure and thick film dielectric with improved dielectric properties |
| TW589455B (en) * | 2000-11-24 | 2004-06-01 | Hannstar Display Corp | Testing method for LCD panel |
| KR100353955B1 (ko) * | 2000-12-20 | 2002-09-28 | 엘지.필립스 엘시디 주식회사 | 신호라인 검사를 위한 액정표시장치 |
| KR100800330B1 (ko) * | 2001-12-20 | 2008-02-01 | 엘지.필립스 엘시디 주식회사 | 라인 온 글래스형 신호라인 검사를 위한 액정표시패널 |
| EP1455985A1 (en) | 2001-12-21 | 2004-09-15 | iFire Technology Inc. | Method of laser ablation for patterning thin film layers for electroluminescent displays |
| WO2003056879A1 (en) | 2001-12-21 | 2003-07-10 | Ifire Technology Inc. | Low firing temperature thick film dielectric layer for electroluminescent display |
| JP2006505764A (ja) * | 2002-01-23 | 2006-02-16 | マレナ システムズ コーポレーション | 欠陥検出及び解析用赤外線サーモグラフィ |
| KR100777724B1 (ko) * | 2002-02-07 | 2007-11-19 | 삼성에스디아이 주식회사 | 유기전자 발광소자와, 이의 기판 및 그 절단방법 |
| CN100401518C (zh) * | 2002-09-20 | 2008-07-09 | 皇家飞利浦电子股份有限公司 | 一种电子器件以及制造电子器件的方法 |
-
2004
- 2004-09-21 CA CA002539589A patent/CA2539589A1/en not_active Abandoned
- 2004-09-21 WO PCT/CA2004/001716 patent/WO2005034584A1/en not_active Ceased
- 2004-09-21 JP JP2006529510A patent/JP4943152B2/ja not_active Expired - Fee Related
- 2004-09-21 KR KR1020067008645A patent/KR20070015110A/ko not_active Withdrawn
- 2004-09-21 CN CNA2004800287951A patent/CN1891015A/zh active Pending
- 2004-09-29 US US10/952,642 patent/US7497755B2/en not_active Expired - Fee Related
- 2004-10-01 TW TW093129845A patent/TW200518622A/zh unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020087584A1 (zh) * | 2018-10-30 | 2020-05-07 | 惠科股份有限公司 | 引脚组件及显示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005034584A1 (en) | 2005-04-14 |
| WO2005034584B1 (en) | 2005-06-02 |
| KR20070015110A (ko) | 2007-02-01 |
| US20050073250A1 (en) | 2005-04-07 |
| CA2539589A1 (en) | 2005-04-14 |
| US7497755B2 (en) | 2009-03-03 |
| WO2005034584A9 (en) | 2005-10-27 |
| TW200518622A (en) | 2005-06-01 |
| JP2007507836A (ja) | 2007-03-29 |
| JP4943152B2 (ja) | 2012-05-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: YIFEILEI INTELLECTUAL PROPERTY CO.,LTD.; APPLICAN Free format text: FORMER OWNER: IFIRE TECHNOLOGY INC.; APPLICANT Effective date: 20071109 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20071109 Address after: alberta canada Applicant after: Ifire Technology Corp. Co-applicant after: Sanyo Electric Co., Ltd. Address before: alberta canada Applicant before: Ifire Technology Inc. Co-applicant before: Sanyo Electric Co., Ltd. |
|
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20070103 |